ليست عنوان مقالات لاتين فني مهندسي Characterization of protein secondary structure Characterization of the Hurwitz Region for Systems with Parametric Uncertainty

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1

Characterization of protein secondary structure

2

Characterization of proteolytically digested Zebrafish chorion as extracellular matrix

3

Characterization of proton damage in light-emitting diodes

4

Characterization of proton interactions in electronic components

5

Characterization of protons and deuterons from intense 35 fs laser heated water droplet plasma

6

Characterization of protons and deuterons from intense 35 fs laser heated water droplet plasma

7

Characterization of prototype BTeV silicon pixel sensors before and after irradiation

8

Characterization of prototype BTeV silicon pixel sensors before and after irradiation

9

Characterization Of Proximity Correction In 0.1 /spl mu/m Regime X-Ray Lithography

10

Characterization of pseudomorphic InGaAs/AlGaAs MODFET structures grown by molecular beam epitaxy

11

Characterization of PTC resistor pastes applied in LTCC technology.

12

Characterization of pteris vittata rhizosphere during treatment of arsenite in hydroponics

13

Characterization of Pt-Ru binary alloy thin films for work function tuning

14

Characterization of P-Type Cr:TiO2 Gas Sensor

15

Characterization of p-type PbEuTe/PbTe MQW structures with high thermoelectric figures of merit in the PbTe quantum wells

16

Characterization of public datasets for Recommender Systems

17

Characterization of pulsating partial discharges in SF₆-N₂ mixture

18

Characterization of pulse distortion and dispersion of spiral antennas

19

Characterization of pulse induced plasma fueled by aluminum metallization

20

Characterization of pulse radiation by CRLH leaky-wave antennas using a time-domain Green’s function approach

21

Characterization of pulse timing jitter of actively stabilised 1-GHz vertical-external-cavity surface-emitting semiconductor laser producing 500-fs pulses

22

Characterization of pulsed laser generated plasma through its perturbation in an electric field

23

Characterization of pulsed Nd:YAG active/passive mode-locked laser

24

Characterization of pulsed-laser deposited Pb(Zr,Ti)O₃ for piezoelectric thin films devices

25

Characterization of Pulsed-Laser-Deposited Aln Films as a Gate Dielectric in Aln-Si Mis Structures

26

Characterization of pulse-modulated inductively coupled discharges in argon and chlorine

27

Characterization of pump-induced refractive index changes observed in Nd³⁺ and Yb³⁺ doped laser materials

28

Characterization of Pure Germanium for Detector Fabrication

29

Characterization of PV cell-environmental factors consideration

30

Characterization of PV cells with varying weather parameters to achieve maximum power

31

Characterization of PVA cryogel for intravascular ultrasound elasticity imaging

32

Characterization of PVD aluminum nitride for heat spreading in RF IC's

33

Characterization of PVK-based photorefractive polymers by photo-EMF technique in reflectance configuration

34

Characterization of PZN single crystals [ferroelectric properties and fracture behavior]

35

Characterization of PZT and PNZT thin films for monolithic microwave integrated circuit applications

36

Characterization of PZT composite thick films fabricated using a modified Sol-Gel based process

37

Characterization of PZT ferroelectric thin films prepared by a modified sol-gel method

38

Characterization of PZT ferroelectric thin films prepared by a modified sol-gel mothed

39

Characterization of PZT hollow-sphere transducers

40

Characterization of PZT multi-layer actuator

41

Characterization of PZT thin film transducers obtained by pulsed laser deposition

42

Characterization of PZT Thin Films by Sol-Gel Method in Application of Resonant Sensor

43

Characterization of PZT-5A dual thickness mode resonators

44

Characterization of QCM odor sensors coated with LB films

45

Characterization of QRS Complex in ECG Signals Applying Wavelet Transform

46

Characterization of QT interval adaptation to RR interval changes and its use as a risk-stratifier of arrhythmic mortality in amiodarone-treated survivors of acute myocardial infarction

47

Characterization of Quanta Image Sensor Pump-Gate Jots With Deep Sub-Electron Read Noise

48

Characterization of quantization energy fluctuations in single quantum wires by femtosecond near-field optics

49

Characterization of quantum dot enhanced solar cells for concentrator photovoltaics

50

Characterization of Quantum-Cascade Lasers Using Single-Pass Transmission Spectroscopy

51

Characterization of quantum-well and super-lattice lasers

52

Characterization of quarter wavelength line as measurement standard for scattering parameter in the frequency range of W-band and D-band

53

Characterization of quartz crystal resonators on phase modulation noise without an oscillator

54

Characterization of Quartz Crystals by Cathodoluminescence

55

Characterization of quasi-breakdown in ultra-thin gate oxides in an automated test environment

56

Characterization of quasi-monocycle NIR pulses with stabilized carrier-envelop phase by XFROG

57

Characterization of Quasi-Monoenergetic Electron Beams at the Lund Laser Centre

58

Characterization of quasi-optical filters with picosecond transient radiation

59

Characterization of quasi-optical focusing systems at W-band frequencies

60

Characterization of Quasi-Stationarity Regions for Vehicle-to-Vehicle Radio Channels

61

Characterization of quaternary extremal codes of lengths 18 and 20

62

Characterization of radar absorber based on square patch textured surface

63

Characterization of Radar Backscatter Response of Sand-Covered Surfaces at Millimeter-Wave Frequencies

64

Characterization of radar clutter by gamma induced distributions

65

Characterization of Radar Target Using Multiple Ultra Wideband Transient Responses

66

Characterization of radar targets based on ultra wideband polarimetric transient signatures

67

Characterization of radar targets in resonance domain with a reduced number of natural poles

68

Characterization of radar-absorbing material using time-domain techniques

69

Characterization of radial magnetic forces in low-speed permanent magnet wind generator with non-overlapping concentrated windings

70

Characterization of radiated EMI generated by digital wireless speaker

71

Characterization of radiation boundary conditions used in the finite-difference time-domain method

72

Characterization of radiation damage and thermal annealing effects on thallium bromide nuclear radiation detectors

73

Characterization of Radiation Damage in Carbon Nanotube Field-Effect Transistors

74

Characterization of radiation damage in multi-junction solar cells using light-biased current measurement

75

Characterization Of Radiation Detector Using The PBI₂crystal By Response Properties Of α-rays

76

Characterization of radiation effects on trench-isolated bipolar analog microcircuit technology

77

Characterization of radiation effects on trench-isolated bipolar analog microcircuit technology

78

Characterization of Radiation Hardened Bipolar Linear Devices for High Total Dose Missions

79

Characterization of radiation induced brightness and darkening in fiber-optic cables at PBFA-Z

80

Characterization of radiation loss from microstrip discontinuities using a multiport network modeling approach

81

Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS

82

Characterization of radiative and nonradiative Processes in Nd:YAG lasers by comparing direct and band pumping

83

Characterization of Radio Frequency Echo using frequency sweeping and power analysis

84

Characterization of radio over multimode fiber links using coherence bandwidth

85

Characterization of radio propagation at 60 GHz channel

86

Characterization of radio receiver´s front-end nonlinearity by measurement of spurious-free dynamic ranges

87

Characterization of radio wave propagation in tunnels for microcellular communications

88

Characterization of radio wave propagation into buildings at 1800 MHz

89

Characterization of Radiofrequency Ablation Lesion Development Based on Simulated and Measured Intracardiac Electrograms

90

Characterization of radiometer using 8-term linear model

91

Characterization of radiometer using eight-term linear model

92

Characterization of radiometric transfer standards based on silicon trap detectors

93

Characterization of Radionuclide Behavior in Low-Level Waste Sites

94

Characterization of Radoms for Millimetrewave Radar Applications

95

Characterization of Rain Microphysics based on Disdrometer and Polarimetric Radar Observations

96

Characterization of rain profiles in a second-order approximation and application to attenuation beyond 10 GHz

97

Characterization of rainfall signature due to multispectral microwave radiometric data from ground

98

Characterization of RAL bipedal robot capacitive MEMS accelerometer using electrical impedance measurements

99

Characterization of Raman gain for different gain medium

100

Characterization of Raman-assisted Fiber optical parametric amplifiers gain

101

Characterization of ramp edge-geometry Ag:YBa/sub 2/Cu/sub 3/O/sub 7-x//PrBa/sub 2/Cu/sub 3/O/sub 7-x//Ag:YBa/sub 2/Cu/sub 3/O/sub 7-x/ junctions and dc SQUIDs

102

Characterization of ramp-type Josephson junctions with a Co-doped PrBaCuO barrier

103

Characterization of ramp-type YBa/sub 2/Cu/sub 3/O/sub 7/ junctions by AFM

104

Characterization of random decision errors in clocked comparators

105

Characterization of random matrix eigenvectors for stochastic block model

106

Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor

107

Characterization of random reactive ion etched-textured silicon solar cells

108

Characterization of random telegraph noise and its impact on reliability of SRAM sense amplifiers

109

Characterization of Random Telegraph Signal Noise of High-Performance p-MOSFETs With a High- $k$ Dielectric/Metal Gate

110

Characterization of randomly time variant linear channel-an application to directional radio channels

111

Characterization of Randomly Time-Variant Linear Channels

112

Characterization of Randomly Varying Birefringence in Long Single Mode Fibers

113

Characterization of randomly varying linear systems

114

Characterization of randomness sources in ring oscillator-based true random number generators in FPGAs

115

Characterization of Range Resolution as a Function of Bandwidth and Frequency

116

Characterization of Rate Dependent Hysteresis of Piezoceramic Actuators

117

Characterization of Rate Region in Interference Channels with Constrained Power

118

Characterization of rate-dependent hysteresis of magnetostrictive actuators

119

Characterization of Rayleigh fading channel at 28 GHz using narrow and wide beamwidth antennas in reverberation chamber (Invited paper)

120

Characterization of RBSOA of high power bipolar transistors using a nondestructive tester

121

Characterization of Reaction Bonded Au and Ag Thick Film Metallizations

122

Characterization of reactive ion etching of polysilicon over gate oxide for failure mode analysis deprocessing

123

Characterization of reactive sputtered ITO and TiO2/ITO thin films for applications at elevated temperatures

124

Characterization of reactively sputtered iron oxide thin films for developing magnetic resonance imaging contrast agents

125

Characterization of Readback Signal, Distortion, and Noise and Estimation of Error Rates Based on Spectral Measurements Only

126

Characterization of real workloads of web search engines

127

Characterization of Real-Time PMD and Chromatic Dispersion Monitoring in a High-PMD 46-Gb/s Transmission System

128

Characterization of Real-World Steered-Beam Antennas from Amplitude-Only Near-Field Data

129

Characterization of Received Pulses by Antennas in Proximity of Human Body

130

Characterization of recessed Ohmic contacts to AlGaN/GaN

131

Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the AC lifetime profiling technique

132

Characterization of recombination processes in quantum dot lasers using small signal modulation

133

Characterization of Reconfigurable LC-Reflectarrays Using Near-Field Measurements

134

Characterization of reconfigurable ultra-narrowband optical filters realized by localized dynamic Brillouin gratings

135

Characterization of reconstituted mica paper capacitors used in high voltage and high temperature power electronics applications

136

Characterization of reconstituted mica paper capacitors used in high voltage electronics applications

137

Characterization of reconstituted mica paper capacitors used in high voltage power electronics applications

138

Characterization of reconstituted mica paper for use in high voltage capacitors

139

Characterization of Rectangular Glass Microcapillaries by Low-Coherence Reflectometry

140

Characterization of rectangular waveguide with a pseudochiral /spl Omega/ slab

141

Characterization of red blood cell aggregate formation using an analytical model of the ultrasonic backscattering coefficient

142

Characterization of red blood cell aggregation with photoacoustics: A theoretical and experimental study

143

Characterization of red blood cell deformability change during blood storage

144

Characterization of Reduced-height Loaded Wire Antenna as EMI Sensor

145

Characterization of Reflection Phase Modulators Using Hyperbolic Geometry

146

Characterization of Reflective Defects in Fabry–Pérot Laser Diodes Through the Power Transmission Spectrum

147

Characterization of Refractive Index Distribution in Spherical Microlenses Fabricated by Deep Proton Writing

148

Characterization of refractive index profiles in silver-sodium ion-exchanged glass waveguides for homogeneous refracting waveguide structures

149

Characterization of regular linear-phase paraunitary filter banks using dyadic-based structures

150

Characterization of Regulated Converters to Ensure Stability and Performance in Distributed Power Supply Systems

151

Characterization of relativistic magnetron behavior by 3-D PIC simulation

152

Characterization of relaxation-oscillation noise in continuous-wave traveling wave tubes

153

Characterization of Relay Channels Using the Bhattacharyya Parameter

154

Characterization of reliability in 3-D NAND flash memory

155

Characterization of reliability in WSN

156

Characterization of renal masses with harmonic and subharmonic contrast-enhanced ultrasound

157

Characterization of repeatability of XY-Theta platform held by robotic manipulator arms using a camera

158

Characterization of reperfused infarcted myocardium from high-frequency intracardiac ultrasound imaging using homodyned K distribution

159

Characterization of repolarization alternans during ischemia: time-course and spatial analysis

160

Characterization of resection dexterity in transurethral resection of bladder tumor: A kinematic study

161

Characterization of residual information for SeaWinds quality control

162

Characterization of residual strains of the EMC in PBGA during manufacturing and IR solder reflow process

163

Characterization of residual stress levels in complementary bipolar junction transistors on (100) silicon

164

Characterization of resistive dividers for a wideband power analyzer

165

Characterization of resistive transmission lines by short-pulse propagation

166

Characterization of resistive transmission lines to 70 GHz with ultrafast optoelectronics

167

Characterization of resolution for integrated optical Mach-Zehnder Interferometer with optimization of photolithography process

168

Characterization of resonances by polar expansion of Generalized Admittance Matrix

169

Characterization of resonant elements for passive and reconfigurable reflectarray design

170

Characterization of resonant tunneling diodes for microwave and millimeter-wave detection

171

Characterization of respiratory mechanics in mechanically ventilated neonates by using inflation and interrupter methods

172

Characterization of response of a dual resonance of an arc-induced long-period grating to various physical parameters

173

Characterization of response of the MSM photodetector

174

Characterization of responsivity and quantum efficiency of TiO2—Based photodetectors doped with Ag nanoparticles

175

Characterization of Revenue Monotonicity in Combinatorial Auctions

176

Characterization of Reverberation Chambers for OTA Measurements of Wireless Devices: Physical Formulations of Channel Matrix and New Uncertainty Formula

177

Characterization of reverse leakage components for ultrashallow p+/n diodes fabricated using gas immersion laser doping

178

Characterization of reverse-bias leakage currents and their effect on the holding time characteristics of MOS dynamic RAM circuits

179

Characterization of reversed c-axis AlN thin films

180

Characterization of RF Devices using Two-Tone Probe Signals

181

Characterization of RF noise source impedance for switched mode power supply

182

Characterization of RF plasma cleaning protocols for removal of contaminants in high voltage beam diodes

183

Characterization of RF power BJT and improvement of thermal stability with nonlinear base ballasting

184

Characterization of RF Propagation in Helical and Toroidal Metal Pipes for Passive RFID Systems

185

Characterization of RF signal coupling between MeerKAT telescope structures

186

Characterization of RF sputter deposited HfAlOx dielectrics for MIM capacitor applications

187

Characterization of RF Sputtered ZnO and ZnS Thin Films for SAW Transducers by X-Ray Diffraction Analysis

188

Characterization of RF Transistors For AM/FM Radio Applications

189

Characterization of RF transmission in human body

190

Characterization of RF–DC Transfer Difference for Thermal Voltage Converters With Built-in Tees in the Frequency Range 1 MHz to 1 GHz

191

Characterization of RF/microwave packaging structures

192

Characterization of RF-Driven Slot Microplasmas using Optical Emission Spectroscopy

193

Characterization of RFID Strap Using Single-Ended Probe

194

Characterization of RF-MOSFETs in Common-Source Configuration at Different Source-to-Bulk Voltages From S-Parameters

195

Characterization of rheotaxis of bull sperm using microfluidics

196

Characterization of Rice Paddies by a UAV-Mounted Miniature Hyperspectral Sensor System

197

Characterization of RIE Induced Radiation Damage in Silicon Using Nondestructive Transverse Acoustoelectric Voltage Measurements

198

Characterization of ring modulators and broadband photodetectors in silicon photonics for 25 Gb/s interconnection

199

Characterization of Ring-Bar and Contrawound Helix Circuits for High-Power Traveling-Wave Tubes

200

Characterization of risky projects based on project managers evaluation

201

Characterization of RNS multiply-add units for power efficient DSP

202

Characterization of road traffic flow from measured data of speed and time-headway -relationship between density ( k ), flow rate ( q ) and speed (V )-

203

Characterization of robotic needle insertion and rotation in artificial and ex vivo tissues

204

Characterization of Robust Alignment Mark to Improve Alignment Performance

205

Characterization of robust feedback Nash equilibrium for multi-channel systems

206

Characterization of robust finite frequency positive-real property

207

Characterization of Robust Stability of a Class of Interconnected Systems

208

Characterization of robustness with respect to small delay for exponential stability of linear dynamical systems

209

Characterization of Roebel Cables for Potential Use in High-Field Magnets

210

Characterization of RoF GPON performance for different modulation schemes

211

Characterization of ROFF/RON ratio of fluidic based memristor sensor for pH detection

212

Characterization of room temperature detectors using the proposed IEEE standard

213

Characterization of room temperature E-beam evaporated Ge thin film

214

Characterization of rotational mode disk resonator quality factors in liquid

215

Characterization of Ru electrodes for Ru/(Ba,Sr)TiO/sub 3//Ru capacitors

216

Characterization of rubble on the frequency band [300MHz–3GHz]

217

Characterization of Runtime and Jitter on a Laser Triggered Spark Gap Switch

218

Characterization of runtime and jitter on a laser triggered spark gap switch

219

Characterization of RuO2 nanocrystals deposited on carbon nanotubes by reactive RF sputtering

220

Characterization of rural traffic and evaluation of cellular protocols for fixed-mobile rural application

221

Characterization of safety regions of high power antennas

222

Characterization of samarium-cobalt TWT magnets

223

Characterization of Sample Entropy in the Context of Biomedical Signal Analysis

224

Characterization of sampling schemes for whole body PET imaging

225

Characterization of sampling schemes for whole body PET imaging

226

Characterization of SAR image patterns pertinent to individual façades

227

Characterization of satellite transponder impairments based on simulations with test data

228

Characterization of Satellite-derived Cloud Products for Application in an Aircraft Icing Prediction System

229

Characterization of saturable absorption of E11 and E22 transitions of carbon nanotubes

230

Characterization of saturation effects on digital beam forming radars

231

Characterization of SAW devices up to 2.6 GHz on GaAs and InP

232

Characterization of SAW Duplexer Inserts for LTCC RF Front-End Modules by Simulation and Measurement

233

Characterization of SAW Metal Strip Waveguides

234

Characterization of Sb₂Te₃ ohmic contacts on p-type CdTe single crystals

235

Characterization of Sb₂Te₃ ohmic contacts on P-type CdTe single crystals

236

Characterization of Sb-Al co-doped ZnO nanowires synthesized using nanoparticle-assisted pulsed-laser deposition

237

Characterization of Sb-Doped Fully-Silicided NiSi/SiO₂/Si MOS Structure

238

Characterization of SBS gain and loss spectra using Fresnel reflections and interaction of two sidebands

239

Characterization of scalar strategy mechanisms for efficient resource allocation: Supply side case

240

Characterization of scaled MANOS nonvolatile semiconductor memory (NVSM) devices

241

Characterization of scaled SONOS EEPROM memory devices for space and military systems

242

Characterization of scandate cathode emission

243

Characterization of scattered radiation profile in volumetric 64 slice CT scanner: Monte Carlo study using GATE

244

Characterization of scatterers by their anisotropic and dispersive behavior

245

Characterization of scatterers by their energetic dispersive and anisotropic behaviors in high-resolution laboratory radar imagery

246

Characterization of scatterers concentration in cataractous lens using Nakagami distribution by ultrasounds

247

Characterization of Scattering Parameters Near a Flat Phantom for Wireless Body Area Networks

248

Characterization of scheduling algorithms in real-time computing systems

249

Characterization of Schottky contacts on n-GaN at high temperature

250

Characterization of Scientific and Transactional Applications under Multi-core Architectures on Cloud Computing Environment

251

Characterization of scientific workflows

252

Characterization of Scientific Workloads on Systems with Multi-Core Processors

253

Characterization of Scintillation Properties of a Gd-Doped Lead Chloride Single Crystal for $\\gamma$ -Rays at Low Temperature

254

Characterization of scintillation pulses in time determination in TOF-PET

255

Characterization of scintillators by modern photomultipliers — A new source of errors

256

Characterization of Scintillators by Modern Photomultipliers—A New Source of Errors

257

Characterization of ScN heterojunctions

258

Characterization of Screen-Printed Mercuric Iodide Photoconductors for Mammography

259

Characterization of SDR/CR front-ends for improved digital signal processing algorithms

260

Characterization of sea ice types using synthetic aperture radar

261

Characterization of seafloor geo-acoustic properties from multibeam data

262

Characterization of second order moments of a Multi-Cluster Gaussian Scatterer Distribution channel model

263

Characterization of secondary neutron production during proton therapy

264

Characterization of Second-Order Isotropic Fractional Brownian Fields

265

Characterization of security levels for the dynamics of autonomous vehicle networks

266

Characterization of SEFI events on the EDODRAM used in large space solid state memory

267

Characterization of segmentation methods by multidimensional metrics: application to the delimitation of structures

268

Characterization of segmented HPGe detectors using Pulse Shape Comparison methods

269

Characterization of Segregation and Precipitation at Grain Boundaries in Thermally Aged Pressure Vessel Steels

270

Characterization of selective polysilicon deposition for MEMS resonator tuning

271

Characterization of selective-emitter solar cells consists of laser opened window and subsequently screen-printed electrodes

272

Characterization of Selectively Deposited Cobalt Capping Layers: Selectivity and Electromigration Resistance

273

Characterization of self-aligned metal electrodes poly-Si TFTs with schottky barrier contact

274

Characterization of self-aligned transfer gates for 1µm bubble contiguous-disk devices

275

Characterization of Self-Assembly and Evolution in Carbon Nanotube Thin Film Field Emitter

276

Characterization of self-formed Ti-based barrier layers in Cu(Ti)/dielectric-layer samples using X-ray Photoelectron Spectroscopy

277

Characterization of self-heating in advanced VLSI interconnect lines based on thermal finite element simulation

278

Characterization of self-heating in high-mobility Ge FinFET pMOS devices

279

Characterization of self-organized InAs/GaAs quantum dots under strain-induced and temperature-controlled nucleation mechanisms by atomic force microscopy and photoluminescence spectroscopy

280

Characterization of self-similarity properties of discrete-time linear scale-invariant systems

281

Characterization of semi-active vibration control system with energy regeneration based on MR damper

282

Characterization of semiconducting glaze by dielectric spectroscopy in frequency domain

283

Characterization of semiconducting iron disilicide obtained by LRP/CVD

284

Characterization of semiconducting structures by the PWP method

285

Characterization of semiconducting thin films on InP for magneto-optical applications

286

Characterization of semiconductor Bragg gratings

287

Characterization of Semiconductor Device Structures with Ultrathin Layers by Raman Scattering

288

Characterization of Semiconductor Devices at Very High Temperatures

289

Characterization of semiconductor devices using technological and geometric parameters

290

Characterization of semiconductor laser gain media by the segmented contact method

291

Characterization of semiconductor lasers by spontaneous emission measurements

292

Characterization of semiconductor materials as terahertz emitters under the effect of in-plane magnetic field

293

Characterization of Semiconductor Materials by Charged Particle Activation

294

Characterization of semiconductor materials by Raman microprobe

295

Characterization Of Semiconductor Surfaces And Interfaces By Non-linear Spectroscopy

296

Characterization Of Semiconductor Wafers By Light Of Shorter Wavelength Than Their Band Gap

297

Characterization of semiconductor with spintronic dopant

298

Characterization of Semiconductor-Based Optical Frequency Comb Sources Using Generalized Multiheterodyne Detection

299

Characterization of semiconductor-laser phase noise with digital coherent receivers

300

Characterization of semi-insulating (SI) GaAs as photoconductive switch material for high power, UWB microwave applications

301

Characterization of Semi-Insulating 4H Silicon Carbide for Radiation Detectors

302

Characterization of semi-insulating InP: Cu

303

Characterization of semilumped CPW elements for Millimeter-wave filter design

304

Characterization of semi-synthetic dataset for big-data semantic analysis

305

Characterization of Sensitivity Encoded Silicon Photomultiplier (SeSP) with 1-Dimensional and 2-Dimensional Encoding for High Resolution PET/MR

306

Characterization of sequential cells for constraint sensitivities

307

Characterization of serial links at 5.5Gbps on FR4 backplanes

308

Characterization of set of vectors represented by lattices

309

Characterization of SET response of the LM124A the LM111, and the LM6144

310

Characterization of Shallow Junction Ion Implantation Profiles: Correlation Between a Noncontact Photodisplacement Thermal Wave Technique and Rutherford Backscattering Analysis

311

Characterization of shallow junction transistors manufactured with plasma doping

312

Characterization of shallow ocean sediments using the airborne electromagnetic method

313

Characterization of shallow silicided junctions for sub-quarter micron ULSI technology. Extraction of silicidation induced Schottky contact area

314

Characterization of shallow underground targets using wideband microwave reflectometry

315

Characterization of Shared Library Access Patterns of Android Applications

316

Characterization of shield inhomogeneities of multiconductor cables by evaluation of measured transfer impedances and admittances

317

Characterization of shielded coplanar type transmission line junction discontinuities incorporating the finite metallization thickness effect

318

Characterization of shielding effectiveness of metallic frustum cone-like cabin with one coaxial feeding monopole antenna illuminated by a HEMP

319

Characterization of short and narrow channel effects for CAD-IGFET model

320

Characterization of short circuit faults and incipient insulation degradation between stator winding turns of induction motor

321

Characterization of short optical pulses using simplified chronocyclic tomography

322

Characterization of short PM Raman fiber lasers with a small spectral bandwidth

323

Characterization of short pulse propagation using Euclid distance

324

Characterization of short-duration voltage events

325

Characterization of Short-Wavelength-Selective a-Si:H MSM Photoconductors for Large-Area Digital-Imaging Applications

326

Characterization of Si and CdTe sensor layers in Medipix assemblies using a microfocus x-ray source

327

Characterization of Si- delta doped GaInAs grown by low pressure chemical vapor deposition

328

Characterization of Si implants in p-type GaN

329

Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test

330

Characterization of Si-δ doped InP grown by low pressure chemical vapor deposition

331

Characterization of Si/SiO2interface degradation due to hot-carrier injection

332

Characterization of Si3N4/SiC Microstructure Derived from UV curable polymer ceramic precursor pyrolyzing

333

Characterization of Si3N4 Metal-Insulator-Metal (MIM) Capacitors for Monolithic Microwave Integrated Circuits (MMIC) Applications

334

Characterization of Si-based monolithic transformers with patterned ground shield

335

Characterization of SiC diodes in extremely high temperature ambient

336

Characterization of SiC JFET for Temperature Dependent Device Modeling

337

Characterization of SiC PiN diode forward bias degradation

338

Characterization of SiC Schottky diodes at different temperatures

339

Characterization of SiC thin films grown on Si by inductively coupled plasma chemical vapor deposition at low temperatures

340

Characterization of Si-CeO₂-YBCO tri-layers grown by magnetron sputtering

341

Characterization of SiCN Ceramic Material Dielectric Properties at High Temperatures for Harsh Environment Sensing Applications

342

Characterization of side mounted vehicular antennas

343

Characterization of sidewall roughness inside porous anodic alumina template holes by scanning electron microscopy

344

Characterization of SiFe sheet insulation

345

Characterization of sigma-delta modulators using ARMAX identification methods

346

Characterization of sign controllability for linear systems with real eigenvalues

347

Characterization of signal perturbation using voting based curve fitting for multispectral images

348

Characterization of signal polarization near 900 MHz in and on vehicles and within buildings

349

Characterization of signal propagation in neuronal systems for nanomachine-to-neurons communications

350

Characterization of signal quality using data stream optical autocorrelation

351

Characterization of signal response for surface water movements in underwater optical wireless communications

352

Characterization of Signal Response of Lead Absorber Coupled Transition Edge Sensor Gamma-Ray Microcalorimeters

353

Characterization of signal via structure in multilayer printed circuit boards up to 50 GHz

354

Characterization of signals and noise rejection with bipolar longitudinal intrafascicular electrodes

355

Characterization of signals by the ridges of their wavelet transforms

356

Characterization of signals from multiscale edges

357

Characterization of SILC and its end-of-life reliability assessment on 45NM high-K and metal-gate technology

358

Characterization of silent stores

359

Characterization of Silica Nanowires for Optical Sensing

360

Characterization of silica optical fibers based on chemical etching

361

Characterization of Silicided Polysilicon Fuse Implemented in 65nm Logic CMOS Technology

362

Characterization of silicon 3D pixel detectors for the ATLAS Forward Physics experiment

363

Characterization of Silicon Avalanche Photodetectors Fabricated in Standard CMOS process

364

Characterization of silicon avalanche photodiode in term of breakdown voltage and leakage current

365

Characterization of silicon carbide (SiC) epitaxial channel MOSFETs

366

Characterization of silicon carbide and commercial-off-the-shelf (COTS) components for high-g launch and EM applications

367

Characterization of Silicon Carbide Differential Amplifiers at High Temperature

368

Characterization of Silicon Detectors for the SiliPET Project: A Small Animal PET Scanner Based on Stacks of Silicon Detectors

369

Characterization of silicon detectors with thin dead-layers on the n-side

370

Characterization of silicon die strength with application to die crack analysis

371

Characterization of silicon direct bonding methodology for high performance IGBT

372

Characterization of silicon electro-optical modulators for microwave photonic links

373

Characterization of silicon field effect transistor sub-THz detectors for imaging systems

374

Characterization of silicon isotropic etch by inductively coupled plasma etch in post-CMOS processing

375

Characterization of silicon metallization systems using energetic ion backscattering

376

Characterization of silicon micro-ring resonators using near-field scanning optical microscopy

377

Characterization of silicon MOS tunnel diodes

378

Characterization of silicon nanowire biosensors and solar cells

379

Characterization of Silicon Nanowire Embedded in a MEMS Diaphragm Structure Within Large Compressive Strain Range

380

Characterization of silicon nanowire transistor as a temperature nano-sensor device

381

Characterization of silicon nanowires

382

Characterization of silicon nanowires grown by electroless etching

383

Characterization of silicon nitride films for a silicon nanowire-based biosensor

384

Characterization of Silicon Nitride Micromachined Beams via Remote Optical Interrogation

385

Characterization of silicon parallel-plate electrostatic actuator in partially conducting aqueous solution

386

Characterization of silicon photodiodes for diffuse reflectance signal extraction

387

Characterization of Silicon Photomultipliers for nEXO

388

Characterization of Silicon Photomultipliers for PET Imaging

389

Characterization of silicon photomultipliers for the Cherenkov Telescope Array medium-sized telescopes

390

Characterization of silicon pixel detectors with the n⁺/n/p⁺ and double-sided multiguard ring structure before and after neutron irradiation

391

Characterization of silicon pixel detectors with the n⁺/n/p⁺ and double-sided multiguard ring structure before and after neutron-irradiation

392

Characterization of silicon solar cells by means of their luminescence under high frequency sinusoidal excitations

393

Characterization of silicon solar cells with interdigitated contacts

394

Characterization of silicon spheres for Spheral Solar cells

395

Characterization of silicon/glass anodic bond initiation toughness

396

Characterization of silicon-based molecular resonant tunneling diodes with scanning tunneling microscopy

397

Characterization of silicone gel properties for high power IGBT modules and MEMS

398

Characterization of silicone rubber based soft pneumatic actuators

399

Characterization of Silicon-Film™ sheet material

400

Characterization of silicon-on-insulator waveguide chirped grating for coupling to a vertical optical fiber

401

Characterization of silicon-on-sapphire IGFET transistors

402

Characterization of silver CPWs for applications in silicon MMICs

403

Characterization of silver flakes utilized for isotropic conductive adhesives

404

Characterization of silver nanoparticles biosynthesized using lemon juice

405

Characterization of Silver/Polystyrene (PS)-Coated Hollow Glass Waveguides at THz Frequency

406

Characterization of SIMOX and ZMR materials by spreading resistance and point contact current voltage techniques

407

Characterization of SIMOX material with channeled and unchanneled oxygen implantation

408

Characterization of simple wireless neurostimulators and sensors

409

Characterization of simulated ion beam neutralization stability in two and three dimensions

410

Characterization of simultaneous bulk and interface high-field trapping effects in SiO2

411

Characterization of simultaneous ozone measurements by the MAESTRO and FTS space instruments

412

Characterization of simultaneous protein microarray formation by discrete micro stamper on surfaces of different wettabilities

413

Characterization of single and composites thin films memristive device

414

Characterization of Single and Dual Layer Anti Reflecting Coating (ARC) for Solar Cell Applications

415

Characterization of single and multiple scatter from matter and activity distributions outside the FOV in 3-D PET

416

Characterization of single and multiple scatter from matter and activity distributions outside the FOV in PET

417

Characterization of Single- and Multiwalled Carbon Nanotube Composites for Electromagnetic Shielding and Tunable Applications

418

Characterization of Single- and Multi-walled Carbon Nanotubes at Microwave Frequencies

419

Characterization of single and three phase power rectifiers with passive and active loads

420

Characterization of single event effects for the AD677, 16-bit A/D converter

421

Characterization of single hard errors (SHE) in 1 M-bit SRAMs from single ion

422

Characterization of Single Poly Radiation Sensors

423

Characterization of single quantum wells on GaAs/Si grown by metalorganic chemical vapor deposition

424

Characterization of single red blood cell using twin microcantilever type sensor array

425

Characterization of single stage 3 phase power factor correction circuit using modular single phase PWM DC-to-DC converters

426

Characterization of single-carrier block transmission under the precoded OFDM architecture

427

Characterization of single-channel depolarizations in smooth muscle by analysis of ATP-activated membrane voltage noise

428

Characterization of Single-Crystal Synthetic Diamond for Multi-Watt Continuous-Wave Raman Lasers

429

Characterization of Single-Electron Tunneling Transistors for Designing Low-Power Embedded Systems

430

Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser Testing

431

Characterization of Single-Event Transient Pulse Quenching among Dummy Gate Isolated Logic Nodes in 65 nm Twin-Well and Triple-Well CMOS Technologies

432

Characterization of Single-Event Transients Of Body-Tied vs. floating-body circuits in 150 nm 3D SOI

433

Characterization of single-event upsets in a flash analog-to-digital converter (AD9058)

434

Characterization of Single-Frequency Yb: $\\hbox {KYF}_{4}$ Lasers at 1.03 $\\mu\\hbox {m}$ for Opt

435

Characterization of single-mode chalcogenide glass waveguides at 8.35 µm

436

Characterization of single-mode coated fibers at low temperatures using periodic distortion of the fiber axis

437

Characterization of Single-Mode Fiber With Fiber Bragg Gratings for the Design of Long-Period Gratings

438

Characterization of single-mode fibers from wavelength dependence of modal field and far field

439

Characterization of single-mode optical fibres

440

Characterization of single-mode performance of Chirally-Coupled-Core fibers with cores larger than 50μm

441

Characterization of Single-Photon Avalanche Diode arrays in 150nm CMOS technology

442

Characterization of Single-Photon Avalanche Diodes in a 0.5 $\\mu$ m Standard CMOS Process—Part 1: Perimeter Breakdown Suppression

443

Characterization of single-photon avalanche diodes in standard CMOS

444

Characterization of Single-Photon Time Resolution: From Single SPAD to Silicon Photomultiplier

445

Characterization of single-port and multi-port collective communication operations on the Cell BE processor

446

Characterization of single-port surface transverse wave resonators in the lower GHz range

447

Characterization of single-stage three-phase power-factor-correction circuit using modular single-phase PWM DC-to-DC converters

448

Characterization of singular structures in polarimetric SAR images by wavelet frames

449

Characterization of SINR Region for Interfering Links With Constrained Power

450

Characterization of SINR uncertainty due to spatial interference variation

451

Characterization of SiO2 Films Deposited by Pyrolysis of Tetraethylorthosilicate (TEOS)

452

Characterization of SiO₂ dielectric breakdown for reliability simulation

453

Characterization of SiON integrated waveguides via FTIR and AFM measurements

454

Characterization of SION microring resonators for biosensing applications

455

Characterization of SiPM: Temperature dependencies

456

Characterization of SIS Receivers Using a Digital Spectrometer

457

Characterization of Sites for Low-Level Waste Disposal Facilities

458

Characterization of situation awareness performance

459

Characterization of size-controlled ZnO nanorods produced by electrochemical deposition technique

460

Characterization of SKA-AAlow antenna elements in the array environment

461

Characterization of Skin Effect in High-Speed Interconnects and Spiral Inductors

462

Characterization of skin incision closure using diode laser and ICG -albumin protein solder

463

Characterization of Skin Incision Closure Using Diode Laser and ICG-Albumin Protein Solder

464

Characterization of skin lesion texture in diffuse reflectance spectroscopic images

465

Characterization of skin lesions

466

Characterization of Skip or Far Track Erasure in a Side Shield Design

467

Characterization of slaughtered and non-slaughtered goat meat using low frequency

468

Characterization of sleep spindles using higher order statistics and spectra

469

Characterization of sleep using bispectral analysis

470

Characterization of Slice-Based H.264/AVC Encoded Video Traffic

471

Characterization of Slider Dynamics and Media Defects by Concurrent Methods Using Multifunctional Spinstand

472

Characterization of sliding Al-Cu Electrical contacts

473

Characterization of slots in rectangular waveguide by method of moments with proper edge condition

474

Characterization of SMA actuator for applications in robotic neurosurgery

475

Characterization of small antennas for hearing aids by several measurement techniques

476

Characterization of small apertures in the center conductor of a microstrip line

477

Characterization of small CdTe detectors to be used for linear and matrix arrays

478

Characterization of small CdTe detectors to be used for linear and matrix arrays

479

Characterization of small cracks in eddy current testing

480

Characterization of small photovoltaic inverters for harmonic modeling

481

Characterization of small specimens using an integrated computational/measurement technique

482

Characterization of small trapping sets in LDPC codes from Steiner triple systems

483

Characterization of Small-size Microstrip Patch Antennas for Wireless Applications

484

Characterization of smart hydrogels for biometric sensors and actuators

485

Characterization of Smelling Contaminations on Textiles using a Gradient Micro Array as an Electronic Nose

486

Characterization of Smoke Particles Using Polarization Modulated Scattering

487

Characterization of Sn2.4Ag solder viscoplastic behavior under cyclic loading

488

Characterization of SNMP MIB modules

489

Characterization of SnO₂ thin films through thermoelectric power measurements

490

Characterization Of Snow Grain Size In The Near-infrared And Microwave Wavelengths

491

Characterization of SOA in Time Domain and the Improvement Techniques for Using in High-Voltage Integrated Circuits

492

Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current

493

Characterization of soft errors caused by single event upsets in CMOS processes

494

Characterization of soft handoff in CDMA systems

495

Characterization of soft magnetic material METGLAS 2605S-3A for power applications and transformers

496

Characterization of soft magnetic materials in a wide range of frequencies

497

Characterization of soft magnetic thin film by means of single sheet testing

498

Characterization of soft tissue mechanics with aging

499

Characterization of soft X-ray source using laser-irradiated gas puff targets

500

Characterization of Software Aging Effects in Elastic Storage Mechanisms for Private Clouds

501

Characterization of Software Processes Improvement Needs in SMEs

502

Characterization of Software Projects by Restructuring Parameters for Usability Evaluation

503

Characterization of SOI Lamé-mode square resonators

504

Characterization of SOI microrings using IR imaging

505

Characterization of SOI MOSFETs by gate capacitance measurements

506

Characterization of SOI wafers by temporal decay measurement of condensate luminescence

507

Characterization of soil moisture using a microstrip resonator

508

Characterization of soil surface roughness from terrestrial laser scanner data

509

Characterization of SOI-MOSFET with the channel conductance transient spectroscopy

510

Characterization of sol - gel in doped ZnO films: Structural and optical properties

511

Characterization of solar cell degradation due to electrostatic discharge on multi-junction solar cell

512

Characterization of solar cells by frequency-domain transient analysis

513

Characterization of solar cells by thermal transient testing

514

Characterization of solar cells contacts deposited by direct writing approach

515

Characterization of solar cells in transportation

516

Characterization of solar cells with high spatial resolution

517

Characterization of solar irradiance profiles for photovoltaic system studies through data rescaling in time and amplitude

518

Characterization of solar panel using capacitive load

519

Characterization of solar-powered non-asbestos diaphragm cells for the production of caustic soda

520

Characterization of solder joint electromigration for flip chip technology

521

Characterization of solderable metallization on power devices for 3-D packaging

522

Characterization of sol-gel derived (Pb,La)TiO₃ pyroelectric thin film detectors

523

Characterization of sol-gel derived PZT and PLZT thin films

524

Characterization of sol-gel Pb(Zr_0.53Ti_0.47)O₃ in thin film bulk acoustic resonators

525

Characterization of solid liquid suspensions utilizing ultrasonic measurements

526

Characterization of solid tin target for gas discharges produced EUV plasmas

527

Characterization of solid UV cross-linked PEGDA for biological applications

528

Characterization of solutions of non-square algebraic Riccati equations

529

Characterization of some concepts of aging

530

Characterization of sonar target data using Gabor wavelet features

531

Characterization of sonicated breath films by atomic force microscopy

532

Characterization of soot aggregates based on polarization modulated scattering

533

Characterization of soot from multimode vapor-phase axial deposition (VAD) optical fiber performs

534

Characterization of SOS-CMOS FETs at Low Temperatures for the Design of Integrated Circuits for Quantum Bit Control and Readout

535

Characterization of source power distributions in multimode fiber by a splice offset technique

536

Characterization of source-to-drain capacitance (C/sub ds/) effect of GaAs PHEMT for millimeter wave switch

537

Characterization of space charges and conduction current in LDPE by modified PEA method

538

Characterization of space-charge properties of a linearly graded p-n junction by an approximate "Regional" analysis method

539

Characterization of space-division multiplexing fibers using swept-wavelength interferometry

540

Characterization of space-division multiplexing systems using a swept-wavelength interferometer

541

Characterization of space-time focusing in time-reversed random fields

542

Characterization of spatial channel model based on ray path analysis in high-rise urban environment

543

Characterization of spatial diversity in cooperative spectrum sensing

544

Characterization of spatial intrafield gate CD variability, its impact on circuit performance, and spatial mask-level correction

545

Characterization of spatial modulational instability of second-order nonlinear eigenmodes in a slab waveguide

546

Characterization of spatial ordering of corneal stroma fibrils

547

Characterization of spatio-temporal parameters of human gait assisted by a robotic walker

548

Characterization of SPEC CPU2006 and SPEC OMP2001: Regression Models and their Transferability

549

Characterization of special fibers and fiber devices

550

Characterization of spectral and spatial distributions of penetration, scatter and lead X-rays in Ga-67 SPECT

551

Characterization of spectral broadening of Doppler signals recorded in the left ventricular outflow tract of patients with a valvular aortic stenosis

552

Characterization of spectral compression of OFDM symbols using optical time lenses

553

Characterization of Spectral Density of wind farm power output

554

Characterization of spectral regrowth in microwave amplifiers based on the nonlinear transformation of a complex Gaussian process

555

Characterization of spectral transitions with applications to acoustic sub-word segmentation and automatic speech recognition

556

Characterization of Spectrum Activities in the U.S. Public Safety Band for Opportunistic Spectrum Access

557

Characterization of speed and stability of BiNMOS gates with a bipolar and PMOSFET merged structure

558

Characterization of sperm whale vocalization energy based on echolocation signals

559

Characterization of spiculation on ultrasound lesions

560

Characterization of Spillover and Recovery Coefficients in the Gated Mouse Heart for Non-Invasive Extraction of Input Function in microPET Studies: Feasibility and Sensitivity Analysis

561

Characterization of spin-orbit torques in Pt/Co/Ta structures

562

Characterization of spiral inductors with patterned floating structures

563

Characterization of spiral microstripline inductors

564

Characterization of Spiral Planar Inductors Built on Printed Circuit Boards

565

Characterization of split gate flash memory endurance degradation mechanism

566

Characterization of split-gate flash memory devices: reliability, gate-disturbance and capacitive coupling coefficients

567

Characterization of spontaneous and stimulated emission from praseodymium (Pr³⁺) ions doped into a silica-based monomode optical fiber

568

Characterization of spontaneous changes in electrogram morphology

569

Characterization of spurious emissions of wireless devices in a reverberation chamber

570

Characterization of spurious-response suppression in double-balanced mixers

571

Characterization of sputter-deposited (Ba,Sr)TiO₃ thin films on the sidewalls of fine-patterned electrodes

572

Characterization of Sputtered Gold-Tungsten and Gold-Molybdenum Metallizations for Microwave Power Transistors

573

Characterization of Sputtered High Dielectric Constant Ba0.5Sr0.5TiO3 Thin Films for DRAM Applications

574

Characterization of Sputtered Ta and TaN Films by Spectroscopic Ellipsometry

575

Characterization of Sputtered-TaN metal gate for SiO₂ and HfO₂ gate dielectrics

576

Characterization of SQUID-Based Null Detector for a Quantum Metrology Triangle Experiment

577

Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS

578

Characterization of SRM drive systems under normal and fault operating conditions

579

Characterization of SrTiO3-based MIM capacitors grown by using different precursors and growth temperatures

580

Characterization of SSN coupling to signal via in multi-layer PCBs and packages

581

Characterization of stability margins of the Foschini-Miljanic power allocation strategy under constant and time-varying delays

582

Characterization of Stability Region for General Autonomous Nonlinear Dynamical Systems

583

Characterization of stability transitions and practical stability of planar singularly perturbed linear switched systems

584

Characterization of Stabilizing Switching Sequences in Switched Systems

585

Characterization of stacked die using die-to-wafer integration for high yield and throughput

586

Characterization of stackless vertically aligned carbon nanotube synthesized by thermal CVD with gravity effect and water-assisted etching

587

Characterization of stainless steel inertia welds using HTS SQUID NDE

588

Characterization of Stand Alone AC Generators during No-Break Power Transfer using AI-EM Based Approach

589

Characterization of Stand Alone AC Generators During No-Break Power Transfer Using Radial Basis Networks

590

Characterization of Standard Cells for Intra-Cell Mismatch Variations

591

Characterization of Standard Cells for Intra-Cell Mismatch Variations

592

Characterization of standard CMOS compatible photodiodes and pixels for Lab-on-Chip devices

593

Characterization of standard controllers satisfying given H_∞ specifications

594

Characterization of standing wave movement by in-line antennas

595

Characterization of state estimation biases

596

Characterization of state-of-the art 15-bit, 10 MHz A/D converter

597

Characterization of static electrification in power transformers

598

Characterization of Static/Dynamic Topological Routing for Grid Networks

599

Characterization of Statical Properties of Rat´s Whisker System

600

Characterization of Static-dissipative Ceramics for ESD and Contamination Control Purposes

601

Characterization of stationary and rotating magnetic fields in an MERIE

602

Characterization of stationary patterns and their link with cavity solitons in semiconductor microresonators

603

Characterization of stationary processes differentiable in mean square (Corresp.)

604

Characterization of statistical multiplexing of heterogeneous ATM sources

605

Characterization of steady and transient heating of interconnects - a review

606

Characterization of Steady-State Current Ripple in Interleaved Power Converters Under Inductance Mismatches

607

Characterization of stencil printing parameters for fine pitch wafer bumping

608

Characterization of STI Edge Effects on CMOS Variability

609

Characterization of Stiction Accrual in a MEMS

610

Characterization of stiction forces in ultra-clean encapsulated MEMS devices

611

Characterization of Stimulated Brillouin Scattering in Polymer Optical Fibers Based on Lock-in-Free Pump–Probe Technique

612

Characterization of storage workload traces from production Windows Servers

613

Characterization of strain fields in graphene films

614

Characterization of Strained Silicon MOSFET Using Semiconductor TCAD Tools

615

Characterization of Stratospheric Clear Air Turbulence for Air Force Platforms

616

Characterization of streamers in liquid nitrogen under AC voltages using UHF techniques

617

Characterization of streamers in water in a coaxial reactor

618

Characterization of stress distribution in ultra-thinned DRAM wafer

619

Characterization of stress in amorphous silicon nitride and implications to c-Si surface passivation

620

Characterization of Stress in Thallium Bromide Devices

621

Characterization of Stress in TlBr devices

622

Characterization of stress induced defects in deep sub-micron MOSFETS

623

Characterization of stress-controlled a-IGZO thin films and their applications to thin-film transistor and micro-electromechanical system processes

624

Characterization of stress-voiding of Cu / Low-k vias attached to narrow lines

625

Characterization of strip induced damage in ultra low-k dielectric

626

Characterization of Strip Line Crossing by Transverse Resonance Analysis

627

Characterization of strip-fed cavity-backed slots

628

Characterization of stripline circuit by planar circuit/equivalent network and demonstration of its validity by 1D, 2D and 3D analysis for practical structures

629

Characterization of Stripline Crossing by Transverse Resonance Analysis

630

Characterization of strong structural controllability of uncertain linear time-varying discrete-time systems

631

Characterization of Strongly Coupled Si-Wire Waveguides for High-Density Optical WDM and Sensing Applications

632

Characterization of strongly spun fibers with spin rate exceeding OFDR spatial resolution

633

Characterization of strontium barium niobate single crystals grown by the vertical Bridgman method

634

Characterization of structural controllability

635

Characterization of structural effects in ferroelectric tunable capacitors using barium strontium titanate thin films

636

Characterization of structural features for small regulatory RNAs in Escherichia coli genomes

637

Characterization of structural irregularities in highly birefringent photonic crystal fiber based on polarization coupling by torsional acoustic wave

638

Characterization of structure and growth evolution for nc-Si:H in the tandem photovoltaic device configuration

639

Characterization of Structure and Growth Evolution for nc-Si:H in the Tandem Photovoltaic Device Configuration

640

Characterization of structured and unstructured decentralized fixed modes using transfer matrices

641

Characterization of structures maskless-etched by low-energy FIB

642

Characterization of SU-8 using terahertz time-domain spectroscopy

643

Characterization of sub-10-fs pulses using spatially encoded arrangement for SPIDER

644

Characterization of subcortical structures during deep brain stimulation utilizing support vector machines

645

Characterization of Submicrometer Buried-Channel and Surface-Channel PMOSFETS

646

Characterization of submicrometer thickness of copper film on silicon wafer by using pulsed eddy current method

647

Characterization of sub-micron MOS transistors, modified using a focused ion beam system

648

Characterization of submicron-period periodically-segmented ion-exchanged KTiOPO/sub 4/ waveguides based on backward second-harmonic generation

649

Characterization of submillimeter-wave Schottky diodes in the 500–750 GHz band using micromachined on-wafer probes

650

Characterization of sub-mm-wave dielectric waveguide directional coupler using the FDTD method

651

Characterization of subnanosecond heavy-ion bunches at the TASCC superconducting cyclotron

652

Characterization of sub-nm AlOx and LaOx capping layers on high-k gate stack film systems using VuV (λ=120 nm) reflectivity

653

Characterization of Subpicosecond Pulses Based on Temporal Interferometry With Real-Time Tracking of Higher Order Dispersion and Optical Time Delay

654

Characterization of substrate anisotropy using substrate integrated waveguide technology

655

Characterization of substrate material using complementary split ring resonators at terahertz frequencies

656

Characterization of substrate noise coupling in high speed CMOS current-steering D/A converter

657

Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates

658

Characterization of Subsurface Anomalies by Elastic Surface Wave Dispersion

659

Characterization of Sub-THz Photonic-Transmitters Based on GaAs–AlGaAs Uni-Traveling-Carrier Photodiodes and Substrate-Removed Broadband Antennas for Impulse-Radio Communication

660

Characterization of sub-two-cycle pulses from a hollow-core fiber compressor in the spatiotemporal and spatio-spectral domains

661

Characterization of suburban areas for land use planning using landscape ecological indicators derived from IKONOS-2 multispectral imagery

662

Characterization of subwavelength grating waveguides with 3D finite element method

663

Characterization of sulfate and phosphate containing plasma polymer surfaces

664

Characterization of sulfurized CuSbS2 thin films for PV applications

665

Characterization of superconducting bearings for lunar telescopes

666

Characterization of superconducting FeSe0.5Te0.5 hot electron bolometer

667

Characterization of superconducting rings using an in-field Hall probe magnetic mapping system

668

Characterization of superconducting wires by cone-beam micro-tomography

669

Characterization of superconductors with artificial pinning microstructures

670

Characterization of super-harmonic effect using piezoelectric film cantilever with a proof mass in the point

671

Characterization of superhydrophobic materials using multiresonance acoustic shear wave sensors

672

Characterization of super-resolution photolithography

673

Characterization of Supply and Substrate Noises in CMOS Digital Circuits

674

Characterization of SURF and BRISK Interest Point Distribution for Distributed Feature Extraction in Visual Sensor Networks

675

Characterization of SURF interest point distribution for visual processing in sensor networks

676

Characterization of surface acoustic wave focusing by an annular interdigital transducer

677

Characterization of surface acoustic wave optomechanical oscillators

678

Characterization of surface acoustic wave propagation in a ZnO layer on a conducting substrate

679

Characterization of surface acoustic wave propagation in multi-layered structures using extended FEM/SDA software

680

Characterization of surface and buried channel ion sensitive field effect transistors (ISFET´s)

681

Characterization of surface- and buried-channel detection transistors for CCD on-chip amplifiers

682

Characterization of surface barrier effects from Cu-implanted SiO ₂/Si interfaces

683

Characterization of surface channel CCD image arrays at low light levels

684

Characterization of surface dead layer in VCF/TrFE nano films by means of broadband dielectric spectroscopy

685

Characterization of surface defects in niobium microwave cavities

686

Characterization of surface discharge as indicator for hydrophobicity evaluation of silicone rubber insulators

687

Characterization of Surface EMG Signal Based on Fuzzy Entropy

688

Characterization of surface EMG with cumulative residual entropy

689

Characterization of Surface Finishing Effect on Filtration Performance of a Regenerable Filter Media by a Simplified Model

690

Characterization of surface heat convection of bilayer graphene

691

Characterization of surface micromachined hollow metallic microneedles

692

Characterization of surface micromachined metallic microneedles

693

Characterization of surface mobility in MOS structures containing interfacial cesium ions

694

Characterization of surface mobility on the sidewalls of dry-etched trenches

695

Characterization of Surface Mount Components at Microwave Frequencies using Wafer Probes

696

Characterization of surface mount packages at microwave frequencies using wafer probes

697

Characterization of surface plasmon polariton pulse propagation on thin metallic films and two dimensional nanohole arrays

698

Characterization of surface potential and capacitance on CdS/Cu(In,Ga)Se2 multi-layers by KFM and EFM

699

Characterization of surface profile for surface activated bonding by using Power Spectral Density function

700

Characterization of surface recombination velocity of InP reduced by sulfur-treatment and a phosphorous-nitride film formation with Raman spectroscopy

701

Characterization of Surface-Breaking Cracks Using One Tangential Component of Magnetic Leakage Field Measurements

702

Characterization of surface-measured potentials from implanted cochlear protheses

703

Characterization of surface-undoped In_0.52Al_0.48As/In_0.53Ga_0.47As/InP high electron mobility transistors

704

Characterization of Surface-Wave and Leaky-Wave Propagation on Wire-Medium Slabs and Mushroom Structures Based on Local and Nonlocal Homogenization Models

705

Characterization of surrogate parameters for blood pressure regulation in neurally-mediated syncope

706

Characterization of swaged mixed metal heat sinks

707

Characterization of SWCNT-based TSV

708

Characterization of Swelling of A Polymeric Coating for DNA Microarray Applications Using Spectral Self-Interference Fluorescence Microscopy

709

Characterization of switched mode LDMOS and GaN power amplifiers for optimal use in polar transmitter architectures

710

Characterization of switched reluctance machines using Fourier series approach

711

Characterization of switching parameters and multilevel capability in HfOx/AlOx bi-layer RRAM devices

712

Characterization of switching sequences on system with dwell-time restriction for Model Predictive Control

713

Characterization of switching windows of an 160-Gb/s all-optical demultiplexer with data base rates of 10 and 40 Gb/s

714

Characterization of symmetric scattering using polarimetric SARs

715

Characterization of symmetrical electrode system to estimate the degree of uniformity under symmetrically and asymmetrically applied high voltage

716

Characterization of syngas and bio-char: Co-products from pyrolysis of waste fish fats

717

Characterization of Synonymous Codon Usage Bias in the UL19 Gene of Duck Plague Virus (DPV)

718

Characterization of syringe-pump-driven versus pressure-driven microfluidic flows

719

Characterization of System Services and Their Performance Impact in Multi-core Nodes

720

Characterization of Systematic and Random Diode Mismatches in Antiparallel-Diode Mixers

721

Characterization of systematic MOSFET current factor mismatch caused by metal CMP dummy structures

722

Characterization of systems-level organization through mining large-scale genetic interaction networks

723

Characterization of Ta₂O₅-MgF₂ composite thin films

724

Characterization of tactile display for stiffness distribution using Magneto-rheological fluid

725

Characterization of talker radiation pattern using a microphone array

726

Characterization of tantalum oxide-ruthenium oxide hybrid capacitors

727

Characterization of tantalum-silicon films on GaAs at elevated temperatures

728

Characterization of tapered slot antenna feeds and feed arrays

729

Characterization of tapered-erbium doped fiber in co-propagating amplifier

730

Characterization of tapered-slot antenna designs for subsurface radar applications

731

Characterization of Target effect of Nano-hydrogel by Near-infrared Fluorescent Quantum Dots

732

Characterization of target symmetric scattering using polarimetric SARs

733

Characterization of target-pylon interactions in RCS measurements

734

Characterization of task performance based on maximum a posteriori reconstructions

735

Characterization of TCC on chip-multiprocessors

736

Characterization of TCO deposition for CIGS solar cells

737

Characterization of teleportation in optics

738

Characterization of TEM cell discontinuities due to filtered DUT test harnesses

739

Characterization of temperature and strain sensitivity of low cost few-mode fiber based interferometer sensor

740

Characterization of temperature effects on single-photon avalanche diodes fabricated in a HV-CMOS conventional technology

741

Characterization of temperature profile in solid waste decomposition to demonstrate potential for harnessing thermal energy

742

Characterization of temperature sensor using VT extractor circuit

743

Characterization of temperature-dependent biophysical properties during laser mediated cartilage reshaping

744

Characterization of temporal fading for a traffic monitoring system

745

Characterization of temporal fading in urban fixed wireless links

746

Characterization of temporal patterns of transient ischemic ST change episodes during ambulatory ECG monitoring

747

Characterization of temporal sequences in geophysical databases

748

Characterization of temporary short circuit in induction motor winding using wavelet analysis

749

Characterization of Terahertz Beam Profile and Propagation

750

Characterization of terahertz detectors based on niobium nitride superconducting tunnel junctions

751

Characterization of terahertz four-wave mixing in a semiconductor laser amplifier

752

Characterization of terahertz generation based on the different structures of lithium tantalate crystals

753

Characterization of terahertz planar antenna by Josephson admittance spectroscopy

754

Characterization of terahertz wave transmission through complementary metamaterials with split ring resonator arrays

755

Characterization of Terra and Aqua MODIS VIS, NIR, and SWIR Spectral Bands´ Calibration Stability

756

Characterization of terrain background in LWIR hyperspectral data to aid landmine detection

757

Characterization of Terrestrial Features Using Space-Shuttle-Based Polarimetry

758

Characterization of test devices for development of nanowire sensor FETs

759

Characterization of textile substrate to design a textile antenna

760

Characterization of Texture Features Between Carcinomatous and Normal Wall Tissue in MR Bladder Imaging

761

Characterization of texture in hexagonal materials using a line focus acoustic microscope

762

Characterization of texture in image of skin lesions by support vector machine

763

Characterization of texture in two-phase (cubic-hexagonal) materials using a line focus acoustic microscope

764

Characterization of tfLIFE Neural Response for the Control of a Cybernetic Hand

765

Characterization of TFT/LCD arrays

766

Characterization of thallium bromide chloride crystals for radiation detectors

767

Characterization of thallium bromide crystals purified by the filter method

768

Characterization of Thallium Bromide Detectors Made From Material Purified by the Filter Method

769

Characterization of the 2.4 GHz ISM band electromagnetic interference in a hospital environment

770

Characterization of the 2^nd generation magnetic microbearing with integrated stabilization for frictionless devices

771

Characterization of the 20-T immersed diode on RITS-3

772

Characterization of the 4Mb chalcogenide-random access memory

773

Characterization of the 5 GHz wireless channel for small airport surface areas

774

Characterization of the 5-GHz Elevator Shaft Channel

775

Characterization of the 60 GHz channel in underground mining environment

776

Characterization of the 60 GHz Wireless Desktop Channel

777

Characterization of the A/D conversion section in Software Defined Radios

778

Characterization of the A15 Layer Growth and Microstructure for Varying Heat Treatments in ${\\rm Nb}_{3}{\\rm Sn}$ Tube Type Composites

779

Characterization of the absorbing material used in EMC experiments

780

Characterization of the Accommodation Effect in Soft Hysteretic Materials Via Sensorless Measurement Technique

781

Characterization of the ACE 4 catcher´s mitt POS-load configuration

782

Characterization of the acoustic output of commercial extra-corporeal shock wave lithotripters for kidney stones

783

Characterization of the acoustic signature of a small remotely operated vehicle for detection

784

Characterization of the adhesion between nanoparticles and polymer matrix by atomic force microscopy

785

Characterization of the adverse effect of neighborhood capture in MANET and on the way to a remedy

786

Characterization Of The AlGaAs/GaAs Tunneling Emitter Bipolar Transistor

787

Characterization of the allowable perturbations for disturbance rejection and data sensitivity

788

Characterization of the aluminum-tantalum oxide-silicon dioxide-silicon charge storage (MTOS) device

789

Characterization of the ambient temperature optics of the submillimeter limb-sounder SMILES

790

Characterization of the analytical boundary of the workspace for 3-6 SPS parallel manipulator

791

Characterization of the Angle, Delay and Polarization of Multipath Signals for Indoor Environments

792

Characterization of the ANITA Neutron Source for Accelerated SEE Testing at the Svedberg Laboratory

793

Characterization of the ANITA neutron source for accelerated SEE testing at The Svedberg laboratory

794

Characterization of the annealing behavior for copper-filled TSVs

795

Characterization of the aquarius and juno radiometers using a programmable digital noise source

796

Characterization of the array modes of high-power gain-guided GaAs single-quantum-well laser arrays

797

Characterization of the Arterial System in the Time Domain

798

Characterization of the Attenuation due to Rain Cell Fields applying Cellular Automata to Weather Radar Images

799

Characterization of the AURORA FXR Photon Radiation Field for SREMP Studies

800

Characterization of the autonomic system during the cyclic alternating pattern of sleep

801

Characterization of the axiomatizable prenex fragments of first-order godel logics

802

Characterization of the Back Channel Interface in SOI MOSFET´s

803

Characterization of the Back Interface in Strained-Silicon-on-Insulator Channel and Enhancement of Electrical Properties by Heat Treatment

804

Characterization of the bandwidth performance of distributed junction arrays

805

Characterization of the Basic Operationa L Properties of the Capillary Plasma Electrode (CPE) Discharge

806

Characterization of the Bayes estimator and the MDL estimator for exponential families

807

Characterization of the Bayes estimator and the MDL estimator for exponential families

808

Characterization of the Beam-Spread Function for Underwater Wireless Optical Communications Links

809

Characterization of the behavior of outer functions with applications to spectral factorization and system design

810

Characterization of the behaviour of dissociated neurons exposed to dielectrophoretic forces

811

Characterization of the bending creep behavior for electroplating nickel microbeam

812

Characterization of the Binary Micro-Grating Surface by Scanning White Light Interferometry

813

Characterization of the Birefringence in Fiber Bragg Gratings Fabricated With an Ultrafast-Infrared Laser

814

Characterization of the bistable ring PUF

815

Characterization of the bistatic scattered distribution

816

Characterization of the Body Node in PD SOI MOSFETs Using Multiport VNA Measurements

817

Characterization of the Body-Area Propagation Channel for Monitoring a Subject Sleeping

818

Characterization of the body-centric propagation channel at 60 GHz in the presence of textiles

819

Characterization of the branch-line and rat-race ideal hybrids through their merit parameters

820

Characterization of the breast region for computer assisted Tabar masking of paired mammographic images

821

Characterization of the broadband transmission behavior of interconnections on silicon substrates

822

Characterization of the broadband transmission behavior of interconnections on silicon substrates

823

Characterization of the brushless, doubly-fed machine by magnetic field analysis

824

Characterization of the buffers in real Internet paths

825

Characterization of the bulk current injection calibration-jig for probe-model extraction

826

Characterization of the burst stabilization protocol for the RR/RR CICQ switch

827

Characterization of the cardiac response to Vagal Nerve Stimulation

828

Characterization of the cardiovascular autonomic influence through time frequency spectrum analysis

829

Characterization of the Cathode Spot

830

Characterization of the causal interactions between depolarization and repolarization temporal changes in unipolar electrograms

831

Characterization of the C-Band wideband satellite-to-indoor channel for navigation services

832

Characterization of the cell flow using burst scale probability algorithm

833

Characterization of the cell leakage of a stacked trench capacitor (STT) cell

834

Characterization of the cellular biomechanlcal responses caused on microprocessed substrates: effect of micropatterned cell adhesiveness and microelasticity gradient

835

Characterization of the central sulcus in the brain in early childhood

836

Characterization of the Channel-Shortening Effect on P-Type Poly-Si TFTs

837

Characterization of the chaos generated by semiconductor lasers subject to electro-optical and all-optical feedback

838

Characterization of the Chaotic Magnetic Particle Dynamics

839

Characterization of the Chaotic or Regular Nature of Dynamical Orbits: A New, Fast Method

840

Characterization of the charge transport uniformity of CdZnTe crystals for large-volume nuclear detector applications

841

Characterization of the chirp and intensity modulation properties of an SOA-MZI wavelength converter

842

Characterization of the chirp of silicon optical modulators

843

Characterization of the chirp properties of a monolithically-integrated widely-tunable all-optical wavelength converter (TAO-WC)

844

Characterization of the chronobiological signals based on the continuous wavelet transform

845

Characterization of the cinematic by the means of dynamical models

846

Characterization of the Clear-PEM breast imaging scanner performance

847

Characterization of the coil displacement in the LNE and metas watt balance experiments

848

Characterization of the colorectal cancer in a rabbit model using quantitative high-frequency endoscopic ultrasound

849

Characterization of the commercial textile electromagnetic shields based on free-space broadband measurements

850

Characterization of the Communication Patterns of Scientific Applications on Blue Gene/P

851

Characterization of the compact Hokuyo URG-04LX 2D laser range scanner

852

Characterization of the Complex Noise Transfer Function of a Modelocked Ti: sapphire Laser

853

Characterization of the complex noise transfer function of a modelocked Ti: Sapphire laser

854

Characterization of the complex permittivity of brain tissues up to 50 GHz utilizing a two-port microstrip test fixture

855

Characterization of the complex permittivity of thin films using a slow-wave coplanar strips resonator

856

Characterization of the complex ultrashort laser pulses by Dammann SHG FROG

857

Characterization of the conditional distribution of monopulse ratio for chi-square fluctuating targets and its exploitation for track initiation

858

Characterization of the conduction mechanisms in polycrystalline alumina

859

Characterization of the confidentiality of a green time reversal communication system: Experimental measurement of the spy BER sink

860

Characterization of the consistency of healthcare components using LDA

861

Characterization of the constrained capacity of multiple-antenna fading coherent channels driven by arbitrary inputs

862

Characterization of the contact between TiO/sub 2/ and PbS quantum dots

863

Characterization of the Coplanar Waveguide Step Discontinuity using the Transverse Resonance Method

864

Characterization of the Coronary Vascular Capacitance, Resistance, and Flow in Endocardium and Epicardium Based on a Nonlinear Dynamic Analog Model

865

Characterization of the correlation, SPM, ICA and specified-resolution wavelet methods in analysis of fMRI study with visual task

866

Characterization of the coverage uniformity of an antenna based on its far-field

867

Characterization of the creep constitutive behavior of SnAgCu solder in flip chip joints from the indentation creep testing

868

Characterization of the Critical Current Capabilities of Commercial REBCO Coated Conductors for an HTS Cable-in-Conduit Conductor

869

Characterization of the critical cycle length of a left atrial driver which causes right atrial fibrillatory conduction

870

Characterization of the Critical Density for Percolation in Random Geometric Graphs

871

Characterization of the Critical Sets of Quantum Unitary Control Landscapes

872

Characterization of the cross-talk SAR image produced by the cross-polarization in a single offset parabolic reflector

873

Characterization of the Cu/barrier metal interface for copper interconnects

874

Characterization of the cumulative effects of ultrawideband technology on the electromagnetic environment

875

Characterization of the curing properties of no-flow underfill and B-stage feasibility study for wafer level application

876

Characterization of the cyclic short-time variation of indoor power-line channels response

877

Characterization of the cytotoxic effect of high-intensity, 10-ns duration electrical pulses

878

Characterization of the data access behavior for TPC-C traces

879

Characterization of the default mode functional connectivity in normal aging and Alzheimer´s disease: An approach combining entropy-based and graph theoretical measurements

880

Characterization of the defect structure in acceptor- and donor-doped PZT ceramics

881

Characterization of the defects in oxide dispersion-strengthened iron alloy after helium ion irradiation

882

Characterization of the densification induced by electron-beam irradiation of ge-doped silica for the fabrication of integrated optical circuits

883

Characterization of the departure process of M/G/1 queue with heavy-tailed service time distribution

884

Characterization of the Depth Distribution and Electrical Activation and Deactivation of Ion Implanted Dopants in Silicon

885

Characterization of the DFB fiber laser resonator strength and α-parameter by response to external feedback

886

Characterization of the Dielectric and Pyroelectric Properties of Ferroelectric Material

887

Characterization of the dielectric endurance of reinforced recycled PET using electro-thermal aging test

888

Characterization of the dielectric properties of multiwalled carbon nanotubes (MWCNTs) /PEDOT:PSS nanocomposites

889

Characterization of the diffraction behavior of femtosecond pulses by hard-edge circular apertures via STARFISH technique

890

Characterization of the Digital Micromirror Devices

891

Characterization of the diode leakage current in advanced 0.12 /spl mu/m CMOS technology. (Does stress play a role?)

892

Characterization of the directional mobile radio channel in industrial scenarios, based on wideband propagation measurements

893

Characterization of the dispersion of a Rotman lens

894

Characterization of the Displacement Tolerance of QCA Interconnects

895

Characterization of the distortion of OFDM/OQAM modulations under frequency selective channels

896

Characterization of the distributed cavity phase shift in FO2 for improving the accuracy of SYRTE fountain clocks

897

Characterization of the distributed cavity phase shift in LNE-SYRTE FO2 fountain

898

Characterization of the Dose Effect in Secondary Electron Emission

899

Characterization of the downstream plasma in a microsecond conduction time POS

900

Characterization of the Dual-Active Bridge topology for high-power applications employing a duty-cycle modulation

901

Characterization of the Dynamic Absorption of Electroabsorption Modulators With Application to OTDM Demultiplexing

902

Characterization of the Dynamic Narrowband On-Body to Off-Body Area Channel

903

Characterization of the Dynamic Properties of Pneumatic Muscle Actuators

904

Characterization of the dynamic range of a single aperture communications system

905

Characterization of the Dynamical Processes in All-Optical Signal Processing Using Semiconductor Optical Amplifiers

906

Characterization of the dynamical response of receivers to fading

907

Characterization of the dynamics and interactions of domain names and name server

908

Characterization of the dynamics of semiconductor lasers using optical modulation

909

Characterization of the ear-to-ear propagation channel using microstrip dipole antennas

910

Characterization of the E-commerce Storage Subsystem Workload

911

Characterization of the economic impact of stranded bandwidth in fixed OADM relative to ROADM networks

912

Characterization of the EDGES receiver and its capability for constraining the EoR

913

Characterization of the effect of small perturbations on the optical modes in high Q microdisk cavities

914

Characterization of the effect of small perturbations on the optical modes in high Q microdisk cavities

915

Characterization of the effect of TiN oxidation on via resistance

916

Characterization of the effectiveness of carbon incorporation in SiGe for the elimination of parasitic energy barriers in SiGe HBTs

917

Characterization of the Effects of CW and Pulse CW Interference on the GPS Signal Quality

918

Characterization of the effects of the human head on communication with implanted antennas

919

Characterization of the elastic properties of metrological quartz crystal resonators using acoustic force microscopy

920

Characterization of the electrical performance of PGA Packages

921

Characterization of the electrical resistance of carbon-black-filled silicone: Application to a flexible and stretchable robot skin

922

Characterization of the electrically excited flexion withdrawal response used in restoration of locomotion in spinal cord injured paraplegics

923

Characterization of the electro-absorption modulator chirp using modulated-transmission spectroscopy

924

Characterization of the Electrochemical Behavior of Gastrointestinal Fluids Using a Multielectrode Sensor Probe

925

Characterization of the electrode erosion by spectrum analysis at low pressure gas-discharge lamps

926

Characterization of the electrode-skin impedance of textile electrodes

927

Characterization Of The Electroencephalogram As A Chaotic Time Serms

928

Characterization of the electromagnetic disturbances in the customer premises

929

Characterization of the electromagnetic environment in a hospital

930

Characterization of the electromagnetic environment in a hospital and propagation study

931

Characterization of the electromagnetic environment in aircraft cavities excited by internal and external sources

932

Characterization of the electromagnetic environment with the installation of industrial rectifiers

933

Characterization of the electromagnetic response of maize crops with polarimetric backscatter profiles

934

Characterization of the electro-mechanical behavior of zirconia-rich PZT ceramics

935

Characterization of the electron mobility in the inverted <100> Si surface

936

Characterization of the electronic mobility dependence on frequency and bias in AsGa devices

937

Characterization of the electrostatic discharge induced interface traps in metal-oxide-semiconductor field-effect transistors

938

Characterization of the electrostriction-induced acoustic response in optical fibers and its consequences for soliton transmission systems

939

Characterization of the eLine ASICs in prototype detector systems for LCLS

940

Characterization of the EM environment of railway spot communication systems

941

Characterization of the EMC Performances of the CAN Bus in a Typical System Bus Architecture for Small Satellites

942

Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]

943

Characterization of the EMP response of cable and shelter network

944

Characterization of the energy radiation pattern of a transient antenna array: Eigen-analysis and bounds

945

Characterization of the energy spectral density for a potash mine

946

Characterization of the ePix10k camera at SSRL and LCLS

947

Characterization of the error resiliency of power grid substation devices

948

Characterization of the Evolution of IC Emissions After Accelerated Aging

949

Characterization of the Excess Noise Conversion From Optical Relative Intensity Noise in the Photodetection of Mode-Locked Lasers for Microwave Signal Synthesis

950

Characterization of the expansion of an aluminum laser-induced plasma in ambient air by fast photography

951

Characterization of the exposure induced by a wireless network

952

Characterization of the extremely low frequency (ELF) electric field interactions with living tissue

953

Characterization of the Far-Field Environment of Antennas Located Over a Ground Plane and Implications for Cellular Communication Systems

954

Characterization of the fast wave in cancellous bone using the Bayesian probability theory approach

955

Characterization of the fat content of beef using microwave techniques

956

Characterization of the fatigue properties of bonding wires

957

Characterization of the faulted behavior of digital computers and fault tolerant systems

958

Characterization of the Field-Dependent Permittivity of Nonlinear Ferroelectric Films Using Tunable Coplanar Lines

959

Characterization of the Finline Step Discontinuity on Anisotropic Substrates

960

Characterization of the First FBK High-Density Cell Silicon Photomultiplier Technology

961

Characterization of the First Prototypes of Silicon Photomultiplier Fabricated at ITC-irst

962

Characterization of the flexion-withdrawal reflex for use in stimulation-assisted SCI gait

963

Characterization of the Flip Capacitor Filter for the XFEL-DSSC Project

964

Characterization of the floating phenomena for flip chip processing with no flow underfills

965

Characterization of the Flow Field inside a Rotating, Rib-Roughened, U-Shaped Channel using Particle Image Velocimetry

966

Characterization of the fluorescent lifetime of doped fibers by measuring the frequency transfer function

967

Characterization of the fourier spatial frequencies of time resolved laser speckle from interacting high density lipoprotein disks

968

Characterization of the Freesound online community

969

Characterization of the frequency dispersion of transconductance and drain conductance of GaAs MESFET

970

Characterization of the frequency pulling by magnetic field oscillations of the Brazilian ¹³³Cs atomic-frequency standard

971

Characterization of the frequency response of electrodes in arc furnaces for silicon production

972

Characterization of the frequency stability of frequency-hopping sources

973

Characterization of the fringing window of a magnetic core

974

Characterization of the fundamental polarization modes of a silicon waveguide in the far field

975

Characterization of the Gate SiO2 /Channel-Si Interface in Thin-gate SiO2 MOSFETs by Low Frequency Noise and Charge Pumping Techniques

976

Characterization of the GLDT laser range finder

977

Characterization of the gliding arc device for industry applications

978

Characterization of the GPRS radio interface by means of a statistical model

979

Characterization of the ground impedance of rural MV lines on Hydro-Quebec´s system

980

Characterization of the Growth of Water Trees

981

Characterization of the growths of UV-induced birefringence in effective mode index and index modulation in fiber Bragg gratings

982

Characterization of the H3D ASIC Readout System and 6.0 cm $^{3}$ 3-D Position Sensitive CdZnTe Detectors

983

Characterization of the handover dwell time in mobile cellular networks

984

Characterization of the Haptic Shape-Weight Illusion with 3D Objects

985

Characterization of the HDP-CVD oxide as interlayer dielectric material for sub-quarter micron CMOS

986

Characterization Of The Head-Disc Interface For Proximity Recording

987

Characterization of the head-disk interface at nanometer dimensions

988

Characterization of the head-disk interface for proximity recording

989

Characterization of the heart muscle aniosotropy using ultrasound Nakagami imaging

990

Characterization of the heat loading of Nd-doped YAG, YOS, YLF, and GGG excited at diode pumping wavelengths

991

Characterization of the Hermite indices of the pair (A+BF, B)

992

Characterization of the HEVC Coding Efficiency Advance Using 20 Scenes, ITU-T Rec. P.913 Compliant Subjective Methods, VQM, and PSNR

993

Characterization of the High Frequency Performance of 28-nm UTBB FDSOI MOSFETs as a Function of Backgate Bias

994

Characterization of the High-Efficiency Neutron Detector Array (HENDA)

995

Characterization of the Hokuyo UBG-04LX-F01 2D laser rangefinder

996

Characterization of the Hot Carrier Related MOS Parameters Using Negative Feedback Circuits in VLSI CMOS

997

Characterization of the hot-cutting defects produced by the processing of alumina green tape

998

Characterization of the Hourly Load Curve in the Colombian Electricity Market

999

Characterization of the human cortex in MR images through the image foresting transform

1000

Characterization of the Hurwitz Region for Systems with Parametric Uncertainty

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