DocumentCode :
995797
Title :
Exploiting Narrow Values for Soft Error Tolerance
Author :
Ergin, Oguz ; Unsal, Osman ; Vera, Xavier ; González, Antonio
Author_Institution :
TOBB Univ. of Econ. & Technol., Ankara
Volume :
5
Issue :
2
fYear :
2006
Firstpage :
12
Lastpage :
12
Abstract :
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. In this paper we propose simple mechanisms that effectively reduce the vulnerability to soft errors In a processor. Our designs are generally motivated by the fact that many of the produced and consumed values in the processors are narrow and their upper order bits are meaningless. Soft errors canted by any particle strike to these higher order bits can be avoided by simply identifying these narrow values. Alternatively soft errors can be detected or corrected on the narrow values by replicating the vulnerable portion of the value inside the storage space provided for the upper order bits of these operands. We offer a variety of schemes that make use of narrow values and analyze their efficiency in reducing soft error vulnerability of level-1 data cache of the processor
Keywords :
cache storage; error correction; error detection; microprocessor chips; radiation effects; system recovery; transients; contemporary microprocessors; data cache; error correction; narrow values; particle strike; soft error tolerance; transient errors; Cache storage; Error correction; Hardware; Impurities; Manufacturing; Microprocessors; Multithreading; Neutrons; Process design; Random access memory; Data Cache; Error Correction; Narrow Values; Soft Errors;
fLanguage :
English
Journal_Title :
Computer Architecture Letters
Publisher :
ieee
ISSN :
1556-6056
Type :
jour
DOI :
10.1109/L-CA.2006.12
Filename :
4069169
Link To Document :
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