Record number :
6249
Author :
Parag K. Lala
Creator Role :
نويسنده
Title :
Digital Circuit Testing and Testability
Publication :
San Diego Academic Press
Published Year :
1997
Fierst Pages :
0
Main Pages :
199
Collation :
199
Notes :
621.3950287^cL3 , Glossary
Reprint :
False
Contents :
0
Print issue :
0
Subject :
Integrated Circuits- Very Large Scale Integration+Faults in Digital Circuits+Test Generation for Combinational logic Circuits+Testable Combinational Logic Circuit Design+Test Generation for Sequential Circuits
Class :
621.3950287
CutterNumber :
L3
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=7&DC=6249
