Title :
Impact of design-manufacturing interface on SoC design methodologies
Author :
Carballo, Juan-Antonio ; Nassif, Sani R.
Author_Institution :
IBM Austin Res. Lab., TX, USA
Abstract :
Today´s semiconductor manufacturing trends are increasingly influencing hardware design techniques, tools, and methodologies. We analyze these trends and describe their effects on design methodologies. These effects clearly include impacts on yield optimization resolution enhancement.
Keywords :
design for manufacture; integrated circuit layout; integrated circuit manufacture; integrated circuit reliability; system-on-chip; design for manufacture; design-manufacturing interface; integrated circuit reliability; integrated circuit yield optimization; semiconductor manufacture; system-on-chip design; Computer aided manufacturing; Computer integrated manufacturing; Data mining; Design for manufacture; Design methodology; Logic testing; Manufacturing industries; Packaging; Semiconductor device manufacture; Software design;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2004.13
