DocumentCode
995897
Title
Determination of Geometry and Absorption Effects and Their Impact on the Accuracy of Alpha Particle Soft Error Rate Extrapolations
Author
Baumann, Robert C. ; Radaelli, Daniele
Author_Institution
Texas Instrum., Dallas, TX
Volume
54
Issue
6
fYear
2007
Firstpage
2141
Lastpage
2148
Abstract
The results of a physical experiment and extensive simulation runs are presented for the first time demonstrating the significant effects of geometry and air absorption on accelerated alpha particle soft error rate tests. These results show that geometry and absorption must be properly accounted for even when the source is in close proximity to the device to avoid substantial underestimation of product soft failure rates in the terrestrial environment.
Keywords
CMOS integrated circuits; SRAM chips; alpha-particle sources; geometry; reliability; CMOS; SRAM device; accelerated alpha particle soft error rate tests; air absorption effects; alpha particle source; geometry; reliability; single event effects; Absorption; Alpha particles; Error analysis; Extrapolation; Geometry; Life estimation; Neutrons; Packaging; Testing; Voltage; Alpha particles; reliability; single event effects; soft errors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2007.909709
Filename
4394998
Link To Document