Title :
New Methodologies for SET Characterization and Mitigation in Flash-Based FPGAs
Author :
Rezgui, Sana ; Wang, J.J. ; Tung, Eric Chan ; Cronquist, Brian ; McCollum, John
Author_Institution :
Actel Corp., Mountain View, CA
Abstract :
New single event transient characterization and mitigation techniques unique for nonvolatile field programmable gate arrays (FPGAs) are investigated. Their implementation on a flash-based FPGA and evaluation in-beam show their efficacy with little area overhead but moderately high time penalty for highly scaled technologies.
Keywords :
field programmable gate arrays; transients; flash-based FPGAs; mitigation techniques; nonvolatile field programmable gate arrays; radiation testing; single event transient characterization; Aerospace testing; Application specific integrated circuits; Field programmable gate arrays; Filtering; Latches; Logic; Nonvolatile memory; Pulse measurements; Single event upset; Space vector pulse width modulation; Single event transient (SET) characterization and mitigation; radiation testing; reprogrammable and nonvolatile field programmable gate arrays (FPGAs);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.910126
