• DocumentCode
    994746
  • Title

    Integrated physics-oriented statistical modeling, simulation, and optimization [MESFETs]

  • Author

    Bandler, John W. ; Biernacki, Radoslaw M. ; Cai, Qian ; Chen, Shao Hua ; Ye, Shen ; Zhang, Qi-Jun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
  • Volume
    40
  • Issue
    7
  • fYear
    1992
  • fDate
    7/1/1992 12:00:00 AM
  • Firstpage
    1374
  • Lastpage
    1400
  • Abstract
    Physics-based modeling of MESFETs is addressed from the point of view of efficient simulation, accurate behavior prediction and robust parameter extraction. A novel integration of a large-signal physics-based model into the harmonic balance equations for simulation of nonlinear circuits, involving an efficient Newton update, is presented and exploited in a gradient-based FAST (feasible adjoint sensitivity technique) circuit optimization technique. For yield-driven MMIC design a relevant physics-based statistical modeling methodology is presented. Quadratic approximation of responses and gradients suitable for yield optimization is discussed. The authors verify their theoretical contributions and exemplify their computational results using built-in and user-programmable modeling capabilities of the CAE systems OSA90/hope and HarPE. Results of device modeling using a field-theoretic nonlinear device simulator are reported
  • Keywords
    MMIC; Schottky gate field effect transistors; digital simulation; electronic engineering computing; equivalent circuits; optimisation; semiconductor device models; sensitivity analysis; solid-state microwave devices; statistical analysis; CAE systems; HarPE; MESFETs; Newton update; OSA90/hope; behavior prediction; circuit optimization technique; feasible adjoint sensitivity technique; gradient-based FAST; harmonic balance equations; large-signal physics-based model; nonlinear circuits; nonlinear device simulator; optimization; parameter extraction; physics-oriented statistical modeling; simulation; yield optimization; yield-driven MMIC design; Circuit optimization; Circuit simulation; Computer aided engineering; MESFETs; MMICs; Nonlinear circuits; Nonlinear equations; Parameter extraction; Predictive models; Robustness;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.146320
  • Filename
    146320