• DocumentCode
    999674
  • Title

    Surface morphology and photoluminescence of InAs quantum dots grown on [11~0]-oriented streaked islands under ultra-low V/III ratio

  • Author

    Tang, Shiang Feng ; Shih Yen Lin ; Yang, San Te ; Chiang, Cheng Der ; Cherng, Ya Tung ; Shen, Hui Tang ; Nee, Tzer En ; Lin, Ray Ming ; Hsu, Min Yu

  • Author_Institution
    Mater. & Electro-Opt. Div., Chung Shan Inst. of Sci. & Technol., Taoyuan, Taiwan
  • Volume
    3
  • Issue
    2
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    275
  • Lastpage
    280
  • Abstract
    The influences of the low V/III ratio on the surface morphologies and temperature-dependent photoluminescence spectrum of InAs-GaAs quantum dots (QDs) prepared by organometallic vapor phase epitaxy are investigated. Due to the accumulation of In adatoms at the multiatomic step edge on [001] 2/sup 0/ off toward an [111] n-type GaAs substrate, InAs island growth with /spl sim/1 ML coverage takes place prior to the InAs QD formation. With increasing InAs coverage, self-assembled InAs QDs are observed near the InAs islands, which is attributed to the recapture of desorbed In atoms nucleating with supplied As atoms on the edge along [11~0]-orientation of the GaAs substrate.
  • Keywords
    III-V semiconductors; desorption; indium compounds; island structure; photoluminescence; semiconductor epitaxial layers; semiconductor quantum dots; surface morphology; GaAs; In adatoms; InAs; InAs island growth; InAs quantum dots; [111] n-type GaAs substrate; [11~0]-oriented streaked islands; desorbed In atoms; organometallic vapor phase epitaxy; self-assembled InAs QD; surface morphology; temperature-dependent photoluminescence spectra; Atomic force microscopy; Atomic layer deposition; Chemical technology; Epitaxial growth; Gallium arsenide; Photoluminescence; Quantum dots; Substrates; Surface morphology; US Department of Transportation;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2004.828534
  • Filename
    1303522