DocumentCode
996382
Title
Programmable interconnects speed system verification
Author
Mohsen, A.
Volume
9
Issue
3
fYear
1993
fDate
5/1/1993 12:00:00 AM
Firstpage
37
Lastpage
42
Abstract
A family of CMOS integrated circuits called field programmable interconnect components (FPICs) that can provide designers with the high-density interconnect architectures for making programmable hardware a reality is discussed. The FPIC devices address a broad spectrum of interconnect needs, including system prototypes and breadboards, user-specific/configurable printed circuit boards (PCBs), application configurable processors, test interfaces, and programmable connector and switching matrix applications. Using FPIC devices for system prototyping, in conjunction with other programmable components (programmable logic devices (PLDs), field programmable gate arrays (FPGAs), microprocessors, microcontrollers, DSP, and programmable memory) enhance the design verification process, allowing faster, more flexible, and thorough product integration. Field programmable circuit boards (FPCBs) designed to take advantage of the high density interconnect and observability of FPIC devices and a FPIC/FPCB development environment are described.<>
Keywords
CMOS integrated circuits; automatic testing; digital integrated circuits; integrated circuit testing; printed circuit testing; CMOS integrated circuits; application configurable processors; configurable printed circuit boards; design verification process; development environment; field programmable circuit boards; field programmable interconnect components; high-density interconnect architectures; programmable connector; programmable hardware; switching matrix; system prototyping; test interfaces; CMOS integrated circuits; Circuit testing; Connectors; Field programmable gate arrays; Hardware; Integrated circuit interconnections; Printed circuits; Programmable logic arrays; Prototypes; System testing;
fLanguage
English
Journal_Title
Circuits and Devices Magazine, IEEE
Publisher
ieee
ISSN
8755-3996
Type
jour
DOI
10.1109/101.252306
Filename
252306
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