Title :
Investigation of 1/f noise in tunnel junction DC SQUIDS
Author :
Koch, Roger H. ; Clarke, John ; Martinis, J.M. ; Goubau, W.M. ; Pegrum, M.C. ; Harlingen, D.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
fDate :
5/1/1983 12:00:00 AM
Abstract :
We describe two methods of measuring the 1/f noise in a dc SQUID. One is sensitive only to 1/f noise in the critical currents of the junctions, and the other is sensitive only to 1/f flux noise that is not associated with critical current fluctuations. From measurements on a planar thin-film dc SQUID incorporating Josephson tunnel junctions we conclude that the predominant source of 1/f noise is not noise in the crititcal currents, but rather an apparent flux noise of unknown origin.
Keywords :
Josephson device noise; Critical current; Current measurement; Fluctuations; Noise measurement; Noise reduction; Physics; SQUIDs; Superconducting device noise; Temperature; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1983.1062412
