Efficient development of mass producible MMIC circuits

The state-of-the-art criteria and tools for an efficient development of mass producible MMICs are discussed with reference to a specific development philosophy. The available yield evaluation systems are then critically analyzed and the results of a systematic functional yield evaluation performed on a large number of monolithic circuit components are reported. A statistically meaningful database (including both FET equivalent circuit and S parameters) developed for parametric yield evaluation and yield-driven design centering is described. Through a significant example, the possibility is demonstrated of drastically improving the accuracy of the parametric circuit yield forecasts by using a small set of mutually uncorrelated process dependent parameters and by making reference to a physically based semiempirical FET model