• DocumentCode
    997418
  • Title

    90% write power-saving SRAM using sense-amplifying memory cell

  • Author

    Kanda, Kouichi ; Sadaaki, Hattori ; Sakurai, Takayasu

  • Author_Institution
    Syst. LSI Dev. Labs., Kanagawa, Japan
  • Volume
    39
  • Issue
    6
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    927
  • Lastpage
    933
  • Abstract
    This paper describes a low-power write scheme which reduces SRAM power by 90% by using seven-transistor sense-amplifying memory cells. By reducing the bitline swing to VDD/6 and amplifying the voltage swing by a sense-amplifier structure in a memory cell, the charging and discharging component of the power of the bit/data lines is reduced. A 64-kb test chip has been fabricated and correct read/write operation has been verified. It is also shown that the scheme can also have the capability of leakage power reduction with small modifications. Achievable leakage power reduction is estimated to be two orders of magnitude from SPICE simulation results.
  • Keywords
    CMOS memory circuits; SPICE; SRAM chips; leakage currents; low-power electronics; system-on-chip; SPICE simulation; SRAM power; bitline swing; leakage current; leakage power reduction; low-power write scheme; sense-amplifier structure; sense-amplifying memory cells; test chip; voltage swing; write power; Circuit simulation; Energy consumption; Laboratories; Power dissipation; Random access memory; Read-write memory; SPICE; System-on-a-chip; Testing; Voltage; Leakage current; SRAM; low power; reduced swing; sense-amplifying cell; write power;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2004.827793
  • Filename
    1302269