Author :
Buchner, S. ; Rapchun, David A. ; Moseley, Harvey ; Meyer, Stephen E. ; Oldham, Tim ; Ray, Knute ; Tuttle, Jim ; Quinn, Ed ; Buchanan, Ernie ; Bloom, Dave ; Hait, Tom ; Pearce, Mike ; Beamer, A.
Abstract :
Total ionizing dose (TID) measurements at low temperature (60 K) of a micro-electro-mechanical system (MEMS) microshutter array (MSA) indicate that exposing the MSA to ionizing radiation causes some of the shutters to stop operating properly. The number of non-functional shutters depends on the applied bias. With increasing dose, the number of micro-shutters that become non-functional increases.
Keywords :
micromechanical devices; radiation effects; MEMS; applied bias; insulators; ionizing radiation effects; micro-electro-mechanical system; microshutter; temperature 60 K; Degradation; Infrared detectors; Infrared spectra; Ionizing radiation; Microelectromechanical systems; Micromechanical devices; NASA; Space technology; Telescopes; Temperature measurement; Insulators; low temperature; micro-electro-mechanical system; total ionizing dose;
