Title :
Reliably designing InGaAs-InAlAs strained multiple-quantum-well structures for amplitude modulation
Author :
Tribuzy, Christiana Villas-Bôas ; Pires, Mauricio Pamplona ; De Souza, Patrícia Lustozade ; Yavich, Boris
Author_Institution :
Laboratorio de Semicond.es-Centro de Estudos em Telecomunicacoes-Pontificia, Univ. Catolica do Rio de Janeiro, Brazil
fDate :
6/1/2004 12:00:00 AM
Abstract :
A simulation of the performance parameters of amplitude modulators was carried out for InGaAs-InAlAs multiple-quantum-well structures for operation at 1.55 μm. The device parameters were estimated from the calculated absorption spectra with applied reverse bias and from the photoluminescence spectra. The theoretically determined results are compared with the experimental data obtained from the measured photocurrent spectra with light incident in the direction perpendicular to the layers. Good agreement was achieved between experimental and theoretical data, providing a reliable way for designing efficient amplitude modulators. The effect of residual doping level and pre-bias on device parameters is discussed.
Keywords :
III-V semiconductors; aluminium compounds; amplitude modulation; electro-optical modulation; gallium arsenide; indium compounds; optical communication equipment; photoconductivity; photoluminescence; quantum well devices; semiconductor device models; semiconductor doping; semiconductor quantum wells; 1.55 micron; InGaAs-InAlAs; amplitude modulation; amplitude modulators; calculated absorption spectra; device parameters; photocurrent spectra; photoluminescence spectra; reliably designing InGaAs-InAlAs strained multiple quantum well structures; residual doping level; Absorption; Amplitude modulation; Chirp modulation; Integrated optics; Optical modulation; Optical saturation; Photoconductivity; Quantum well devices; Reliability theory; Telecommunications; Amplitude modulators; MQWs; Stark effect; multiple quantum wells; strained structures;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2004.828455