DocumentCode :
999930
Title :
VHDL´s Impact on Test
Author :
Lowenstein, Al ; Winter, Greg
Author_Institution :
Prospective Computer Analysts
Volume :
3
Issue :
2
fYear :
1986
fDate :
4/1/1986 12:00:00 AM
Firstpage :
48
Lastpage :
53
Abstract :
High-tech microcircuits command a modernized approach to design and test. This approach, born of harsh economic reality, mandates that effective test be inextricably tied to design. The test generation problem is enormous and requires automatic test program generators that in turn require computer-readable descriptions of the unit under test. The government-sponsored VHSIC Hardware Description Language, or VHDL, addresses both design and test needs, allowing both efforts to work together to reduce product cost while improving product quality. In this article, we focus on the needs of test throughout a product´s life cycle and explain how VHDL serves those needs.
Keywords :
Automatic control; Automatic test equipment; Automatic testing; Computational modeling; Costs; Hardware design languages; Life testing; Packaging; Production; System testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1986.294903
Filename :
4069761
Link To Document :
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