• DocumentCode
    995783
  • Title

    Rigorous analysis of 3-D planar circuit discontinuities using the space-spectral domain approach (SSDA)

  • Author

    Wu, Ke ; Yu, Ming ; Vahldieck, Ruediger

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
  • Volume
    40
  • Issue
    7
  • fYear
    1992
  • fDate
    7/1/1992 12:00:00 AM
  • Firstpage
    1475
  • Lastpage
    1483
  • Abstract
    The space-spectral domain approach (SSDA) has been developed to determine scattering parameters for arbitrarily shaped multilayered planar MIC/MMIC discontinuities. Although the basic framework was introduced previously, only resonant frequencies of planar circuit discontinuities could be calculated. The SSDA presented is not only significantly extended, but also introduces the concept of self-consistent hybrid boundary conditions to replace the modal source concept in the feed line. A general error function is derived to provide a direct assessment of the discretization accuracy. The convergence behavior of this method is investigated, and current standing-wave profiles along microstrip throughlines with matched, open, and short-circuited conditions are given. S-parameters for several microstrip discontinuities with abrupt and smooth transition are obtained to demonstrate the flexibility of the approach
  • Keywords
    MMIC; S-parameters; microwave integrated circuits; strip line components; 3D discontinuities; S-parameters; convergence behavior; current standing-wave profiles; error function; feed line; hybrid boundary conditions; microstrip discontinuities; microstrip throughlines; multilayered planar MIC/MMIC discontinuities; planar circuit discontinuities; resonant frequencies; scattering parameters; space-spectral domain approach; Boundary conditions; Convergence; MMICs; Microstrip; Microwave integrated circuits; RLC circuits; Resonance; Scattering parameters; Substrates; Transmission line discontinuities;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.146329
  • Filename
    146329