DocumentCode
999857
Title
Statistical design centring for electrical circuits
Author
Soin, R.S. ; Spence, R.
Author_Institution
Imperial College of Science & Technology, Department of Electrical Engineering, London, UK
Volume
14
Issue
24
fYear
1978
Firstpage
772
Lastpage
774
Abstract
The problem of maximising the manufacturing yield of electrical circuits is addressed. Within the constraint that the absolute component tolerances and the forms of their statistical distributions are fixed, a new design-centring procedure is developed and illustrated by example. It is directly applicable to the design of discrete circuits where fixed tolerances are often considered. The assumption of fixed tolerances also suggests its relevance (as yet untested) to the design of integrated circuits.
Keywords
circuit CAD; component tolerances; computer aided circuit design; electrical circuits; manufacturing yield; statistical design centring;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19780522
Filename
4249579
Link To Document