DocumentCode :
993946
Title :
A metric for line segments
Author :
Nacken, Peter F M
Author_Institution :
Center for Math. & Comput. Sci., Amsterdam, Netherlands
Volume :
15
Issue :
12
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
1312
Lastpage :
1318
Abstract :
This correspondence presents a metric for describing line segments. This metric measures how well two line segments can be replaced by a single longer one. This depends for example on collinearity and nearness of the line segments. The metric is constructed using a new technique using so-called neighborhood functions. The behavior of the metric depends on the neighborhood function chosen. In this correspondence, an appropriate choice for the case of line segments is presented. The quality of the metric is verified by using it in a simple clustering algorithm that groups line segments found by an edge detection algorithm in an image. The fact that the clustering algorithm can detect long linear structures in an image shows that the metric is a good measure for the groupability of line segments
Keywords :
geometry; image recognition; clustering algorithm; collinearity; edge detection; groupability measure; line segments; metric; nearness; neighborhood functions; Clustering algorithms; Computer science; Computer vision; Extraterrestrial measurements; Image edge detection; Image segmentation; Machine intelligence; Mathematics; Pixel;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.250848
Filename :
250848
Link To Document :
بازگشت