DocumentCode
997418
Title
90% write power-saving SRAM using sense-amplifying memory cell
Author
Kanda, Kouichi ; Sadaaki, Hattori ; Sakurai, Takayasu
Author_Institution
Syst. LSI Dev. Labs., Kanagawa, Japan
Volume
39
Issue
6
fYear
2004
fDate
6/1/2004 12:00:00 AM
Firstpage
927
Lastpage
933
Abstract
This paper describes a low-power write scheme which reduces SRAM power by 90% by using seven-transistor sense-amplifying memory cells. By reducing the bitline swing to VDD/6 and amplifying the voltage swing by a sense-amplifier structure in a memory cell, the charging and discharging component of the power of the bit/data lines is reduced. A 64-kb test chip has been fabricated and correct read/write operation has been verified. It is also shown that the scheme can also have the capability of leakage power reduction with small modifications. Achievable leakage power reduction is estimated to be two orders of magnitude from SPICE simulation results.
Keywords
CMOS memory circuits; SPICE; SRAM chips; leakage currents; low-power electronics; system-on-chip; SPICE simulation; SRAM power; bitline swing; leakage current; leakage power reduction; low-power write scheme; sense-amplifier structure; sense-amplifying memory cells; test chip; voltage swing; write power; Circuit simulation; Energy consumption; Laboratories; Power dissipation; Random access memory; Read-write memory; SPICE; System-on-a-chip; Testing; Voltage; Leakage current; SRAM; low power; reduced swing; sense-amplifying cell; write power;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2004.827793
Filename
1302269
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