• DocumentCode
    996446
  • Title

    Probabilistic Evaluation of Analog Single Event Transients

  • Author

    Kauppila, Amy V. ; Vaughn, Gregg L. ; Kauppila, Jeffrey S. ; Massengill, Lloyd W.

  • Author_Institution
    InfoWorks Inc., Nashville
  • Volume
    54
  • Issue
    6
  • fYear
    2007
  • Firstpage
    2131
  • Lastpage
    2136
  • Abstract
    We propose a procedure to estimate the consequences of an analog single event transient (ASET). The method qualifies ASETs based on their frequency domain signatures and determines the probability of a single event transient induced error.
  • Keywords
    operational amplifiers; radiation effects; analog circuit; analog single event transients; frequency domain signatures; operational amplifier; probabilistic evaluation; radiation effects; single event transient induced error; Analog circuits; Circuit noise; Context; Fourier transforms; Frequency domain analysis; Histograms; Ionizing radiation; Operational amplifiers; Qualifications; Radiation effects; Analog single-event transients; Fourier transforms; integral square error; operational amplifier;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2007.910166
  • Filename
    4395045
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=996446