DocumentCode
994484
Title
Investigation of 1/f noise in tunnel junction DC SQUIDS
Author
Koch, Roger H. ; Clarke, John ; Martinis, J.M. ; Goubau, W.M. ; Pegrum, M.C. ; Harlingen, D.
Author_Institution
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Volume
19
Issue
3
fYear
1983
fDate
5/1/1983 12:00:00 AM
Firstpage
449
Lastpage
452
Abstract
We describe two methods of measuring the 1/f noise in a dc SQUID. One is sensitive only to 1/f noise in the critical currents of the junctions, and the other is sensitive only to 1/f flux noise that is not associated with critical current fluctuations. From measurements on a planar thin-film dc SQUID incorporating Josephson tunnel junctions we conclude that the predominant source of 1/f noise is not noise in the crititcal currents, but rather an apparent flux noise of unknown origin.
Keywords
Josephson device noise; Critical current; Current measurement; Fluctuations; Noise measurement; Noise reduction; Physics; SQUIDs; Superconducting device noise; Temperature; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1983.1062412
Filename
1062412
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