DocumentCode
999277
Title
Autoprobing on the L200 Functional Tester
Author
Moore, Tim ; Garner, Stephen
Author_Institution
Digital Equipment Corp.
Volume
2
Issue
6
fYear
1985
Firstpage
44
Lastpage
49
Abstract
The X-Y autoprobing process was developed to eliminate the need to manually probe prototype modules, and to diagnose production modules. The goal of the X-Y autoprobing process is to increase the throughput of the L200 functional tester by decreasing the average diagnostic time, through automatic control of the probe´s movement and positioning. The X-Y autoprobing systems installed have demonstrated that the amount of time to probe manually can be reduced by a factor of ten.
Keywords
Automatic testing; Design automation; Fixtures; Hardware; Manufacturing; Probes; Software safety; Software testing; System testing; Throughput;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1985.294797
Filename
4069698
Link To Document