DocumentCode
997104
Title
DC and temperature dependent characteristics of InP double heterostructure bipolar transistors with quaternary collector
Author
McAlister, S.P. ; Abid, Z.-E. ; McKinnon, W.R. ; Davies, Mike
Author_Institution
Inst. of Microstructural Sci., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Volume
29
Issue
16
fYear
1993
Firstpage
1415
Lastpage
1417
Abstract
Reports the first study of the temperature dependence of the DC characteristics of InP-based double heterostructure bipolar transistors which have a quaternary collector. The quaternary layer was spaced away from the base-collector junction to improve the HBT characteristics. The devices exhibited useful gain over seven orders of magnitude of current and had breakdown voltages of approximately 8 V. The DC gain decreased with decreasing temperature whereas the ideality factors increased.
Keywords
III-V semiconductors; heterojunction bipolar transistors; indium compounds; 8 V; DC characteristics; InP; base-collector junction; breakdown voltages; double heterostructure bipolar transistors; gain; ideality factors; quaternary collector; temperature dependence;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19930948
Filename
252466
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