Title :
Observation of recorded magnetization patterns by electron holography
Author :
Yoshida, K. ; Okuwaki, T. ; Osakabe, N. ; Tanabe, H. ; Horiuchi, Y. ; Matsuda, T. ; Shinagawa, K. ; Tonomura, A. ; Fujiwara, H.
Author_Institution :
Central Research Laboratory, Hitachi Ltd., Kokubunji, Tokyo, Japan
fDate :
9/1/1983 12:00:00 AM
Abstract :
Magnetization patterns recorded on Co thin films prepared by oblique incidence vacuum deposition were directly observed by electron holography. Complicated ellipse-like interference fringes were observed along the sawtooth-like walls in the transition regions. Stray magnetic flux was observed in empty space beyond the edge of the film. The following results were obtained from analysis of these interference images. The smaller the product of the remanence and the film thickness, and the higher the coercivity, the narrower is the transition length that determines the limit of the recording density of a medium. It was confirmed that longitudinal magnetic recording of a density of up to 170 kBPI is attainable using Co film 30 nm thick and with coercivity of 112 kA/m. It was quantitatively proven that the intensity of the recorded magnetization in a medium is equal to its remanence when the magnetized area is distinguishable from the transition region.
Keywords :
Holography; Magnetic recording/recording materials; Coercive force; Electrons; Holography; Interference; Magnetic films; Magnetic flux; Magnetic recording; Magnetization; Remanence; Sputtering;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1983.1062674