Title :
A Design Language Based Approach to Test Sequence Generation
Author :
Hill, Fredrick J. ; Huey, Ben
Author_Institution :
University of Arizona
fDate :
6/1/1977 12:00:00 AM
Abstract :
There are two important advantages inherent in test sequence generation based on a design language description:
Keywords :
Analytical models; Circuit faults; Circuit testing; Information analysis; Iterative methods; Logic testing; Sequential analysis; Sequential circuits; System testing;
DOI :
10.1109/C-M.1977.217743
