DocumentCode :
997598
Title :
Spatial sampling and filtering in near-field measurements
Author :
Joy, Edward B. ; Paris, Demetrius T.
Author_Institution :
Georgia Institute of Technology, Atlanta, GA, USA
Volume :
20
Issue :
3
fYear :
1972
fDate :
5/1/1972 12:00:00 AM
Firstpage :
253
Lastpage :
261
Abstract :
A sample spacing criterion and a data minimization technique for measurements made over the surface of a plane in the near field of an antenna are presented. The sample spacing is shown to depend on the distance from the antenna to the measurement plane, and on the extent to which evanescent waves can be neglected. The near-field data minimization technique utilizes two-dimensional spatial filtering to effect a significant reduction in computational effort required to calculate selected portions of the far-field pattern. Far-field patterns of an X band antenna calculated from near-field measurements are presented and compared with those measured on a standard far-field range. The far-field calculations are repeated for several near-field sample spacings and for various post-filter sample rates.
Keywords :
Antenna measurements; Sampling methods; Spatial filters; Antenna measurements; Antenna radiation patterns; Electric variables measurement; Electromagnetic measurements; Filtering; Helium; Measurement standards; Probes; Sampling methods; Size measurement;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.1972.1140193
Filename :
1140193
Link To Document :
بازگشت