Title :
Use of 2-dimensional arrays to determine the uniformity of Josephson junctions
Author :
Martens, J.S. ; Char, K. ; Pance, A. ; Lee, L.P. ; Johansson, M.E. ; Whiteley, S.R. ; Kihlstrom, K.E. ; Wendt, J.R. ; Hietala, V.M. ; Plut, T.A. ; Vawter, G.A. ; Hou, S.Y. ; Phillips, J.M. ; Lee, W.Y.
Author_Institution :
Conductus Inc., Sunnyvale, CA, USA
Abstract :
The linewidths of phase-locked, oscillating arrays of high temperature superconducting Josephson junctions have been used to estimate such statistical information for several junction processes using a fitting process to simulate results. Statistical data from arrays consisting of several hundred to many thousand junctions operating, and at least partially phase locked, at 77K are being used to characterize and improve junction processes. Spreads on critical currents for three different processes; step edge, edge SNS and electron-beam defined nanobridges, have ranged from +or-3% to 15% (l sigma ) and on normal state resistances from +or-2% to 11%.<>
Keywords :
Josephson effect; critical currents; high-temperature superconductors; superconducting junction devices; 2-dimensional arrays; 2D arrays; 77 K; Josephson junction; critical currents; edge SNS process; electron-beam defined nanobridges; fitting process; high temperature superconducting Josephson junctions; linewidths; phase-locked, oscillating arrays; statistical information; step edgeprocess; Circuits; Critical current; Data mining; High temperature superconductors; Josephson junctions; Phase estimation; Phased arrays; Student members; Superconducting devices; Temperature distribution;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
