Title :
Built-in self-test (BIST) structure for analog circuit fault diagnosis
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
fDate :
6/1/1990 12:00:00 AM
Abstract :
An analog built-in self-test (BIST) structure for analog circuit fault diagnosis is described that increases the numbers of test points while still keeping low pin overhead. The BIST structure allows access to some internal nodes so that the fault diagnosis process can be significantly simplified. The BIST structure also allows designers to use one channel of an oscilloscope to simultaneously monitor multiple output waveforms of analog circuits or systems
Keywords :
VLSI; analogue circuits; automatic testing; fault location; integrated circuit testing; linear integrated circuits; waveform analysis; BIST; VLSI; analog circuit; built-in self-test; fault diagnosis; internal nodes; multiple output waveforms; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Clocks; Fault diagnosis; Latches; Modems; Printed circuits; Shift registers;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
