• DocumentCode
    998142
  • Title

    Measurement of surface topography of magnetic recording materials through computer analyzed microscopic interferometry

  • Author

    Perry, David M. ; Robinson, Glen M. ; Peterson, Richard W.

  • Author_Institution
    3M Center, Saint Paul, Minnesota, USA.
  • Volume
    19
  • Issue
    5
  • fYear
    1983
  • fDate
    9/1/1983 12:00:00 AM
  • Firstpage
    1656
  • Lastpage
    1658
  • Abstract
    A recently developed surface characterization technique, Computer Analyzed Microscopic Interferometry, is shown to have many applications in the study of magnetic recording surfaces. Three-dimensional and quantitative interferometric images produce very high depth resolution without reducing the field of view. This allows very precise surface roughness and volume measurements.
  • Keywords
    Interferometry; Magnetic recording/recording materials; Application software; Interferometry; Magnetic analysis; Magnetic field measurement; Magnetic force microscopy; Magnetic materials; Magnetic recording; Rough surfaces; Surface roughness; Surface topography;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1983.1062741
  • Filename
    1062741
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=998142