• DocumentCode
    995504
  • Title

    Reconfigurable architecture for autonomous self-repair

  • Author

    Mitra, Subhasish ; Huang, Wei-Je ; Saxena, Nirmal R. ; Yu, Shu-Yi ; McCluskey, Edward J.

  • Author_Institution
    Center for Reliable Comput., Stanford Univ., CA, USA
  • Volume
    21
  • Issue
    3
  • fYear
    2004
  • Firstpage
    228
  • Lastpage
    240
  • Abstract
    Fault-tolerant systems typically require expensive additional resources (spare pins, columns, and chips) and external control for reconfiguration. We introduce an effective, low-cost repair solution in which originally unused blocks and routing resources replace faulty parts. In addition, the proposed reconfiguration hardware allows autonomous repair, that is, the system does not require external intervention for recovery.
  • Keywords
    built-in self test; fault location; fault tolerance; field programmable gate arrays; logic testing; reconfigurable architectures; autonomous self-repair; built-in self test; fault location; fault-tolerant system; field programmable gate arrays; logic testing; reconfigurable architecture; Control systems; Fault tolerant systems; Field programmable gate arrays; Hardware; Pins; Random access memory; Reconfigurable architectures; Reconfigurable logic; Routing; Wiring;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2004.18
  • Filename
    1302089
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=995504