Title :
The Impact of Radiation-Induced Failure Mechanisms in Electronic Components on System Reliability
Author :
Mayer, Donald C. ; Koga, Rokutaro ; Womack, J.M.
Author_Institution :
Aerosp. Corp., El Segundo
Abstract :
A methodology is described to incorporate destructive radiation effects into the reliability estimation for a space system. Examples are presented to illustrate how on-orbit system reliability can be estimated from test data from radiation-sensitive parts.
Keywords :
aerospace instrumentation; radiation effects; destructive radiation effects; electronic components; on-orbit system reliability; radiation-induced failure mechanisms; space system; Aerospace electronics; Electronic components; Failure analysis; MOSFETs; Power generation; Radiation effects; Reliability; Space technology; Space vehicles; System testing; Destructive radiation effects; reliability; single-event burnout; single-event effects; single-event latchup;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.910294
