Title :
Transient response of tin microstrips to supercritical current pulses
Author :
Butler, D. ; Hsiang, Thomas ; Mourou, Gerard
Author_Institution :
University of Rochester, Rochester, NY
fDate :
5/1/1983 12:00:00 AM
Abstract :
We have measured the transient response of tin microstrips to short current pulses whose amplitude exceeded the dc critical current Icof the sample. The current pulses were generated by an electro-optic switching technique. The voltage across the microstrip was measured indirectly by integrating the sample into a transmission line and measuring the transmission characteristics. For a fixed pulse duration, no voltage was measured until a threshold Ic1(>Ic) was reached. Above Ic1, the voltage developed at a delay time of τd. When current amplitude exceeded a second threshold Ic2, the voltage onset occurred with no observable delay. These results were partially explained by existing theories that employed TDGL calculations.
Keywords :
Microstrip; Pulse measurement; Superconducting devices; Tin materials/devices; Transient analysis; Critical current; Current measurement; Delay; Microstrip; Pulse generation; Pulse measurements; Threshold voltage; Tin; Transient response; Transmission line measurements;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1983.1062480