Title :
Interference patterns from very thick samples for determining the profile of graded-index fibres
Author_Institution :
Philips Research Laboratories, Eindhoven, Netherlands
Abstract :
Recent studies have pointed out the need for very thin (10 ¿m) fibre samples prepared for interferometric analysis of the refractive index profile of an optical fibre. We show that this is not necessary for all graded-index fibres with reasonable dispersion properties. Sample thicknesses of 125 ¿m, or more, can be used for fibres with a core diameter of about 50 ¿m.
Keywords :
light interferometry; optical fibres; refractive index measurement; 125 micron thick samples; 50 micron core diameter; graded index optical fibres; interferometric analysis; refractive index profile measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19770225
