DocumentCode :
999277
Title :
Autoprobing on the L200 Functional Tester
Author :
Moore, Tim ; Garner, Stephen
Author_Institution :
Digital Equipment Corp.
Volume :
2
Issue :
6
fYear :
1985
Firstpage :
44
Lastpage :
49
Abstract :
The X-Y autoprobing process was developed to eliminate the need to manually probe prototype modules, and to diagnose production modules. The goal of the X-Y autoprobing process is to increase the throughput of the L200 functional tester by decreasing the average diagnostic time, through automatic control of the probe´s movement and positioning. The X-Y autoprobing systems installed have demonstrated that the amount of time to probe manually can be reduced by a factor of ten.
Keywords :
Automatic testing; Design automation; Fixtures; Hardware; Manufacturing; Probes; Software safety; Software testing; System testing; Throughput;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1985.294797
Filename :
4069698
Link To Document :
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