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1
Reliability of Sensors Based on Nanowire Networks With Either an Equilateral Triangle Lattice or a Hexagonal Lattice Structure
2
Reliability of series system with two identical units and repairman single vacation under common cause failure
3
Reliability of Series-Parallel Systems With Random Failure Propagation Time
4
Reliability of Service Level Estimators in the Data Centre
5
Reliability of Several Standby-Priority-Redundant Systems
6
Reliability of SiC power devices and its influence on their commercialization - review, status, and remaining issues
7
Reliability of SiGe HBTs for Power Amplifiers—Part I: Large-Signal RF Performance and Operating Limits
8
Reliability of SiGe HBTs for Power Amplifiers—Part II: Underlying Physics and Damage Modeling
9
Reliability of signal processing technique for pavement damages detection and classification using ground penetrating radar
10
Reliability of signals from a chronically implanted, silicon-based electrode array in non-human primate primary motor cortex
11
Reliability of Silicon and Gallium Arsenide KA-Band Impatt Diodes
12
Reliability of silicon nitride dielectric-based metal-insulator-metal capacitors
13
Reliability of Silicon Resonator Oscillators
14
Reliability of Silicone Encapsulants in high Pollution Environments.
15
Reliability of silkscreen printed planar capacitors and inductors under accelerated thermal cycling and humidity bias life testing
16
Reliability of silver nanowire transparent electrode under atmospheric environment
17
Reliability of Silver Sintering on DBC and DBA Substrates for Power Electronic Applications
18
Reliability of single and dual Layer Pt nanocrystal devices for NAND flash applications: A 2-region model for endurance defect generation
19
Reliability of Single-Error Correction Protected Memories
20
Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon
21
Reliability of Sn-3.5Ag solder joints in high temperature packaging applications
22
Reliability of Sn3wt%Ag0.5wt%Cu0.019wt%Ce (SACC) solder joints
23
Reliability of SnAgCu Interconnections with Minor Additions of Ni or Bi under Mechanical Shock Loading at Different Temperatures
24
Reliability of SnAgCu solder balls in packaging
25
Reliability of SnAgCu solder joints during vibration in various temperature
26
Reliability of SnPb and Pb-free flip-chips under different test conditions
27
Reliability of Sn-Pb solder joints with Cu and Co-P surface finishes under thermal cycling
28
Reliability of SOA Systems Using SPN and GA
29
Reliability of Soft Verification of Message Authentication Codes
30
Reliability of Solar Arrays
31
Reliability of solar cell´s solder joints
32
Reliability of Solar Energy Systems
33
Reliability of solder joint and SMT assembly
34
Reliability of solder joints assessed by acoustic imaging during accelerated thermal cycling
35
Reliability of solder joints in High-power LED package in power cycling tests
36
Reliability of solder joints under electrical stressing - strain evolution of solder joints
37
Reliability of Solder-Connected, Thick-Film Hybrid Integrated Circuits
38
Reliability of soldered joints in CSPs of various designs and mounting conditions
39
Reliability of soldered joints in CSPs of various designs and mounting conditions
40
Reliability of soldered silicon devices on copper alloys
41
Reliability of solid-state lighting electrical drivers subjected to WHTOL accelerated aging
42
Reliability of some examination and laboratory marks in electronic engineering
43
Reliability of Some Modularly Redundant Systems
44
Reliability of Some Redundant Systems with Repair
45
Reliability of space-grade vs. COTS SRAM-based FPGA in N-modular redundancy
46
Reliability of special protection systems
47
Reliability of Special Redundant Systems Considering Exchange Time and Repair Time
48
Reliability of Specific Absorption Rate measurements in the head using standardized hand phantoms
49
Reliability of spectral analysis of fetal heart rate variability
50
Reliability of spectral analysis of the heart rate variability signal from a commercial Holter system
51
Reliability of Spectrum Sensing Under Noise and Interference Uncertainty
52
Reliability of Sputtered Aluminum Thin Film on Flexible Substrate Under High Cyclic Bending Fatigue Conditions
53
Reliability of SSPA´s and TWTA´s
54
Reliability of stack packaging varying the die stacking architectures for flash memory applications
55
Reliability of stacked ball grid array packages during the solder reflow process
56
Reliability of Standby Equipment with Periodic Testing
57
Reliability of standby generators in Hong Kong buildings
58
Reliability of standby generators in Hong Kong buildings
59
Reliability of Standby System for Units with Birnbaum & Saunders Distribution
60
Reliability of state-of-the-art GaAs pseudomorphic low-noise HEMTs
61
Reliability of station class surge arresters
62
Reliability of stochastic flow networks with continuous link capacities
63
Reliability of strained quantum well lasers
64
Reliability of strained-channel NMOSFETs with SiN capping layer on hi-wafers with a thin LPCVD-TEOS buffer layer
65
Reliability of Strained-Si Devices With Post-Oxide-Deposition Strain Introduction
66
Reliability of Strain-Si FPGA Product Fabricated by Novel Ultimate Spacer Process
67
Reliability of structures with active control
68
Reliability of sub 30NM BT(Body-Tied)-FinFET with HFSION/Poly Silicon Gate Stack for symmetric Vth control
69
Reliability of Super Low Noise HEMTs
70
Reliability of SuperPON systems
71
Reliability of surface micromachined MicroElectroMechanical actuators
72
Reliability of surface polyelectromyographic recordings of motor unit activity
73
Reliability of surface-mount PPTC circuit protection devices
74
Reliability of surveillance mission with unmanned aerial vehicles
75
Reliability of Suspended Bridges on Superconducting Microstrip Filters Using MEMS Switches
76
Reliability of SUV estimates in FDG PET as a function of acquisition and processing protocols
77
Reliability of symmetric hypernets
78
Reliability of syringe infusion pump data channel
79
Reliability of systems of independently developable end-user assessable logical (IDEAL) programs
80
Reliability of Systems Subject to Failures With Dependent Propagation Effect
81
Reliability of Systems with Consecutive Minimal Cutsets
82
Reliability of systems with fuzzy-failure criterion
83
Reliability of Systems with Limited Repairs
84
Reliability of systems with Markov transfer of control
85
Reliability of systems with Markov transfer of control, II
86
Reliability of Systems with Standby Components
87
Reliability of Systems with Time-Varying Coverage
88
Reliability of tantalum-foil-type electrolytic capacitors
89
Reliability of Task Execution During Safe Software Processing
90
Reliability of telecommunication systems as a function of their environment
91
Reliability of telecommunications for bulk power system teleprotection
92
Reliability of the 3-D computer under stress of mechanical vibration and thermal cycling
93
Reliability of the adjustable speed drives in power electronic waveform environment
94
Reliability of the aging lead free solder joint
95
Reliability of the asperity contact model in determining charge injection across interfaces
96
Reliability of the beamsplitter based Bell-state measurement
97
Reliability of the channel estimation for the wireless communication systems
98
Reliability of the Closed-Chain-Fan Social Network
99
Reliability of the Conductor System in Today~s Environment and the Importance of Maintaining Its Integrity
100
Reliability of the design method for optimized multiloop Opto-Electronic Oscillators
101
Reliability of the Fermilab Antiproton source
102
Reliability of the Gaussian broadcast channel with common message and feedback
103
Reliability of the laminate from advanced COPNA-resin/E-glass fabrics system
104
Reliability of the LEP vacuum system: experience and analysis
105
Reliability of the longitudinal welds of LHC main dipoles
106
Reliability of the measurement of RT variability
107
Reliability of the OS-280M Optical Submarine Repeater
108
Reliability of the parameters calibrating algorithm of the virtual studio camera
109
Reliability of the partial CO
2
rebreathing technique for measurement of cardiac output
110
Reliability of the Path Analysis Testing Strategy
111
Reliability of the Pb-free solder bump on electroless ni under bump metallurgies
112
Reliability of the prediction of the location of the culprit lesion from the ECG in totally occluded arteries in case of single vessel disease
113
Reliability of the repelling carrier method of implementing optical FDMA
114
Reliability of the resource sharing backup connections
115
Reliability of the shuffle-exchange network and its variants
116
Reliability of the SnBi lead finished Pb-free produet
117
Reliability of the Station-Keeping Activator Subsystem of a Geostationary Satellite
118
Reliability of the supply and demand distribution in spare parts inventory network
119
Reliability of the TileTrack capacitive user tracking system in smart home environment
120
Reliability of thermal compression bond combine with non conductive paste process in fine pitch micro-bumps soldering
121
Reliability of thermally aged Au and Sn plated copper leads for TAB inner lead bonding
122
Reliability of Thermoelectric Couple Networks Based Upon Couple Catastrophic Failures
123
Reliability of thick Al wire bonds in IGBT modules for traction motor drives
124
Reliability of thick Al wire bonds in IGBT modules for traction motor drives
125
Reliability of thin gate oxide under plasma charging caused by antenna topography-dependent electron shading effect
126
Reliability of Thin Oxide Grown on Heavily Doped Polysilicon
127
Reliability of thin oxides grown on deuterium implanted silicon substrate
128
Reliability of thin seamless package with embedded high-pin-count LSI chip
129
Reliability of thin SiO/sub 2/ at direct-tunneling voltages
130
Reliability of thin SiO
2
films showing intrinsic dielectric integrity
131
Reliability of three-dimensional ferroelectric capacitor memory-like arrays simultaneously submitted to x-rays and electrical stresses
132
Reliability of Three-Electrode Spark Gaps for Synthetic Test Circuits
133
Reliability of three-electrode spark gaps for synthetic test circuits
134
Reliability of thyristor-based memory cells
135
Reliability of time critical multicast communication
136
Reliability of traffic management applications based on digital short-range communications
137
Reliability of transfer of the information in Ethernet radio networks with spasmodic change of frequency
138
Reliability of transformer station 10(20)/0.4 kV grounding system and components
139
Reliability of transformers for electronic applications
140
Reliability of transmission by means of line impedance and K-Factor measurement
141
Reliability of transmission lines fabricated by screen printing for on-wafer measurements at millimeter-wave
142
Reliability of Trench Capacitors for VLSI Memories
143
Reliability of TSV interconnects: Thermal shock and mechanical properties
144
Reliability of tunneling magnetoresistance recording head-lifetime, failure mode, and production screening
145
Reliability of TV klystron with multi stage depressed collector
146
Reliability of two failure mode systems subject to correlated failures
147
Reliability of Two Items in Sequence with Sensing and Switching
148
Reliability of two-dissimilar-unit parallel system with delay in repair
149
Reliability of two-stage weighted-k-out-of-n systems with components in common
150
Reliability of TWTAs and MPMs in orbit
151
Reliability of TWTAs and MPMs in orbit - update 2014
152
Reliability of UHF RFID tags in humid environments
153
Reliability of Ultra Thin Gate Oxide CMOS Devices: Design Perspective
154
Reliability of ultra thinning of flip chips for through-silicon analyses
155
Reliability of ultra-porous low-k materials for advanced interconnects
156
Reliability of ultra-thin chip-on-flex (UTCOF) with anisotropic conductive adhesive (ACA) joints
157
Reliability of ultra-thin dielectrics for giga scale silicon technologies
158
Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing
159
Reliability of Ultra-thin MOS Gate Oxides under Constant Voltage Stressing: Do They Break Down?
160
Reliability of Ultra-thin Oxides for the Giga-bit generations
161
Reliability of ultrathin silicon dioxide under combined substrate hot-electron and constant voltage tunneling stress
162
Reliability of Ultra-thin Zirconium Dioxide (ZrO2) Films on Strained-Si
163
Reliability of underground concrete structures under water ingress attack
164
Reliability of uninterruptible power supply systems
165
Reliability of uniprocessor and multiprocessor real-time artificial intelligence planning systems
166
Reliability of UPS Configurations
167
Reliability of uptake estimates in FDG PET as a function of acquisition and processing protocols using the CPET
168
Reliability of Usability Inspection for Sonification Applications
169
Reliability of utility supply configuration for industrial power systems
170
Reliability of utility supply configurations for industrial power systems
171
Reliability of vacuum switching equipment
172
Reliability of vapor-grown InGaAs and InGaAsP heterojunction laser structures
173
Reliability of vapor-grown planar In/sub 0.53/Ga/sub 0.47/As/InP p-i-n photodiodes with very high failure activation energy
174
Reliability of Various 2-Out-of-4:G Redundant Systems With Minimal Repair
175
Reliability of various industrial substations
176
Reliability of various industrial substations
177
Reliability of various Pb-free solders under vibration and elevated temperature environments
178
Reliability of various size oxide aperture VCSELs
179
Reliability of Various Types of Wafer Level Package (WLP) for Mobile Application
180
Reliability of VCSELs for >25Gb/s
181
Reliability of vehicle-to-vehicle communication at urban intersections
182
Reliability of Velocity Measurement by MTD Radar
183
Reliability of vertical MOSFETs for gigascale memory applications
184
Reliability of via and its diagnosis by e-beam probing
185
Reliability of VLSI-level chip assembly for evaluating the development of back-end technologies using a test chip with a top two-level metal structure
186
Reliability of voting in fault-tolerant software systems for small output-spaces
187
Reliability of wafer level chip scale package (WLCSP) with 96.5Sn-3.5Ag lead-free solder joints on build-up microvia printed circuit board
188
Reliability of wafer level chip scale packages (WL-CSP) under dynamic loadings
189
Reliability of wafer level thin film MEMS packages during wafer backgrinding
190
Reliability of wafer-level SLID bonds for MEMS encapsulation
191
Reliability of wear-out items in electric motors in space — A case study
192
Reliability of wide bandgap semiconductor power switching devices
193
Reliability of widely-tunable SGDBR lasers suitable for deployment in agile networks
194
Reliability of Wind Turbine components — Solder elements fatigue failure
195
Reliability of wind turbine subassemblies
196
Reliability of wireless mesh networks with directional antennas
197
Reliability of wireless on-chip interconnects based on carbon nanotube antennas
198
Reliability of wireless sensor grids
199
Reliability of Wireless Sensor Network: Hotspot and critical challenges
200
Reliability of Wood Transmission Structures Through Nondestructive Evaluation
201
Reliability of Wood Transmission Structures Through Nondestructive Evaluation
202
Reliability of ZigBee networks under broadband electromagnetic noise interference
203
Reliability of ZrO
2
/GeO
x
N
y
stacked high-k dielectrics on Ge under dynamic and pulsed voltage stress
204
Reliability on ARM Processors against Soft Errors by a Purely Software Approach
205
Reliability on the regulatory horizon
206
Reliability optimisation of bulk power systems including voltage stability
207
Reliability optimisation of distribution feeders
208
Reliability Optimization ߞ A Case Study
209
Reliability Optimization by 0-1 Programming for a System with Several Failure Modes
210
Reliability Optimization by Generalized Lagrangian-Function and Reduced-Gradient Methods
211
Reliability optimization design of distribution systems via multi-level hierarchical procedures and generalized reduced gradient method
212
Reliability Optimization for Distributed Systems through Task Clustering
213
Reliability optimization for multilayer active RFID tags on rigid and flexible substrates
214
Reliability optimization for optimal placement of multiple distributed generators in primary distribution network using an evolutionary approach
215
Reliability optimization for redundant Flight Control System based on genetic algorithm
216
Reliability optimization for single-input linear stochastic systems
217
Reliability Optimization for Transmission Expansion Planning
218
Reliability Optimization for Transmission Expansion Planning
219
Reliability optimization for wide bandgap devices: Recent developments in high-spatial resolution thermal imaging of GaN devices
220
Reliability optimization in cable system design using a fuzzy uniform-cost algorithm
221
Reliability optimization in generalized stochastic-flow networks
222
Reliability Optimization in Multiloop Communication Networks
223
Reliability Optimization in Telephone Switching Systems Design
224
Reliability Optimization in the Design of Distributed Systems
225
Reliability Optimization In The Design Of Telephone Networks
226
Reliability optimization model of standby phased-mission systems based on BDD
227
Reliability optimization models for embedded systems with multiple applications
228
Reliability optimization models for fault-tolerant distributed systems
229
Reliability optimization of a series system with multiple-choice and budget constraints using a genetic algorithm
230
Reliability Optimization of a Series-Parallel System
231
Reliability optimization of coherent systems
232
Reliability optimization of complex technical systems and its application to port terminal transportation system
233
Reliability optimization of complex weapon system using Particle Swarm Optimization algorithm
234
Reliability optimization of computer communication networks using genetic algorithms
235
Reliability optimization of computer-communication networks
236
Reliability optimization of distributed access networks with constrained total cost
237
Reliability optimization of multi-state weighted k-out-of-n systems by fuzzy mathematical programming and genetic algorithm
238
Reliability Optimization of Overlay Multicast Topology with Efficient Genetic Algorithm
239
Reliability optimization of phased-mission systems with multimode failures based on simulation
240
Reliability optimization of PLC-integrated high-quality power supply protection systems
241
Reliability Optimization of Reconfigurable Computing-Based Fault-Tolerant System
242
Reliability Optimization of Reconfigurable FPGA Based on Second-Order Approximation Domain-Partition
243
Reliability optimization of redundant software with correlated failures
244
Reliability optimization of series-parallel systems using a genetic algorithm
245
Reliability Optimization of Stacked System-in-Package Using FEA
246
Reliability optimization of systems by a surrogate-constraints algorithm
247
Reliability Optimization Problems with Multiple Constraints
248
Reliability Optimization using SLUMT
249
Reliability Optimization with Multiple Properties and Integer Variables
250
Reliability Optimization with the Lagrange-Multiplier and Branch-and-Bound Technique
251
Reliability Optimizing of the Series-Parallel System Owing to Immune Genetic Algorithm
252
Reliability Options for Data Communications in the Future Deep-Space Missions
253
Reliability Options in Distribution Planning Using Distributed Generation
254
Reliability or liability?
255
Reliability or performance: A tradeoff in wireless sensor networks
256
Reliability oriented allocation of files on distributed systems
257
Reliability Oriented Design Tool For the New Generation of Grid Connected PV-Inverters
258
Reliability oriented optimal displacement of conventional generators by using Particle Swarm Optimization
259
Reliability oriented process and device simulations of power VDMOS transistors in Bipolar/CMOS/DMOS technology
260
Reliability oriented task allocation in heterogeneous distributed computing systems
261
Reliability over time of EEG-based mental workload evaluation during Air Traffic Management (ATM) tasks
262
Reliability Overview of RF MEMS Devices and Circuits
263
Reliability overview of RF MEMS devices and circuits
264
Reliability parameter estimation of the Inverse Flexible Weibull Distribution for type-I censored samples
265
Reliability parameters of compound embedded systems
266
Reliability parameters of equipment with a general repair-time distribution
267
Reliability performance analysis in power distribution system using Weibull distribution-A case study
268
Reliability performance analysis vs. deployment cost of fiber access networks
269
Reliability performance and failure mode of high I/O thermally enhanced ball grid array packages
270
Reliability performance assessment and characterization of fine pitch mold array BGA
271
Reliability performance assessment in smart grids with demand-side management
272
Reliability performance characterization of SOI FinFETs
273
Reliability performance index probability distribution analysis of bulk electricity systems
274
Reliability performance of advanced metallization options for 30nm ½ pitch in SiCOH low-k materials
275
Reliability performance of Au-Sn and Cu-Sn wafer level SLID bonds for MEMS
276
Reliability performance of components and ICs from a production 1 μm GaAs HBT process
277
Reliability performance of different layouts of wide metal tracks
278
Reliability performance of ETOX based flash memories
279
Reliability performance of optical cross-connect switches-requirements and practice
280
Reliability Performance of Passive Optical Networks
281
Reliability performance of shuffle exchange omega network
282
Reliability performance of smart grids with demand-side management and distributed generation/storage technologies
283
Reliability Performance of Stretch Solder Interconnections
284
Reliability performances of optical ATM switches based on different routing and buffering schemes
285
Reliability perspective of high-k gate dielectrics - what is different from SiO
2
?
286
Reliability Perspective of High-k Gate Stack Assessed by Temperature Dependence of Dielectric Breakdown
287
Reliability perspectives for high density PRAM manufacturing
288
Reliability Phenomena in Aluminum Metalizations on Silicon Dioxide
289
Reliability Physics
290
Reliability Physics (The Physics of Failure)
291
Reliability physics and chemistry of thin and high-k gate oxides
292
Reliability physics and electronics design for high operating temperatures
293
Reliability physics and probabilistic design for reliability (PDfR): Role, attributes, challenges
294
Reliability Physics at RADC
295
Reliability physics in electronics: a historical view
296
Reliability Physics Models
297
Reliability Planning at Dominion
298
Reliability Planning for Space Systems
299
Reliability polynomial for a ring network
300
Reliability polynomials and link importance in networks
301
Reliability polynomials crossing more than twice
302
Reliability Polynomials of Networks with Vertex Failure
303
Reliability practice at NASA Goddard Space Flight Center
304
Reliability practice in Aerospace Zero-defect Systems Engineering Management
305
Reliability practices for satellite design and assembly focusing on FMECA, cleanliness and X-ray inspection
306
Reliability Prediction
307
Reliability prediction
308
Reliability prediction and assessment of fielded software based on multiple change-point models
309
Reliability prediction and estimation of PROLOG programs
310
Reliability prediction and Markov analysis of braking system based on Relex 2009
311
Reliability prediction and real world for LED lamps
312
Reliability prediction and sensitivity analysis based on software architecture
313
Reliability prediction and simulation for a communications-satellite fleet
314
Reliability prediction based on degradation measure distribution and wavelet neural network
315
Reliability prediction based on degradation modeling for systems with multiple degradation measures
316
Reliability prediction for a class of highly reliable digital systems
317
Reliability prediction for complex medical systems
318
Reliability Prediction for Component-Based Software Systems with Architectural-Level Fault Tolerance Mechanisms
319
Reliability Prediction for Component-Based Systems: Incorporating Error Propagation Analysis and Different Execution Models
320
Reliability Prediction for Continuously Operating Systems
321
Reliability prediction for internetware applications: a research framework and its practical use
322
Reliability Prediction for Inverters in Hybrid Electrical Vehicles
323
Reliability Prediction for Inverters in Hybrid Electrical Vehicles
324
Reliability prediction for repairable redundant systems
325
Reliability prediction for self-repairing flight control systems
326
Reliability Prediction for Service Component Architectures with the SCA-ASM Component Model
327
Reliability Prediction for Service Oriented System via Matrix Factorization in a Collaborative Way
328
Reliability prediction for service-oriented computing environments
329
Reliability prediction for smart meter based on Bellcore standards
330
Reliability prediction for textile packages
331
Reliability prediction for TFBGA assemblies
332
Reliability prediction for TFBGA assemblies
333
Reliability prediction for the spring-cam actuator of vacuum circuit breaker
334
Reliability Prediction Formulas for Standby Redundant Structures
335
Reliability prediction in electronic packages using molecular simulation
336
Reliability Prediction Method Based on Function and Fault Reasoning for Electronic Products
337
Reliability prediction method for electronic systems: a comparative reliability assessment method
338
Reliability Prediction Method of Fatigue Life for Rod String
339
Reliability prediction method with field environment variation
340
Reliability prediction model for gyroscopes
341
Reliability Prediction Model for SOA Using Hidden Markov Model
342
Reliability Prediction Model of Aircraft using Self-Organizing Map
343
Reliability prediction modeling of semiconductor light emitting device
344
Reliability prediction models to support conceptual design
345
Reliability prediction of 3C-SiC cantilever beams using dynamic Raman spectroscopy
346
Reliability prediction of a hydraulic system with probabilistic model checking
347
Reliability prediction of a trajectory verification system
348
Reliability prediction of an Ethernet Bus Interface Controller in a nuclear power plant simulator
349
Reliability prediction of constant fraction discriminator using modified PoF approach
350
Reliability prediction of diffused pathset routing in wireless multihop networks
351
Reliability Prediction of Direct Tunneling RAM with SiON and HfSiON Tunnel Dielectrics Based on Transistor Leakage Current Measurements
352
Reliability prediction of distributed embedded fault-tolerant systems
353
Reliability prediction of electronic packages
354
Reliability prediction of Electronic Power Conditioner (EPC) using MIL-HDBK-217 based parts count method
355
Reliability prediction of engine systems using least square support vector machine
356
Reliability Prediction of Fuel cycling System in Pebble Bed Reactor Based on GO Methodology
357
Reliability prediction of hydraulic gasket sealing
358
Reliability prediction of LAN/WLAN integration network based on artificial intelligence
359
Reliability prediction of long-lived linear assets with incomplete failure data
360
Reliability Prediction of Machining Center using Grey System Theory and GO Methodology
361
Reliability prediction of MOS devices: experiments and model for charge build up and annealing
362
Reliability prediction of new improved current source inverter (CSI) topology for transformer-less grid connected solar system
363
Reliability prediction of offshore oil and gas equipment for use in an arctic environment
364
Reliability prediction of optocouplers for the safety of digital instrumentation
365
Reliability prediction of PV inverters based on MIL-HDBK-217F N2
366
Reliability Prediction of Re-Used Electronics Circuit Boards
367
Reliability Prediction of Silicon Bipolar Transistors by Means of Noise Measurements
368
Reliability prediction of single-board computer based on physics of failure method
369
Reliability Prediction of Smartphone Applications through Failure Data Analysis
370
Reliability prediction of solid dielectrics using electrical Noise as a screening parameter
371
Reliability prediction of substitute parts based on component temperature rating and limited accelerated test data
372
Reliability Prediction of the Series System with Spares Subject to Weibull Failures
373
Reliability prediction of weapon systems
374
Reliability Prediction of Web Service Composition Based on DTMC
375
Reliability Prediction on the Vehicle Control System
376
Reliability prediction or reliability assessment
377
Reliability prediction or reliability assessment
378
Reliability prediction sensitivity analysis — How to perform reliability prediction time efficiently
379
Reliability Prediction Studies of Complex Systems Having Many Failed States
380
Reliability Prediction Techniques for Complex Systems
381
Reliability prediction through Bayesian inference based on product change
382
Reliability prediction through critical area analysis
383
Reliability prediction through degradation data modeling using a quasi-likelihood approach
384
Reliability prediction using an unequal interval grey model
385
Reliability prediction using fuzzy logic
386
Reliability Prediction using Large MOS Capacitors
387
Reliability prediction using multivariate degradation data
388
Reliability prediction using nondestructive accelerated-degradation data: case study on power supplies
389
Reliability Prediction Using Physics–Statistics-Based Degradation Model
390
Reliability prediction using the concept of relevant-condition parameters
391
Reliability prediction, in the conceptual phase, of a processor system with its embedded software
392
Reliability prediction: a state-of-the-art review
393
Reliability Prediction: improving the Crystal Ball
394
Reliability prediction: the turn-over point
395
Reliability predictions - continued reliance on a misleading approach
396
Reliability predictions — more than the sum of the parts
397
Reliability Predictions and System Support Costs
398
Reliability Predictions and System Support Costs
399
Reliability predictions based on criticality-associated similarity analysis
400
Reliability predictions based on customer usage stress profiles
401
Reliability predictions for high density packaging
402
Reliability predictions for strained-Si/SiGe Quantum-well p-MOSFETs
403
Reliability predictions to support a design for reliability program
404
Reliability Predictions, a Case History
405
Reliability Pricing Using Contingent Contracts
406
Reliability principles and practices
407
Reliability probability evaluation of wind turbine based on Monte-Carlo simulation
408
Reliability problems due to ionic conductivity of IC encapsulation materials under high voltage conditions
409
Reliability problems investigation during the pLEDMOS fabrication
410
Reliability problems of polysilicon/Al contacts due to grain-boundary enhanced thermomigration effects
411
Reliability processing of the circuits in CPLD design
412
Reliability products for Space Launch Vehicle safety assessments
413
Reliability prognostics for electronics via built-in diagnostic tools
414
Reliability program and results for a 4K dynamic RAM
415
Reliability Program Development and Implementation for a Remote Piloted Vehicle
416
Reliability program for a financial computer-operations center
417
Reliability program for mill maintenance
418
Reliability program for neonatal intensive care equipment
419
Reliability program for plant maintenance
420
Reliability program management: today and tomorrow
421
Reliability program plan for R & D organizations
422
Reliability Program Plan Is Not Enough
423
Reliability Program Planning, Organization and Direction
424
Reliability Programs and the Problem of Attaining High Probabilities of Mission Success in Space Exploration
425
Reliability Programs for Commercial Communication Satellites
426
Reliability Project Coordinator - An Extension of the Management Function
427
Reliability projection and polarity dependence of TDDB for ultra thin CVD HfO/sub 2/ gate dielectrics
428
Reliability projection for ultra-thin oxides at low voltage
429
Reliability properties assessment at system level: a co-design framework
430
Reliability properties comparison for epitaxy and non-epitaxy wafers on DRAM devices
431
Reliability properties in sub-50nm high performance high-k/metal gate stacks SiGe pMOSFETs
432
Reliability Properties of
Systems
433
Reliability properties of low voltage PZT ferroelectric capacitors and arrays
434
Reliability properties of low-voltage ferroelectric capacitors and memory arrays
435
Reliability Properties of Rapid Thermal Processed Nitrided Oxides after Fowler-Nordheim Electrical Stress
436
Reliability Properties of Series and Parallel Systems under Equilibrium Distribution
437
Reliability Properties of Ta2O5 Films Grown on N2O Plasma Nitrided Silicon
438
Reliability proving of 980 nm pump lasers for metro applications
439
Reliability purge test of SAGCM InGaAs/InP APDs
440
Reliability Pyramid Based Dense Corresponding between Facial Texture Images
441
Reliability qualification of a demountable packaging technology
442
Reliability qualification of a smart power technology for high temperature application based on physics-of-failure and risk & opportunity assessment
443
Reliability Qualification of CoSi2 Electrical Fuse for 90Nm Technology
444
Reliability Qualification of Flexible Printed Circuits with Common and New Methods
445
Reliability qualification of photovoltaic smart panel electronics
446
Reliability qualification test for circuit boards exposed to airborne hygroscopic dust
447
Reliability quantification of induction motors-accelerated degradation testing approach
448
Reliability quantification of the flexure: a critical stirling convertor component
449
Reliability Quantification of the Tree Structure Based Distributed System
450
Reliability quantitative analysis for rotor vibration based on WCFSE
451
Reliability questions
452
Reliability ratio based weighted bit-flipping decoding for LDPC codes
453
Reliability ratio based weighted bit-flipping decoding for low-density parity-check codes
454
Reliability Reduction in Electrical Installations Due to Equipment Overload
455
Reliability Redundancy Design of Underwater Sensor Networks
456
Reliability related concept comparison and derivation of a risk analysis in early design stages
457
Reliability requirements for submarine systems components
458
Reliability research based on the fuzzy random time-variant probabilistic model for flexure member of reinforced concrete bridge beam
459
Reliability research for PV system using BDD-based fault tree analysis
460
Reliability Research for Steer-by-Wire System of Electric Vehicle
461
Reliability Research in Japan Guest Editor´s Preface
462
Reliability research of impact fatigue life for pump´s valve covers
463
Reliability research of the cutting machines performance specification forecast
464
Reliability Research of Web Press High Speed Feeding Paper System
465
Reliability research of wireless sensor network node
466
Reliability research on multi-switch fibre channel fabric networks
467
Reliability research on optoelectronics packaging
468
Reliability research on power MOSFET using coupled electrical-thermal-mechanical analysis
469
Reliability Research on the Thermal Deformation and Stress of Metal Packaging With Low-Resistance Leads
470
Reliability research on the thermal deformation and thermal stress of the metal packaging with low resistance and high electric current
471
Reliability Research on Travel Time of Transportation Network
472
Reliability response of plasma nitrided gate dielectrics to physical and electrical CET-scaling
473
Reliability Responsibilities
474
Reliability Results of 0.8 mil Fine Pitch Copper wire bonding on Immersion Gold Plated Pad for Copper Low-k Devices
475
Reliability results of HBTs with an InGaP emitter
476
Reliability results on a 0.25 micron aluminum backend with a TiN sidewall
477
Reliability results on electron bombarded semiconductor power devices
478
Reliability review of 250 GHz fully self aligned heterojunction bipolar transistors for millimeterwave applications
479
Reliability review of North American gas/electric system interdependency
480
Reliability roadmap and industry collaboration
481
Reliability robustness of 65nm BEOL Cu damascene interconnects using porous CVD low-k dielectrics with k = 2.2
482
Reliability Sampling Methodology Using Simulation and Re-Sampling
483
Reliability sampling plans for lognormal distribution, based on progressively-censored samples
484
Reliability Sampling Plans Under Progressive Type-I Interval Censoring Using Cost Functions
485
Reliability scaling issues for nanoscale devices
486
Reliability schemes for nano-communications
487
Reliability Schemes for P2P Systems in Dynamic Mobile Environments
488
Reliability Screening of a-Si TFT Circuits: Very-Low Voltage and
Testing
489
Reliability Screening Procedures for Integrated Circuits
490
Reliability sensitivity analysis based on system failure evolution
491
Reliability sensitivity analysis for Yahoo! Pipes mashups
492
Reliability sensitivity analysis involving correlated random variables by directional sampling
493
Reliability sensitivity analysis of mechanical parts with multiple failure modes
494
Reliability sensitivity analysis via the likelihood ratio method
495
Reliability sensitivity analysis with mixture of random and fuzzy variables
496
Reliability significant improvement of resistive switching memory by dynamic self-adaptive write method
497
Reliability simulation analysis for complex mechanism based on support vector machine
498
Reliability simulation analysis method based on stress-damage model of electronic product
499
Reliability simulation and analysis of messenger wire bearing on electrified railways
500
Reliability Simulation and Circuit-Failure Analysis in Analog and Mixed-Signal Applications
501
Reliability Simulation and Design Consideration of High Speed ADC Circuits
502
Reliability simulation and structural optimization for mechanical loading
503
Reliability simulation for phased mission system with multi-mode failures based on CPN
504
Reliability simulation model for systems with multiple intermediate storages
505
Reliability simulation of component-based software systems
506
Reliability simulation of fault-tolerant software and systems
507
Reliability simulation of fretting wear based on neural network response surface in space structure latches
508
Reliability Simulation of Large-Scale Networks using Sampling-Scale
509
Reliability simulation of metal bump in a three-dimensional chip stacking structure
510
Reliability simulation of surface crack growth and analysis of life cycles
511
Reliability simulation of TMO RRAM
512
Reliability Simulation Prediction Based on Multi-factors for CNC Bending Machine Tools
513
Reliability simulation shows results
514
Reliability simulator for interconnect and intermetallic contact electromigration
515
Reliability Society to Offer Scholarships
516
Reliability Society to Offer Scholarships
517
Reliability Society to Offer Scholarships
518
Reliability Society to Offer Scholarships
519
Reliability Society to Offer Scholarships
520
Reliability Society to Offer Scholarships
521
Reliability Society to Offer Scholarships
522
Reliability Society to Offer Scholarships
523
Reliability Society to Offer Scholarships
524
Reliability Society to Offer Scholarships
525
Reliability software AVALON
526
Reliability specialists-a critical need
527
Reliability specification methods for preventing long service outages in telecommunication networks
528
Reliability Speedup: An Effective Metric for Parallel Application with Checkpointing
529
Reliability Statistic Estimation on Network via Perfect Sampling
530
Reliability statistics analysis of components using masked series system life data from random censoring test with incomplete information
531
Reliability statistics perspective on standard wafer-level electromigration accelerated test (SWEAT)
532
Reliability status of GaN transistors and MMICs in Europe
533
Reliability Stipulated Microgrid Architecture Using Particle Swarm Optimization
534
Reliability stress test method: impact on the new product introduction process, time to market, field reliability impact and reliability assessment
535
Reliability structure functions based upon fuzzy numbers
536
Reliability studies μBGA solder joints-effect of Ni-Sn intermetallic compound
537
Reliability Studies and Implementation of Remote Monitoring and Self-Diagnosis on a Smart System for Fast Transients Characterization in Power Networks
538
Reliability studies for Three Gorges DC system
539
Reliability studies of 0.85 mu m vertical cavity surface emitting lasers: 50000 h MTTF at 25 degrees C
540
Reliability studies of a 22nm SoC platform technology featuring 3-D tri-gate, optimized for ultra low power, high performance and high density application
541
Reliability studies of a 32nm System-on-Chip (SoC) platform technology with 2
nd
generation high-k/metal gate transistors
542
Reliability studies of a PV-WG hybrid system in presence of multi-micro storage systems
543
Reliability studies of a through via silicon stacked module for 3D microsystem packaging
544
Reliability studies of AlGaN/GaN high electron mobility transistors (HEMT)
545
Reliability studies of an isotropic electrically conductive adhesive
546
Reliability studies of AuGe/Ni/Au ohmic contacts to MESFETs by accelerated thermal aging tests
547
Reliability studies of bent-beam electro-thermal actuators
548
Reliability studies of decay heat removal system
549
Reliability studies of gain-guided 0.85 μm GaAs/AlGaAs quantum well surface emitting lasers
550
Reliability Studies of Gunn Diodes
551
Reliability studies of Hf-doped and NH
3
-nitrided gate dielectric for advanced CMOS application
552
Reliability studies of leadless chip carrier assemblies using the integrated matrix creep method
553
Reliability Studies of LSI Arrays Employing Al-Si Schottky Barrier Devices
554
Reliability Studies of Mesa Transistors
555
Reliability studies of mo layer deposited on polyimide substrate for CIGS solar cell applications
556
Reliability Studies of MOS Si-Gate Arrays
557
Reliability studies of one-micron Schottky gate GaAs FET
558
Reliability studies of photovoltaic module insulation systems
559
Reliability Studies of Planar Silicon Detectors
560
Reliability studies of plastic ball grid array assemblies reflowed in nitrogen ambient
561
Reliability Studies of Polysilicon Fusible Link PROM´s
562
Reliability studies of single crystal silicon beams for rigid micro mirrors
563
Reliability studies of Sn-Ag-Cu BGA solder joints on Ni/Cu/Au surface finish for SMAFTI packaging technology
564
Reliability studies of surface mount solder joints - effect of Cu-Sn intermetallic compounds
565
Reliability studies of surface mount, solder joints-effect of Cu-Sn intermetallic compounds
566
Reliability studies of wafer-bonded InGaAs P-I-N photodetectors on GaAs substrates
567
Reliability studies on a 45nm low power system-on-chip (SoC) dual gate oxide high-k / metal gate (DG HK+MG) technology
568
Reliability studies on GaAs MESFETs fabricated using spin-on platinum source
569
Reliability studies on high current power modules with parallel mosfets
570
Reliability Studies on High-Temperature Operation of Mixed As/Sb Staggered Gap Tunnel FET Material and Devices
571
Reliability studies on micro-bumps for 3-D TSV integration
572
Reliability studies on micro-joints for 3D-stacked chip
573
Reliability Studies on Non Planar DRAM Cell Transistor
574
Reliability studies on sub 100 nm SOI-MNSFETs
575
Reliability Studies on the 2-Level Al/SiO2/Al System
576
Reliability studies on the bonding materials for ceramic-metal composite actuators
577
Reliability studies on thin metal-insulator-metal (MIM) capacitors
578
Reliability studies utilizing rapid-scan microscopy
579
Reliability study and failure analysis of fine pitch solder bumped flip chip on low-cost printed circuit board substrate
580
Reliability study and failure analysis of fine pitch solder-bumped flip chip on low-cost flexible substrate without using stiffener
581
Reliability study for CTE mismatching in build-up structure
582
Reliability study for high temperature stable conductive adhesives
583
Reliability study for large silicon interposers report on board
584
Reliability Study for Test Lands Targeting during Electrical Testing
585
Reliability study for the refurbishment of a HV/MV transformer substation
586
Reliability study for the refurbishment of a HV/MV transformer substation
587
Reliability study in capacitor less 1T-RAM cells on SOI
588
Reliability Study in Solder Joint under Electromigration and Thermal-Mechanical Load
589
Reliability Study of 0.15um MHEMT with Vds≫3V Bias for Amplifier Application
590
Reliability study of 1.55 μm distributed Bragg reflector lasers
591
Reliability study of 1.55-μm DBR lasers grown in three MOVPE steps
592
Reliability study of 3-D stacked structures
593
Reliability study of 3D-WLP through silicon via with innovative polymer filling integration
594
Reliability study of 850 nm VCSELs for data communications
595
Reliability study of 90nm CMOS inverter
596
Reliability study of a control system for CMMB transmitter
597
Reliability study of a distributed generation system based on renewable energy
598
Reliability study of a flip-chip-on-silicon BGA (FSBGA) package
599
Reliability study of a GaAs MMIC amplifier
600
Reliability Study of a High-Precision Thick Film Resistor Network
601
Reliability study of a low-voltage Class-E power amplifier in 130nm CMOS
602
Reliability study of a micro grid system with optimal sizing and placement of DER
603
Reliability study of a micro-grid power system
604
Reliability study of AlTi/TiW, polysilicon and ohmic contacts for piezoresistive pressure sensors applications
605
Reliability study of an epoxy-bonded laser-to-fiber assembly
606
Reliability Study of an N-Channel Silicon Gate FET with Field Shield
607
Reliability study of Au-In transient liquid phase bonding for SiC power semiconductor packaging
608
Reliability study of beam and plate structures based on stochastic finite element method
609
Reliability study of bilayer graphene - material for future transistor and interconnect
610
Reliability Study of Cable, Terminations, and Splices by Electric Utilities in the Northwest
611
Reliability study of carbon-doped GST stack robust against Pb-free soldering reflow
612
Reliability study of ceramic substrate in a SIP type package
613
Reliability study of CMOS FinFETs
614
Reliability Study of Coding Schemes for Wide-Area Distributed Storage Systems
615
Reliability study of complex power systems
616
Reliability study of digital silicon photonic MEMS switches
617
Reliability study of disengaging mechanism based on fault tree analysis
618
Reliability study of fault-tolerant multiwavelength nonblocking optical cross connect based on InGaAsP/InP laser-amplifier gate-switch arrays
619
Reliability study of flexible display module by experiments
620
Reliability study of flip chip on FR4 interconnections with ACA
621
Reliability Study of GaAs MESFET´s
622
Reliability Study of GaAs, 63P.37 LED´S
623
Reliability study of gallium arsenide transistors
624
Reliability Study of High Efficiency Gallium Arsenide Avalanche Diodes
625
Reliability Study of High-Density EBGA Packages Using the Cu Metallized Silicon
626
Reliability study of high-end Pb-free CBGA solder joint under various thermal cycling test conditions
627
Reliability study of high-pin-count flip-chip BGA
628
Reliability Study of HV Substations Equipped With the Fault Current Limiter
629
Reliability study of hybrid PV-wind power systems to isolated micro-grid
630
Reliability study of InAs/InGaAs quantum dot diode lasers
631
Reliability Study of InGaP/GaAs HBT for 28V Operation
632
Reliability Study of Interconnect Structures in IC Packages
633
Reliability study of isotropic electrically conductive adhesives under thermal cycling testing
634
Reliability study of lead-free flip-chips with solder bumps down to 30 μm diameter
635
Reliability study of liner/barrier/seed options for via-middle TSV´s with 3 micron diameter and below
636
Reliability Study of Loss of Off-Site Power Supply
637
Reliability study of low cost alternative Ag bonding wire with various bond pad materials
638
Reliability Study of Low Normal Force LGA Sockets
639
Reliability study of magnetic tunnel junction with naturally oxidized MgO barrier
640
Reliability study of MANOS with and without a SiO
2
buffer layer and BE-MANOS charge-trapping NAND flash devices
641
Reliability study of metro Ethernet
642
Reliability study of micro-pin fin array for on-chip cooling
643
Reliability Study of Microwave GaAs Field-Effect Transistors
644
Reliability Study of Microwave Transistors
645
Reliability study of mounting structure for high temperature power semiconductor device chip using high purity aluminum
646
Reliability Study of Nanoporous Silicon Oxide Impedance Biosensor for Virus Detection: Influence of Surface Roughness
647
Reliability study of ONO gate film in high speed PTOx-TMOS based on electrical characteristics under high electric field
648
Reliability study of onshore and offshore wind generation and impact of location
649
Reliability Study of Optical Adhesive For Photonic Devices Under The High Temperature And High Humid Environment
650
Reliability study of parasitic source and drain resistances of InP-based HEMTs
651
Reliability study of phase-change nonvolatile memories
652
Reliability study of planarized aluminum metallization
653
Reliability Study of Plastic Encapsulated Copper Lead Frame/Epoxy Die Attach Packaging System
654
Reliability study of reconfigurable unit in auto-sorting system of post office
655
Reliability study of redundant configuration of IMU fiber optic gyroscope inertial measurement unit
656
Reliability Study of Regional Power Network Communication
657
Reliability study of RFID flip chip assembly by isotropic conductive adhesive through computer simulation
658
Reliability Study of RTV 566 for Its Application as a “Spring”
659
Reliability Study of Ruthenium-Based Dye-Sensitized Solar Cells (DSCs)
660
Reliability study of selected communication systems for energy grid
661
Reliability study of shape factors on metal-insulator-metal (MIM) capacitors
662
Reliability study of single-poly floating gates in 0.13 μm CMOS for use in field programmable analog arrays
663
Reliability study of solder interface with voids using an irreversible cohesive zone model
664
Reliability Study of Split Gate Silicon Nanocrystal Flash EEPROM
665
Reliability study of stretchable electronics interconnect by simulation
666
Reliability study of sub 100 micron pitch, flex-to-ITO/glass interconnection, bonded with an anisotropic conductive film
667
Reliability study of the digital rocket-ground signal detection and analysis system
668
Reliability study of the JET neutral injection system
669
Reliability study of the laminate-based flip-chip chip scale package
670
Reliability study of the solder joints in CCGA package during thermal test
671
Reliability study of the Stud Bump Bonding flip chip technology on Molded Interconnect Devices
672
Reliability study of thin inter-poly dielectrics for non-volatile memory application
673
Reliability study of two station configurations for connecting IPPs to a radial supply system
674
Reliability Study of Wire Bonds to Silver Plated Surfaces
675
Reliability study of Zinc Oxide thin-film transistor with High-K gate dielectric
676
Reliability study on 50-100-mW CW operation of 680-nm visible laser diodes with a window-mirror structure
677
Reliability Study on Absolute Pressure Sensitive Chip Vacuum Packaging
678
Reliability Study on Adhesive Interconnections in Flex-to-Flex Printed Electronics Applications Under Environmental Stresses
679
Reliability study on chip capacitor solder joints under thermo-mechanical and vibration loading
680
Reliability Study on Copper Pillar Bumping with Lead Free Solder
681
Reliability study on high density LED packaging with Chip On Board structures
682
Reliability study on high power LED with chip on board
683
Reliability study on InP/InGaAs emitter-base junction for high-speed and low-power InP HBT
684
Reliability study on polycrystalline silicon thin film resistors used in LSIs under thermal and electrical stress
685
Reliability study on pseudomorphic InGaAs power HEMT devices at 60 GHz
686
Reliability study on SMD components on an organic substrate with a thick copper core for power electronics applications
687
Reliability study on system memories of an iterative MIMO-BICM system
688
Reliability study on technology trends beyond 20nm
689
Reliability study on through mold via (TMV) for 3D microelectronic packaging under thermal and moisture loadings
690
Reliability study on tri-gate nanowires poly-Si TFTs under DC and AC hot-carrier stress
691
Reliability study on unitraveling-carrier photodiode for a 40 Gbit/s optical transmission systems
692
Reliability study under DC stress on mmW LNA, Mixer and VCO
693
Reliability Study: A Digitally Controlled Ring Generator System vs Traditional Systems
694
Reliability Support for On-Chip Memories Using Networks-on-Chip
695
Reliability Support in Virtual Infrastructures
696
Reliability Support Protocol for Continuous Object Detection in Large-Scale Wireless Sensor Networks
697
Reliability survey of 600 to 1800 kW diesel and gas-turbine generating units
698
Reliability survey of diesel and gas-turbine generating units
699
Reliability survey of military acquisition systems
700
Reliability survey of standby generator by evaluation of maintenance service data
701
Reliability surveying-segmenting for comparability
702
Reliability Symposium scheduled for January 22–24 in San Francisco
703
Reliability symposium scheduled for January 22-24 in San Francisco
704
Reliability tactics
705
Reliability Targets for a Calibration Program
706
Reliability techniques for combined hardware/software systems
707
Reliability Techniques for RFID-Based Object Tracking Applications
708
Reliability Techniques in the Service of Industry
709
Reliability Technology and Nuclear Power
710
Reliability technology to achieve insertion of advanced packaging (RELTECH) program
711
Reliability Technology to Achieve Insertion of Advanced Packaging (RELTECH) program
712
Reliability Terminology and Formulae for Photovoltaic Power Systems
713
Reliability test and analysis for vibration-induced solder joint failure of PBGA assembly
714
Reliability test and failure analysis of high-brightness LEDs from Cree under the various injection currents
715
Reliability test and failure analysis of optical MEMS
716
Reliability test and IMC investigation of lead and lead free solder joints on different surface finish processes
717
Reliability test and simulation analyses for high power LED
718
Reliability test chips: NIST 33 and NIST 34 for JEDEC inter-laboratory experiments and more
719
Reliability test failure analysis using advance FA techniques on Cu wire bonded devices
720
Reliability Test for 500 kV GIS
721
Reliability Test for 500 kV Gis
722
Reliability Test Method Overview to Characterize Second Level Interconnects
723
Reliability test methods for media-compatible pressure sensors
724
Reliability test of interconnections using electrical noise measurement
725
Reliability test of MESFETs in presence of hot electrons
726
Reliability Test of Using 802.11b Technology In Switchgear for Measurement and Control
727
Reliability test procedures for achieving highly robust electronic products
728
Reliability test procedures: LSI circuits: Fault models make high-volume testing practical
729
Reliability Test Results for Optical Devices Assembled with a Non-Smell & Highly Moisture Durable New Optical Adhesive
730
Reliability test results for physical contact between connectors assembled with different material ferrules
731
Reliability test results for W FIB interconnect structures
732
Reliability test target development
733
Reliability test to key components of radio fuze under high impact and high temperature
734
Reliability Testing
735
Reliability testing and analysis of IGBT power semiconductor modules
736
Reliability testing and data analysis of an 1657CCGA (ceramic column grid array) package with lead-free solder paste on lead-free PCBs (printed circuit boards)
737
Reliability Testing and Evaluation of Magnetic Bubble Memories for Electronic Switching Systems
738
Reliability testing and Failure Analysis of 3D integrated systems
739
Reliability Testing and Modeling of Anisotropic Conductive Adhesive Joints Under Temperature Cycling Test
740
Reliability testing and stress strain estimations of flip-chip joints made by stud-bump-bonding technique
741
Reliability testing and test structure design in an age of increasing variability
742
Reliability testing beyond Qualification as a key component in photovoltaic´s progress toward grid parity
743
Reliability testing by precise electrical measurement
744
Reliability testing for customer satisfaction attributes
745
Reliability Testing for Hostile Environments
746
Reliability Testing for Industrial Use
747
Reliability testing for non-constant MTBFs
748
Reliability testing in practice
749
Reliability testing method for RDS based on the PI code statistics
750
Reliability testing methodology of broadly tunable laser chips for external cavity lasers
751
Reliability testing of 0.1 μm GaAs pseudomorphic HEMT MMIC amplifiers
752
Reliability testing of a software-driven system
753
Reliability testing of AlGaN/GaN HEMTs under multiple stressors
754
Reliability testing of aluminum magnet wire connections for hermetic motors
755
Reliability testing of an lna with 0.18 μm gate process
756
Reliability testing of applications on Windows NT
757
Reliability testing of cell assemblies for photovoltaic concentrator modules
758
Reliability testing of Cu-Sn intermetallic micro-bump interconnections for 3D-device stacking
759
Reliability testing of electric motors
760
Reliability testing of electric motors
761
Reliability testing of electrically conductive joints made of sintered nano silver
762
Reliability testing of electronic packages in harsh environments
763
Reliability Testing of Fluorinated Polymeric Materials (FNP) for Hybrid Encapsulation
764
Reliability testing of frequency converters with salt spray and temperature humidity tests
765
Reliability testing of GaAs MMICs
766
Reliability testing of high aspect ratio through silicon vias fabricated with atomic layer deposition barrier, seed layer and direct plating and material properties characterization of electrografted insulator, barrier and seed layer for 3-D integration
767
Reliability testing of in vivo
1
H-MRS-signals and elimination of signal artifacts by median filtering
768
Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications
769
Reliability testing of InP HEMT´s using electrical stress methods
770
Reliability testing of large area 3J space solar cells
771
Reliability testing of lead-free solder joints
772
Reliability testing of methodology developed for acquisition of acoustic patterns for liquids
773
Reliability Testing of Microwave Transistors for Array-Radar Applications
774
Reliability Testing of Polytronics Components in the Micro-Nano Region
775
Reliability testing of power units
776
Reliability testing of power VDMOS transistors
777
Reliability testing of PV modules
778
Reliability testing of rule-based systems
779
Reliability testing of semiconductor devices in a humid environment
780
Reliability testing of silicone-based thermal greases [IC cooling applications]
781
Reliability testing of single diffused planar InP/InGaAs avalanche photodiodes
782
Reliability testing of solder joints in surface mounted assembly using real-time holographic interferometry
783
Reliability testing of state-of-the-art PM HEMT MMICs three-stage low-noise amplifier
784
Reliability testing of structures with road loadings
785
Reliability testing of through-silicon vias for high-current 3D applications
786
Reliability testing of TIM materials with thermal transient measurements
787
Reliability Testing of Triacs
788
Reliability testing of wire bonds using pad resistance with van der Pauw method
789
Reliability testing system of relay based on ethernet
790
Reliability testing technology for computer network applications
791
Reliability testing the die-attach of CPV cell assemblies
792
Reliability testing, analysis and prediction of balancing resistors
793
Reliability Tests and Experimental Analysis on Radioreceiver Chains
794
Reliability tests and failure analysis for quality improvement in 1.5 /spl mu/m Fabry-Perot lasers
795
Reliability Tests and Stress in Plastic Integrated Circuits
796
Reliability tests for a three dimensional chip stacking structure with through silicon via connections and low cost
797
Reliability tests for discriminating between technological variants of QFN packaging
798
Reliability Tests for Process Flow with Fault Tree Analysis
799
Reliability tests for system-on-chip design
800
Reliability tests for thermal aging of thin-film AlCu metallizations
801
Reliability tests for Weibull distribution with varying shape-parameter, based on complete data
802
Reliability Tests of a RFID-based Lock for Power Meter Applications
803
Reliability Tests of a Wireless System of Monitoring and Controlling for High Voltage Switch Cabinets
804
Reliability tests of the MR head in helical-scan tape systems
805
Reliability tests of ultrasonic bonding methods using HAST and THB technology
806
Reliability tests of X-25 packet switching network based on the system Energonet-PS1
807
Reliability tests on micro-insert die bonding technology
808
Reliability tests on power devices
809
Reliability the Fourth Optimization Pillar of Nanoelectronics
810
Reliability theory and predictions versus reality
811
Reliability theory for large linear systems with helping neighbors
812
Reliability theory in thermoelectricity
813
Reliability threats in VDSM - shortcomings in conventional test and fault tolerance alternatives
814
Reliability through consistency
815
Reliability through increased safety insulation systems: the effect of high-speed switching on the motor insulation system
816
Reliability Through Redundancy
817
Reliability Today and Tomorrow
818
Reliability tool for initial quantified functional risk and hazard analysis
819
Reliability tools enable strategic problem resolution & savings
820
Reliability Tradeoffs and Scaling Issues of Read Drain Bias in
nor
Flash Memory
821
Reliability tradeoffs for energy efficient wireless networks
822
Reliability transaction and pricing under power system deregulation
823
Reliability trending for Nuclear Power Plant relicensing
824
Reliability Trends with Advanced CMOS Scaling and The Implications for Design
825
Reliability unit commitment in ERCOT
826
Reliability unit commitment in the new ERCOT nodal electricity market
827
Reliability Upgrade Of The Harwell 136 Mev Electron Linear-accelerator Modulators
828
Reliability using Redundancy Concepts
829
Reliability value of fast state estimation on power systems
830
Reliability value-based power system operation decision
831
Reliability variability simulation methodology for IC design: An EDA perspective
832
Reliability Verification in a Measurement System of Integrated Varactors for RF Applications
833
Reliability Verification of a FBG Sensors Based Train Wheel Condition Monitoring System
834
Reliability verification of fault-tolerant systems design based on mutation analysis
835
Reliability Verification of Hermetic Package With Nanoliter Cavity for RF-Micro Device
836
Reliability verification of multi-power domain designs using an integrated approach of symbolic and geometry analysis
837
Reliability Verification of Software Based on Cloud Service
838
Reliability verification of system applying a microprocessor in a high-voltage gas insulated substation
839
Reliability versus yield and die location in deep sub-micron VLSI
840
Reliability victory song
841
Reliability Victory Song
842
Reliability victory song
843
Reliability vs component tolerances in microelectronic circuits
844
Reliability vs. efficiency in distributed source coding for field-gathering sensor networks
845
Reliability vs. Safety
846
Reliability vs. Total Quality Cost — Part selection criteria based on field data, combined optimal customer and business solution
847
Reliability well-being assessment of PV-wind hybrid system using Monte Carlo simulation
848
Reliability With an Evolutionary Hazard Rate
849
Reliability with Erlang
850
Reliability worth analysis of distributed generation enhanced distribution system considering the customer cost model based on optimal radial basis function neural network
851
Reliability worth assessment in a developing country-commercial and industrial survey results
852
Reliability worth assessment in a developing country-residential survey results
853
Reliability worth assessment in electric power delivery systems
854
Reliability worth assessment of an advanced cable health monitoring scheme
855
Reliability worth assessment of an advanced centralized Feeder Automation scheme
856
Reliability worth assessment of an Automatic Loop Restoration Scheme for urban distribution networks
857
Reliability worth assessment of composite system for operational purposes
858
Reliability worth assessment of distribution system with large wind farm considering wake effect
859
Reliability worth assessment of high-tech industry
860
Reliability Worth Assessment of High-Tech Industry
861
Reliability Worth Comparisons
862
Reliability worth evaluation for distribution system planning and operation using improved actual performance data
863
Reliability worth for a restructured electricity distribution industry
864
Reliability Worth Guides Distribution System Design
865
Reliability worth in distribution plant replacement programmes
866
Reliability worth of distribution system network reinforcement considering dispersed customer cost data
867
Reliability year in review
868
Reliabilityߞtheory and practice
869
Reliability, availability and maintainability (RAM) of high power variable speed drive systems (VSDS)
870
Reliability, availability and maintainability modelling - metrics and models
871
Reliability, availability, and maintainability expert system (RAMES)
872
Reliability, availability, and maintainability of high-power variable-speed drive systems
873
Reliability, availability, and maintainability of utility and industrial cogeneration power plants
874
Reliability, availability, and maintainability of utility and industrial cogeneration power plants
875
Reliability, cost, and performance of PV-powered water pumping systems: a survey for electric utilities
876
Reliability, costs and delay performance of sending short message service in wireless systems
877
Reliability, degradation and breakdown of advanced gate stacks
878
Reliability, democracy and man in systems
879
Reliability, Democracy, and Man in Systems
880
Reliability, design qualification, and prognostic opportunity of in die E-Fuse
881
Reliability, efficiency, and cost comparisons of MW-scale photovoltaic inverters
882
Reliability, Electric Power, and Public Versus Private Goods: A New Look at the Role of Markets
883
Reliability, failure, and fundamental limits of graphene and carbon nanotube interconnects
884
Reliability, lifetime prediction and accelerated testing of prospective alternatives to lead based solders
885
Reliability, Maintainability and Risk. Practical Methods for Engineers (4th edition)
886
Reliability, maintainability, supportability initiatives: contributing to the competitive edge
887
Reliability, performance and economics of thermally enhanced plastic packages
888
Reliability, reconfiguration, and spare allocation issues in binary-tree architectures based on multiple-level redundancy
889
Reliability, scalability and robustness issues in IRI
890
Reliability, survivability, and quality of large scale telecommunications systems [Book Review]
891
Reliability, test, and I/sub DDQ/ measurements
892
Reliability, testability and yield of majority voting VLSI
893
Reliability, Theme Issues, and Plagiarism
894
Reliability, thermal analysis and optimization wirability design of multi-layer PCB boards
895
Reliability, thermal, and power modeling and optimization
896
Reliability, validity and development of ocean thermal energy conversion
897
Reliability, validity, and imprecision in fuzzy multicriteria decision-making
898
Reliability, yield and quality correlation for a particular failure mechanism
899
Reliability, yield, and performance of a 90 nm SOI/Cu/SiCOH technology
900
Reliability. An aid to design in pursuit of total quality control
901
Reliability/availability guarantees of gas turbine and combined cycle generating units
902
Reliability/availability guarantees of gas turbine and combined cycle generating units
903
Reliability/availability modeling and prediction for e-commerce and other Internet information systems
904
Reliability/availability of K-out-of-N system with M cold standby units
905
Reliability/Cost Evaluation With PEV and Wind Generation System
906
Reliability/cost implications of PV and wind energy utilization in small isolated power systems
907
Reliability/Cost Implications of PV and Wind Energy Utilization in Small Isolated Power Systems
908
Reliability/Design Assessment by Internal-Node Timing-Margin Analysis using Laser Photocurrent-Injection
909
Reliability/wearout-aware design
910
Reliability/yield trade-off in mitigating “no trouble found” field returns
911
Reliability: A Cross-Disciplinary and Cross-Layer Approach
912
Reliability: A New Approach in Design of Inverters for PV Systems
913
Reliability: Fallacy or Reality?
914
Reliability: reality or the power engineers´ last gasp
915
Reliability´s Role in Management
916
Reliability-Aided Multiuser Detection in Time-Frequency-Domain Spread Multicarrier DS-CDMA Systems
917
Reliability-aimed defect/fault characterization of standard cells of VLSI circuits
918
Reliability-availability-serviceability characteristics of a compressed-memory system
919
Reliability-aware and energy-efficient synthesis of NoC based MPSoCs
920
Reliability-Aware Approach: An Incremental Checkpoint/Restart Model in HPC Environments
921
Reliability-aware Checkpoint/Restart Scheme: A Performability Trade-off
922
Reliability-aware controller placement for Software-Defined Networks
923
Reliability-aware co-synthesis for embedded systems
924
Reliability-aware cross multilateral filtering for robust disparity map refinement
925
Reliability-aware cross-layer custom instruction screening
926
Reliability-aware deduplication storage: Assuring chunk reliability and chunk loss severity
927
Reliability-aware delay faults evaluation of CMOS flip-flops
928
Reliability-aware design automation flow for analog circuits
929
Reliability-Aware Design Flow for Silicon Photonics On-Chip Interconnect
930
Reliability-aware design for nanometer-scale devices
931
Reliability-Aware Design Optimization for Multiprocessor Embedded Systems
932
Reliability-Aware Dynamic Energy Management in Dependable Embedded Real-Time Systems
933
Reliability-Aware Dynamic Voltage and Frequency Scaling
934
Reliability-aware Dynamic Voltage Scaling for energy-constrained real-time embedded systems
935
Reliability-Aware Energy Efficiency in Web Service Provision and Placement
936
Reliability-aware energy management for hybrid storage systems
937
Reliability-Aware Energy Management for Periodic Real-Time Tasks
938
Reliability-Aware Energy Management for Periodic Real-Time Tasks
939
Reliability-Aware Exceptions: Tolerating intermittent faults in microprocessor array structures
940
Reliability-aware floorplanning for 3D circuits
941
Reliability-Aware Frame Packing for the static segment of FlexRay
942
Reliability-Aware Genetic Scheduling Algorithm in Grid Environment
943
Reliability-aware geocast for mobile ad hoc networks
944
Reliability-aware global routing under thermal considerations
945
Reliability-aware IBGP route reflection topology design
946
Reliability-Aware Instruction Set Customization for ASIPs with Hardened Logic
947
Reliability-aware mapping optimization of multi-core systems with mixed-criticality
948
Reliability-aware marketplace for food services
949
Reliability-Aware Microarchitecture Design [Guest editor´s introduction]
950
Reliability-aware operation chaining in high level synthesis
951
Reliability-Aware Optimization for DVS-Enabled Real-Time Embedded Systems
952
Reliability-aware placement and fault tolerant reconfiguration in FPGAs
953
Reliability-aware placement in SRAM-based FPGA for voltage scaling realization in the presence of process variations
954
Reliability-aware power management for parallel real-time applications with precedence constraints
955
Reliability-aware register binding for control-flow intensive designs
956
Reliability-aware resource allocation in HPC systems
957
Reliability-aware resource management for computational grid/cluster environments
958
Reliability-aware scalability models for high performance computing
959
Reliability-Aware Scheduling Based on a Novel Simulated Annealing in Grid
960
Reliability-aware simultaneous multithreaded architecture using online architectural vulnerability factor estimation
961
Reliability-aware SOC voltage islands partition and floorplan
962
Reliability-Aware Speed Control Policy for Energy Reduction in Server Farms
963
Reliability-Aware Speedup Models for Parallel Applications with Coordinated Checkpointing/Restart
964
Reliability-Aware Support Vector Machine-Based High-Level Surrogate Model for Analog Circuits
965
Reliability-aware synthesis for flow-based microfluidic biochips by dynamic-device mapping
966
Reliability-Aware Synthesis of Combinational Logic With Minimal Performance Penalty
967
Reliability-Aware System Synthesis
968
Reliability-Aware Task Allocation in Distributed Computing Systems using Hybrid Simulated Annealing and Tabu Search
969
Reliability-aware thermal management for hard real-time applications on multi-core processors
970
Reliability-aware virtual data center embedding
971
Reliability-balanced feature level fusion for fuzzy commitment scheme
972
Reliability-Based Adaptive Control In Manufacturing Decision Systems
973
Reliability-Based Adaptive Distributed Classification in Wireless Sensor Networks
974
Reliability-based analysis of frequency of closed-loop vibration control systems with uncertain parameters
975
Reliability-based appraisal of Smart Grid challenges and realization
976
Reliability-based automatic repeat request for short code modulation visual evoked potentials in brain computer interfaces
977
Reliability-Based Channel Allocation Using Genetic Algorithm in Mobile Computing
978
Reliability-based characterization of single crystalline silicon micromirrors for space applications
979
Reliability-based coded modulation with low-density parity-check codes
980
Reliability-based code-search algorithms for maximum-likelihood decoding of block codes
981
Reliability-based complexity in intelligent machines
982
Reliability-based covariance control design
983
Reliability-based data-puncturing hybrid ARQ scheme with LDPC Codes
984
Reliability-based deblocking filter for distributed video coding
985
Reliability-based decision analysis for ready mixed concrete supply chain using stochastic method
986
Reliability-based decision fusion scheme for cooperative spectrum sensing
987
Reliability-based decoding algorithm in multistage decoding of multilevel codes
988
Reliability-Based Decoding for Convolutional Tail-Biting Codes
989
Reliability-based decoding of Reed-Solomon codes using their binary image
990
Reliability-based design for the structure of tower crane under aleatory and epistemic uncertainties
991
Reliability-based design integrating system topology and structural components
992
Reliability-based design of a spindle based on random and interval variables
993
Reliability-based design of doubler plates for ship structures
994
Reliability-based design of overhead transmission structures-a critical review
995
Reliability-based design of transmission lines: a comparison of the ASCE and IEC methods
996
Reliability-based design of unstiffened panels for ship structures
997
Reliability-Based Design Optimization for Cloud Migration
998
Reliability-based design optimization for land grid array solder joints under thermo-mechanical load
999
Reliability-based design optimization for pressure shell of remotely operated vehicle with discrete and continuous variables
1000
Reliability-based design optimization of electrothermal microactuators using Hybrid Reliability Approach
