Title :
Simple material parameter estimation via terahertz time-domain spectroscopy
Author :
Withayachumnankul, W. ; Ferguson, B. ; Rainsford, T. ; Mickan, S.P. ; Abbott, D.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Adelaide, SA, Australia
fDate :
7/7/2005 12:00:00 AM
Abstract :
A simple and precise method based on fixed-point iteration is used to estimate dielectric parameters using terahertz time-domain spectroscopy (THz-TDS). The method converges and gives correct parameters when the sample thickness is greater than 200 μm at a frequency of 0.1 THz or 20 μm at a frequency of 1.0 THz. The technique in validated using measured terahertz data, obtained by probing a sample of high-resistivity silicon.
Keywords :
dielectric materials; dielectric measurement; nondestructive testing; parameter estimation; submillimetre wave spectroscopy; time-domain analysis; 0.1 THz; 1.0 THz; dielectric parameters; fixed-point iteration; high-resistivity silicon; material parameter estimation; terahertz time-domain spectroscopy;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20051467
