DocumentCode :
995325
Title :
Mixing efficiency of SIS junctions
Author :
Sollner, T. ; Powell, Scott D.
Author_Institution :
University of Massachusetts, Amherst, Massachusetts
Volume :
19
Issue :
3
fYear :
1983
fDate :
5/1/1983 12:00:00 AM
Firstpage :
605
Lastpage :
607
Abstract :
To evaluate new SIS technologies as low noise mixers we have investigated theoretically the frequency down-conversion efficiency of SIS junctions with IV curves which closely resemble experimentally observed curves. Leakage current and IV curve "sharpness" of the current rise at 
are included as parameters. We have applied a 3-port version of the quantum mixing theory to study the importance of these parameters on conversion efficiency. The results suggest that the leakage conductance should be less than 10% of the normal conductance, that the voltage width of the current rise should be less than 10% of the gap voltage, and that the optimum frequency of operation is near 10% of the gap frequency, 
.
are included as parameters. We have applied a 3-port version of the quantum mixing theory to study the importance of these parameters on conversion efficiency. The results suggest that the leakage conductance should be less than 10% of the normal conductance, that the voltage width of the current rise should be less than 10% of the gap voltage, and that the optimum frequency of operation is near 10% of the gap frequency, .Keywords :
Millimeter-wave mixers; Mixer noise; Superconductor insulator superconductor devices; Frequency conversion; Josephson junctions; Leakage current; Millimeter wave technology; Quantum computing; Quantum mechanics; Superconducting device noise; Superconducting devices; Superconductivity; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1983.1062485
Filename :
1062485
Link To Document :
