• DocumentCode
    994584
  • Title

    Microstructure and Exchange Coupling of Segregated Oxide Perpendicular Recording Media

  • Author

    Nolan, Thomas P. ; Risner, Juliet D. ; Harkness, Samuel D., IV ; Girt, Erol ; Wu, Stella Z. ; Ju, Ganping ; Sinclair, Robert

  • Author_Institution
    Seagate Technol., Fremont, CA
  • Volume
    43
  • Issue
    2
  • fYear
    2007
  • Firstpage
    639
  • Lastpage
    644
  • Abstract
    The magnetic properties and corresponding microstructure of (Co 80Pt20)x (metal oxide)1-x perpendicular recording media have been studied as a function of the volume percentage (vol%) of metal oxide sputtering into the magnetic film. The exchange coupling field (Hex) estimated from the coercivity (H c) and nucleation field (Hn) decreases rapidly between 0-20 vol% of metal oxide. The analytical transmission electron microscope composition analysis of (Co80Pt20)x(TiO2)1-x media confirms that the microstructure includes crystalline grain cores in an apparently amorphous oxide matrix. The grain cores comprise only Co and Pt in a nearly constant ratio independent of the vol% of oxide addition. The amorphous matrix contains Co, Ti, and O, but no Pt. The Co concentration is nearly constant in grain boundary and core regions, unlike high-temperature longitudinal recording media wherein Co segregates to form a concentration gradient in the grain core. Perpendicular media thus maintain fairly high anisotropy of the grain core phase, even for very high-oxide concentrations that significantly decrease remanant magnetization (Mrt), Hc, and thermal stability (KuV/kT)
  • Keywords
    cobalt compounds; coercive force; grain size; magnetic thin films; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum compounds; sputtering; transmission electron microscopes; (Co80Pt20)x(TiO2) 1-x; amorphous oxide matrix; coercivity; concentration gradient; crystalline grain cores; exchange coupling; exchange coupling field; high-oxide concentrations; magnetic film; magnetic properties; metal oxide sputtering; microstructure; nucleation field; remanant magnetization; segregated oxide perpendicular recording media; thermal stability; Amorphous materials; Grain boundaries; Magnetic analysis; Magnetic cores; Magnetic films; Magnetic properties; Microstructure; Pareto analysis; Perpendicular magnetic recording; Sputtering; Electron microscopy; magnetic films; perpendicular magnetic recording;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2006.888208
  • Filename
    4069052