ليست عنوان مقالات لاتين فني مهندسي Characterization of Electrodeposited Magnetic Multilayers Characterization of low-dielectric-constant SiCON films grown by PECVD under different RF power

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1

Characterization of Electrodeposited Magnetic Multilayers

2

Characterization of electrodeposited multiwall carbon nanotube films on silicon substrates

3

Characterization of electrodynamic screen performance for dust removal from solar panels and solar hydrogen generators

4

Characterization of Electrodynamic Screen Performance for Dust Removal from Solar Panels and Solar Hydrogen Generators

5

Characterization of electroless copper as a seed layer for sub-0.1 /spl mu/m interconnects

6

Characterization of Electrolytic Pot Signal by Autoregressive Model with Exogenous Input

7

Characterization of electromagnetic backscatter from moving tracked vehicles

8

Characterization of electromagnetic band-gaps composed of multiple periodic tripods with interconnecting vias: concept, analysis, and design

9

Characterization of electromagnetic fields in complex systems through phase-space techniques

10

Characterization of electromagnetic leakages throughout the connector shell

11

Characterization of electromagnetic propagation effects in the human head and its application to Deep Brain Implants

12

Characterization of electromagnetic propagation in multilayered structures using the Finite-Difference Time Domain method

13

Characterization of Electromagnetic Properties of Molded Interconnect Device Materials

14

Characterization of electromagnetic properties of textile materials for the use in wearable antennas

15

Characterization of electromagnetic radiation absorber materials

16

Characterization of electromagnetic scattering by a plasma anisotropic spherical shell

17

Characterization of electromagnetic shield

18

Characterization of Electromagnetic Software

19

Characterization of electromagnetic systems using Pade´ approximation with expansion at infinity

20

Characterization of electromagnetically induced transparency in Rydberg state of ⁸⁷Rb

21

Characterization of electromechanical coupling coefficients of piezoelectric films using composite resonators

22

Characterization of electromechanical properties of relaxor-PT piezoelectric single crystals

23

Characterization of Electromigration Parameters on Single Device

24

Characterization of electromigration under bidirectional (BC) and pulsed unidirectional (PDC) currents

25

Characterization of electron beam and gamma irradiation in light emitting diodes

26

Characterization of electron beams for modulated electron beam radiotherapy

27

Characterization of electron bunches from a diamond current amplifier

28

Characterization of electron cyclotron resonance plasma oxide for sub-half micron technology

29

Characterization of electron density depletion in a cathode spot driven dusty plasma for reentry vehicle communications applications

30

Characterization of electron device breakdown under nonlinear dynamic operation

31

Characterization of electron emitters for miniature X-ray sources

32

Characterization of electron flow in negative- and positive-polarity linear-induction accelerators

33

Characterization of electron surface scattering in single crystalline metallic nanowires

34

Characterization of electron traps in AlInAs treated with plasma

35

Characterization of electron traps in ion-implanted GaAs MESFET´s on undoped and Cr-doped LEC semi-insulating substrates

36

Characterization of Electron Traps in Si-Capped Ge MOSFETs With $\\hbox {HfO}_{2}/\\hbox {SiO}_{2}$ Gate Stack

37

Characterization of electronic charged states of self-aligned coupled Si quantum dots by AFM/KFM probe technique

38

Characterization of Electronic Charged States of Si-based Quantum Dots for Multi-valued MOS Memories

39

Characterization of electronic converters by time-varying harmonic phasors and waveforms

40

Characterization of electronic materials using fundamental parameter micro X-ray fluorescence

41

Characterization of electronic transport through Si dot with Ge core using AFM conducting probe

42

Characterization of electron-irradiated biaxially-oriented polypropylene films

43

Characterization of electrooptic polymer applied to microwave sensing

44

Characterization of electrophoretically deposited dielectric thin films for electronics applications

45

Characterization of Electrophotographic Print Artifacts: Banding, Jitter, and Ghosting

46

Characterization of electrospun zinc oxide nanofibers

47

Characterization of electrostatically coupled microcantilevers

48

Characterization of Electrostriction Nonlinearity in a Standard Single-Mode Fiber Based on Coherent Detection and Cross-Phase Modulation

49

Characterization of electrostriction nonlinearity in a standard single-mode fiber based on cross-phase modulation

50

Characterization of electrothermal actuation with nanometer and microradian precision

51

Characterization of electrothermal actuators and arrays fabricated in a four-level, planarized surface-micromachined polycrystalline silicon process

52

Characterization of electro-thermal aging of a filled epoxy resin

53

Characterization of electro-thread for wearable antenna applications

54

Characterization of elevated CPW on different substrates for high speed digital interconnects

55

Characterization of elliptic core fiber acousto-optic tunable filters operated in the single mode and the multi-mode range

56

Characterization of elliptic dark hollow optical beams

57

Characterization of elliptically polarized antenna by complex effective length

58

Characterization of EM downhole-to-surface communication links

59

Characterization of EM effects in RF/microwave integrated circuits

60

Characterization of EM Emission During the Operation of Solid and Plasma Armature Rail Launchers

61

Characterization of em sea clutter with α-stable distribution

62

Characterization of embedded applications for decoupled processor architecture

63

Characterization of embedded passives using macromodels in LTCC technology

64

Characterization of embedded resistors for high frequency wireless applications

65

Characterization of embedded RF elements on a 3D integrated circuit

66

Characterization of embroidered dipole-type RFID tag antennas

67

Characterization of EMC environments using numerical simulations

68

Characterization of EMC sensors in a spherical near-field facility

69

Characterization of EMG Patterns From Proximal Arm Muscles During Object- and Orientation-Specific Grasps

70

Characterization of EMI effects in communication data link system in the presence of high-power radar radiation

71

Characterization of EMI filters based on metamaterials

72

Characterization of EMI performance for hard and soft-switched inverters

73

Characterization of EMI/RFI in Commercial and Industrial Electrical Systems

74

Characterization of emission lifetime of nitrogen-vacancy centres in nanodiamonds

75

Characterization Of Emission Patterns In Field Emitter Array Cathodes

76

Characterization of emission regimes in a 1.5 µm high brightness

77

Characterization of emitting carbon films

78

Characterization of emphysema in low dose computed tomography images using maximum likelihood estimation of the scale exponent

79

Characterization of Encapsulants for High-Voltage High-Temperature Power Electronic Packaging

80

Characterization of encapsulants for high-voltage, high-temperature power electronic packaging

81

Characterization of Encapsulated Micromechanical Resonators Sealed and Coated With Polycrystalline SiC

82

Characterization of encapsulation and metal interconnects of solar cells by terahertz techniques

83

Characterization of endothelial cells using electrochemical impedance spectroscopy

84

Characterization of Energy Consumption of a 802.11g Device

85

Characterization of energy storage devices for constant power applications

86

Characterization of enhanced field emission from HfC-coated Si emitter arrays through parameter extraction

87

Characterization of enhanced low dose rate sensitivity (ELDRS) effects using Gated Lateral PNP transistor structures

88

Characterization of Enhanced Stress Memorization Technique on nMOSFETs by Multiple Strain-Gate Engineering

89

Characterization of Enterprise Architecture quality attributes

90

Characterization of entropy measures against data loss: Application to EEG records

91

Characterization of Environment Conditions with Metric Temporal Feature Logic

92

Characterization of ENVISAT multipolarization SAR data with bidimensional statistics

93

Characterization of EOS induced defects on submicron devices using 2D spectral imaging

94

Characterization of epitaxial film silicon solar cells grown on seeded display glass

95

Characterization of epitaxial Hg/sub 1-x/Cd/sub x/Te layers using the far infrared optical method

96

Characterization of epitaxial Si/sub 1-y/C/sub y/ layers on Si[001] grown by gas-source molecular beam epitaxy

97

Characterization of epitaxial silicon thin film solar cells on SSP substrate

98

Characterization of epitaxially grown YBa₂Cu₃O_7-δ thin films produced using pulsed ion-beam evaporation

99

Characterization of epoxy microcomposite and nanocomposite materials for power engineering applications

100

Characterization of epoxy resin SU-8 film using thickness-shear mode (TSM) resonator

101

Characterization of epoxy resin surfaces exposed to partial discharges in SF₆ and N₂-SF₆ mixtures

102

Characterization of epoxy/BaTiO3 composite embedded capacitors for high frequency behaviors

103

Characterization of equalized 10-Gb/s multimode fibre LAN links using transverse 7-tap analog FIR filter in 0.13-μm CMOS

104

Characterization of Equalized and Repeated Interconnects for NoC Applications

105

Characterization of equilibria for the degraded Gaussian broadcast and sum power MAC channels

106

Characterization of Equilibrium and Stability in Power Systems

107

Characterization of Er^3+ Doped Tellurite Glasses Used in Long Optical Communication

108

Characterization of Er-Added YBCO Coated Conductor Produced by Metal Organic Deposition (MOD)

109

Characterization of erbium-doped fibers and application to modeling 980-nm and 1480-nm pumped amplifiers

110

Characterization of erbium-doped nanoparticles in transparent glass ceramic optical fibres

111

Characterization of erbium-silicided Schottky diode junction

112

Characterization of Er-doped ZnO nanorod arrays for broadband antireflection

113

Characterization of Ergodic Hidden Markov Sources

114

Characterization of Eroded Boron Atoms in the Plume of a Hall Thruster

115

Characterization of eROSITA PNCCDs

116

Characterization of error correction and detection in a general transmission system

117

Characterization of Error Diffusion Halftone Images based on Subband Decompostion

118

Characterization of error in a Near-Field Electromagnetic Ranging (NFER) Real-Time Location System (RTLS)

119

Characterization of error sequences in UHF digital mobile radio channels

120

Characterization of errors in compositing panoramic images

121

Characterization of errors in vector wind retrievals from satellite-based polarimetric microwave radiometer measurements

122

Characterization of Error-Tolerant Applications when Protecting Control Data

123

Characterization Of ESD Damaged Magnetoresistive Recording Heads

124

Characterization of ESD risks in an assembly process by using component-level CDM withstand voltage

125

Characterization of ESD tweezers for use with magnetoresistive recording heads

126

Characterization of etched and Unetched Vertically Aligned Carbon Nanofibers (VACNFs) using Atomic Force Microscopy

127

Characterization of etched tracks and nanotubules by ion transmission spectrometry

128

Characterization of ethylene-propylene-diene terpolymer based electrical insulation

129

Characterization of European lacquers by terahertz (THz) reflectometric imaging

130

Characterization of evanescent ultrasonic waves in a band gap of a 1D phononic crystal

131

Characterization of evaporated Cr-SiO cermet films for resistive-gate CCD applications

132

Characterization of evaporated solid-phase crystallized silicon thin-film solar cells on glass

133

Characterization of event related potentials using information theoretic distance measures

134

Characterization of Evertroll nickel-zinc batteries

135

Characterization of evoked and induced activity in EEG and assessment of intertrial variability

136

Characterization of excess electrical noise in Al-thin films

137

Characterization of excess noise induced by external reflection in 1.55 μm gain-coupled DFB lasers of absorptive grating type

138

Characterization of exchange coupling at NiFe-CoPt interface

139

Characterization of Exchange-Biased CoFe/(Co,Fe)O Thin Films by Magnetometry and Ferromagnetic Resonance Techniques

140

Characterization of excimer laser annealing of ion implanted Si

141

Characterization of Excimer Laser Beam Parameters

142

Characterization of excimer lasers for application to lenslet array

143

Characterization of excitons in wurtzite GaN quantum wells under valence band mixing, strain, and piezoelectric field

144

Characterization of experimental textured ZnO:Al films for thin film solar cell applications and comparison with commercial and plasmonic alternatives

145

Characterization of Expert Drivers´ Last-Second Braking and Its Application to a Collision Avoidance System

146

Characterization of Exploding Film Plasmas Using Emission Spectroscopy

147

Characterization of Explosively Driven Ferroelectric Generator Material

148

Characterization of exponential divergence of the Kalman filter for time-varying systems

149

Characterization of Extended and Simplified Intelligent Water Drop (SIWD) Approaches and Their Comparison to the Intelligent Water Drop (IWD) Approach

150

Characterization of extended objects with the D.O.R.T. method

151

Characterization of extended width optical dipole antennas

152

Characterization of External Cavity Laser with Thin Film Narrow Bandpass Filter

153

Characterization of Extracellular Matrix (ECM) Produced by MC3T3 Cells Using Thickness Shear Mode (TSM) Resonators

154

Characterization of extracting Cr, Ni and Fe from the sludge of stainless steel acid washing wastewater with ammonia and sulfuric acid

155

Characterization of extracting Cu from the circuit plank sludge with sulfuric acid

156

Characterization of Extraordinary Transmission for a Single Subwavelength Slit: A Fabry-Pérot-Like Formula Model

157

Characterization of extremal epidemic networks with diffusion characters

158

Characterization of extremely low contact resistances on modulation-doped FET´s

159

Characterization of extrusion formation during high temperature anneal

160

Characterization of fabrication process noises for 32nm NMOS devices

161

Characterization of Facade Regularities in High-Resolution SAR Images

162

Characterization of fading on fixed wireless channels between 200 MHz and 2 GHz in suburban macrocell environments

163

Characterization of failures in an IP backbone

164

Characterization of Failures in an Operational IP Backbone Network

165

Characterization of far electric field waveforms produced by rocket-triggered lightning

166

Characterization of fast 4.5 kV SiC p-n diodes

167

Characterization of fast and power efficient optical OFDM transmission system based on Hartley transform

168

Characterization of Fast Cure Anisotropic Conductive and Non-Conductive Adhesives

169

Characterization of fast fading vector channels for multi-antenna communication systems

170

Characterization of fast fading wireless vector channels

171

Characterization of Fast Flashover of External Insulation

172

Characterization of Fast Relaxation During BTI Stress in Conventional and Advanced CMOS Devices With $\\hbox {HfO}_{2}/\\hbox {TiN}$ Gate Stacks

173

Characterization of fast rise-time transients when energizing large 13.2 kV motors

174

Characterization of fast temporal photoreponse in a broadband graphene photodetector

175

Characterization of fast-response and low-noise poly si uncooled far infrared sensor

176

Characterization of fatigue resistance property of photochrome materials for optical storage devices

177

Characterization of Fault Current Patterns of 3-Phase MFCL Under 3 Lines-to-Ground Fault

178

Characterization of Fault Recovery through Fault Injection on FTMP

179

Characterization of FBGs written in HiBi IEC fibre for multiparameter sensors

180

Characterization of FCC Compliance UWB Pulse Response of the UWB Low Noise Amplifier

181

Characterization of Fe/W spin-polarized tips by means of holographic TEM and spin-polarized STS of optically pumped p-GaAs

182

Characterization of Fe/W spin-polarized tips by means of holographic TEM and spin-polarized-STS of optically pumped p-GaAs

183

Characterization of Fe3O4 nano particles for biomedical applications

184

Characterization of fear conditioning and fear extinction by analysis of electrodermal activity

185

Characterization of feasible controls for Petri nets with unobservable transitions

186

Characterization of Feasible LMPs: Inclusion of Losses and Reactive Power

187

Characterization of femtosecond laser filamentation in soda-lime glass

188

Characterization of Ferrimagnetic Garnets for MSW-Optical Diffraction

189

Characterization of ferrite materials used as a core for multi-phase coupled inductors

190

Characterization of ferrite surface mount bead using S-parameters

191

Characterization of ferroelectric Ba0.6Sr0.4TiO3 thin films on different substrates for reconfigurable microwave application

192

Characterization of ferroelectric BST MIM capacitors up to 65 GHz for a compact phase shifter at 60 GHz

193

Characterization of ferroelectric capacitors over wide frequency range

194

Characterization of ferroelectric thin-film planar microwave devices using the method of line (MoL)

195

Characterization of ferromagnetic Co-implanted rutile TiO₂(110)

196

Characterization of ferromagnetic materials for microelectronics applications over a wide range of frequencies

197

Characterization of ferromagnetic wires for self-sensing materials

198

Characterization of ferromagnetics as working in the parametrically excited circuits

199

Characterization of fetal heart rate irregularity using approximate entropy and wavelet filtering

200

Characterization of fetal heart rate using approximate entropy

201

Characterization of few mode fibers by OLCI technique

202

Characterization of FHSS in Wireless Personal Area Networks

203

Characterization of fiber accumulation fouling in fine pitched heat sinks

204

Characterization of Fiber Bragg Grating as optical temperature sensor for pipeline water leakage inspection

205

Characterization of Fiber Bragg Grating Inscribed in Few-Mode Silica-Germanate Fiber

206

Characterization of fiber Bragg grating sensor for pH measurement

207

Characterization of Fiber Bragg Gratings by Phase-Sensitive Optical Low-Coherence Reflectometry

208

Characterization of fiber Bragg gratings by use of optical coherence-domain reflectometry

209

Characterization of fiber Bragg gratings using spectral interferometry based on minimum-phase functions

210

Characterization of Fiber Nonlinearity and Analysis of Its Impact on Link Capacity Limit of Two-Mode Fibers

211

Characterization of fiber optic microwave link with monolithic integrated optoelectronic upconverter

212

Characterization of Fiber Optics Gyro and Noise Compensation Using Discrete Wavelet Transform

213

Characterization of fiber wave retarders for interferometric fiber-optic current sensors

214

Characterization of fibre Bragg gratings using the interferometric side diffraction technique with an ultraviolet light source

215

Characterization of field emission cathodes based on different diamond materials

216

Characterization of field emission properties of β-Na0.33V2O5 single crystalline nanowires

217

Characterization of field emission properties of glass frit-based CNT pastes prepared using high-energy milling

218

Characterization of field emitter arrays (FEAs) for a twystrode amplifier

219

Characterization of field emitter arrays for compact neutron sources utilizing field ionization

220

Characterization of field emitter arrays operating in a traveling wave tube amplifier

221

Characterization of field exposed thin film modules

222

Characterization of Field Penetration in Superconducting Multilayers Samples

223

Characterization of field-aged 400 kV silicone rubber composite insulators

224

Characterization of field-aged nonceramic insulators

225

Characterization of Field-Oxide-Transistor-Instabilities Caused by SOG-Planarization

226

Characterization of fields in the proximity of vehicle mounted sources over the real ground

227

Characterization of filled skutterudite LaFe₃CoSb₁₂ thin films prepared by laser ablation

228

Characterization of film uniformity in LPCVD TEOS vertical furnace

229

Characterization of Fine Metallic Wires for Wire-Array $Z$ -Pinch Experiments

230

Characterization of fine-pitch solder bump joint and package warpage for low K high-pin-count flip-chip BGA through Shadow Moiré and Micro Moiré techniques

231

Characterization of FinFET SRAM cells with asymmetrically gate underlapped bitline access transistors under process parameter fluctuations

232

Characterization of Finite Photonic Crystals

233

Characterization of Finite Photonic Crystals With Defects

234

Characterization of finite waveguide arrays using a new generalized scattering matrix approach

235

Characterization of finite-ground CPW reactive series-connected elements for innovative design of uniplanar M(H)MICs

236

Characterization of fire hazards of aged photovoltaic balance-of-systems connectors

237

Characterization of First and Second Order Statistics of Large Scale Fading Using Vehicular Sensors

238

Characterization of five CPV module technologies with the Helios 3198 solar simulator

239

Characterization of fixed wireless channels between 200 MHz and 2 GHz for intelligent grid applications in suburban macrocell environments

240

Characterization of flagella-templated silica nanotubes and their metallization

241

Characterization of Flash X-ray source and radiography results of newly developed KALI-30GW relativistic electron beam system

242

Characterization of flat outputs for LPV discrete-time systems: A graph-oriented approach

243

Characterization of flexible CMOS technology tranferred onto a metallic foil

244

Characterization of flexible hybrid transparent conductive films fabricated with silver nanowires and carbon nanotubes for organic solar cells

245

Characterization of flexible interconnects in mobile devices

246

Characterization of flexural and longitudinal acoustic waves in standard and photonic crystal fibres

247

Characterization of flicker noise contributions to the carrier-envelope phase stabilization of femtosecond lasers

248

Characterization of flicker noise in GaAs MESFET´s for oscillator applications

249

Characterization of flicker noise in GaN-based MODFET´s at low drain bias

250

Characterization of flicker noise in YBa₂Cu₃O _7-δ bicrystal junctions in weak magnetic fields

251

Characterization of flip chip assembly utilizing wafer applied underfill

252

Characterization of Flip Chip Bump Failure Mode by using High Frequency 230MHz MP and CP4 Transducer

253

Characterization of Flip Chip Bump Interconnects

254

Characterization of flip chip interconnect failure modes using high frequency acoustic micro imaging with correlative analysis

255

Characterization of flip chip microjoins up to 40 GHz using silicon carrier

256

Characterization of flip-chip CMOS ASIC simultaneous switching noise on multilayer organic and ceramic BGA/CGA packages

257

Characterization of flip-chip interconnection for high speed digital transmission

258

Characterization of flip-chip interconnects up to millimeter-wave frequencies based on a nondestructive in situ approach

259

Characterization of flocs in coagulation processes in Taylor-Couette flow by PIV

260

Characterization of Flow in Intravenous Catheters

261

Characterization of Flow in Intravenous Infusion Systems

262

Characterization of flow in sub-scale cable-in-conduit conductors

263

Characterization of flow through an array of cylinders modeling Marine Hydrokinetic support structures

264

Characterization of Flowing Blood Optical Property Under Various Fibrinogen Levels Using Optical Coherence Tomography

265

Characterization of fluctuation statistics of radar clutter for Indian terrain

266

Characterization of fluid flow properties at the basilar apex

267

Characterization of fluid resistance in nanostructured TiO2 (NST) film

268

Characterization of fluor concentration and geometry in organic scintillators for in situ beta imaging

269

Characterization of fluor concentration and geometry in organic scintillators for in situ beta imaging

270

Characterization of Fluorescence Lifetime of Photofrin and Delta-Aminolevulinic Acid Induced Protoporphyrin IX in Living Cells Using Single- and Two-Photon Excitation

271

Characterization of fluorine-doped thin-multiwalled carbon nanotubes by terahertz spectroscopy

272

Characterization of flux reversal machine (FRM) in low speed (direct) servo drives-the pole-PM configuration

273

Characterization of Flux Rotation and of the Ensuing Core Losses in the Stator of Induction Motors

274

Characterization of flux-grown PZN-PT single crystals for high-performance piezo devices

275

Characterization of fog by liquid water content for use in free space optics

276

Characterization of Force and Torque Interactions During a Simulated Transgastric Appendectomy Procedure

277

Characterization of Forced Vibration for Difference Inclusions: A Lyapunov Approach

278

Characterization of forest recovery from fire using Landsat and SAR data

279

Characterization of forests in Western Sayani Mountains, Siberia from SAR data

280

Characterization of forward scattering parameters from an arbitrarily shaped cylinder by near-field probing

281

Characterization of forward-wave interaction in a frequency tunable gyrotron

282

Characterization of four states polarization flipper for single photon application

283

Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory

284

Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory

285

Characterization of four-wave mixing in electroabsorption modulator and its application to high-speed optical demultiplexing

286

Characterization of FPGA-master ARM communication delays in Cyclone V devices

287

Characterization of fractional photothermolysis and visualization of microthermal zone with optical coherence tomography

288

Characterization of fractionated electrograms using a novel time-frequency based algorithm

289

Characterization of fracture surface by polarimetric borehole radar

290

Characterization of free falling drops inside a microwave cavity

291

Characterization of free-carrier nonlinearities in porous silicon waveguides

292

Characterization of freeze-dried pharmaceutical product structures by an FFT-imaging approach

293

Characterization of frequency conversion crystals for the implementation of a 1-THz bandwidth on the OMEGA laser

294

Characterization of frequency dependent behavior of wideband systems interference

295

Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure

296

Characterization of Frequency Drift of Sampled-Grating DBR Laser Module Under Direct Modulation

297

Characterization of Frequency Fluctuations by Crosscorrelations and by Using Three or More Oscillators

298

Characterization of frequency response functions for nonlinear convergent systems

299

Characterization of Frequency Stability

300

Characterization of frequency stability in precision frequency sources

301

Characterization of Frequency Stability: A Transfer Function Approach and Its Application to Measurements via Filtering of Phase Noise

302

Characterization of Frequency Stability: Analysis of the Modified Allan Variance and Properties of Its Estimate

303

Characterization of Frequency Stability: Bias Due to the Juxtaposition of Time-Interval Measurements

304

Characterization of Frequency Stability: Effect of RF Filtering

305

Characterization of frequency stability: frequency-domain estimation of stability measures

306

Characterization of Frequency Stability: Uncertainty Due to the Autocorrelation of the Frequency Fluctuations

307

Characterization of Frequency Stability: Uncertainty due to the Finite Number of Measurements

308

Characterization of frequently sampled intravenous glucose tolerance test using scaling and sensitivity analysis of MINMOD

309

Characterization of Fricke-gel layers for absolute dose measurements in radiotherapy

310

Characterization of friction and speed effects and methods for detection of cochlear implant electrode tip fold-over

311

Characterization of friction force dynamics

312

Characterization of fritting phenomena on Al electrode for low contact force probe card

313

Characterization of front and back Si-SiO₂ interfaces in thick- and thin-film silicon-on-insulator MOS structures by the charge-pumping technique

314

Characterization of front-end read-out electronics of thin-film on ASIC

315

Characterization of Fruit juices treated with Electrical Pulses

316

Characterization of full surface roughness in agricultural soils using groundbased LiDAR

317

Characterization of fully depleted SOI transistors after removal of the silicon substrate

318

Characterization of Fully Embedded RF Inductors in Organic SOP Technology

319

Characterization of functional biointerface on silicon nanowire MOSFET

320

Characterization of functional layers of CdTe crystals subjected different surface processing

321

Characterization of Functional Layers of CdTe Crystals Subjected to Different Surface Treatments

322

Characterization of functional software requirements space: The law of requirements taxonomic growth

323

Characterization of fundamental parameters of a semiconductor laser with an injected optical probe

324

Characterization of fused-silica optical fibers delivery high- peak power YAG laser beam

325

Characterization of fused-silica optical fibers delivery high-peak power YAG laser beam

326

Characterization of fuzzy integrals viewed as aggregation operators

327

Characterization of FWM in EAM using picosecond pulses and its application to high-speed optical signal processing

328

Characterization of FWM-induced crosstalk for WDM operation of a fiber-optical parametric amplifier

329

Characterization of gm-dispersion and its impact on linearity of AlGaN/GaN HEMTs for microwave applications

330

Characterization of GaAs and InGaAs double-quantum well heterostructure FETs

331

Characterization of GaAs devices by a versatile pulsed I-V measurement system

332

Characterization of GaAs FET´s in Terms of Noise, Gain, and Scattering Parameters through a Noise Parameter Test Set

333

Characterization of GaAs integrated circuits by direct electro-optic sampling

334

Characterization of GaAs MESFET gate capacitances

335

Characterization of GaAs PN junction bonded on selenium sulphide (SeS₂) treated Si substrates

336

Characterization of GaAs Schottky-read IMPATT diodes

337

Characterization of GaAs(001) step-terraced morphology formation

338

Characterization of GaAs/Al/sub x/Ga/sub 1-x/As structure using scanning photoluminescence

339

Characterization of GaAs/AlGaAs mid-infrared emitters

340

Characterization of GaAsSb/GaAs quantum wells for 1.3 /spl mu/m VCSELs

341

Characterization of gadolinium via the temporal and spatial evolution of emissions from laser-created plasmas

342

Characterization of Ga-doped ZnO nanowires grown by thermal chemical vapor deposition

343

Characterization of gain- and index-guided InGaN multiple quantum well laser diodes

344

Characterization of gain dynamics in InAs/InP 1550 nm quantum dash lasers and optical amplifiers u ing spectrally resolved optical modulation and cross gain modulation

345

Characterization of Gain Enhanced In-Field Defects in Digital Imagers

346

Characterization of GaInP avalanche transit time device in millimeter-wave frequencies

347

Characterization of Gain-Switched Pulses From 1.55- $\\mu$ m VCSEL

348

Characterization of gait abnormalities in Parkinson´s disease using a wireless inertial sensor system

349

Characterization of gait dynamics using fractal analysis for normal and Parkinson disease patients

350

Characterization of Galileo signal correlation losses caused by non linear power amplification with memory

351

Characterization of GaN and GaAs FETs through a new pulsed measurement system

352

Characterization of GaN and GaAs FETs through a new pulsed measurement system

353

Characterization of GaN cantilevers fabricated with GaN-on-silicon platform

354

Characterization of GaN HEMT Low-Frequency Dispersion Through a Multiharmonic Measurement System

355

Characterization of GaN HEMTs for integrated supply modulator

356

Characterization of GaN MOSFETs on AlGaN/GaN Heterostructure With Variation in Channel Dimensions

357

Characterization of GaN thin films on HVPE GaN templates

358

Characterization of GaN/InGaN hetero-structures by Raman spectroscopy, PL and CL

359

Characterization of GaN-based HEMTs as varactor diode devices

360

Characterization of GaN-based HEMTs as varactor diode devices

361

Characterization of Gas Conductance of a Thermal Device With a V-Groove Cavity

362

Characterization of gas phase temperatures in dependence of particle presence in the flame spray pyrolysis process

363

Characterization of gas propagation and ventilation in battery rooms

364

Characterization of gas sensor with polyaniline film

365

Characterization of Gas Turbine Lean Blowout During Frequency Excursions in Power Networks

366

Characterization of gas turbine lean blowout during frequency excursions in power networks

367

Characterization of GaSb based VCSE and MQW lasers for 2.3 µm sensing application

368

Characterization of Gaseous Helium Flow Cryogen in a Flexible Cryostat for Naval Applications of High Temperature Superconductors

369

Characterization of gas-liquid two-phase flow pattern based on complexity measures analysis

370

Characterization of gate oxide degradation mechanisms in trench-gated power MOSFETs using the charge-pumping technique

371

Characterization of Gate-All-Around Si-NWFET, including Rsd, cylindrical coordinate based 1/f noise and hot carrier effects

372

Characterization of Gated Cold Cathode Fabrication Using Standing Thin-Film Technique

373

Characterization Of Gated Silicon Field Emission Micro Triodes

374

Characterization of Ge Films on Si(001) Substrates Grown by Nanocontact Epitaxy

375

Characterization of Ge28Sb12Se60 waveguides

376

Characterization of GEM detectors for application in the CMS muon detection system

377

Characterization of generation currents in solid-state imagers

378

Characterization of Generic and Personalized On-Screen Vibrotactile Patterns

379

Characterization of Geographic Distribution of Sensor Data by Opportunistic Network

380

Characterization of Geometric Leakage Current of $\\hbox {GeO}_{2}$ Isolation and Effect of Forming Gas Annealing in Germanium p-n Junctions

381

Characterization of Ghosting Defects in Electrophotographic Printers

382

Characterization of giant magnetoresistance effect based sensors and its applications

383

Characterization of GIS Spacers Exposed to SF6 Decomposition Products

384

Characterization of gliding arc discharge with auxiliary electrodes

385

Characterization of global irradiance sensors for use with PV Systems

386

Characterization of global near-nadir backscatter for remote sensing radar design

387

Characterization of Glottal Activity From Speech Signals

388

Characterization of Glowing Contacts using Optical Emission Spectroscopy

389

Characterization of glucose responsive phenylboronic acid-based hydrogel using optical coherence tomography

390

Characterization of GMR nonlinear response and the impact on BER in perpendicular magnetic recording

391

Characterization of GNSS measurement distortions due to antenna array processing in the presence of interference signals

392

Characterization of GNSS signal parameters under ionosphere scintillation conditions using software-based tracking algorithms

393

Characterization of Golay detector for the absolute power measurement of terahertz radiation

394

Characterization of gold and silver nanoparticles using it´s color image segmentation and feature extraction using fuzzy C-means clustering and generalized shape theory

395

Characterization of gold electrodes in phosphate buffered saline solution by impedance and noise measurements for biological applications

396

Characterization of GP30EVLF 30 Ah Lithium Iron Phosphate battery cells

397

Characterization of GPGPU Workloads via Correlation-Driven Kernel Similarity Analysis

398

Characterization of GPS PWV during flooding event over Keningau, Sabah

399

Characterization of G-R noise in GaAs/AlGaAs based double barrier resonant tunneling diodes

400

Characterization of Grain Boundaries in Cu(In,Ga)Se$_{\bf 2}$ Films Using Atom-Probe Tomography

401

Characterization of grain boundaries in YBa/sub 2/Cu/sub 3/O/sub y/ bicrystal junctions [SQUIDs]

402

Characterization of grain boundary properties in BaSi2 epitaxial films on Si(111) and Si(001) by Kelvin probe force microscopy

403

Characterization of granularity and redundancy for SRAMs for optimal yield-per-area

404

Characterization of graph-cover pseudocodewords of codes over F3

405

Characterization of graphene based field effect transistors using nano probing microscopy

406

Characterization of graphene electrode on nickel thin film for electrochemical sensing

407

Characterization of graphene photothermoelectric detector via two-wave mixing technique

408

Characterization of graphene-based inkjet printed samples on flexible substrate for wireless sensing applications

409

Characterization of graphene-based nano-antennas in the terahertz band

410

Characterization of graphite field emitter inflamed at high temperature

411

Characterization of grasp quality measures for evaluating robotic hands prehension

412

Characterization of green synthesized copper nanoparticles: A novel approach

413

Characterization of group I-rich growth during (Ag,Cu)(In,Ga)Se2 three-stage co-evaporation

414

Characterization of GSM Non-Line-of-Sight Propagation Channels Generated in a Reverberating Chamber by Using Bit Error Rates

415

Characterization of GSO:Ce phosphorescence after low-dose-rate gamma-ray irradiation

416

Characterization of GTOs for soft switching applications

417

Characterization of GTOs under different modes of zero current switching

418

Characterization of GTOs under different modes of zero current switching

419

Characterization of guided modes excited by periodically poled transducers on Si

420

Characterization of Gun Plasma Penetrated Into a Steady State Plasma Device

421

Characterization of gyrating electron beams with a pinhole analyzer

422

Characterization of gyromagnetic materials using a partially-filled waveguide technique

423

Characterization of H2QL antenna by simulation

424

Characterization of HA/βTCP 3-D printed scaffolds for custom bone repair applications

425

Characterization of Hadoop Jobs Using Unsupervised Learning

426

Characterization of hafnium and zirconium silicate films fabricated by plasma-enhanced chemical vapor deposition

427

Characterization of halogen-free package materials using cavity resonators

428

Characterization of Hamiltonian input-output systems

429

Characterization of handover initialization in cellular mobile radio networks

430

Characterization of handover orientations used by humans for efficient robot to human handovers

431

Characterization of hard and soft sources of information: A practical illustration

432

Characterization of hard- and soft-switching performance of high-voltage Si and 4H-SiC PiN diodes

433

Characterization of hard limits on performance of autocatalytic pathways

434

Characterization of Hard Piezoelectric Lead-Free Ceramics

435

Characterization of harmonic distortion and memory effects for RF power amplifiers based on volterra algorithm

436

Characterization of harmonics in a utility feeder with PV distributed generation

437

Characterization of hazardous gases released during ion implant processes

438

Characterization of HDP FSG process

439

Characterization of head and body phantoms for radiofrequency dosimetry, up to 6 GHz

440

Characterization of Head Overcoat for 1 Tb/in $^{2}$ Magnetic Recording

441

Characterization of head saturation

442

Characterization of head stability induced signal fluctuation

443

Characterization of head stability induced signal fluctuation

444

Characterization of healthy and epileptic brain EEG signals by monofractal and multifractal analysis

445

Characterization of Healthy and Pathological Voice Through Measures Based on Nonlinear Dynamics

446

Characterization of heart rate dynamics in infants as a probe for neural state and age

447

Characterization of Heart Rate Variability loss with aging and heart failure using Sample Entropy

448

Characterization of heart rate variability using a nonlinear model

449

Characterization of Heat Dissipation From a Microprocessor Chip Using Digital Interferometry

450

Characterization of heat transfer along a silicon nanowire using thermoreflectance technique

451

Characterization of Heat Treatment in Aluminum Based on Ultrasonic Determination of the Second and Third Order Elastic Constants

452

Characterization of heat-sinks of socketable LED modules using thermal transient testing

453

Characterization of heavy-ice deposition-thickness on flat metal targets for deuteron ion acceleration

454

Characterization of Heavy-Ion-Induced Single-Event Effects in 65 nm Bulk CMOS ASIC Test Chips

455

Characterization of He-plasma-assisted GSMBE InGaAsP

456

Characterization of hermetic wafer-level Cu-Sn SLID bonding

457

Characterization of hetero interfaces in InP/In₇₅Ga₂₅As/InP HFETs by means of digital signal processing of measured low frequency noise spectra

458

Characterization of heterojunction laser diodes by near field optical scanning microscopy: layer composition and mode structure analysis

459

Characterization of heterostructure barrier varactors for 255 GHz tripling operation

460

Characterization of heterostructure complementary MISFET circuits employing the new gate current model

461

Characterization of hexagonal rare-earth aluminates for application in flash memories

462

Characterization of HfO2 on Hafnium-Indium-Zinc Oxide HIZO layer metal-insulator-semiconductor structures deposited by RF sputtering

463

Characterization of HFOs in short and long duration discharges recorded from in-vivo MeCP2-deficient mice

464

Characterization of HfSiON Gate Dielectric with TiN Gate on Multi-Gate MOSFET

465

Characterization of Hg1-xCdxTe for high performance device applications by optical modulation spectroscopy

466

Characterization of High $J_{c}$ ${\\rm Nb}_{3}{\\rm Sn}$ Strands for the Series-Connected Hybrid

467

Characterization of High Altitude Turbulence for Air Force Platforms

468

Characterization of High Altitude Turbulence for Air Force Platforms

469

Characterization of High Altitude Turbulence for Air Force Platforms

470

Characterization of high average power Nd:GGG slab lasers

471

Characterization of high bit rate optical signals by low rate asynchronous sampling

472

Characterization of high count rate capability of Solar X-ray Monitor on-board Chandrayaan-2 — the second Indian mission to the Moon

473

Characterization of High Current RRP Wires as a Function of Magnetic Field, Temperature, and Strain

474

Characterization of high density spin valve recording heads by novel magnetic force microscope

475

Characterization of high electron mobility transistor under different temperatures

476

Characterization of high energy density capacitors under projected US Navy ETC gun operating conditions

477

Characterization of high fluence irradiations on advanced triple junction solar cells

478

Characterization of high frequency interconnects using finite difference time domain and finite element methods

479

Characterization of high frequency transducers with wire target and hydrophone

480

Characterization of High Grazing Angle X-Band Sea-Clutter Doppler Spectra

481

Characterization of high impedance surfaces using magnitude measurements

482

Characterization of high performance CNT-based TSV for radar applications

483

Characterization of high performance inverted delta-modulation-doped (IDMD) GaAs/InGaAs pseudomorphic heterostructure FET´s

484

Characterization of high permittivity GdScO3 films prepared by liquid injection MOCVD

485

Characterization of high permittivity substrates by a thickness resonance method

486

Characterization of high power IGBTs with sinewave current

487

Characterization of high power IGBTs with sinewave current

488

Characterization of high power laser systems Bragg grating stretchers

489

Characterization of High Power Microwave Radiation by an Axially Extracted Vircator

490

Characterization of high power multimode combiners

491

Characterization of high power thyristors

492

Characterization of high resistivity poly-CdZnTe thick films grown by thermal evaporation method

493

Characterization of high resolution DAC by DFT and sine fitting

494

Characterization of high resolution multilinear charge coupled device for space appplications

495

Characterization of high speed data transmission interface for future IRS payloads

496

Characterization of high T_c superconductor by luminescence methods

497

Characterization of high voltage varactors for load modulation of GaN-HEMT power amplifier

498

Characterization of High-Accuracy, Wideband Transconductance Amplifiers up to 100 kHz

499

Characterization of High-Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors by Low-Frequency Noise Measurements

500

Characterization of high-current, high-temperature superconductor current lead elements

501

Characterization of high-density micromachined interconnects

502

Characterization of high-energy electrons produced from the self-modulated laser wakefield acceleration

503

Characterization of high-energy optical-parametric oscillation by using periodically poled Mg-doped congruent LiTaO3

504

Characterization of higher density spin valve recording head by magnetic force microscope

505

Characterization of higher-order-mode content in large mode-area fibers

506

Characterization of High-Frequency High-Current Reverse Blocking Triode Thyristors for Trapezoidal Current Waveforms

507

Characterization of high-frequency noise performance of GaN double heterojunction HEMT

508

Characterization of high-frequency plane-to-plane coupling through cutout in multi-layer packages

509

Characterization of High-Frequency Surface Modulation Using the Transport-of-Intensity Equation

510

Characterization of high-frequency transducers with small aperture hydrophones

511

Characterization of high-frequency, single-element focused transducers with wire target and hydrophone

512

Characterization of high-k/metal gate stack breakdown in the time scale of ESD events

513

Characterization of High-Linearity Modified Uni-Traveling Carrier Photodiodes Using Three-Tone and Bias Modulation Techniques

514

Characterization of highly birefringent optical fibers using interferometric techniques

515

Characterization of highly birefringent optical fibers using interferometric techniques

516

Characterization of highly dispersive components using direct instantaneous frequency measurements

517

Characterization of highly dispersive materials using composite coaxial cells: electromagnetic analysis and wideband measurement

518

Characterization of highly doped n- and p-type 6H-SiC piezoresistors

519

Characterization of Highly Doped Si Through the Excitation of THz Surface Plasmons

520

Characterization of highly doped Si with surface plasmon

521

Characterization of highly erbium-doped fibers confocal luminescence microscopy

522

Characterization of highly pixelated CZT detectors for sub-millimeter PET imaging

523

Characterization of high-order harmonics generated from solid surfaces

524

Characterization of High-Pressure $\\hbox {XeF}_{2}$ Vapor-Phase Silicon Etching for MEMS Processing

525

Characterization of high-purity, pulsed squeezed light at telecom wavelengths from pp-KTP for quantum information applications

526

Characterization of high-Q laterally moving RF MEMS tuneable capacitor

527

Characterization of high-Q laterally moving RF MEMS tuneable capacitor

528

Characterization of high-Q resonators for microwave filter applications

529

Characterization of high-rate large-sized flows

530

Characterization of High-Rate QPSK Channel with Adaptive Equalization

531

Characterization of high-repetition rate telecommunications pulse trains by dual-quadrature spectral interferometry

532

Characterization of high-resistivity poly-CdZnTe thick films grown by thermal evaporation method

533

Characterization of high-resistivity polycrystalline silicon substrates for wafer-level packaging and integration of RF passives

534

Characterization of high-speed (above 500 MHz) devices using advanced ATE-techniques, results and device problems

535

Characterization of high-speed optical detectors and pulse dispersion in optical fibers using a mode-locked (GaAl)As laser

536

Characterization of high-speed optical pulses based on spectral shearing interferometry in intensity modulator with bias sweeper

537

Characterization of high-temperature ceramic materials at microwave frequencies for MEMS applications

538

Characterization of high-voltage charge-trapping effects in GaN-based power HEMTs

539

Characterization of high-voltage lithium niobate piezoelectric transformers

540

Characterization of high-voltage SiC MOSFETs under UIS avalanche stress

541

Characterization of hippocampal synaptic plasticity in the freely behaving neonatal rat

542

Characterization of HMWPE Used for High Voltage Insularion

543

Characterization of HNA etchant for silicon microneedles array fabrication

544

Characterization of hole transport phenomena in AlGaAs-InGaAs HEMT´s biased in impact-ionization regime

545

Characterization of Hollow-core Silicon Nanowires

546

Characterization of homoepitaxial germanium p-n junctions for photovoltaic and thermophotovoltaic applications

547

Characterization of homogenous TM nonlinear waveguide sensors

548

Characterization of horizontal earth electrodes: Variable frequency and impulse responses

549

Characterization of hot carrier degradation in n-type poly-Si TFTs under dynamic drain pulse Stress with DC gate bias

550

Characterization of Hot Carrier Trapping in the Gate Oxide of MOSFETs

551

Characterization of hot wall RTP for thin gate oxide films

552

Characterization of hot-carrier aging of a 0.35 /spl mu/m fully overlapped-LDD CMOS technology

553

Characterization of hot-carrier degradation in non-isolated MOSFETs using a new gate-current measurement technique

554

Characterization of hot-carrier effects in thin-film fully-depleted SOI MOSFETs

555

Characterization of hot-carrier-induced degradation in p-channel MOSFETs by total injected charge techniques

556

Characterization of hot-carrier-induced degradation of MOSFETs enhanced by H/sub 2/O diffusion for multilevel interconnection processing

557

Characterization of hot-electron-stressed MOSFET´s by low-temperature measurements of the drain tunnel current

558

Characterization of hot-hole injection induced SILC and related disturbs in flash memories

559

Characterization of hot-pressed poplar wood with chemical pretreatment

560

Characterization of Hot-Wire Detonators Using Analytical Modeling and Computational Tools

561

Characterization of HPGe- and Si(Li)-detectors with a 1D-fine pitch strip structure

562

Characterization of HPGe-segmented detectors from noise measurements

563

Characterization of HTS SFQ circuits using interface-engineered Josephson junctions

564

Characterization of HTTP behavior on access networks in Web 2.0

565

Characterization of Human Body-Based Thermal and Vibration Energy Harvesting for Wearable Devices

566

Characterization of human emotions and preferences for text-to-speech systems using multimodal neuroimaging methods

567

Characterization of human femoral trabecular bone in vitro using transmission and backscatter ultrasound measurements

568

Characterization of human gait by means of body center of mass oscillations derived from ground reaction forces

569

Characterization of human Metal ESD reference discharge event and correlation of generator parameters to failure levels-part I: reference event

570

Characterization of human metal ESD reference discharge event and correlation of generator parameters to failure levels-part II: correlation of generator parameters to failure levels

571

Characterization of human trabecular bone quantity and quality using confocal acoustic scanning

572

Characterization of human use of ethanol based on video games with ethanol rewards: Model, system identification and statistical performance

573

Characterization of hurried driving based on collision risk and attentional allocation

574

Characterization of HV-IGBT for high-power inverter applications

575

Characterization of HVPE-grown thick GaAs structures for IR and THz generation

576

Characterization of hybrid access control with SINR constraints in cognitive radio networks

577

Characterization of hybrid entanglement via a photonic basis converter

578

Characterization of Hybrid Integrated All-Optical Flip-Flop

579

Characterization of hybrid metal/semiconductor electron pumps for quantum metrology

580

Characterization of hybrid underfill for low-temperature process applicable to flexible substrate

581

Characterization of hydraulic high pressure transducers as a transfer standard

582

Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique

583

Characterization of hydrogen-functionalized carbon nanotubes using Terahertz spectroscopy

584

Characterization of hydrometeor scattering effects and experimental measurements using near-infrared free-space urban links

585

Characterization of hydrophone with hydrothermal PZT thick film vibrator and Ti front layer for measurement in high intensity therapeutic ultrasound

586

Characterization of hydroquinone clathrates by THz time-domain spectroscopy

587

Characterization of hydrothermal systems using simulated HyspIRI data

588

Characterization of hygroscopic swelling behavior of mold compounds and plastic packages

589

Characterization of hyperspectral data using a genetic algorithm

590

Characterization of hypervelocity gouge craters in rail conductors

591

Characterization of HYPRES´ 4.5 kA/cm² & 8 kA/cm² Nb/AlO_x/Nb fabrication processes

592

Characterization of hysteresis in ferroelectric devices

593

Characterization of IC devices fabricated in low temperature (550 ° c) epitaxy by UHV/CVD technique

594

Characterization of ICA attachment of SMD on inkjet-printed substrates

595

Characterization of Icarrin and Icariin-2-Hydroxypropyl-beta-Cyclodextrin Inclusion Complex- Loading Poly (L-Lactic Acid) Scaffolds

596

Characterization of ice in the Chukchi Sea at the start of the growing season using satellite SAR

597

Characterization of idle periods in IEEE 802.11e networks

598

Characterization of IGBT devices for use in series resonant inverter for induction heating applications

599

Characterization of IGBT modules for system EMI simulation

600

Characterization of IGBTs for high-speed switches for laser applications

601

Characterization of IGBTs for high-speed switches for laser applications

602

Characterization of IGCT under zero-current-transition condition

603

Characterization of IGCTs for series connected operation

604

Characterization of III-V periodic structures by spectroscopic ellipsometry and grazing X-ray reflectance

605

Characterization of IIP2 and DC-offsets in transconductance mixers

606

Characterization of II-VI alloy semiconductor layers by photoreflectance spectroscopy and prism-coupler method

607

Characterization of Image Receivers for Optical Wireless Location Technology

608

Characterization of imaging gamma detectors for use in small animal SPECT

609

Characterization of IMG

610

Characterization of immobilized antibodies on silica surfaces

611

Characterization of immobilized DNA probes on the surface of silicon compatible materials

612

Characterization of immobilized pH gradient formed in capillary based on quantum dots

613

Characterization of Impact of Transient Faults and Detection of Data Corruption Errors in Large-Scale N-Body Programs Using Graphics Processing Units

614

Characterization of Impact Response of a Plant Stem

615

Characterization of impact-ionization in InAlAs/InGaAs/InP HEMT structures using a novel photocurrent-measurement technique

616

Characterization of IMPATT diodes at millimeter-wave frequencies

617

Characterization of impedance rendering with a cable-driven agonist-antagonist haptic device

618

Characterization of Impedance Variations in Antennas for TETRA Terminals

619

Characterization of Implantable Antennas for Intracranial Pressure Monitoring: Reflection by and Transmission Through a Scalp Phantom

620

Characterization of implantable microfabricated fluid delivery devices

621

Characterization of Implemented Algorithm for MIMO Spatial Multiplexing in Reverberation Chamber

622

Characterization of impregnating varnish with silica nanofiller

623

Characterization of improved Capacitive Micromachined Ultrasonic Transducers (CMUTS) using ALD high-Κ dielectric isolation

624

Characterization of improved InSb interfaces

625

Characterization of improved tactile sensors using piezoelectric resonator

626

Characterization of impurities in GaInNAs pn junctions from capacitance transient spectroscopy

627

Characterization of in vitro healthy and pathological human liver tissue periodicity applying singular spectrum analysis to backscattered ultrasound

628

Characterization of In0.53Ga0.47As photodiodes exhibiting low dark current and low junction capacitance

629

Characterization of InAlAs solar cells grown by MOVPE

630

Characterization of InAlAs/In0.25Ga0.75As0.72Sb0.28/InGaAs double heterojunction bipolar transistors

631

Characterization of InAlAs/InGaAs HFETs with High Indium Content in the Channel Grown on GaAs Substrate

632

Characterization of InAs/GaAs quantum dots utilizing THz time-domain spectroscopy

633

Characterization of InAsP/InGaAsP strained MQW crystals for 1.3μm-wavelength laser diodes usi

634

Characterization of in-band distortion in RF front-ends using multi-sine excitation

635

Characterization of in-building UHF wireless radio communication channels using spectral energy measurements

636

Characterization of Inclusions in a Nonhomogeneous GPR Problem by Artificial Neural Networks

637

Characterization of index changes in silicone- and nonsilicone-based hydrogel polymers induced by femtosecond micromachining

638

Characterization of Indian ionospheric TEC behavior using PDFs and GPS satellite data

639

Characterization of indirect coupling mechanisms from lightning to underground cavities

640

Characterization of indirectly measurable antenna balun/impedance-matching device

641

Characterization of indium and nitrogen co-implant of NMOSFET for advanced DRAM technologies with dual-gate oxide

642

Characterization of indium tin oxide and al-doped Zinc oxide thin films deposited by confocal RF magnetron sputter deposition

643

Characterization of individual filaments extracted from a Bi-2223/Ag tape

644

Characterization of Individual Filaments in a Multifilamentary YBCO Coated Conductor

645

Characterization of individual L1₀ FePt nanoparticles

646

Characterization of individual muscle activities during isometric contraction using ultrasound imaging

647

Characterization of individual noise sources in high-temperature superconductor Josephson junctions

648

Characterization of individual weights in transversal filters and application to CCDs

649

Characterization of indoor channel propagation in 450 mhz, 900 mhz and 1800 mhz band

650

Characterization of indoor penetration loss at ISM band

651

Characterization of indoor photovoltaic devices and light

652

Characterization of indoor propagation for three dimensional femtocell environment

653

Characterization of indoor radio propagation environments by cluster analysis as preprocessing for neural network model

654

Characterization of indoor radiowave propagation at university buildings

655

Characterization of Indoor Ultra-wide Band NLOS channel

656

Characterization of induced voltages on overhead power lines caused by lightning strokes with arbitrary configurations

657

Characterization of Inductance Gradient and Current Distribution in Electromagnetic Launchers

658

Characterization of inductance gradients in electromagnetic launchers

659

Characterization of induction machines with a genetic algorithm

660

Characterization of induction motors in adjustable speed drives using a time-stepping coupled finite element state space method including experimental validation

661

Characterization of induction motors in adjustable-speed drives using a time-stepping coupled finite-element state-space method including experimental validation

662

Characterization of inductive changes by resonant circuit technique

663

Characterization of inductive recording heads by magnetic force microscopy

664

Characterization of Inductively Coupled Plasma Driven with Ferrite Cores at 400 kHz

665

Characterization of inductively coupled plasma using neural networks

666

Characterization of industrial p-type CZ silicon wafers passivated with a-SiC_x:H films

667

Characterization of inertial measurement unit placement on the human body upon repeated donnings

668

Characterization of infant cries using spectral and prosodic features

669

Characterization of infinite- and finite-extent coplanar waveguide metamaterials with varied left- and right-handed passbands

670

Characterization of infinite transmission zeros of state space systems

671

Characterization of Information Channels for Asymptotic Mean Stationarity and Stochastic Stability of Nonstationary/Unstable Linear Systems

672

Characterization of information content in remote sensing imagery

673

Characterization of information in phase of radar range profiles

674

Characterization of Information Systems with Fuzzy and Intuitionistic Fuzzy Decision Attributes

675

Characterization of infrared femtosecond pulses by using transient-grating self-referenced spectral interferometry

676

Characterization of Infrared Range-Finder PBS-03JN for 2-D Mapping

677

Characterization of InGaAs and InGaAsN saturable absorber mirrors for high power mode locked sub-ps thin-disk lasers

678

Characterization of InGaAs/AlGaAs pseudomorphic modulation-doped field-effect transistors

679

Characterization of InGaAs/GaAs microtubes at transparent wavelengths

680

Characterization of InGaAs/InP single-photon avalanche diodes

681

Characterization of InGaN/GaN lasing structures for high temperature device applications

682

Characterization of InGaP heterojunction emitter quantum dot solar cells

683

Characterization of in-home MIMO power line channels

684

Characterization of in-home UWB channel with different antenna directivity

685

Characterization of inhomogeneity perpendicular to the surface of composite boards

686

Characterization of inhomogeneous cylinders from transient data

687

Characterization of IN-IC integrable in-plane nanometer scale resonators fabricated by a silicon on nothing advanced CMOS technology

688

Characterization of initial plasma discharges in the CPS-1 experiment

689

Characterization of inkjet patch antenna on different ground planes at millimeter-wave frequencies

690

Characterization of ink-jet printed CPW on Kapton substrates at 60 GHz

691

Characterization of Inkjet Printed MWCNT in Colloidal and Conductive Polymer Solution

692

Characterization of InN films grown by plasma-assisted MOMBE

693

Characterization of InP and related materials by light scattering and photoluminescence

694

Characterization of InP epitaxial layers for use in radiation detection

695

Characterization of InP Schottky junctions formed by in-situ remote plasma process

696

Characterization of InP using metal-insulator-semiconductor-tunneling microscopy (MISTM)

697

Characterization of InP/InGaAs/InGaAsP using atmospheric and low pressure MOVPE

698

Characterization of In-Phase/Quad-Phase Digital Downconversion Via Special Sampling Scheme

699

Characterization of In-Plane Resonant Cavities with Photonic Crystal Boundaries Etched in InP-Based Heterostructure

700

Characterization of in-plane strain relaxation in strained layers after mesa isolation using a newly developed plane-NBD method

701

Characterization of in-plane stress in TSV array — A unit model approach

702

Characterization of in-process substrate warpage of underfilled flip chip assembly

703

Characterization of Input/Output Bandwidth Performance Models in NUMA Architecture for Data Intensive Applications

704

Characterization of Insertion Loss and Back Reflection in Passive Hybrid Silicon Tapers

705

Characterization of inspiratory flow limitation during sleep with an exponential model

706

Characterization of instability of dynamic control for kinematically redundant manipulators

707

Characterization of instantaneous frequency and glitches of sweeping oscillator and its application to multifrequency estimation

708

Characterization of instrument transformers with nonsinusoidal waveforms

709

Characterization of insulated-gate versus schottky-gate InAs/AlSb HEMTs

710

Characterization of insulators for electric insulation in vacuum

711

Characterization of integrated antenna-coupled plasma-wave detectors with wide bandwidth amplification in 130nm CMOS

712

Characterization of integrated antennas at millimeter-wave frequencies

713

Characterization of integrated logic circuits

714

Characterization of Integrated Optical Strain Sensors Based on Silicon Waveguides

715

Characterization of Integrated Planar Photonic Crystal Circuits Fabricated by a CMOS Foundry

716

Characterization of integrated polarization-diversity DPSK demodulator with two-dimensional chirped grating couplers and ring resonators

717

Characterization of integrated semiconductor optical amplifiers in the JePPIX multi-project wafer platform

718

Characterization of integrated thin film Pt heater and temperature sensors on Si platform

719

Characterization of Integrated Tin Oxide Gas Sensors With Metal Additives and Ion Implantations

720

Characterization of intense pulsed aluminum ion beam by magnetically insulated diode with vacuum arc ion source

721

Characterization of intensity and frequency fluctuations of mid-infrared quantum cascade lasers

722

Characterization of intensity distribution in symmetric and asymmetric fiber DFB lasers

723

Characterization of Inter Digital capacitor for water level sensor

724

Characterization of inter-body interference in context aware body area networking (CABAN)

725

Characterization of interchannel interference effects in multicarrier 32-Gbaud QPSK/16QAM Nyquist systems

726

Characterization of interconnect coupling noise using in-situ delay-change curve measurements

727

Characterization of Interconnect Process Variation in CMOS Using Electrical Measurements and Field Solver

728

Characterization of interconnections performances for high speed digital boards: a frequency/time domain approach

729

Characterization of interconnects resulting from capillary die-to-substrate self-assembly

730

Characterization of Interdependency Between Intracranial Pressure and Heart Variability Signals: A Causal Spectral Measure and a Generalized Synchronization Measure

731

Characterization of inter-detector effects in a 3-D position-sensitive dual-CZT detector modules for PET

732

Characterization of interdigitated electrode structures for water contaminant detection using a hybrid voltage divider and a vector network analyzer

733

Characterization of interface and bulk oxide traps in SiC MOSFETs with epitaxialy grown and implanted channels

734

Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique

735

Characterization of interface roughness of rippled sand off Fort Walton Beach, Florida

736

Characterization of Interface Spin Clusters in Exchange Bias Systems

737

Characterization of Interface Strength as function of Temperature and Moisture Conditions

738

Characterization of Interface Structure in GalnAs/lnP Superlattices by means of X-Ray Diffraction

739

Characterization of interface trap density of In-rich InGaAs Gate-all-around nanowire MOSFETs

740

Characterization of interface trap density of In-rich InGaAs nMOSFETs with ALD Al2O3 as gate dielectric

741

Characterization of interface traps in SOI material

742

Characterization of interface traps in subthreshold regions of implanted 6H- and 4H-SiC MOSFETs

743

Characterization of Interfaces Between Contacts and Active Layer in Organic Photovoltaics Using Impedance Spectroscopy and Equivalent Circuit Model

744

Characterization of interfaces involving electrically conductive adhesives using electron-beam moire and infrared microscopy

745

Characterization of interfacial adhesion damage induced by accelerated life testing

746

Characterization of interfacial charge transport and recombination by impedance spectroscopy on SiO2 coated TiO2 based dye sensitized solar cells

747

Characterization of interfacial growth between Bi(2212) and Ag coating

748

Characterization of interfacial properties in magnetic tunnel junctions by bias-dependent complex impedance spectroscopy

749

Characterization of interfacial properties in magnetic tunnel junctions by bias-dependent complex impedance spectroscopy

750

Characterization of interfacial thermal resistance for packaging high-power electronics modules

751

Characterization of interference effects in multiple antenna GNSS receivers

752

Characterization of interictal and ictal scalp EEG signals with the Hilbert transform

753

Characterization of Interlayer Sliding Deformation for Individual Multiwalled Carbon Nanotubes Using Electrostatically Actuated Nanotensile Testing Device

754

Characterization of intermetallic compound (IMC) growth in Cu wire ball bonding on Al pad metallization

755

Characterization of intermetallic compound formation and copper diffusion of copper wire bonding

756

Characterization of Intermetallic Compound Formation on In/Bi/Sn Solder Bumps Used in Pb-Alloy Josephson Chip Packaging

757

Characterization of Intermetallic Compounds in Al-Cu-Bimetallic Interfaces

758

Characterization of intermetallic compounds in Cu-Al ball bonds: Layer growth, mechanical properties and oxidation

759

Characterization of intermetallic compounds in Cu-Al ball bonds: Mechanical properties, delamination strength and thermal conductivity

760

Characterization of intermetallic compounds in Cu-Al ball bonds: Thermo-mechanical properties, interface delamination and corrosion

761

Characterization of Intermetallic Growth for Gold Bonding and Copper Bonding on Aluminum Metallization in Power Transistors

762

Characterization of intermittent contact head disk interface

763

Characterization of Intermodulation and Memory Effects Using Offset Multisine Excitation

764

Characterization of intermodulation distortion in multicarrier transmission systems

765

Characterization of Internal Learning Parameters in Artificial Neural Networks

766

Characterization of Inter-Poly High- κ Dielectrics for Next Generation Stacked-Gate Flash Memories

767

Characterization of inter-pulse interference and fading for ultra-wideband systems

768

Characterization of intersymbol interference in concentration-encoded unicast molecular communication

769

Characterization of intra device mutual thermal coupling in multi finger SiGe:C HBTs

770

Characterization of intra-bandgap defect states through leakage current analysis for optimization of 4H-SiC photoconductive switches

771

Characterization of intracavity losses in Yb-ion laser oscillators based on spectroscopic gain analysis

772

Characterization of intra-cortical local field potentials - before, during and after an ischemic event in rats

773

Characterization of Intrinsic Capacitances of Small-Geometry MOSFET´s

774

Characterization of Intrinsic Field-Effect Mobility in TFTs by De-Embedding the Effect of Parasitic Source and Drain Resistances

775

Characterization of intrinsic hysteresis of pentacene-based organic thin-film transistor through in-situ electrical measurement

776

Characterization Of Intrinsic Optical Properties For Sea Ice And Snow

777

Characterization of in-tunnel distance measurements for vehicle localization

778

Characterization of in-use medium duty electric vehicle driving and charging behavior

779

Characterization of Inverse Temperature Dependence in logic circuits

780

Characterization of inverse-Gaussian and gamma distributions through their length-biased distributions

781

Characterization of inversion and accumulation layer electron transport in 4H and 6H-SiC MOSFETs on implanted P-type regions

782

Characterization of inversion layer carrier profile in deep-submicron p-MOSFETs

783

Characterization of Inversion Tunneling Current Saturation Behavior for MOS(p) Capacitors With Ultrathin Oxides and High- $k$ Dielectrics

784

Characterization of Inversion-Layer Capacitance of Electrons in High- $k$ /Metal Gate Stacks

785

Characterization of inversion-layer capacitance of holes in Si MOSFET´s

786

Characterization of inverter-grid interactions using a hardware-in-the-loop system test-bed

787

Characterization Of Ion Beam Damaged Photovoltaic Devices

788

Characterization of ion implantation quantum well intermixing for carrier confinement of VCSEL

789

Characterization of Ion Implanted Silicon Annealed with a Graphite Radiation Source

790

Characterization of ion implanted silicon using UV Raman and multiwavelength photoluminescence for in-line dopant activation monitoring

791

Characterization of ion implanter electron flood guns using charge pumping and threshold voltage measurements

792

Characterization of ion-assisted, coevaporated CH3NH3PbI3 thin films

793

Characterization of ionic permeability and water vapor transmission rate of polymers used for implantable electronics

794

Characterization of ion-implanted avalanche diode oscillators

795

Characterization of ion-implanted IMPATT oscillators

796

Characterization of ionization phenomena in soils under fast impulses

797

Characterization of ionizing radiation effects in MOS structures by bipolar operation study

798

Characterization of ionospheric scintillation at high latitude in the European region

799

Characterization of IP flows eligible for lambda-connections in optical networks

800

Characterization of IPMC strip sensorial properties: preliminary results

801

Characterization of Iran Stock Market Indices Using Recurrence Plots

802

Characterization of iris pattern stretches and application to the measurement of roll axis eye movements

803

Characterization of iron oxide-gold core-shell multifunctional nanoparticles in biomedical imaging

804

Characterization of Irradiation Sites of Apsara Reactor for $k_{0}$ -Based IM-NAA and Its Validation and Application

805

Characterization of isolated attosecond pulses from multi-cycle lasers

806

Characterization of Isothetic Polygons for Image Indexing and Retrieval

807

Characterization of ISP Traffic: Trends, User Habits, and Access Technology Impact

808

Characterization of ITER $\\hbox {Nb}_{3}\\hbox {Sn}$ Strands Under Strain-Applied Conditions

809

Characterization of Java applications at bytecode and ultra-SPARC machine code levels

810

Characterization of Java^TM application server workloads

811

Characterization of jitter and admission control in multiservice networks

812

Characterization of Josephson tunneling junction by lifetime of zero-voltage state and fiske self-resonant step

813

Characterization of Josephson-vortex flow device as a magnetic sensor

814

Characterization of junction activation and deactivation using non-equilibrium annealing: Solid phase epitaxy, spike annealing, laser annealing instructions for

815

Characterization of junction capacitance parameters for Gaussian/constant doping profiles

816

Characterization of junction dosage effect on NAND arrays with charge pumping method

817

Characterization of Kalman filter residuals in the presence of mismodeling

818

Characterization of Kalman filter residuals in the presence of mismodeling

819

Characterization of Kansas State University Dense Plasma Focus as a multi-radiation source

820

Characterization of Kapton® polyimide film for use in flexible circuitry

821

Characterization of K-band radio frequency interference from AMSR-E, WindSat and SSM/I

822

Characterization of keepers for film memories

823

Characterization of key coating properties of immersion tin for PWB

824

Characterization of Kilohertz-Ignited Nonthermal He and He/ ${\\rm O}_{2}$ Plasma Pencil for Biomedical Applications

825

Characterization of KMPR^®1025 as a masking layer for deep reactive ion etching of fused silica

826

Characterization of laboratory aged MV XLPE cables using dielectric losses factor measurements

827

Characterization of laminar jet impingement cooling in portable computer application

828

Characterization of laminar jet impingement cooling in portable computer applications

829

Characterization of Land Cover Types in TerraSAR-X Images by Combined Analysis of Speckle Statistics and Intensity Information

830

Characterization of Landsat Thematic Mapper radiometry and geometry for land cover analysis

831

Characterization of LANDSAT-4 MSS And TM Digital Image Data

832

Characterization of landslide deposits using SAR images

833

Characterization of langasite as a material for SAW based RFID and sensing systems at high temperatures

834

Characterization of langasite for application in high temperature SAW sensors

835

Characterization of LANL A1-series Marx flash radiography source

836

Characterization of laplacian surface electromyographic signals during isometric contraction in biceps brachii

837

Characterization of large area Cu(In,Ga)Se2 nanotip arrays via photoluminescence

838

Characterization of Large Area PLD Grown Combinatorial Compositions of Barium Strontium Titanium Oxides

839

Characterization of large area SPAD detectors operated in avalanche photodiode mode

840

Characterization of Large Frustum CsI(Tl) Crystals for the ${\\rm R}^{3}{\\rm B}$ Calorimeter

841

Characterization of large frustum CsI(Tl) crystals for the R3B calorimeter

842

Characterization of large TEM cells and their interaction with large DUT for vehicle immunity testing and antenna factor determination

843

Characterization of large-aperture CO2amplifier

844

Characterization of large-scale fading for 45 GHz indoor channels

845

Characterization of Large-Scale Fading for the 2.4 GHz Channel in Obstacle-Dense Indoor Propagation Topologies

846

Characterization of large-scale non-uniformities in a 20k TDC/SPAD array integrated in a 130nm CMOS process

847

Characterization of Large-Scale SMTP Traffic: the Coexistence of the Poisson Process and Self-Similarity

848

Characterization of laser ablated Al-plasma in ambient atmosphere of nitrogen

849

Characterization of laser edge isolation in multicrystalline silicon solar cells

850

Characterization of laser ignition of hydrocarbon/air mixtures using tunable InGaAsSb/AlGaAsSb diode laser at 2.55 μm

851

Characterization of laser inscribed on-chip photonic lanterns with different core distances

852

Characterization of laser phase noise using parallel linear optical sampling

853

Characterization of laser planarized aluminum for submicron double level metal CMOS circuits

854

Characterization of Laser Plasma Plume for Deposition of CN/sub x/ Films

855

Characterization of laser produced tetrakis (dimethylamino) ethylene plasma in a high-pressure background gas

856

Characterization of Laser Sintering of Copper Nanoparticle Ink by FEM and Experimental Testing

857

Characterization Of Laser Zone Texture

858

Characterization of laser-annealed magnetic garnet films by scanning probe microscopes

859

Characterization of Laser-Doped Localized p-n Junctions for High Efficiency Silicon Solar Cells

860

Characterization of laser-fired contacts processed on wafers with different resistivity

861

Characterization of laser-induced air plasmas and thin films using third harmonic generation microscopy

862

Characterization of laser-induced air plasmas via third harmonic generation

863

Characterization of laser-induced photoexcitation effect on a surrounding CMOS ring oscillator

864

Characterization of laser-produced plasma in a plasma opening switch

865

Characterization of laser-SOI double Si active layers by fabricating elementary device structures

866

Characterization of Latching 2Ã\x972 Optical Switch with Movable Polymer Waveguide

867

Characterization of latch-up in CMOS inverters in pulsed electromagnetic interference environments

868

Characterization of lateral asymmetric channel (LAC) thin film SOI MOSFETs

869

Characterization of lateral dopant diffusion in silicides

870

Characterization of lateral thin-film-edge field emitter arrays

871

Characterization of laterally aligned carbon nanotubes formed by AC dielectrophoresis

872

Characterization of laterally nanopatterned W/Si multilayers

873

Characterization of lattice modular robots by discrete displacement groups

874

Characterization of layer thickness and interdiffusion in CdTe/CdS/ZTO/CTO solar cells

875

Characterization of Layer-2 Unique Topologies in Multisubnet Local Area Networks

876

Characterization of layered dielectrics with short electromagnetic pulses

877

Characterization of layered materials by the Lamb wave lens

878

Characterization of layered media using full-waveform inversion of proximal GPR data

879

Characterization of layered transmission lines

880

Characterization of layout dependent thermal coupling in SOI CMOS current mirrors

881

Characterization of L-band RFI and implications for mitigation techniques

882

Characterization of LC-tank circuits for mm-wave applications in 90 nm CMOS

883

Characterization of lead zirconate titanate ceramics for use in miniature high-frequency (20-80 MHz) transducers

884

Characterization of lead-free alkali niobate piezoceramics by the Inverse Method

885

Characterization of lead-free solder and sintered nano-silver die-attach layers using thermal impedance

886

Characterization of Lead-Free Solder and Sintered Nano-Silver Die-Attach Layers Using Thermal Impedance

887

Characterization of lead-free solder by reliability testing

888

Characterization of lead-free solders and under bump metallurgies for flip-chip package

889

Characterization of lead-free solders and under bump metallurgies for flip-chip package

890

Characterization of Leakage and Reliability of SiN_x Gate Dielectric by Low-Pressure Chemical Vapor Deposition for GaN-based MIS-HEMTs

891

Characterization of leakage behaviors of high-k gate stacks by electron-beam-induced current

892

Characterization of leakage current in buried-oxide SOI transistors

893

Characterization of leakage current in thin gate oxide subjected to 10 keV X-ray irradiation

894

Characterization of leakage current of a post station insulator covered with ice with various surface conductivities

895

Characterization of leakage current on high voltage glass insulators using wavelet transform technique

896

Characterization of leakage current on the surface of porcelain insulator under contaminated conditions

897

Characterization of leakage currents in long-lifetime capacitors

898

Characterization of leakage power in CMOS technologies

899

Characterization of leaky wave antenna and active gain enhancement

900

Characterization of left-handed traveling-wave field effect transistors

901

Characterization of lens-coupled TiN LEKIDs at 215µm

902

Characterization of LEO satellites through ground-based Doppler observations

903

Characterization of level sea-ice thickness in the labrador sea using C-band polarimetric SAR data

904

Characterization of Light Emission From Electron-Beam-Generated Plasmas in Oxygen

905

Characterization of light emission from SiGe heterojunction bipolar transistor for photon emission microscopy applications

906

Characterization of light output from narrow sodium iodide detectors

907

Characterization of light shift below 10/sup -15/ in a cesium fountain frequency standard operated without the use of mechanical shutters

908

Characterization of Light Transport in Scattering Media at Subdiffusion Length Scales with Low-Coherence Enhanced Backscattering

909

Characterization of lightning observed by multiple high-speed cameras

910

Characterization of lignin and study on mechanical properties of lignin/PVC blends

911

Characterization of Li-Ion Batteries for Intelligent Management of Distributed Grid-Connected Storage

912

Characterization of Li-Ion Polymer battery to estimate the download time on systems with constant load

913

Characterization of limestone-water slurry droplets generated by electrohydrodynamic atomization

914

Characterization of line edge roughness and line width roughness of nano-scale typical structures

915

Characterization of line edge roughness in resist patterns by Fourier analysis and auto-correlation function

916

Characterization of linear and morphological operators

917

Characterization of Linear and Nonlinear Properties of GaAs MESFET´s for Broad-Band Control Applications

918

Characterization of linear block codes as cyclic sources with memory

919

Characterization of linear network coding for pollution detection

920

Characterization of linear scale invariant system input/output relationships and synthesis of network traffic traces

921

Characterization of Linearly Graded Position-Sensitive Silicon Photomultipliers

922

Characterization of Line-of-Sight MIMO Channel for Fixed Wireless Communications

923

Characterization of linewidth variation for single- and multiple-layer resist systems

924

Characterization of link failures in multi-agent systems under the agreement protocol

925

Characterization of linux kernel behavior under errors

926

Characterization of Liquid Crystal Display Phase Modulation

927

Characterization of liquid crystal polymer (LCP) material and transmission lines on LCP substrates from 30 to 110 GHz

928

Characterization of liquid crystal polymer for high frequency system-in-a-package applications

929

Characterization of liquid crystal polymer from 110 GHz to 170 GHz

930

Characterization of liquid crystals 5CB in terahertz frequency

931

Characterization of Liquid Developers for Continuous Tone Electrography

932

Characterization of liquid jet injection into tissue based on optical coherence tomography

933

CHARACTERIZATION OF LIQUID MERCURY JETS AND THE POTENTIAL APPLICATION AS AN OPENING SWITCH

934

Characterization of liquid phase epitaxy grown YBa/sub 2/Cu/sub 3/O/sub 7-x/ thick films as superconductive substrates

935

Characterization of liquid water containing bio-molecules using micro-strip-line THz sensors

936

Characterization of liquid-metal Galinstan® for droplet applications

937

Characterization of liquid-phase sensor utilizing GaN-based two-terminal device

938

Characterization of liquids using leaky surface acoustic waves in YX-LiTaO3

939

Characterization of lithium out-diffused slab waveguides in LiNbO ₃ as a function of fabrication conditions

940

Characterization of lithium-ion capacitors for low-power energy neutral wireless sensor networks

941

Characterization of lithographically printed resistive strain gauges

942

Characterization of live yeast cell derivative (LYCD) induced by atmospheric pressure cold plasma and its protective effects on cells

943

Characterization of Living Drosophila Embryos using Micro Robotic Manipulation System

944

Characterization of LN2 cooled LAAPDs for single photon counting applications

945

Characterization of LO leakage behavior in Transconductance Mixers

946

Characterization of load profile deviations for residential buildings

947

Characterization of loaded TEM-waveguides using time-domain reflectometry

948

Characterization of loading effects in precision 1 Ω resistors

949

Characterization of local 3D rough surfaces using UWB near-range phase-based GPR signatures from wide-beamwidth antennas

950

Characterization of local dielectric properties of superconductor YBa₂Cu₃O_7-δ using evanescent microwave microscopy

951

Characterization of local physical field produced by high density gene regulation particles

952

Characterization of local regularity in SAR Imagery by means of multiscale techniques: application to oil spill detection

953

Characterization of local strain around trough silicon via interconnects in wafer-on-wafer structures

954

Characterization of local transfer defects in CCD´s using a multireversal transfer mode

955

Characterization of locallzed core-shell nanoparticles in a homogeneous phantom

956

Characterization of logical masking and error propagation in combinational circuits and effects on system vulnerability

957

Characterization of Long Period Gratings in hollow core fiber fabricated via Electrode Arc Discharge

958

Characterization of long term channel variations in industrial wireless sensor networks

959

Characterization Of Long Wavelength Strained Ouanturn Well Laser Diodes

960

Characterization of longitudinal fin heat sink thermal performance and flow bypass effects through CFD methods

961

Characterization of Long-Length, MOCVD-Derived REBCO Coated Conductors

962

Characterization of Long-Period Fiber Gratings Written by CO $_{2}$ Laser in Twisted Single-Mode Fibers

963

Characterization of long-range surface plasmon Bragg gratings with microfluidic channels

964

Characterization Of Longwall Power Systems

965

Characterization of loss mechanisms in piezoelectric ceramic microresonators

966

Characterization of lossy cylinder in reverberation chamber by computed and measured absorption cross sections

967

Characterization of lossy dielectric targets using time reversal arrays

968

Characterization of lossy layers through monostatic radar measurements

969

Characterization of lossy transmission lines of arbitrary characteristic impedance by time domain measurements

970

Characterization of low 1/f noise in MOS transistors

971

Characterization of low alpha emissivity system on electroplated solder bumps

972

Characterization of Low Dark-Current Lateral Amorphous-Selenium Metal-Semiconductor-Metal Photodetectors

973

Characterization of low dielectric constant materials

974

Characterization of low dose SIMOX for low power electronics

975

Characterization of low energy Lu background on continuous LYSO blocks

976

Characterization of low energy SIMOX (LES) structures

977

Characterization of low frequency noise in epitaxial NbN/AlN/NbN tunnel junctions

978

Characterization of Low Frequency Noise in Floating Gate NAND Flash Memory

979

Characterization of low frequency noise in InGaAs-channel heterojunction-FET´s and GaAs-JFET´s at liquid helium temperature

980

Characterization of low frequency noise in nanowire FETs considering variability and quantum effects

981

Characterization of low latitude ionospheric scintillations using EEMD - DFA method

982

Characterization of low loss dielectric materials in millimeter wave region using a whispering gallery mode resonator

983

Characterization of low loss materials for high frequency PCB application

984

Characterization of low observable targets and wakes by a matched illumination multifrequency, multistatic radar system

985

Characterization of low power DC/DC converter modules at cryogenic temperatures

986

Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics

987

Characterization of Low Pressure Chemical-Vapor-Deposited Titanium Nitride from Metalorganic Sources

988

Characterization of Low Temperature Deposited Flexible Amorphous Silicon Solar Cells

989

Characterization of low temperature GaAs buffer

990

Characterization of low temperature processing and high density integrated capacitor on organic substrate

991

Characterization of Low Temperature P-Type Hydrogenated Microcrystalline Silicon Thin Films Deposited by Plasma Enhanced Chemical Vapor Deposition

992

Characterization of Low Temperature Sintered Ferrite Laminates for High Frequency Point-of-Load (POL) Converters

993

Characterization of low temperature transport properties in InP/InGaAs double heterojunction bipolar transistors

994

Characterization of low VAR bipolar transistors using a revised SPICE simulator

995

Characterization of low voltage SRAM response to gamma radiation

996

Characterization of Low-Antenna Ultrawideband Propagation in a Forest Environment

997

Characterization of Low-Backscatter Ocean Features in Dual-Copolarization SAR Using Log-Cumulants

998

Characterization of low-cost tissue mimicking materials at millimeter-wave frequencies

999

Characterization of Low-Defect Cd_0.9Zn_0.1Te and CdTe Crystals for High-Performance Frisch Collar Detectors

1000

Characterization of low-dielectric-constant SiCON films grown by PECVD under different RF power

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