DocumentCode :
998305
Title :
D&T Research
Volume :
2
Issue :
3
fYear :
1985
fDate :
6/1/1985 12:00:00 AM
Firstpage :
87
Lastpage :
100
Keywords :
CADCAM; Circuit testing; Circuits and systems; Computer aided manufacturing; Computer integrated manufacturing; Design automation; Integrated circuit manufacture; Semiconductor device manufacture; Telecommunication computing; Very large scale integration;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1985.294767
Filename :
4069594
Link To Document :
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