• DocumentCode
    995897
  • Title

    Determination of Geometry and Absorption Effects and Their Impact on the Accuracy of Alpha Particle Soft Error Rate Extrapolations

  • Author

    Baumann, Robert C. ; Radaelli, Daniele

  • Author_Institution
    Texas Instrum., Dallas, TX
  • Volume
    54
  • Issue
    6
  • fYear
    2007
  • Firstpage
    2141
  • Lastpage
    2148
  • Abstract
    The results of a physical experiment and extensive simulation runs are presented for the first time demonstrating the significant effects of geometry and air absorption on accelerated alpha particle soft error rate tests. These results show that geometry and absorption must be properly accounted for even when the source is in close proximity to the device to avoid substantial underestimation of product soft failure rates in the terrestrial environment.
  • Keywords
    CMOS integrated circuits; SRAM chips; alpha-particle sources; geometry; reliability; CMOS; SRAM device; accelerated alpha particle soft error rate tests; air absorption effects; alpha particle source; geometry; reliability; single event effects; Absorption; Alpha particles; Error analysis; Extrapolation; Geometry; Life estimation; Neutrons; Packaging; Testing; Voltage; Alpha particles; reliability; single event effects; soft errors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2007.909709
  • Filename
    4394998