DocumentCode
994746
Title
Integrated physics-oriented statistical modeling, simulation, and optimization [MESFETs]
Author
Bandler, John W. ; Biernacki, Radoslaw M. ; Cai, Qian ; Chen, Shao Hua ; Ye, Shen ; Zhang, Qi-Jun
Author_Institution
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
Volume
40
Issue
7
fYear
1992
fDate
7/1/1992 12:00:00 AM
Firstpage
1374
Lastpage
1400
Abstract
Physics-based modeling of MESFETs is addressed from the point of view of efficient simulation, accurate behavior prediction and robust parameter extraction. A novel integration of a large-signal physics-based model into the harmonic balance equations for simulation of nonlinear circuits, involving an efficient Newton update, is presented and exploited in a gradient-based FAST (feasible adjoint sensitivity technique) circuit optimization technique. For yield-driven MMIC design a relevant physics-based statistical modeling methodology is presented. Quadratic approximation of responses and gradients suitable for yield optimization is discussed. The authors verify their theoretical contributions and exemplify their computational results using built-in and user-programmable modeling capabilities of the CAE systems OSA90/hope and HarPE. Results of device modeling using a field-theoretic nonlinear device simulator are reported
Keywords
MMIC; Schottky gate field effect transistors; digital simulation; electronic engineering computing; equivalent circuits; optimisation; semiconductor device models; sensitivity analysis; solid-state microwave devices; statistical analysis; CAE systems; HarPE; MESFETs; Newton update; OSA90/hope; behavior prediction; circuit optimization technique; feasible adjoint sensitivity technique; gradient-based FAST; harmonic balance equations; large-signal physics-based model; nonlinear circuits; nonlinear device simulator; optimization; parameter extraction; physics-oriented statistical modeling; simulation; yield optimization; yield-driven MMIC design; Circuit optimization; Circuit simulation; Computer aided engineering; MESFETs; MMICs; Nonlinear circuits; Nonlinear equations; Parameter extraction; Predictive models; Robustness;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.146320
Filename
146320
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