DocumentCode
996386
Title
Using Subthreshold Heavy Ion Upset Cross Section to Calculate Proton Sensitivity
Author
Inguimbert, Christophe ; Duzellier, Sophie ; Nuns, Thierry ; Bezerra, Françcoise
Author_Institution
ONERA-DESP, Toulouse
Volume
54
Issue
6
fYear
2007
Firstpage
2394
Lastpage
2399
Abstract
This paper reports on SEU proton calculations using the very low LET heavy ion upset cross section measurements. This approach allows for improving the prediction of the proton sensivity of devices based on heavy ion data.
Keywords
heavy ion-nucleus reactions; nuclei with mass number 20 to 38; proton-nucleus reactions; 28Si(12C,X); SEU proton calculations; Si(p,X); proton sensitivity calculation; single-event upset; subthreshold LET; subthreshold heavy ion upset cross section; Assembly; Energy states; International collaboration; Nuclear power generation; Numerical simulation; Predictive models; Protons; Shape; Software libraries; Statistics; Heavy ion; SEU; prediction; proton; sub-threshold LET;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2007.909983
Filename
4395041
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