• DocumentCode
    995522
  • Title

    Estimating the parameters of semiconductor lasers based on weak optical feedback self-mixing interferometry

  • Author

    Xi, Jiangtao ; Yu, Yanguang ; Chicharo, Joe F. ; Bosch, Thierry

  • Author_Institution
    Sch. of Electr. Comput. & Telecommun. Eng., Univ. of Wollongong, NSW, Australia
  • Volume
    41
  • Issue
    8
  • fYear
    2005
  • Firstpage
    1058
  • Lastpage
    1064
  • Abstract
    The paper presents a practical approach for measuring the linewidth enhancement factor α of semiconductor lasers and the optical feedback level factor C in a semiconductor laser with an external cavity. The proposed approach is based on the analysis of the signals observed in an optical feedback self-mixing interferometric system. The parameters α and C are estimated using a gradient-based optimization algorithm that achieves best data-to-theoretical model match. The effectiveness and accuracy of the method has been confirmed and tested by computer simulations and experiments, which show that the proposed approach is able to estimate α and C with an accuracy of 6.7% and 4.63%, respectively.
  • Keywords
    gradient methods; laser cavity resonators; laser feedback; light interferometry; optimisation; parameter estimation; semiconductor lasers; spectral line breadth; data-to-theoretical model match; external cavity laser; gradient-based optimization algorithm; linewidth enhancement factor; optical feedback level factor; parameter estimation; self-mixing interferometry; semiconductor lasers; weak optical feedback; Current measurement; Laser feedback; Laser modes; Laser sintering; Optical feedback; Optical interferometry; Parameter estimation; Semiconductor lasers; Signal analysis; Testing; Linewidth enhancement factor (LEF); optical feedback; optimization algorithm; self-mixing interferometry; semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2005.851250
  • Filename
    1463269