Record number :
4186
Title :
Oxide Reliability a Summary of Silicon Oxide Wearout, Breakdown, and Reliability
Publication :
USA World Scientific
Published Year :
2002
Fierst Pages :
0
Main Pages :
270
Collation :
270
Notes :
621.39732^cO96
Reprint :
False
Contents :
0
Print issue :
0
Subject :
Metal Oxide Semiconductors- Reliability+Silicon Oxide Deterioration
Class :
621.39732
CutterNumber :
O96
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=7&DC=4186
