Signal-to-noise in silicon microstrip detectors with binary readout

Author

DeWitt, J. ; Dorfan, D. ; Dubbs, T. ; Grillo, A. ; Hubbard, B. ; Kashigin, S. ; Noble, K. ; Pulliam, T. ; Rahn, J. ; Rowe, W.A. ; Sadrozinski, H.F.-W. ; Seiden, A. ; Spencer, E. ; Webster, A. ; Wilder, M. ; Williams, D.C. ; Ciocio, A. ; Collins, T. ; Kipn

Author_Institution

Inst. for Particle Phys., California Univ., Santa Cruz, CA, USA

Volume

42

Issue

4

fYear

1995

fDate

8/1/1995 12:00:00 AM

Firstpage

445

Lastpage

450

Abstract

We report the results of a beam test at KEK using double-sided AC-coupled silicon microstrip detectors with binary readout, i.e., a readout where the signals are discriminated in the front-end electronics and only the hit location as kept. For strip pitch between 50μ and 200μ, we determine the efficiency and the noise background as function of threshold setting. This allows us to reconstruct the Landau pulse height spectrum and determine the signal/noise ratio. In addition, the threshold/noise ratio necessary for operation with low occupancy is determined

Keywords

position sensitive particle detectors; silicon radiation detectors; KEK beam test; Landau pulse height spectrum; Si; binary readout; double-sided AC-coupled detectors; efficiency; front-end electronics; hit location; low occupancy operation; microstrip detectors; noise background; signal-to-noise ratio; threshold setting; threshold/noise ratio; Background noise; Detectors; Electronic equipment testing; Laboratories; Microstrip; Particle beams; Pipelines; Pulse amplifiers; Silicon; Strips;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.467803

Filename

467803