Title :
SoC yield optimization via an embedded-memory test and repair infrastructure
Author :
Shoukourian, Samvel ; Vardanian, Valery ; Zorian, Yervant
Author_Institution :
Virage Logic, Fremont, CA, USA
Abstract :
Today, embedded memories are the most important contributor to SoC yield. To maximize embedded-memory yield, advanced test and repair solutions must be an integral part of the memory block. We analyze factors that affect memory yield and presents advanced techniques for maximizing the positive impact.
Keywords :
built-in self test; integrated circuit testing; integrated circuit yield; logic testing; system-on-chip; SoC yield optimization; built-in self test; embedded memory testing; integrated circuit testing; integrated circuit yield; logic testing; system-on-chip; Algorithm design and analysis; Fault detection; Fault diagnosis; Fault location; Fuses; History; Logic; Performance analysis; Redundancy; Testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2004.19
