A study of temperature dependence of some relevant parameters performed on a set of CdTe detectors

Author

Dusi, W. ; Caroli, E. ; Cocco, G. Di ; Donati, A. ; Landini, G. ; Chirco, P. ; Scannavini, M.G.

Author_Institution

Istituto TESRE, CNR, Bologna, Italy

Volume

42

Issue

4

fYear

1995

fDate

8/1/1995 12:00:00 AM

Firstpage

263

Lastpage

266

Abstract

Cadmium telluride is a semiconductor material which is now widely used in both spectroscopic and imaging applications. Among its properties, the most advantageous is its ability to operate at room-temperature, so as to avoid the need of bulk cooling devices. Nevertheless, a quantitative evaluation of the temperature dependence of the detectors response is needed in order to establish a temperature range for safe operations. In this paper, some parameters are evaluated at temperatures ranging from -35°C up to 40°C with an energy source of 511 keV for a set of three spectroscopy grade CdTe detectors. The data obtained seem to indicate a significant temperature independence below 0°C, while at temperatures over 10°C spectra degradations occur

Keywords

II-VI semiconductors; cadmium compounds; gamma-ray detection; gamma-ray spectrometers; semiconductor counters; γ-spectroscopy grade detectors; -35 to 40 C; 0 C; 10 C; 293 K; 511 keV; CdTe; detector response; imaging applications; room-temperature; safe operations; semiconductor detectors; spectra degradations; spectroscopic applications; temperature dependence; Astrophysics; Cadmium compounds; Detectors; Leak detection; Physics; Pulse amplifiers; Semiconductor materials; Spectroscopy; Temperature dependence; Temperature distribution;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.467839

Filename

467839