DocumentCode
995811
Title
High-Tc SNS dc SQUIDs produced by electron beam lithography
Author
Dilorio, M. ; de Lozanne, A. ; Beasley, M.R.
Author_Institution
Stanford University, Stanford, California
Volume
19
Issue
3
fYear
1983
fDate
5/1/1983 12:00:00 AM
Firstpage
308
Lastpage
311
Abstract
We have utilized electron beam lithography to fabricate dc SQUIDs incorporating Nb3 Ge/Cu/Nb3 Ge step-edge microbridges. The primary advantage of this process, over conventional lithography, is to decrease the width of the microbridges and hence increase their normal resistance. The microbridges produced typically have normal resistances between 0.1-1.0 Ω, and we have investigated the behavior of the resistance as the width is scaled down. The dc SQUIDs operate without hysteresis over a wide temperature range and exhibit substantial critical current modulation in the presence of a magnetic field, from which we estimate the inductance of the SQUIDs to be about 13 pH. These devices should possess extremely low self-heating effects by virtue of the two-dimensional geometry of the banks made possible by the use of a novel ion beam etching technique. Preliminary noise measurements indicate an intrinsic energy sensitivity as low as 3 h at 2.2 K.
Keywords
Josephson devices; Critical current; Electron beams; Inductance; Lithography; Magnetic field measurement; Magnetic hysteresis; Magnetic modulators; Niobium; SQUIDs; Temperature distribution;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1983.1062528
Filename
1062528
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