DocumentCode :
996622
Title :
A unified framework for generating all propagation functions for logic errors and events
Author :
Michael, Maria K. ; Haniotakis, Themistoklis ; Tragoudas, Spyros
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Cyprus, Nicosia, Cyprus
Volume :
23
Issue :
6
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
980
Lastpage :
986
Abstract :
We present a generic framework that supports efficient generation of the traditional Boolean difference function of some output with respect to any line in a combinational circuit, which is important when testing for logic defects. The framework also allows for the generation of generalized Boolean difference functions, which reflect sensitivity on event propagation from a given line to some circuit output. This generalized function could apply in timing verification, analysis, and test. We implemented the proposed framework using various function representation environments, including binary decision diagrams, Boolean expression diagrams, and Boolean networks, and report experimental results on the ISCAS´85 and ISCAS´89 benchmarks.
Keywords :
Boolean functions; automatic test pattern generation; binary decision diagrams; combinational circuits; logic simulation; logic testing; sequential circuits; Boolean difference function; Boolean expression diagrams; Boolean networks; ISCAS 85 benchmark; ISCAS 89 benchmarks; automatic test pattern generation; binary decision diagrams; combinational circuit; delay testing; event propagation; function representation environments; logic defect testing; logic errors; logic events; propagation functions; timing analysis; timing verification; unified framework; Automatic test pattern generation; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Computer errors; Data structures; Fault detection; Logic testing; Timing; ATPG; Automatic test pattern generation; delay testing; testing; timing analysis; verification;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2004.828112
Filename :
1302197
Link To Document :
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