بر اساس عنوان

1
Characterization of protein secondary structure
2
Characterization of proteolytically digested Zebrafish chorion as extracellular matrix
3
Characterization of proton damage in light-emitting diodes
4
Characterization of proton interactions in electronic components
5
Characterization of protons and deuterons from intense 35 fs laser heated water droplet plasma
6
Characterization of protons and deuterons from intense 35 fs laser heated water droplet plasma
7
Characterization of prototype BTeV silicon pixel sensors before and after irradiation
8
Characterization of prototype BTeV silicon pixel sensors before and after irradiation
9
Characterization Of Proximity Correction In 0.1 /spl mu/m Regime X-Ray Lithography
10
Characterization of pseudomorphic InGaAs/AlGaAs MODFET structures grown by molecular beam epitaxy
11
Characterization of PTC resistor pastes applied in LTCC technology.
12
Characterization of pteris vittata rhizosphere during treatment of arsenite in hydroponics
13
Characterization of Pt-Ru binary alloy thin films for work function tuning
14
Characterization of P-Type Cr:TiO2 Gas Sensor
15
Characterization of p-type PbEuTe/PbTe MQW structures with high thermoelectric figures of merit in the PbTe quantum wells
16
Characterization of public datasets for Recommender Systems
17
Characterization of pulsating partial discharges in SF6-N2 mixture
18
Characterization of pulse distortion and dispersion of spiral antennas
19
Characterization of pulse induced plasma fueled by aluminum metallization
20
Characterization of pulse radiation by CRLH leaky-wave antennas using a time-domain Green’s function approach
21
Characterization of pulse timing jitter of actively stabilised 1-GHz vertical-external-cavity surface-emitting semiconductor laser producing 500-fs pulses
22
Characterization of pulsed laser generated plasma through its perturbation in an electric field
23
Characterization of pulsed Nd:YAG active/passive mode-locked laser
24
Characterization of pulsed-laser deposited Pb(Zr,Ti)O3 for piezoelectric thin films devices
25
Characterization of Pulsed-Laser-Deposited Aln Films as a Gate Dielectric in Aln-Si Mis Structures
26
Characterization of pulse-modulated inductively coupled discharges in argon and chlorine
27
Characterization of pump-induced refractive index changes observed in Nd3+ and Yb3+ doped laser materials
28
Characterization of Pure Germanium for Detector Fabrication
29
Characterization of PV cell-environmental factors consideration
30
Characterization of PV cells with varying weather parameters to achieve maximum power
31
Characterization of PVA cryogel for intravascular ultrasound elasticity imaging
32
Characterization of PVD aluminum nitride for heat spreading in RF IC's
33
Characterization of PVK-based photorefractive polymers by photo-EMF technique in reflectance configuration
34
Characterization of PZN single crystals [ferroelectric properties and fracture behavior]
35
Characterization of PZT and PNZT thin films for monolithic microwave integrated circuit applications
36
Characterization of PZT composite thick films fabricated using a modified Sol-Gel based process
37
Characterization of PZT ferroelectric thin films prepared by a modified sol-gel method
38
Characterization of PZT ferroelectric thin films prepared by a modified sol-gel mothed
39
Characterization of PZT hollow-sphere transducers
40
Characterization of PZT multi-layer actuator
41
Characterization of PZT thin film transducers obtained by pulsed laser deposition
42
Characterization of PZT Thin Films by Sol-Gel Method in Application of Resonant Sensor
43
Characterization of PZT-5A dual thickness mode resonators
44
Characterization of QCM odor sensors coated with LB films
45
Characterization of QRS Complex in ECG Signals Applying Wavelet Transform
46
Characterization of QT interval adaptation to RR interval changes and its use as a risk-stratifier of arrhythmic mortality in amiodarone-treated survivors of acute myocardial infarction
47
Characterization of Quanta Image Sensor Pump-Gate Jots With Deep Sub-Electron Read Noise
48
Characterization of quantization energy fluctuations in single quantum wires by femtosecond near-field optics
49
Characterization of quantum dot enhanced solar cells for concentrator photovoltaics
50
Characterization of Quantum-Cascade Lasers Using Single-Pass Transmission Spectroscopy
51
Characterization of quantum-well and super-lattice lasers
52
Characterization of quarter wavelength line as measurement standard for scattering parameter in the frequency range of W-band and D-band
53
Characterization of quartz crystal resonators on phase modulation noise without an oscillator
54
Characterization of Quartz Crystals by Cathodoluminescence
55
Characterization of quasi-breakdown in ultra-thin gate oxides in an automated test environment
56
Characterization of quasi-monocycle NIR pulses with stabilized carrier-envelop phase by XFROG
57
Characterization of Quasi-Monoenergetic Electron Beams at the Lund Laser Centre
58
Characterization of quasi-optical filters with picosecond transient radiation
59
Characterization of quasi-optical focusing systems at W-band frequencies
60
Characterization of Quasi-Stationarity Regions for Vehicle-to-Vehicle Radio Channels
61
Characterization of quaternary extremal codes of lengths 18 and 20
62
Characterization of radar absorber based on square patch textured surface
63
Characterization of Radar Backscatter Response of Sand-Covered Surfaces at Millimeter-Wave Frequencies
64
Characterization of radar clutter by gamma induced distributions
65
Characterization of Radar Target Using Multiple Ultra Wideband Transient Responses
66
Characterization of radar targets based on ultra wideband polarimetric transient signatures
67
Characterization of radar targets in resonance domain with a reduced number of natural poles
68
Characterization of radar-absorbing material using time-domain techniques
69
Characterization of radial magnetic forces in low-speed permanent magnet wind generator with non-overlapping concentrated windings
70
Characterization of radiated EMI generated by digital wireless speaker
71
Characterization of radiation boundary conditions used in the finite-difference time-domain method
72
Characterization of radiation damage and thermal annealing effects on thallium bromide nuclear radiation detectors
73
Characterization of Radiation Damage in Carbon Nanotube Field-Effect Transistors
74
Characterization of radiation damage in multi-junction solar cells using light-biased current measurement
75
Characterization Of Radiation Detector Using The PBI2crystal By Response Properties Of α-rays
76
Characterization of radiation effects on trench-isolated bipolar analog microcircuit technology
77
Characterization of radiation effects on trench-isolated bipolar analog microcircuit technology
78
Characterization of Radiation Hardened Bipolar Linear Devices for High Total Dose Missions
79
Characterization of radiation induced brightness and darkening in fiber-optic cables at PBFA-Z
80
Characterization of radiation loss from microstrip discontinuities using a multiport network modeling approach
81
Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS
82
Characterization of radiative and nonradiative Processes in Nd:YAG lasers by comparing direct and band pumping
83
Characterization of Radio Frequency Echo using frequency sweeping and power analysis
84
Characterization of radio over multimode fiber links using coherence bandwidth
85
Characterization of radio propagation at 60 GHz channel
86
Characterization of radio receiver´s front-end nonlinearity by measurement of spurious-free dynamic ranges
87
Characterization of radio wave propagation in tunnels for microcellular communications
88
Characterization of radio wave propagation into buildings at 1800 MHz
89
Characterization of Radiofrequency Ablation Lesion Development Based on Simulated and Measured Intracardiac Electrograms
90
Characterization of radiometer using 8-term linear model
91
Characterization of radiometer using eight-term linear model
92
Characterization of radiometric transfer standards based on silicon trap detectors
93
Characterization of Radionuclide Behavior in Low-Level Waste Sites
94
Characterization of Radoms for Millimetrewave Radar Applications
95
Characterization of Rain Microphysics based on Disdrometer and Polarimetric Radar Observations
96
Characterization of rain profiles in a second-order approximation and application to attenuation beyond 10 GHz
97
Characterization of rainfall signature due to multispectral microwave radiometric data from ground
98
Characterization of RAL bipedal robot capacitive MEMS accelerometer using electrical impedance measurements
99
Characterization of Raman gain for different gain medium
100
Characterization of Raman-assisted Fiber optical parametric amplifiers gain
101
Characterization of ramp edge-geometry Ag:YBa/sub 2/Cu/sub 3/O/sub 7-x//PrBa/sub 2/Cu/sub 3/O/sub 7-x//Ag:YBa/sub 2/Cu/sub 3/O/sub 7-x/ junctions and dc SQUIDs
102
Characterization of ramp-type Josephson junctions with a Co-doped PrBaCuO barrier
103
Characterization of ramp-type YBa/sub 2/Cu/sub 3/O/sub 7/ junctions by AFM
104
Characterization of random decision errors in clocked comparators
105
Characterization of random matrix eigenvectors for stochastic block model
106
Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor
107
Characterization of random reactive ion etched-textured silicon solar cells
108
Characterization of random telegraph noise and its impact on reliability of SRAM sense amplifiers
109
Characterization of Random Telegraph Signal Noise of High-Performance p-MOSFETs With a High- k Dielectric/Metal Gate
110
Characterization of randomly time variant linear channel-an application to directional radio channels
111
Characterization of Randomly Time-Variant Linear Channels
112
Characterization of Randomly Varying Birefringence in Long Single Mode Fibers
113
Characterization of randomly varying linear systems
114
Characterization of randomness sources in ring oscillator-based true random number generators in FPGAs
115
Characterization of Range Resolution as a Function of Bandwidth and Frequency
116
Characterization of Rate Dependent Hysteresis of Piezoceramic Actuators
117
Characterization of Rate Region in Interference Channels with Constrained Power
118
Characterization of rate-dependent hysteresis of magnetostrictive actuators
119
Characterization of Rayleigh fading channel at 28 GHz using narrow and wide beamwidth antennas in reverberation chamber (Invited paper)
120
Characterization of RBSOA of high power bipolar transistors using a nondestructive tester
121
Characterization of Reaction Bonded Au and Ag Thick Film Metallizations
122
Characterization of reactive ion etching of polysilicon over gate oxide for failure mode analysis deprocessing
123
Characterization of reactive sputtered ITO and TiO2/ITO thin films for applications at elevated temperatures
124
Characterization of reactively sputtered iron oxide thin films for developing magnetic resonance imaging contrast agents
125
Characterization of Readback Signal, Distortion, and Noise and Estimation of Error Rates Based on Spectral Measurements Only
126
Characterization of real workloads of web search engines
127
Characterization of Real-Time PMD and Chromatic Dispersion Monitoring in a High-PMD 46-Gb/s Transmission System
128
Characterization of Real-World Steered-Beam Antennas from Amplitude-Only Near-Field Data
129
Characterization of Received Pulses by Antennas in Proximity of Human Body
130
Characterization of recessed Ohmic contacts to AlGaN/GaN
131
Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the AC lifetime profiling technique
132
Characterization of recombination processes in quantum dot lasers using small signal modulation
133
Characterization of Reconfigurable LC-Reflectarrays Using Near-Field Measurements
134
Characterization of reconfigurable ultra-narrowband optical filters realized by localized dynamic Brillouin gratings
135
Characterization of reconstituted mica paper capacitors used in high voltage and high temperature power electronics applications
136
Characterization of reconstituted mica paper capacitors used in high voltage electronics applications
137
Characterization of reconstituted mica paper capacitors used in high voltage power electronics applications
138
Characterization of reconstituted mica paper for use in high voltage capacitors
139
Characterization of Rectangular Glass Microcapillaries by Low-Coherence Reflectometry
140
Characterization of rectangular waveguide with a pseudochiral /spl Omega/ slab
141
Characterization of red blood cell aggregate formation using an analytical model of the ultrasonic backscattering coefficient
142
Characterization of red blood cell aggregation with photoacoustics: A theoretical and experimental study
143
Characterization of red blood cell deformability change during blood storage
144
Characterization of Reduced-height Loaded Wire Antenna as EMI Sensor
145
Characterization of Reflection Phase Modulators Using Hyperbolic Geometry
146
Characterization of Reflective Defects in Fabry–Pérot Laser Diodes Through the Power Transmission Spectrum
147
Characterization of Refractive Index Distribution in Spherical Microlenses Fabricated by Deep Proton Writing
148
Characterization of refractive index profiles in silver-sodium ion-exchanged glass waveguides for homogeneous refracting waveguide structures
149
Characterization of regular linear-phase paraunitary filter banks using dyadic-based structures
150
Characterization of Regulated Converters to Ensure Stability and Performance in Distributed Power Supply Systems
151
Characterization of relativistic magnetron behavior by 3-D PIC simulation
152
Characterization of relaxation-oscillation noise in continuous-wave traveling wave tubes
153
Characterization of Relay Channels Using the Bhattacharyya Parameter
154
Characterization of reliability in 3-D NAND flash memory
155
Characterization of reliability in WSN
156
Characterization of renal masses with harmonic and subharmonic contrast-enhanced ultrasound
157
Characterization of repeatability of XY-Theta platform held by robotic manipulator arms using a camera
158
Characterization of reperfused infarcted myocardium from high-frequency intracardiac ultrasound imaging using homodyned K distribution
159
Characterization of repolarization alternans during ischemia: time-course and spatial analysis
160
Characterization of resection dexterity in transurethral resection of bladder tumor: A kinematic study
161
Characterization of residual information for SeaWinds quality control
162
Characterization of residual strains of the EMC in PBGA during manufacturing and IR solder reflow process
163
Characterization of residual stress levels in complementary bipolar junction transistors on (100) silicon
164
Characterization of resistive dividers for a wideband power analyzer
165
Characterization of resistive transmission lines by short-pulse propagation
166
Characterization of resistive transmission lines to 70 GHz with ultrafast optoelectronics
167
Characterization of resolution for integrated optical Mach-Zehnder Interferometer with optimization of photolithography process
168
Characterization of resonances by polar expansion of Generalized Admittance Matrix
169
Characterization of resonant elements for passive and reconfigurable reflectarray design
170
Characterization of resonant tunneling diodes for microwave and millimeter-wave detection
171
Characterization of respiratory mechanics in mechanically ventilated neonates by using inflation and interrupter methods
172
Characterization of response of a dual resonance of an arc-induced long-period grating to various physical parameters
173
Characterization of response of the MSM photodetector
174
Characterization of responsivity and quantum efficiency of TiO2—Based photodetectors doped with Ag nanoparticles
175
Characterization of Revenue Monotonicity in Combinatorial Auctions
176
Characterization of Reverberation Chambers for OTA Measurements of Wireless Devices: Physical Formulations of Channel Matrix and New Uncertainty Formula
177
Characterization of reverse leakage components for ultrashallow p+/n diodes fabricated using gas immersion laser doping
178
Characterization of reverse-bias leakage currents and their effect on the holding time characteristics of MOS dynamic RAM circuits
179
Characterization of reversed c-axis AlN thin films
180
Characterization of RF Devices using Two-Tone Probe Signals
181
Characterization of RF noise source impedance for switched mode power supply
182
Characterization of RF plasma cleaning protocols for removal of contaminants in high voltage beam diodes
183
Characterization of RF power BJT and improvement of thermal stability with nonlinear base ballasting
184
Characterization of RF Propagation in Helical and Toroidal Metal Pipes for Passive RFID Systems
185
Characterization of RF signal coupling between MeerKAT telescope structures
186
Characterization of RF sputter deposited HfAlOx dielectrics for MIM capacitor applications
187
Characterization of RF Sputtered ZnO and ZnS Thin Films for SAW Transducers by X-Ray Diffraction Analysis
188
Characterization of RF Transistors For AM/FM Radio Applications
189
Characterization of RF transmission in human body
190
Characterization of RF–DC Transfer Difference for Thermal Voltage Converters With Built-in Tees in the Frequency Range 1 MHz to 1 GHz
191
Characterization of RF/microwave packaging structures
192
Characterization of RF-Driven Slot Microplasmas using Optical Emission Spectroscopy
193
Characterization of RFID Strap Using Single-Ended Probe
194
Characterization of RF-MOSFETs in Common-Source Configuration at Different Source-to-Bulk Voltages From S-Parameters
195
Characterization of rheotaxis of bull sperm using microfluidics
196
Characterization of Rice Paddies by a UAV-Mounted Miniature Hyperspectral Sensor System
197
Characterization of RIE Induced Radiation Damage in Silicon Using Nondestructive Transverse Acoustoelectric Voltage Measurements
198
Characterization of ring modulators and broadband photodetectors in silicon photonics for 25 Gb/s interconnection
199
Characterization of Ring-Bar and Contrawound Helix Circuits for High-Power Traveling-Wave Tubes
200
Characterization of risky projects based on project managers evaluation
201
Characterization of RNS multiply-add units for power efficient DSP
202
Characterization of road traffic flow from measured data of speed and time-headway -relationship between density ( k ), flow rate ( q ) and speed (V )-
203
Characterization of robotic needle insertion and rotation in artificial and ex vivo tissues
204
Characterization of Robust Alignment Mark to Improve Alignment Performance
205
Characterization of robust feedback Nash equilibrium for multi-channel systems
206
Characterization of robust finite frequency positive-real property
207
Characterization of Robust Stability of a Class of Interconnected Systems
208
Characterization of robustness with respect to small delay for exponential stability of linear dynamical systems
209
Characterization of Roebel Cables for Potential Use in High-Field Magnets
210
Characterization of RoF GPON performance for different modulation schemes
211
Characterization of ROFF/RON ratio of fluidic based memristor sensor for pH detection
212
Characterization of room temperature detectors using the proposed IEEE standard
213
Characterization of room temperature E-beam evaporated Ge thin film
214
Characterization of rotational mode disk resonator quality factors in liquid
215
Characterization of Ru electrodes for Ru/(Ba,Sr)TiO/sub 3//Ru capacitors
216
Characterization of rubble on the frequency band [300MHz–3GHz]
217
Characterization of runtime and jitter on a laser triggered spark gap switch
218
Characterization of Runtime and Jitter on a Laser Triggered Spark Gap Switch
219
Characterization of RuO2 nanocrystals deposited on carbon nanotubes by reactive RF sputtering
220
Characterization of rural traffic and evaluation of cellular protocols for fixed-mobile rural application
221
Characterization of safety regions of high power antennas
222
Characterization of samarium-cobalt TWT magnets
223
Characterization of Sample Entropy in the Context of Biomedical Signal Analysis
224
Characterization of sampling schemes for whole body PET imaging
225
Characterization of sampling schemes for whole body PET imaging
226
Characterization of SAR image patterns pertinent to individual façades
227
Characterization of satellite transponder impairments based on simulations with test data
228
Characterization of Satellite-derived Cloud Products for Application in an Aircraft Icing Prediction System
229
Characterization of saturable absorption of E11 and E22 transitions of carbon nanotubes
230
Characterization of saturation effects on digital beam forming radars
231
Characterization of SAW devices up to 2.6 GHz on GaAs and InP
232
Characterization of SAW Duplexer Inserts for LTCC RF Front-End Modules by Simulation and Measurement
233
Characterization of SAW Metal Strip Waveguides
234
Characterization of Sb2Te3 ohmic contacts on p-type CdTe single crystals
235
Characterization of Sb2Te3 ohmic contacts on P-type CdTe single crystals
236
Characterization of Sb-Al co-doped ZnO nanowires synthesized using nanoparticle-assisted pulsed-laser deposition
237
Characterization of Sb-Doped Fully-Silicided NiSi/SiO2/Si MOS Structure
238
Characterization of SBS gain and loss spectra using Fresnel reflections and interaction of two sidebands
239
Characterization of scalar strategy mechanisms for efficient resource allocation: Supply side case
240
Characterization of scaled MANOS nonvolatile semiconductor memory (NVSM) devices
241
Characterization of scaled SONOS EEPROM memory devices for space and military systems
242
Characterization of scandate cathode emission
243
Characterization of scattered radiation profile in volumetric 64 slice CT scanner: Monte Carlo study using GATE
244
Characterization of scatterers by their anisotropic and dispersive behavior
245
Characterization of scatterers by their energetic dispersive and anisotropic behaviors in high-resolution laboratory radar imagery
246
Characterization of scatterers concentration in cataractous lens using Nakagami distribution by ultrasounds
247
Characterization of Scattering Parameters Near a Flat Phantom for Wireless Body Area Networks
248
Characterization of scheduling algorithms in real-time computing systems
249
Characterization of Schottky contacts on n-GaN at high temperature
250
Characterization of Scientific and Transactional Applications under Multi-core Architectures on Cloud Computing Environment
251
Characterization of scientific workflows
252
Characterization of Scientific Workloads on Systems with Multi-Core Processors
253
Characterization of Scintillation Properties of a Gd-Doped Lead Chloride Single Crystal for \\gamma -Rays at Low Temperature
254
Characterization of scintillation pulses in time determination in TOF-PET
255
Characterization of scintillators by modern photomultipliers — A new source of errors
256
Characterization of Scintillators by Modern Photomultipliers—A New Source of Errors
257
Characterization of ScN heterojunctions
258
Characterization of Screen-Printed Mercuric Iodide Photoconductors for Mammography
259
Characterization of SDR/CR front-ends for improved digital signal processing algorithms
260
Characterization of sea ice types using synthetic aperture radar
261
Characterization of seafloor geo-acoustic properties from multibeam data
262
Characterization of second order moments of a Multi-Cluster Gaussian Scatterer Distribution channel model
263
Characterization of secondary neutron production during proton therapy
264
Characterization of Second-Order Isotropic Fractional Brownian Fields
265
Characterization of security levels for the dynamics of autonomous vehicle networks
266
Characterization of SEFI events on the EDODRAM used in large space solid state memory
267
Characterization of segmentation methods by multidimensional metrics: application to the delimitation of structures
268
Characterization of segmented HPGe detectors using Pulse Shape Comparison methods
269
Characterization of Segregation and Precipitation at Grain Boundaries in Thermally Aged Pressure Vessel Steels
270
Characterization of selective polysilicon deposition for MEMS resonator tuning
271
Characterization of selective-emitter solar cells consists of laser opened window and subsequently screen-printed electrodes
272
Characterization of Selectively Deposited Cobalt Capping Layers: Selectivity and Electromigration Resistance
273
Characterization of self-aligned metal electrodes poly-Si TFTs with schottky barrier contact
274
Characterization of self-aligned transfer gates for 1µm bubble contiguous-disk devices
275
Characterization of Self-Assembly and Evolution in Carbon Nanotube Thin Film Field Emitter
276
Characterization of self-formed Ti-based barrier layers in Cu(Ti)/dielectric-layer samples using X-ray Photoelectron Spectroscopy
277
Characterization of self-heating in advanced VLSI interconnect lines based on thermal finite element simulation
278
Characterization of self-heating in high-mobility Ge FinFET pMOS devices
279
Characterization of self-organized InAs/GaAs quantum dots under strain-induced and temperature-controlled nucleation mechanisms by atomic force microscopy and photoluminescence spectroscopy
280
Characterization of self-similarity properties of discrete-time linear scale-invariant systems
281
Characterization of semi-active vibration control system with energy regeneration based on MR damper
282
Characterization of semiconducting glaze by dielectric spectroscopy in frequency domain
283
Characterization of semiconducting iron disilicide obtained by LRP/CVD
284
Characterization of semiconducting structures by the PWP method
285
Characterization of semiconducting thin films on InP for magneto-optical applications
286
Characterization of semiconductor Bragg gratings
287
Characterization of Semiconductor Device Structures with Ultrathin Layers by Raman Scattering
288
Characterization of Semiconductor Devices at Very High Temperatures
289
Characterization of semiconductor devices using technological and geometric parameters
290
Characterization of semiconductor laser gain media by the segmented contact method
291
Characterization of semiconductor lasers by spontaneous emission measurements
292
Characterization of semiconductor materials as terahertz emitters under the effect of in-plane magnetic field
293
Characterization of Semiconductor Materials by Charged Particle Activation
294
Characterization of semiconductor materials by Raman microprobe
295
Characterization Of Semiconductor Surfaces And Interfaces By Non-linear Spectroscopy
296
Characterization Of Semiconductor Wafers By Light Of Shorter Wavelength Than Their Band Gap
297
Characterization of semiconductor with spintronic dopant
298
Characterization of Semiconductor-Based Optical Frequency Comb Sources Using Generalized Multiheterodyne Detection
299
Characterization of semiconductor-laser phase noise with digital coherent receivers
300
Characterization of semi-insulating (SI) GaAs as photoconductive switch material for high power, UWB microwave applications
301
Characterization of Semi-Insulating 4H Silicon Carbide for Radiation Detectors
302
Characterization of semi-insulating InP: Cu
303
Characterization of semilumped CPW elements for Millimeter-wave filter design
304
Characterization of semi-synthetic dataset for big-data semantic analysis
305
Characterization of Sensitivity Encoded Silicon Photomultiplier (SeSP) with 1-Dimensional and 2-Dimensional Encoding for High Resolution PET/MR
306
Characterization of sequential cells for constraint sensitivities
307
Characterization of serial links at 5.5Gbps on FR4 backplanes
308
Characterization of set of vectors represented by lattices
309
Characterization of SET response of the LM124A the LM111, and the LM6144
310
Characterization of Shallow Junction Ion Implantation Profiles: Correlation Between a Noncontact Photodisplacement Thermal Wave Technique and Rutherford Backscattering Analysis
311
Characterization of shallow junction transistors manufactured with plasma doping
312
Characterization of shallow ocean sediments using the airborne electromagnetic method
313
Characterization of shallow silicided junctions for sub-quarter micron ULSI technology. Extraction of silicidation induced Schottky contact area
314
Characterization of shallow underground targets using wideband microwave reflectometry
315
Characterization of Shared Library Access Patterns of Android Applications
316
Characterization of shield inhomogeneities of multiconductor cables by evaluation of measured transfer impedances and admittances
317
Characterization of shielded coplanar type transmission line junction discontinuities incorporating the finite metallization thickness effect
318
Characterization of shielding effectiveness of metallic frustum cone-like cabin with one coaxial feeding monopole antenna illuminated by a HEMP
319
Characterization of short and narrow channel effects for CAD-IGFET model
320
Characterization of short circuit faults and incipient insulation degradation between stator winding turns of induction motor
321
Characterization of short optical pulses using simplified chronocyclic tomography
322
Characterization of short PM Raman fiber lasers with a small spectral bandwidth
323
Characterization of short pulse propagation using Euclid distance
324
Characterization of short-duration voltage events
325
Characterization of Short-Wavelength-Selective a-Si:H MSM Photoconductors for Large-Area Digital-Imaging Applications
326
Characterization of Si and CdTe sensor layers in Medipix assemblies using a microfocus x-ray source
327
Characterization of Si- delta doped GaInAs grown by low pressure chemical vapor deposition
328
Characterization of Si implants in p-type GaN
329
Characterization of Si nanowires-based piezoresistive pressure sensor by dynamic cycling test
330
Characterization of Si-δ doped InP grown by low pressure chemical vapor deposition
331
Characterization of Si/SiO2interface degradation due to hot-carrier injection
332
Characterization of Si3N4/SiC Microstructure Derived from UV curable polymer ceramic precursor pyrolyzing
333
Characterization of Si3N4 Metal-Insulator-Metal (MIM) Capacitors for Monolithic Microwave Integrated Circuits (MMIC) Applications
334
Characterization of Si-based monolithic transformers with patterned ground shield
335
Characterization of SiC diodes in extremely high temperature ambient
336
Characterization of SiC JFET for Temperature Dependent Device Modeling
337
Characterization of SiC PiN diode forward bias degradation
338
Characterization of SiC Schottky diodes at different temperatures
339
Characterization of SiC thin films grown on Si by inductively coupled plasma chemical vapor deposition at low temperatures
340
Characterization of Si-CeO2-YBCO tri-layers grown by magnetron sputtering
341
Characterization of SiCN Ceramic Material Dielectric Properties at High Temperatures for Harsh Environment Sensing Applications
342
Characterization of side mounted vehicular antennas
343
Characterization of sidewall roughness inside porous anodic alumina template holes by scanning electron microscopy
344
Characterization of SiFe sheet insulation
345
Characterization of sigma-delta modulators using ARMAX identification methods
346
Characterization of sign controllability for linear systems with real eigenvalues
347
Characterization of signal perturbation using voting based curve fitting for multispectral images
348
Characterization of signal polarization near 900 MHz in and on vehicles and within buildings
349
Characterization of signal propagation in neuronal systems for nanomachine-to-neurons communications
350
Characterization of signal quality using data stream optical autocorrelation
351
Characterization of signal response for surface water movements in underwater optical wireless communications
352
Characterization of Signal Response of Lead Absorber Coupled Transition Edge Sensor Gamma-Ray Microcalorimeters
353
Characterization of signal via structure in multilayer printed circuit boards up to 50 GHz
354
Characterization of signals and noise rejection with bipolar longitudinal intrafascicular electrodes
355
Characterization of signals by the ridges of their wavelet transforms
356
Characterization of signals from multiscale edges
357
Characterization of SILC and its end-of-life reliability assessment on 45NM high-K and metal-gate technology
358
Characterization of silent stores
359
Characterization of Silica Nanowires for Optical Sensing
360
Characterization of silica optical fibers based on chemical etching
361
Characterization of Silicided Polysilicon Fuse Implemented in 65nm Logic CMOS Technology
362
Characterization of silicon 3D pixel detectors for the ATLAS Forward Physics experiment
363
Characterization of Silicon Avalanche Photodetectors Fabricated in Standard CMOS process
364
Characterization of silicon avalanche photodiode in term of breakdown voltage and leakage current
365
Characterization of silicon carbide (SiC) epitaxial channel MOSFETs
366
Characterization of silicon carbide and commercial-off-the-shelf (COTS) components for high-g launch and EM applications
367
Characterization of Silicon Carbide Differential Amplifiers at High Temperature
368
Characterization of Silicon Detectors for the SiliPET Project: A Small Animal PET Scanner Based on Stacks of Silicon Detectors
369
Characterization of silicon detectors with thin dead-layers on the n-side
370
Characterization of silicon die strength with application to die crack analysis
371
Characterization of silicon direct bonding methodology for high performance IGBT
372
Characterization of silicon electro-optical modulators for microwave photonic links
373
Characterization of silicon field effect transistor sub-THz detectors for imaging systems
374
Characterization of silicon isotropic etch by inductively coupled plasma etch in post-CMOS processing
375
Characterization of silicon metallization systems using energetic ion backscattering
376
Characterization of silicon micro-ring resonators using near-field scanning optical microscopy
377
Characterization of silicon MOS tunnel diodes
378
Characterization of silicon nanowire biosensors and solar cells
379
Characterization of Silicon Nanowire Embedded in a MEMS Diaphragm Structure Within Large Compressive Strain Range
380
Characterization of silicon nanowire transistor as a temperature nano-sensor device
381
Characterization of silicon nanowires
382
Characterization of silicon nanowires grown by electroless etching
383
Characterization of silicon nitride films for a silicon nanowire-based biosensor
384
Characterization of Silicon Nitride Micromachined Beams via Remote Optical Interrogation
385
Characterization of silicon parallel-plate electrostatic actuator in partially conducting aqueous solution
386
Characterization of silicon photodiodes for diffuse reflectance signal extraction
387
Characterization of Silicon Photomultipliers for nEXO
388
Characterization of Silicon Photomultipliers for PET Imaging
389
Characterization of silicon photomultipliers for the Cherenkov Telescope Array medium-sized telescopes
390
Characterization of silicon pixel detectors with the n+/n/p+ and double-sided multiguard ring structure before and after neutron irradiation
391
Characterization of silicon pixel detectors with the n+/n/p+ and double-sided multiguard ring structure before and after neutron-irradiation
392
Characterization of silicon solar cells by means of their luminescence under high frequency sinusoidal excitations
393
Characterization of silicon solar cells with interdigitated contacts
394
Characterization of silicon spheres for Spheral Solar cells
395
Characterization of silicon/glass anodic bond initiation toughness
396
Characterization of silicon-based molecular resonant tunneling diodes with scanning tunneling microscopy
397
Characterization of silicone gel properties for high power IGBT modules and MEMS
398
Characterization of silicone rubber based soft pneumatic actuators
399
Characterization of Silicon-Film™ sheet material
400
Characterization of silicon-on-insulator waveguide chirped grating for coupling to a vertical optical fiber
401
Characterization of silicon-on-sapphire IGFET transistors
402
Characterization of silver CPWs for applications in silicon MMICs
403
Characterization of silver flakes utilized for isotropic conductive adhesives
404
Characterization of silver nanoparticles biosynthesized using lemon juice
405
Characterization of Silver/Polystyrene (PS)-Coated Hollow Glass Waveguides at THz Frequency
406
Characterization of SIMOX and ZMR materials by spreading resistance and point contact current voltage techniques
407
Characterization of SIMOX material with channeled and unchanneled oxygen implantation
408
Characterization of simple wireless neurostimulators and sensors
409
Characterization of simulated ion beam neutralization stability in two and three dimensions
410
Characterization of simultaneous bulk and interface high-field trapping effects in SiO2
411
Characterization of simultaneous ozone measurements by the MAESTRO and FTS space instruments
412
Characterization of simultaneous protein microarray formation by discrete micro stamper on surfaces of different wettabilities
413
Characterization of single and composites thin films memristive device
414
Characterization of Single and Dual Layer Anti Reflecting Coating (ARC) for Solar Cell Applications
415
Characterization of single and multiple scatter from matter and activity distributions outside the FOV in 3-D PET
416
Characterization of single and multiple scatter from matter and activity distributions outside the FOV in PET
417
Characterization of Single- and Multiwalled Carbon Nanotube Composites for Electromagnetic Shielding and Tunable Applications
418
Characterization of Single- and Multi-walled Carbon Nanotubes at Microwave Frequencies
419
Characterization of single and three phase power rectifiers with passive and active loads
420
Characterization of single event effects for the AD677, 16-bit A/D converter
421
Characterization of single hard errors (SHE) in 1 M-bit SRAMs from single ion
422
Characterization of Single Poly Radiation Sensors
423
Characterization of single quantum wells on GaAs/Si grown by metalorganic chemical vapor deposition
424
Characterization of single red blood cell using twin microcantilever type sensor array
425
Characterization of single stage 3 phase power factor correction circuit using modular single phase PWM DC-to-DC converters
426
Characterization of single-carrier block transmission under the precoded OFDM architecture
427
Characterization of single-channel depolarizations in smooth muscle by analysis of ATP-activated membrane voltage noise
428
Characterization of Single-Crystal Synthetic Diamond for Multi-Watt Continuous-Wave Raman Lasers
429
Characterization of Single-Electron Tunneling Transistors for Designing Low-Power Embedded Systems
430
Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser Testing
431
Characterization of Single-Event Transient Pulse Quenching among Dummy Gate Isolated Logic Nodes in 65 nm Twin-Well and Triple-Well CMOS Technologies
432
Characterization of Single-Event Transients Of Body-Tied vs. floating-body circuits in 150 nm 3D SOI
433
Characterization of single-event upsets in a flash analog-to-digital converter (AD9058)
434
Characterization of Single-Frequency Yb: \\hbox {KYF}_{4} Lasers at 1.03 \\mu\\hbox {m} for Opt
435
Characterization of single-mode chalcogenide glass waveguides at 8.35 µm
436
Characterization of single-mode coated fibers at low temperatures using periodic distortion of the fiber axis
437
Characterization of Single-Mode Fiber With Fiber Bragg Gratings for the Design of Long-Period Gratings
438
Characterization of single-mode fibers from wavelength dependence of modal field and far field
439
Characterization of single-mode optical fibres
440
Characterization of single-mode performance of Chirally-Coupled-Core fibers with cores larger than 50μm
441
Characterization of Single-Photon Avalanche Diode arrays in 150nm CMOS technology
442
Characterization of Single-Photon Avalanche Diodes in a 0.5 \\mu m Standard CMOS Process—Part 1: Perimeter Breakdown Suppression
443
Characterization of single-photon avalanche diodes in standard CMOS
444
Characterization of Single-Photon Time Resolution: From Single SPAD to Silicon Photomultiplier
445
Characterization of single-port and multi-port collective communication operations on the Cell BE processor
446
Characterization of single-port surface transverse wave resonators in the lower GHz range
447
Characterization of single-stage three-phase power-factor-correction circuit using modular single-phase PWM DC-to-DC converters
448
Characterization of singular structures in polarimetric SAR images by wavelet frames
449
Characterization of SINR Region for Interfering Links With Constrained Power
450
Characterization of SINR uncertainty due to spatial interference variation
451
Characterization of SiO2 Films Deposited by Pyrolysis of Tetraethylorthosilicate (TEOS)
452
Characterization of SiO2 dielectric breakdown for reliability simulation
453
Characterization of SiON integrated waveguides via FTIR and AFM measurements
454
Characterization of SION microring resonators for biosensing applications
455
Characterization of SiPM: Temperature dependencies
456
Characterization of SIS Receivers Using a Digital Spectrometer
457
Characterization of Sites for Low-Level Waste Disposal Facilities
458
Characterization of situation awareness performance
459
Characterization of size-controlled ZnO nanorods produced by electrochemical deposition technique
460
Characterization of SKA-AAlow antenna elements in the array environment
461
Characterization of Skin Effect in High-Speed Interconnects and Spiral Inductors
462
Characterization of skin incision closure using diode laser and ICG -albumin protein solder
463
Characterization of Skin Incision Closure Using Diode Laser and ICG-Albumin Protein Solder
464
Characterization of skin lesion texture in diffuse reflectance spectroscopic images
465
Characterization of skin lesions
466
Characterization of Skip or Far Track Erasure in a Side Shield Design
467
Characterization of slaughtered and non-slaughtered goat meat using low frequency
468
Characterization of sleep spindles using higher order statistics and spectra
469
Characterization of sleep using bispectral analysis
470
Characterization of Slice-Based H.264/AVC Encoded Video Traffic
471
Characterization of Slider Dynamics and Media Defects by Concurrent Methods Using Multifunctional Spinstand
472
Characterization of sliding Al-Cu Electrical contacts
473
Characterization of slots in rectangular waveguide by method of moments with proper edge condition
474
Characterization of SMA actuator for applications in robotic neurosurgery
475
Characterization of small antennas for hearing aids by several measurement techniques
476
Characterization of small apertures in the center conductor of a microstrip line
477
Characterization of small CdTe detectors to be used for linear and matrix arrays
478
Characterization of small CdTe detectors to be used for linear and matrix arrays
479
Characterization of small cracks in eddy current testing
480
Characterization of small photovoltaic inverters for harmonic modeling
481
Characterization of small specimens using an integrated computational/measurement technique
482
Characterization of small trapping sets in LDPC codes from Steiner triple systems
483
Characterization of Small-size Microstrip Patch Antennas for Wireless Applications
484
Characterization of smart hydrogels for biometric sensors and actuators
485
Characterization of Smelling Contaminations on Textiles using a Gradient Micro Array as an Electronic Nose
486
Characterization of Smoke Particles Using Polarization Modulated Scattering
487
Characterization of Sn2.4Ag solder viscoplastic behavior under cyclic loading
488
Characterization of SNMP MIB modules
489
Characterization of SnO2 thin films through thermoelectric power measurements
490
Characterization Of Snow Grain Size In The Near-infrared And Microwave Wavelengths
491
Characterization of SOA in Time Domain and the Improvement Techniques for Using in High-Voltage Integrated Circuits
492
Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current
493
Characterization of soft errors caused by single event upsets in CMOS processes
494
Characterization of soft handoff in CDMA systems
495
Characterization of soft magnetic material METGLAS 2605S-3A for power applications and transformers
496
Characterization of soft magnetic materials in a wide range of frequencies
497
Characterization of soft magnetic thin film by means of single sheet testing
498
Characterization of soft tissue mechanics with aging
499
Characterization of soft X-ray source using laser-irradiated gas puff targets
500
Characterization of Software Aging Effects in Elastic Storage Mechanisms for Private Clouds
501
Characterization of Software Processes Improvement Needs in SMEs
502
Characterization of Software Projects by Restructuring Parameters for Usability Evaluation
503
Characterization of SOI Lamé-mode square resonators
504
Characterization of SOI microrings using IR imaging
505
Characterization of SOI MOSFETs by gate capacitance measurements
506
Characterization of SOI wafers by temporal decay measurement of condensate luminescence
507
Characterization of soil moisture using a microstrip resonator
508
Characterization of soil surface roughness from terrestrial laser scanner data
509
Characterization of SOI-MOSFET with the channel conductance transient spectroscopy
510
Characterization of sol - gel in doped ZnO films: Structural and optical properties
511
Characterization of solar cell degradation due to electrostatic discharge on multi-junction solar cell
512
Characterization of solar cells by frequency-domain transient analysis
513
Characterization of solar cells by thermal transient testing
514
Characterization of solar cells contacts deposited by direct writing approach
515
Characterization of solar cells in transportation
516
Characterization of solar cells with high spatial resolution
517
Characterization of solar irradiance profiles for photovoltaic system studies through data rescaling in time and amplitude
518
Characterization of solar panel using capacitive load
519
Characterization of solar-powered non-asbestos diaphragm cells for the production of caustic soda
520
Characterization of solder joint electromigration for flip chip technology
521
Characterization of solderable metallization on power devices for 3-D packaging
522
Characterization of sol-gel derived (Pb,La)TiO3 pyroelectric thin film detectors
523
Characterization of sol-gel derived PZT and PLZT thin films
524
Characterization of sol-gel Pb(Zr0.53Ti0.47)O3 in thin film bulk acoustic resonators
525
Characterization of solid liquid suspensions utilizing ultrasonic measurements
526
Characterization of solid tin target for gas discharges produced EUV plasmas
527
Characterization of solid UV cross-linked PEGDA for biological applications
528
Characterization of solutions of non-square algebraic Riccati equations
529
Characterization of some concepts of aging
530
Characterization of sonar target data using Gabor wavelet features
531
Characterization of sonicated breath films by atomic force microscopy
532
Characterization of soot aggregates based on polarization modulated scattering
533
Characterization of soot from multimode vapor-phase axial deposition (VAD) optical fiber performs
534
Characterization of SOS-CMOS FETs at Low Temperatures for the Design of Integrated Circuits for Quantum Bit Control and Readout
535
Characterization of source power distributions in multimode fiber by a splice offset technique
536
Characterization of source-to-drain capacitance (C/sub ds/) effect of GaAs PHEMT for millimeter wave switch
537
Characterization of space charges and conduction current in LDPE by modified PEA method
538
Characterization of space-charge properties of a linearly graded p-n junction by an approximate "Regional" analysis method
539
Characterization of space-division multiplexing fibers using swept-wavelength interferometry
540
Characterization of space-division multiplexing systems using a swept-wavelength interferometer
541
Characterization of space-time focusing in time-reversed random fields
542
Characterization of spatial channel model based on ray path analysis in high-rise urban environment
543
Characterization of spatial diversity in cooperative spectrum sensing
544
Characterization of spatial intrafield gate CD variability, its impact on circuit performance, and spatial mask-level correction
545
Characterization of spatial modulational instability of second-order nonlinear eigenmodes in a slab waveguide
546
Characterization of spatial ordering of corneal stroma fibrils
547
Characterization of spatio-temporal parameters of human gait assisted by a robotic walker
548
Characterization of SPEC CPU2006 and SPEC OMP2001: Regression Models and their Transferability
549
Characterization of special fibers and fiber devices
550
Characterization of spectral and spatial distributions of penetration, scatter and lead X-rays in Ga-67 SPECT
551
Characterization of spectral broadening of Doppler signals recorded in the left ventricular outflow tract of patients with a valvular aortic stenosis
552
Characterization of spectral compression of OFDM symbols using optical time lenses
553
Characterization of Spectral Density of wind farm power output
554
Characterization of spectral regrowth in microwave amplifiers based on the nonlinear transformation of a complex Gaussian process
555
Characterization of spectral transitions with applications to acoustic sub-word segmentation and automatic speech recognition
556
Characterization of Spectrum Activities in the U.S. Public Safety Band for Opportunistic Spectrum Access
557
Characterization of speed and stability of BiNMOS gates with a bipolar and PMOSFET merged structure
558
Characterization of sperm whale vocalization energy based on echolocation signals
559
Characterization of spiculation on ultrasound lesions
560
Characterization of Spillover and Recovery Coefficients in the Gated Mouse Heart for Non-Invasive Extraction of Input Function in microPET Studies: Feasibility and Sensitivity Analysis
561
Characterization of spin-orbit torques in Pt/Co/Ta structures
562
Characterization of spiral inductors with patterned floating structures
563
Characterization of spiral microstripline inductors
564
Characterization of Spiral Planar Inductors Built on Printed Circuit Boards
565
Characterization of split gate flash memory endurance degradation mechanism
566
Characterization of split-gate flash memory devices: reliability, gate-disturbance and capacitive coupling coefficients
567
Characterization of spontaneous and stimulated emission from praseodymium (Pr3+) ions doped into a silica-based monomode optical fiber
568
Characterization of spontaneous changes in electrogram morphology
569
Characterization of spurious emissions of wireless devices in a reverberation chamber
570
Characterization of spurious-response suppression in double-balanced mixers
571
Characterization of sputter-deposited (Ba,Sr)TiO3 thin films on the sidewalls of fine-patterned electrodes
572
Characterization of Sputtered Gold-Tungsten and Gold-Molybdenum Metallizations for Microwave Power Transistors
573
Characterization of Sputtered High Dielectric Constant Ba0.5Sr0.5TiO3 Thin Films for DRAM Applications
574
Characterization of Sputtered Ta and TaN Films by Spectroscopic Ellipsometry
575
Characterization of Sputtered-TaN metal gate for SiO2 and HfO2 gate dielectrics
576
Characterization of SQUID-Based Null Detector for a Quantum Metrology Triangle Experiment
577
Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS
578
Characterization of SRM drive systems under normal and fault operating conditions
579
Characterization of SrTiO3-based MIM capacitors grown by using different precursors and growth temperatures
580
Characterization of SSN coupling to signal via in multi-layer PCBs and packages
581
Characterization of stability margins of the Foschini-Miljanic power allocation strategy under constant and time-varying delays
582
Characterization of Stability Region for General Autonomous Nonlinear Dynamical Systems
583
Characterization of stability transitions and practical stability of planar singularly perturbed linear switched systems
584
Characterization of Stabilizing Switching Sequences in Switched Systems
585
Characterization of stacked die using die-to-wafer integration for high yield and throughput
586
Characterization of stackless vertically aligned carbon nanotube synthesized by thermal CVD with gravity effect and water-assisted etching
587
Characterization of stainless steel inertia welds using HTS SQUID NDE
588
Characterization of Stand Alone AC Generators during No-Break Power Transfer using AI-EM Based Approach
589
Characterization of Stand Alone AC Generators During No-Break Power Transfer Using Radial Basis Networks
590
Characterization of Standard Cells for Intra-Cell Mismatch Variations
591
Characterization of Standard Cells for Intra-Cell Mismatch Variations
592
Characterization of standard CMOS compatible photodiodes and pixels for Lab-on-Chip devices
593
Characterization of standard controllers satisfying given H∞ specifications
594
Characterization of standing wave movement by in-line antennas
595
Characterization of state estimation biases
596
Characterization of state-of-the art 15-bit, 10 MHz A/D converter
597
Characterization of static electrification in power transformers
598
Characterization of Static/Dynamic Topological Routing for Grid Networks
599
Characterization of Statical Properties of Rat´s Whisker System
600
Characterization of Static-dissipative Ceramics for ESD and Contamination Control Purposes
601
Characterization of stationary and rotating magnetic fields in an MERIE
602
Characterization of stationary patterns and their link with cavity solitons in semiconductor microresonators
603
Characterization of stationary processes differentiable in mean square (Corresp.)
604
Characterization of statistical multiplexing of heterogeneous ATM sources
605
Characterization of steady and transient heating of interconnects - a review
606
Characterization of Steady-State Current Ripple in Interleaved Power Converters Under Inductance Mismatches
607
Characterization of stencil printing parameters for fine pitch wafer bumping
608
Characterization of STI Edge Effects on CMOS Variability
609
Characterization of Stiction Accrual in a MEMS
610
Characterization of stiction forces in ultra-clean encapsulated MEMS devices
611
Characterization of Stimulated Brillouin Scattering in Polymer Optical Fibers Based on Lock-in-Free Pump–Probe Technique
612
Characterization of storage workload traces from production Windows Servers
613
Characterization of strain fields in graphene films
614
Characterization of Strained Silicon MOSFET Using Semiconductor TCAD Tools
615
Characterization of Stratospheric Clear Air Turbulence for Air Force Platforms
616
Characterization of streamers in liquid nitrogen under AC voltages using UHF techniques
617
Characterization of streamers in water in a coaxial reactor
618
Characterization of stress distribution in ultra-thinned DRAM wafer
619
Characterization of stress in amorphous silicon nitride and implications to c-Si surface passivation
620
Characterization of Stress in Thallium Bromide Devices
621
Characterization of Stress in TlBr devices
622
Characterization of stress induced defects in deep sub-micron MOSFETS
623
Characterization of stress-controlled a-IGZO thin films and their applications to thin-film transistor and micro-electromechanical system processes
624
Characterization of stress-voiding of Cu / Low-k vias attached to narrow lines
625
Characterization of strip induced damage in ultra low-k dielectric
626
Characterization of Strip Line Crossing by Transverse Resonance Analysis
627
Characterization of strip-fed cavity-backed slots
628
Characterization of stripline circuit by planar circuit/equivalent network and demonstration of its validity by 1D, 2D and 3D analysis for practical structures
629
Characterization of Stripline Crossing by Transverse Resonance Analysis
630
Characterization of strong structural controllability of uncertain linear time-varying discrete-time systems
631
Characterization of Strongly Coupled Si-Wire Waveguides for High-Density Optical WDM and Sensing Applications
632
Characterization of strongly spun fibers with spin rate exceeding OFDR spatial resolution
633
Characterization of strontium barium niobate single crystals grown by the vertical Bridgman method
634
Characterization of structural controllability
635
Characterization of structural effects in ferroelectric tunable capacitors using barium strontium titanate thin films
636
Characterization of structural features for small regulatory RNAs in Escherichia coli genomes
637
Characterization of structural irregularities in highly birefringent photonic crystal fiber based on polarization coupling by torsional acoustic wave
638
Characterization of Structure and Growth Evolution for nc-Si:H in the Tandem Photovoltaic Device Configuration
639
Characterization of structure and growth evolution for nc-Si:H in the tandem photovoltaic device configuration
640
Characterization of structured and unstructured decentralized fixed modes using transfer matrices
641
Characterization of structures maskless-etched by low-energy FIB
642
Characterization of SU-8 using terahertz time-domain spectroscopy
643
Characterization of sub-10-fs pulses using spatially encoded arrangement for SPIDER
644
Characterization of subcortical structures during deep brain stimulation utilizing support vector machines
645
Characterization of Submicrometer Buried-Channel and Surface-Channel PMOSFETS
646
Characterization of submicrometer thickness of copper film on silicon wafer by using pulsed eddy current method
647
Characterization of sub-micron MOS transistors, modified using a focused ion beam system
648
Characterization of submicron-period periodically-segmented ion-exchanged KTiOPO/sub 4/ waveguides based on backward second-harmonic generation
649
Characterization of submillimeter-wave Schottky diodes in the 500–750 GHz band using micromachined on-wafer probes
650
Characterization of sub-mm-wave dielectric waveguide directional coupler using the FDTD method
651
Characterization of subnanosecond heavy-ion bunches at the TASCC superconducting cyclotron
652
Characterization of sub-nm AlOx and LaOx capping layers on high-k gate stack film systems using VuV (λ=120 nm) reflectivity
653
Characterization of Subpicosecond Pulses Based on Temporal Interferometry With Real-Time Tracking of Higher Order Dispersion and Optical Time Delay
654
Characterization of substrate anisotropy using substrate integrated waveguide technology
655
Characterization of substrate material using complementary split ring resonators at terahertz frequencies
656
Characterization of substrate noise coupling in high speed CMOS current-steering D/A converter
657
Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates
658
Characterization of Subsurface Anomalies by Elastic Surface Wave Dispersion
659
Characterization of Sub-THz Photonic-Transmitters Based on GaAs–AlGaAs Uni-Traveling-Carrier Photodiodes and Substrate-Removed Broadband Antennas for Impulse-Radio Communication
660
Characterization of sub-two-cycle pulses from a hollow-core fiber compressor in the spatiotemporal and spatio-spectral domains
661
Characterization of suburban areas for land use planning using landscape ecological indicators derived from IKONOS-2 multispectral imagery
662
Characterization of subwavelength grating waveguides with 3D finite element method
663
Characterization of sulfate and phosphate containing plasma polymer surfaces
664
Characterization of sulfurized CuSbS2 thin films for PV applications
665
Characterization of superconducting bearings for lunar telescopes
666
Characterization of superconducting FeSe0.5Te0.5 hot electron bolometer
667
Characterization of superconducting rings using an in-field Hall probe magnetic mapping system
668
Characterization of superconducting wires by cone-beam micro-tomography
669
Characterization of superconductors with artificial pinning microstructures
670
Characterization of super-harmonic effect using piezoelectric film cantilever with a proof mass in the point
671
Characterization of superhydrophobic materials using multiresonance acoustic shear wave sensors
672
Characterization of super-resolution photolithography
673
Characterization of Supply and Substrate Noises in CMOS Digital Circuits
674
Characterization of SURF and BRISK Interest Point Distribution for Distributed Feature Extraction in Visual Sensor Networks
675
Characterization of SURF interest point distribution for visual processing in sensor networks
676
Characterization of surface acoustic wave focusing by an annular interdigital transducer
677
Characterization of surface acoustic wave optomechanical oscillators
678
Characterization of surface acoustic wave propagation in a ZnO layer on a conducting substrate
679
Characterization of surface acoustic wave propagation in multi-layered structures using extended FEM/SDA software
680
Characterization of surface and buried channel ion sensitive field effect transistors (ISFET´s)
681
Characterization of surface- and buried-channel detection transistors for CCD on-chip amplifiers
682
Characterization of surface barrier effects from Cu-implanted SiO 2/Si interfaces
683
Characterization of surface channel CCD image arrays at low light levels
684
Characterization of surface dead layer in VCF/TrFE nano films by means of broadband dielectric spectroscopy
685
Characterization of surface defects in niobium microwave cavities
686
Characterization of surface discharge as indicator for hydrophobicity evaluation of silicone rubber insulators
687
Characterization of Surface EMG Signal Based on Fuzzy Entropy
688
Characterization of surface EMG with cumulative residual entropy
689
Characterization of Surface Finishing Effect on Filtration Performance of a Regenerable Filter Media by a Simplified Model
690
Characterization of surface heat convection of bilayer graphene
691
Characterization of surface micromachined hollow metallic microneedles
692
Characterization of surface micromachined metallic microneedles
693
Characterization of surface mobility in MOS structures containing interfacial cesium ions
694
Characterization of surface mobility on the sidewalls of dry-etched trenches
695
Characterization of Surface Mount Components at Microwave Frequencies using Wafer Probes
696
Characterization of surface mount packages at microwave frequencies using wafer probes
697
Characterization of surface plasmon polariton pulse propagation on thin metallic films and two dimensional nanohole arrays
698
Characterization of surface potential and capacitance on CdS/Cu(In,Ga)Se2 multi-layers by KFM and EFM
699
Characterization of surface profile for surface activated bonding by using Power Spectral Density function
700
Characterization of surface recombination velocity of InP reduced by sulfur-treatment and a phosphorous-nitride film formation with Raman spectroscopy
701
Characterization of Surface-Breaking Cracks Using One Tangential Component of Magnetic Leakage Field Measurements
702
Characterization of surface-measured potentials from implanted cochlear protheses
703
Characterization of surface-undoped In0.52Al0.48 As/In0.53Ga0.47As/InP high electron mobility transistors
704
Characterization of Surface-Wave and Leaky-Wave Propagation on Wire-Medium Slabs and Mushroom Structures Based on Local and Nonlocal Homogenization Models
705
Characterization of surrogate parameters for blood pressure regulation in neurally-mediated syncope
706
Characterization of swaged mixed metal heat sinks
707
Characterization of SWCNT-based TSV
708
Characterization of Swelling of A Polymeric Coating for DNA Microarray Applications Using Spectral Self-Interference Fluorescence Microscopy
709
Characterization of switched mode LDMOS and GaN power amplifiers for optimal use in polar transmitter architectures
710
Characterization of switched reluctance machines using Fourier series approach
711
Characterization of switching parameters and multilevel capability in HfOx/AlOx bi-layer RRAM devices
712
Characterization of switching sequences on system with dwell-time restriction for Model Predictive Control
713
Characterization of switching windows of an 160-Gb/s all-optical demultiplexer with data base rates of 10 and 40 Gb/s
714
Characterization of symmetric scattering using polarimetric SARs
715
Characterization of symmetrical electrode system to estimate the degree of uniformity under symmetrically and asymmetrically applied high voltage
716
Characterization of syngas and bio-char: Co-products from pyrolysis of waste fish fats
717
Characterization of Synonymous Codon Usage Bias in the UL19 Gene of Duck Plague Virus (DPV)
718
Characterization of syringe-pump-driven versus pressure-driven microfluidic flows
719
Characterization of System Services and Their Performance Impact in Multi-core Nodes
720
Characterization of Systematic and Random Diode Mismatches in Antiparallel-Diode Mixers
721
Characterization of systematic MOSFET current factor mismatch caused by metal CMP dummy structures
722
Characterization of systems-level organization through mining large-scale genetic interaction networks
723
Characterization of Ta2O5-MgF2 composite thin films
724
Characterization of tactile display for stiffness distribution using Magneto-rheological fluid
725
Characterization of talker radiation pattern using a microphone array
726
Characterization of tantalum oxide-ruthenium oxide hybrid capacitors
727
Characterization of tantalum-silicon films on GaAs at elevated temperatures
728
Characterization of tapered slot antenna feeds and feed arrays
729
Characterization of tapered-erbium doped fiber in co-propagating amplifier
730
Characterization of tapered-slot antenna designs for subsurface radar applications
731
Characterization of Target effect of Nano-hydrogel by Near-infrared Fluorescent Quantum Dots
732
Characterization of target symmetric scattering using polarimetric SARs
733
Characterization of target-pylon interactions in RCS measurements
734
Characterization of task performance based on maximum a posteriori reconstructions
735
Characterization of TCC on chip-multiprocessors
736
Characterization of TCO deposition for CIGS solar cells
737
Characterization of teleportation in optics
738
Characterization of TEM cell discontinuities due to filtered DUT test harnesses
739
Characterization of temperature and strain sensitivity of low cost few-mode fiber based interferometer sensor
740
Characterization of temperature effects on single-photon avalanche diodes fabricated in a HV-CMOS conventional technology
741
Characterization of temperature profile in solid waste decomposition to demonstrate potential for harnessing thermal energy
742
Characterization of temperature sensor using VT extractor circuit
743
Characterization of temperature-dependent biophysical properties during laser mediated cartilage reshaping
744
Characterization of temporal fading for a traffic monitoring system
745
Characterization of temporal fading in urban fixed wireless links
746
Characterization of temporal patterns of transient ischemic ST change episodes during ambulatory ECG monitoring
747
Characterization of temporal sequences in geophysical databases
748
Characterization of temporary short circuit in induction motor winding using wavelet analysis
749
Characterization of Terahertz Beam Profile and Propagation
750
Characterization of terahertz detectors based on niobium nitride superconducting tunnel junctions
751
Characterization of terahertz four-wave mixing in a semiconductor laser amplifier
752
Characterization of terahertz generation based on the different structures of lithium tantalate crystals
753
Characterization of terahertz planar antenna by Josephson admittance spectroscopy
754
Characterization of terahertz wave transmission through complementary metamaterials with split ring resonator arrays
755
Characterization of Terra and Aqua MODIS VIS, NIR, and SWIR Spectral Bands´ Calibration Stability
756
Characterization of terrain background in LWIR hyperspectral data to aid landmine detection
757
Characterization of Terrestrial Features Using Space-Shuttle-Based Polarimetry
758
Characterization of test devices for development of nanowire sensor FETs
759
Characterization of textile substrate to design a textile antenna
760
Characterization of Texture Features Between Carcinomatous and Normal Wall Tissue in MR Bladder Imaging
761
Characterization of texture in hexagonal materials using a line focus acoustic microscope
762
Characterization of texture in image of skin lesions by support vector machine
763
Characterization of texture in two-phase (cubic-hexagonal) materials using a line focus acoustic microscope
764
Characterization of tfLIFE Neural Response for the Control of a Cybernetic Hand
765
Characterization of TFT/LCD arrays
766
Characterization of thallium bromide chloride crystals for radiation detectors
767
Characterization of thallium bromide crystals purified by the filter method
768
Characterization of Thallium Bromide Detectors Made From Material Purified by the Filter Method
769
Characterization of the 2.4 GHz ISM band electromagnetic interference in a hospital environment
770
Characterization of the 2nd generation magnetic microbearing with integrated stabilization for frictionless devices
771
Characterization of the 20-T immersed diode on RITS-3
772
Characterization of the 4Mb chalcogenide-random access memory
773
Characterization of the 5 GHz wireless channel for small airport surface areas
774
Characterization of the 5-GHz Elevator Shaft Channel
775
Characterization of the 60 GHz channel in underground mining environment
776
Characterization of the 60 GHz Wireless Desktop Channel
777
Characterization of the A/D conversion section in Software Defined Radios
778
Characterization of the A15 Layer Growth and Microstructure for Varying Heat Treatments in {\\rm Nb}_{3}{\\rm Sn} Tube Type Composites
779
Characterization of the absorbing material used in EMC experiments
780
Characterization of the Accommodation Effect in Soft Hysteretic Materials Via Sensorless Measurement Technique
781
Characterization of the ACE 4 catcher´s mitt POS-load configuration
782
Characterization of the acoustic output of commercial extra-corporeal shock wave lithotripters for kidney stones
783
Characterization of the acoustic signature of a small remotely operated vehicle for detection
784
Characterization of the adhesion between nanoparticles and polymer matrix by atomic force microscopy
785
Characterization of the adverse effect of neighborhood capture in MANET and on the way to a remedy
786
Characterization Of The AlGaAs/GaAs Tunneling Emitter Bipolar Transistor
787
Characterization of the allowable perturbations for disturbance rejection and data sensitivity
788
Characterization of the aluminum-tantalum oxide-silicon dioxide-silicon charge storage (MTOS) device
789
Characterization of the ambient temperature optics of the submillimeter limb-sounder SMILES
790
Characterization of the analytical boundary of the workspace for 3-6 SPS parallel manipulator
791
Characterization of the Angle, Delay and Polarization of Multipath Signals for Indoor Environments
792
Characterization of the ANITA neutron source for accelerated SEE testing at The Svedberg laboratory
793
Characterization of the ANITA Neutron Source for Accelerated SEE Testing at the Svedberg Laboratory
794
Characterization of the annealing behavior for copper-filled TSVs
795
Characterization of the aquarius and juno radiometers using a programmable digital noise source
796
Characterization of the array modes of high-power gain-guided GaAs single-quantum-well laser arrays
797
Characterization of the Arterial System in the Time Domain
798
Characterization of the Attenuation due to Rain Cell Fields applying Cellular Automata to Weather Radar Images
799
Characterization of the AURORA FXR Photon Radiation Field for SREMP Studies
800
Characterization of the autonomic system during the cyclic alternating pattern of sleep
801
Characterization of the axiomatizable prenex fragments of first-order godel logics
802
Characterization of the Back Channel Interface in SOI MOSFET´s
803
Characterization of the Back Interface in Strained-Silicon-on-Insulator Channel and Enhancement of Electrical Properties by Heat Treatment
804
Characterization of the bandwidth performance of distributed junction arrays
805
Characterization of the Basic Operationa L Properties of the Capillary Plasma Electrode (CPE) Discharge
806
Characterization of the Bayes estimator and the MDL estimator for exponential families
807
Characterization of the Bayes estimator and the MDL estimator for exponential families
808
Characterization of the Beam-Spread Function for Underwater Wireless Optical Communications Links
809
Characterization of the behavior of outer functions with applications to spectral factorization and system design
810
Characterization of the behaviour of dissociated neurons exposed to dielectrophoretic forces
811
Characterization of the bending creep behavior for electroplating nickel microbeam
812
Characterization of the Binary Micro-Grating Surface by Scanning White Light Interferometry
813
Characterization of the Birefringence in Fiber Bragg Gratings Fabricated With an Ultrafast-Infrared Laser
814
Characterization of the bistable ring PUF
815
Characterization of the bistatic scattered distribution
816
Characterization of the Body Node in PD SOI MOSFETs Using Multiport VNA Measurements
817
Characterization of the Body-Area Propagation Channel for Monitoring a Subject Sleeping
818
Characterization of the body-centric propagation channel at 60 GHz in the presence of textiles
819
Characterization of the branch-line and rat-race ideal hybrids through their merit parameters
820
Characterization of the breast region for computer assisted Tabar masking of paired mammographic images
821
Characterization of the broadband transmission behavior of interconnections on silicon substrates
822
Characterization of the broadband transmission behavior of interconnections on silicon substrates
823
Characterization of the brushless, doubly-fed machine by magnetic field analysis
824
Characterization of the buffers in real Internet paths
825
Characterization of the bulk current injection calibration-jig for probe-model extraction
826
Characterization of the burst stabilization protocol for the RR/RR CICQ switch
827
Characterization of the cardiac response to Vagal Nerve Stimulation
828
Characterization of the cardiovascular autonomic influence through time frequency spectrum analysis
829
Characterization of the Cathode Spot
830
Characterization of the causal interactions between depolarization and repolarization temporal changes in unipolar electrograms
831
Characterization of the C-Band wideband satellite-to-indoor channel for navigation services
832
Characterization of the cell flow using burst scale probability algorithm
833
Characterization of the cell leakage of a stacked trench capacitor (STT) cell
834
Characterization of the cellular biomechanlcal responses caused on microprocessed substrates: effect of micropatterned cell adhesiveness and microelasticity gradient
835
Characterization of the central sulcus in the brain in early childhood
836
Characterization of the Channel-Shortening Effect on P-Type Poly-Si TFTs
837
Characterization of the chaos generated by semiconductor lasers subject to electro-optical and all-optical feedback
838
Characterization of the Chaotic Magnetic Particle Dynamics
839
Characterization of the Chaotic or Regular Nature of Dynamical Orbits: A New, Fast Method
840
Characterization of the charge transport uniformity of CdZnTe crystals for large-volume nuclear detector applications
841
Characterization of the chirp and intensity modulation properties of an SOA-MZI wavelength converter
842
Characterization of the chirp of silicon optical modulators
843
Characterization of the chirp properties of a monolithically-integrated widely-tunable all-optical wavelength converter (TAO-WC)
844
Characterization of the chronobiological signals based on the continuous wavelet transform
845
Characterization of the cinematic by the means of dynamical models
846
Characterization of the Clear-PEM breast imaging scanner performance
847
Characterization of the coil displacement in the LNE and metas watt balance experiments
848
Characterization of the colorectal cancer in a rabbit model using quantitative high-frequency endoscopic ultrasound
849
Characterization of the commercial textile electromagnetic shields based on free-space broadband measurements
850
Characterization of the Communication Patterns of Scientific Applications on Blue Gene/P
851
Characterization of the compact Hokuyo URG-04LX 2D laser range scanner
852
Characterization of the Complex Noise Transfer Function of a Modelocked Ti: sapphire Laser
853
Characterization of the complex noise transfer function of a modelocked Ti: Sapphire laser
854
Characterization of the complex permittivity of brain tissues up to 50 GHz utilizing a two-port microstrip test fixture
855
Characterization of the complex permittivity of thin films using a slow-wave coplanar strips resonator
856
Characterization of the complex ultrashort laser pulses by Dammann SHG FROG
857
Characterization of the conditional distribution of monopulse ratio for chi-square fluctuating targets and its exploitation for track initiation
858
Characterization of the conduction mechanisms in polycrystalline alumina
859
Characterization of the confidentiality of a green time reversal communication system: Experimental measurement of the spy BER sink
860
Characterization of the consistency of healthcare components using LDA
861
Characterization of the constrained capacity of multiple-antenna fading coherent channels driven by arbitrary inputs
862
Characterization of the contact between TiO/sub 2/ and PbS quantum dots
863
Characterization of the Coplanar Waveguide Step Discontinuity using the Transverse Resonance Method
864
Characterization of the Coronary Vascular Capacitance, Resistance, and Flow in Endocardium and Epicardium Based on a Nonlinear Dynamic Analog Model
865
Characterization of the correlation, SPM, ICA and specified-resolution wavelet methods in analysis of fMRI study with visual task
866
Characterization of the coverage uniformity of an antenna based on its far-field
867
Characterization of the creep constitutive behavior of SnAgCu solder in flip chip joints from the indentation creep testing
868
Characterization of the Critical Current Capabilities of Commercial REBCO Coated Conductors for an HTS Cable-in-Conduit Conductor
869
Characterization of the critical cycle length of a left atrial driver which causes right atrial fibrillatory conduction
870
Characterization of the Critical Density for Percolation in Random Geometric Graphs
871
Characterization of the Critical Sets of Quantum Unitary Control Landscapes
872
Characterization of the cross-talk SAR image produced by the cross-polarization in a single offset parabolic reflector
873
Characterization of the Cu/barrier metal interface for copper interconnects
874
Characterization of the cumulative effects of ultrawideband technology on the electromagnetic environment
875
Characterization of the curing properties of no-flow underfill and B-stage feasibility study for wafer level application
876
Characterization of the cyclic short-time variation of indoor power-line channels response
877
Characterization of the cytotoxic effect of high-intensity, 10-ns duration electrical pulses
878
Characterization of the data access behavior for TPC-C traces
879
Characterization of the default mode functional connectivity in normal aging and Alzheimer´s disease: An approach combining entropy-based and graph theoretical measurements
880
Characterization of the defect structure in acceptor- and donor-doped PZT ceramics
881
Characterization of the defects in oxide dispersion-strengthened iron alloy after helium ion irradiation
882
Characterization of the densification induced by electron-beam irradiation of ge-doped silica for the fabrication of integrated optical circuits
883
Characterization of the departure process of M/G/1 queue with heavy-tailed service time distribution
884
Characterization of the Depth Distribution and Electrical Activation and Deactivation of Ion Implanted Dopants in Silicon
885
Characterization of the DFB fiber laser resonator strength and α-parameter by response to external feedback
886
Characterization of the Dielectric and Pyroelectric Properties of Ferroelectric Material
887
Characterization of the dielectric endurance of reinforced recycled PET using electro-thermal aging test
888
Characterization of the dielectric properties of multiwalled carbon nanotubes (MWCNTs) /PEDOT:PSS nanocomposites
889
Characterization of the diffraction behavior of femtosecond pulses by hard-edge circular apertures via STARFISH technique
890
Characterization of the Digital Micromirror Devices
891
Characterization of the diode leakage current in advanced 0.12 /spl mu/m CMOS technology. (Does stress play a role?)
892
Characterization of the directional mobile radio channel in industrial scenarios, based on wideband propagation measurements
893
Characterization of the dispersion of a Rotman lens
894
Characterization of the Displacement Tolerance of QCA Interconnects
895
Characterization of the distortion of OFDM/OQAM modulations under frequency selective channels
896
Characterization of the distributed cavity phase shift in FO2 for improving the accuracy of SYRTE fountain clocks
897
Characterization of the distributed cavity phase shift in LNE-SYRTE FO2 fountain
898
Characterization of the Dose Effect in Secondary Electron Emission
899
Characterization of the downstream plasma in a microsecond conduction time POS
900
Characterization of the Dual-Active Bridge topology for high-power applications employing a duty-cycle modulation
901
Characterization of the Dynamic Absorption of Electroabsorption Modulators With Application to OTDM Demultiplexing
902
Characterization of the Dynamic Narrowband On-Body to Off-Body Area Channel
903
Characterization of the Dynamic Properties of Pneumatic Muscle Actuators
904
Characterization of the dynamic range of a single aperture communications system
905
Characterization of the Dynamical Processes in All-Optical Signal Processing Using Semiconductor Optical Amplifiers
906
Characterization of the dynamical response of receivers to fading
907
Characterization of the dynamics and interactions of domain names and name server
908
Characterization of the dynamics of semiconductor lasers using optical modulation
909
Characterization of the ear-to-ear propagation channel using microstrip dipole antennas
910
Characterization of the E-commerce Storage Subsystem Workload
911
Characterization of the economic impact of stranded bandwidth in fixed OADM relative to ROADM networks
912
Characterization of the EDGES receiver and its capability for constraining the EoR
913
Characterization of the effect of small perturbations on the optical modes in high Q microdisk cavities
914
Characterization of the effect of small perturbations on the optical modes in high Q microdisk cavities
915
Characterization of the effect of TiN oxidation on via resistance
916
Characterization of the effectiveness of carbon incorporation in SiGe for the elimination of parasitic energy barriers in SiGe HBTs
917
Characterization of the Effects of CW and Pulse CW Interference on the GPS Signal Quality
918
Characterization of the effects of the human head on communication with implanted antennas
919
Characterization of the elastic properties of metrological quartz crystal resonators using acoustic force microscopy
920
Characterization of the electrical performance of PGA Packages
921
Characterization of the electrical resistance of carbon-black-filled silicone: Application to a flexible and stretchable robot skin
922
Characterization of the electrically excited flexion withdrawal response used in restoration of locomotion in spinal cord injured paraplegics
923
Characterization of the electro-absorption modulator chirp using modulated-transmission spectroscopy
924
Characterization of the Electrochemical Behavior of Gastrointestinal Fluids Using a Multielectrode Sensor Probe
925
Characterization of the electrode erosion by spectrum analysis at low pressure gas-discharge lamps
926
Characterization of the electrode-skin impedance of textile electrodes
927
Characterization Of The Electroencephalogram As A Chaotic Time Serms
928
Characterization of the electromagnetic disturbances in the customer premises
929
Characterization of the electromagnetic environment in a hospital
930
Characterization of the electromagnetic environment in a hospital and propagation study
931
Characterization of the electromagnetic environment in aircraft cavities excited by internal and external sources
932
Characterization of the electromagnetic environment with the installation of industrial rectifiers
933
Characterization of the electromagnetic response of maize crops with polarimetric backscatter profiles
934
Characterization of the electro-mechanical behavior of zirconia-rich PZT ceramics
935
Characterization of the electron mobility in the inverted <100> Si surface
936
Characterization of the electronic mobility dependence on frequency and bias in AsGa devices
937
Characterization of the electrostatic discharge induced interface traps in metal-oxide-semiconductor field-effect transistors
938
Characterization of the electrostriction-induced acoustic response in optical fibers and its consequences for soliton transmission systems
939
Characterization of the eLine ASICs in prototype detector systems for LCLS
940
Characterization of the EM environment of railway spot communication systems
941
Characterization of the EMC Performances of the CAN Bus in a Typical System Bus Architecture for Small Satellites
942
Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]
943
Characterization of the EMP response of cable and shelter network
944
Characterization of the energy radiation pattern of a transient antenna array: Eigen-analysis and bounds
945
Characterization of the energy spectral density for a potash mine
946
Characterization of the ePix10k camera at SSRL and LCLS
947
Characterization of the error resiliency of power grid substation devices
948
Characterization of the Evolution of IC Emissions After Accelerated Aging
949
Characterization of the Excess Noise Conversion From Optical Relative Intensity Noise in the Photodetection of Mode-Locked Lasers for Microwave Signal Synthesis
950
Characterization of the expansion of an aluminum laser-induced plasma in ambient air by fast photography
951
Characterization of the exposure induced by a wireless network
952
Characterization of the extremely low frequency (ELF) electric field interactions with living tissue
953
Characterization of the Far-Field Environment of Antennas Located Over a Ground Plane and Implications for Cellular Communication Systems
954
Characterization of the fast wave in cancellous bone using the Bayesian probability theory approach
955
Characterization of the fat content of beef using microwave techniques
956
Characterization of the fatigue properties of bonding wires
957
Characterization of the faulted behavior of digital computers and fault tolerant systems
958
Characterization of the Field-Dependent Permittivity of Nonlinear Ferroelectric Films Using Tunable Coplanar Lines
959
Characterization of the Finline Step Discontinuity on Anisotropic Substrates
960
Characterization of the First FBK High-Density Cell Silicon Photomultiplier Technology
961
Characterization of the First Prototypes of Silicon Photomultiplier Fabricated at ITC-irst
962
Characterization of the flexion-withdrawal reflex for use in stimulation-assisted SCI gait
963
Characterization of the Flip Capacitor Filter for the XFEL-DSSC Project
964
Characterization of the floating phenomena for flip chip processing with no flow underfills
965
Characterization of the Flow Field inside a Rotating, Rib-Roughened, U-Shaped Channel using Particle Image Velocimetry
966
Characterization of the fluorescent lifetime of doped fibers by measuring the frequency transfer function
967
Characterization of the fourier spatial frequencies of time resolved laser speckle from interacting high density lipoprotein disks
968
Characterization of the Freesound online community
969
Characterization of the frequency dispersion of transconductance and drain conductance of GaAs MESFET
970
Characterization of the frequency pulling by magnetic field oscillations of the Brazilian 133Cs atomic-frequency standard
971
Characterization of the frequency response of electrodes in arc furnaces for silicon production
972
Characterization of the frequency stability of frequency-hopping sources
973
Characterization of the fringing window of a magnetic core
974
Characterization of the fundamental polarization modes of a silicon waveguide in the far field
975
Characterization of the Gate SiO2 /Channel-Si Interface in Thin-gate SiO2 MOSFETs by Low Frequency Noise and Charge Pumping Techniques
976
Characterization of the GLDT laser range finder
977
Characterization of the gliding arc device for industry applications
978
Characterization of the GPRS radio interface by means of a statistical model
979
Characterization of the ground impedance of rural MV lines on Hydro-Quebec´s system
980
Characterization of the Growth of Water Trees
981
Characterization of the growths of UV-induced birefringence in effective mode index and index modulation in fiber Bragg gratings
982
Characterization of the H3D ASIC Readout System and 6.0 cm ^{3} 3-D Position Sensitive CdZnTe Detectors
983
Characterization of the handover dwell time in mobile cellular networks
984
Characterization of the Haptic Shape-Weight Illusion with 3D Objects
985
Characterization of the HDP-CVD oxide as interlayer dielectric material for sub-quarter micron CMOS
986
Characterization Of The Head-Disc Interface For Proximity Recording
987
Characterization of the head-disk interface at nanometer dimensions
988
Characterization of the head-disk interface for proximity recording
989
Characterization of the heart muscle aniosotropy using ultrasound Nakagami imaging
990
Characterization of the heat loading of Nd-doped YAG, YOS, YLF, and GGG excited at diode pumping wavelengths
991
Characterization of the Hermite indices of the pair (A+BF, B)
992
Characterization of the HEVC Coding Efficiency Advance Using 20 Scenes, ITU-T Rec. P.913 Compliant Subjective Methods, VQM, and PSNR
993
Characterization of the High Frequency Performance of 28-nm UTBB FDSOI MOSFETs as a Function of Backgate Bias
994
Characterization of the High-Efficiency Neutron Detector Array (HENDA)
995
Characterization of the Hokuyo UBG-04LX-F01 2D laser rangefinder
996
Characterization of the Hot Carrier Related MOS Parameters Using Negative Feedback Circuits in VLSI CMOS
997
Characterization of the hot-cutting defects produced by the processing of alumina green tape
998
Characterization of the Hourly Load Curve in the Colombian Electricity Market
999
Characterization of the human cortex in MR images through the image foresting transform
1000
Characterization of the Hurwitz Region for Systems with Parametric Uncertainty