• DocumentCode
    999277
  • Title

    Autoprobing on the L200 Functional Tester

  • Author

    Moore, Tim ; Garner, Stephen

  • Author_Institution
    Digital Equipment Corp.
  • Volume
    2
  • Issue
    6
  • fYear
    1985
  • Firstpage
    44
  • Lastpage
    49
  • Abstract
    The X-Y autoprobing process was developed to eliminate the need to manually probe prototype modules, and to diagnose production modules. The goal of the X-Y autoprobing process is to increase the throughput of the L200 functional tester by decreasing the average diagnostic time, through automatic control of the probe´s movement and positioning. The X-Y autoprobing systems installed have demonstrated that the amount of time to probe manually can be reduced by a factor of ten.
  • Keywords
    Automatic testing; Design automation; Fixtures; Hardware; Manufacturing; Probes; Software safety; Software testing; System testing; Throughput;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1985.294797
  • Filename
    4069698