DocumentCode :
998431
Title :
A Nanodamascene Process for Advanced Single-Electron Transistor Fabrication
Author :
Dubuc, Christian ; Beauvais, Jacques ; Drouin, Dominique
Author_Institution :
Univ. of Sherbrooke, Sherbrooke
Volume :
7
Issue :
1
fYear :
2008
Firstpage :
68
Lastpage :
73
Abstract :
A process design based on a nanowire structure is demonstrated with the fabrication of metallic single-electron transistors. The method is capable of subattofarad resolution resulting in transistors that exhibited Coulomb blockade up to approximately 430 K. An analysis showed that these devices have sufficient operational margin to sustain process fluctuations and still operate within the temperature limits of conventional silicon field effect transistors.
Keywords :
Coulomb blockade; integrated circuit interconnections; nanowires; single electron transistors; Coulomb blockade; advanced single-electron transistor fabrication; metallic single-electron transistors; nanodamascene process; nanowire structure; subattofarad resolution; Capacitance; Energy resolution; FET circuits; Fabrication; Fluctuations; Lithography; Silicon; Single electron transistors; Temperature distribution; Temperature sensors; Chemical mechanical polishing (CMP); electron beam lithography (EBL); nanodevice characterization; single-electron transistor (SET);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2007.913430
Filename :
4395258
Link To Document :
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