Title :
Characterization of Pb3Bi alloy surfaces by Auger spectroscopy and ion sputtering
Author :
Allie, G. ; Blanc, E. ; Chicault, R. ; Lauroz, C.
Author_Institution :
Laboratoire de Spectrométric Physique, Grenoble Cedex, France
fDate :
5/1/1983 12:00:00 AM
Abstract :
The surfaces of Pb3Bi films obtained through evaporation on silicon substrates are analysed by using Auger Electron Spectroscopy and ion sputtering. These films reveal a strong gradient of concentration in the vicinity of the surface. In particular, the topmost layers almost exclusively contain lead, and it is only after the removal of 200 or 300 layers that the composition reaches a constant value.
Keywords :
Electron spectroscopy; Ion radiation effects; Lead materials/devices; Sputtering; Superconducting materials; Bismuth; Electrons; Intensity modulation; Lead; Semiconductor films; Silicon; Spectroscopy; Sputtering; Superconducting films; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1983.1062458
