DocumentCode
999266
Title
Built-in self-test (BIST) structure for analog circuit fault diagnosis
Author
Wey, Chin-Long
Author_Institution
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Volume
39
Issue
3
fYear
1990
fDate
6/1/1990 12:00:00 AM
Firstpage
517
Lastpage
521
Abstract
An analog built-in self-test (BIST) structure for analog circuit fault diagnosis is described that increases the numbers of test points while still keeping low pin overhead. The BIST structure allows access to some internal nodes so that the fault diagnosis process can be significantly simplified. The BIST structure also allows designers to use one channel of an oscilloscope to simultaneously monitor multiple output waveforms of analog circuits or systems
Keywords
VLSI; analogue circuits; automatic testing; fault location; integrated circuit testing; linear integrated circuits; waveform analysis; BIST; VLSI; analog circuit; built-in self-test; fault diagnosis; internal nodes; multiple output waveforms; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Clocks; Fault diagnosis; Latches; Modems; Printed circuits; Shift registers;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.106284
Filename
106284
Link To Document