Title :
Examination of grain boundaries in polycrystalline solar cells using a scanning optical microscope
Author :
Gannaway, J.N. ; Wilson, Thomas
Author_Institution :
University of Oxford, Department of Engineering Science, Oxford, UK
Abstract :
A scanning optical microscope in which the object is scanned mechanically is used to produce images from polycrystalline solar cells using both the reflected-light and photoinduced current modes.
Keywords :
grain boundaries; laser beam applications; optical microscopy; photoconductivity; semiconductor device testing; solar cells; grain boundaries examination; photoinduced current modes; polycrystalline solar cells; reflected light images; scanning optical microscope;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19780340
