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1
Reliability limitations to the scaling of porous low-k dielectrics
2
Reliability limits of TMR implemented in a SRAM-based FPGA: Heavy ion measures vs. fault injection predictions
3
Reliability Loss with Sampling Rate Reduction
4
Reliability Management
5
Reliability management and comprehensive evaluation method on telecommunication networks
6
Reliability management and engineering in a commercial computer environment
7
Reliability management in a nuclear power plant
8
Reliability Management in Software Requirement Analysis
9
Reliability management of advanced electrical multiple unit
10
Reliability Management--A Challenge
11
Reliability Markov Chains for Security Data Transmitter Analysis
12
Reliability measure for propagation-based stereo matching
13
Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults
14
Reliability measure theory: a nonmonotonic semantics
15
Reliability measurement and enhancement using Wiener index of communication networks
16
Reliability Measurement and Prediction
17
Reliability measurement of Complex equipment based on life lost transfer model
18
Reliability measurement of disparity estimates for intermediate view reconstruction
19
Reliability measurement of fault-tolerant onboard memory system under fault clustering
20
Reliability measurement of mass storage system for onboard instrumentation
21
Reliability measurement of single axis capacitive accelerometers employing mechanical, thermal and acoustic stresses
22
Reliability measurement: from theory to practice
23
Reliability measures and their approximate evaluations for networks and distributed systems
24
Reliability Measures for a Regenerative System Viewed Over a Random Horizon
25
Reliability measures for Hebbian-type associative memories with faulty interconnections
26
Reliability Measures for Sea Ice Motion Retrieval From Synthetic Aperture Radar Images
27
Reliability Mechanism for the Core Control Network-Element S-CSCF in IMS
28
Reliability mechanism of the unprogrammed amorphous silicon antifuse
29
Reliability mechanisms and lifetime extrapolation methods for scaled interconnect technologies
30
Reliability mechanisms for very large storage systems
31
Reliability Mechanisms of LTPS-TFT With \\hbox {HfO}_{2} Gate Dielectric: PBTI, NBTI, and Hot-Carrier Stress
32
Reliability methodology and theory for development of novel railway signalling systems
33
Reliability methodology for prediction of micromachined accelerometer stiction
34
Reliability Methods Applied to Reactor Safety: Trends and Progress
35
Reliability methods applied to The IEEE Gold Book Standard Network
36
Reliability metrics and the REMM model
37
Reliability metrics for IGBT power modules
38
Reliability MicroKernel: Providing Application-Aware Reliability in the OS
39
Reliability model and implementation for EEPROM emulation using flash memory
40
Reliability model and system blackout development model of complex electrical networks of power systems
41
Reliability model based on stress-strength interference for marine propulsion shafting
42
Reliability model development for photovoltaic connector lifetime prediction capabilities
43
Reliability model for a distribution system incorporating snowfall as a severe weather event
44
Reliability model for assessment of lifetime of lead-free solder joints
45
Reliability model for computerized safety systems
46
Reliability Model for Control Center of Railway Signalling System Based on SRN
47
Reliability model for cost estimation of pile foundations
48
Reliability model for extending cluster lifetime using Backup Cluster Heads in cluster-based Wireless Sensor Networks
49
Reliability model for high voltage synchronous machines
50
Reliability model for predicting long-term DC/RF performance in GaAs PHEMTs
51
Reliability Model for Step-Stress and Variable-Stress Situations
52
Reliability Model of Bandgap Engineered SONOS (BE-SONOS)
53
Reliability model of distributed simulation system
54
Reliability Model of Distribution Network with Distributed Generation
55
Reliability model of doubled repairable system with standby redundancy
56
Reliability Model of Intelligent Transport Systems
57
Reliability model of large offshore wind farms
58
Reliability model of multiplatform phased mission system based on CPN
59
Reliability model of the railway transportation system with respect to hazard states
60
Reliability model test of resistivity sounding for detecting grouting quality of the high-speed railway karst roadbed
61
Reliability model to estimate power quality and reliability of supply
62
Reliability Model with 1 or 2 Repair Channels
63
Reliability Modeling & Evaluation for Networks under Multiple & Fluctuating Operational Conditions
64
Reliability modeling & test for flip-chip on flex substrates with Ag-filled anisotropic conductive adhesive
65
Reliability modeling analysis for hydraulic/electro-hydrostatic dual redundant actuation system
66
Reliability modeling analysis of a power module
67
Reliability modeling and analysis of a micro-grid with significant clean energy penetration
68
Reliability modeling and analysis of application servers using stochastic Petri Net Model
69
Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design
70
Reliability Modeling and Analysis of Communication Networks with Dependent Failures
71
Reliability Modeling and Analysis of Computer Networks
72
Reliability Modeling and Analysis of Fault-Tolerant Memories
73
Reliability Modeling and Analysis of General Modular Redundant Systems
74
Reliability Modeling and Analysis of IEC 61850 Based Substation Protection Systems
75
Reliability modeling and analysis of multi-station manufacturing processes considering the quality and reliability interaction
76
Reliability Modeling and Analysis of Safety-Critical Manufacture System
77
Reliability Modeling and Analysis of Service-Oriented Robot Management System
78
Reliability Modeling and Analysis of Wireless Sensor Networks
79
Reliability Modeling and Assessment of Embedded Capacitors in Organic Substrates
80
Reliability modeling and assessment of the Star-Graph networks
81
Reliability modeling and assigning method for HXD electric locomotive
82
Reliability modeling and assurance of clockless wave pipeline
83
Reliability Modeling and Control Schemes of Composite Energy Storage and Wind Generation System With Adequate Transmission Upgrades
84
Reliability modeling and design criteria for the backpropagation artificial neural network
85
Reliability modeling and design optimization for mechanical equipment undergoing maintenance
86
Reliability modeling and evaluation in real-time distributed multimedia systems
87
Reliability modeling and evaluation of HVDC power transmission systems
88
Reliability Modeling and Evaluation of Power Systems With Smart Monitoring
89
Reliability modeling and evaluation of Sulaimani - Erbil electrical power system
90
Reliability modeling and evaluation of VSC-HVDC transmission systems
91
Reliability Modeling and Life Estimation Using an Expectation Maximization Based Wiener Degradation Model for Momentum Wheels
92
Reliability modeling and management in dynamic microprocessor-based systems
93
Reliability Modeling and Management of Nanophotonic On-Chip Networks
94
Reliability modeling and optimization of MEMS elements in various devices using multi-scale concepts
95
Reliability modeling and performance evaluation of variable link-capacity networks
96
Reliability modeling and performance of variable link-capacity networks
97
Reliability modeling and prediction of Wireless Multi-Hop Networks with correlated shadowing
98
Reliability modeling and simulation analysis of mechanical system with stochastic states
99
Reliability Modeling and Simulation Discussion Group
100
Reliability Modeling and Simulation in Power Systems With Aging Characteristics
101
Reliability modeling and testing of advanced QFN packages
102
Reliability modeling for appliances using the Proportional Hazard Model
103
Reliability modeling for dependent competing failure processes with damage self-recovery phenomenon
104
Reliability modeling for dependent competitive failure processes
105
Reliability modeling for evaluating the contribution of photovoltaics in electric power systems
106
Reliability modeling for expansion-planning of electric-power plants
107
RELIABILITY MODELING FOR FAULT TOLERANT COMPUTERS
108
Reliability Modeling for Fault-Tolerant Computers
109
Reliability modeling for manufacturing process
110
Reliability Modeling for Momentum Wheel Based on Data Mining of Failure-Physics
111
Reliability modeling for ramp-stress accelerated degradation testing
112
Reliability modeling for safety-critical software
113
Reliability modeling for SOA systems
114
Reliability modeling for systems requiring mission reconfigurability
115
Reliability modeling for systems subject to dependent competing failure processes with set of random shocks affect specific components
116
Reliability Modeling for the Advanced Electric Power Grid: A Proposal for Doctoral Research
117
Reliability modeling for the Space Interferometry Mission
118
Reliability modeling for wireless Ultra Wideband biomedical radar sensing network
119
Reliability Modeling in Electric Power Systems
120
Reliability Modeling in Spatially Distributed Logistics Systems
121
Reliability modeling incorporating error processes for Internet-distributed software
122
Reliability Modeling Method Based on State Truncation and Error Bound Analysis
123
Reliability modeling method for network system using generalized stochastic petri net
124
Reliability modeling method of electronic products considering failure mechanism dependence
125
Reliability Modeling of a 1-Out-Of-2 System: Research with Diverse Off-The-Shelf SQL Database Servers
126
Reliability modeling of a complex repairable system
127
Reliability modeling of a composite energy storage and wind generation systems with adequate transmission upgrades
128
Reliability modeling of a jet pipe electrohydraulic servo valve
129
Reliability modeling of a series system with correlated or dependent component degradation processes
130
Reliability modeling of a single phase liquid cooling system for power electronics applications
131
Reliability modeling of A warm standby redundancy configuration with active → standby → active units
132
Reliability Modeling of All-Digital Protection Systems Including Impact of Repair
133
Reliability modeling of capacitive RF MEMS
134
Reliability modeling of capacitor bank for Modular Multilevel Converter based on Markov State-Space Model
135
Reliability modeling of chip scale packages
136
Reliability Modeling of Compensating Module Failures in Majority Voted Redundancy
137
Reliability modeling of complex mechanical system using CTHPN
138
Reliability modeling of complex mechanism system using GBN
139
Reliability modeling of cyber-physical electric power systems: A system-theoretic framework
140
Reliability modeling of distributed generation in conventional distribution systems planning and analysis
141
Reliability modeling of distributed generation in conventional distribution systems planning and analysis
142
Reliability Modeling of Dynamic Thermal Rating
143
Reliability modeling of electronic systems subjected to high strain rates
144
Reliability Modeling of Energy Efficient Logging Architectures Based on RAID10 Systems
145
Reliability Modeling of Fault Tolerant Control Systems
146
Reliability modeling of freely-available Internet-distributed software
147
Reliability modeling of gas and electric power distribution systems; similarities and differences
148
Reliability Modeling of Generation Systems Including Unconventional Energy Sources
149
Reliability Modeling of Generation Systems Including Unconventional Energy Sources
150
Reliability modeling of hard real-time systems
151
Reliability Modeling of Hardware and Software Interactions, and Its Applications
152
Reliability modeling of hardware/software systems
153
Reliability modeling of HK MG technologies
154
Reliability modeling of large fault-tolerant systems
155
Reliability Modeling of Large Wind Farms and Associated Electric Utility Interface Systems
156
Reliability Modeling of Large Wind Farms and Associateed Electric Utility Interface Systems
157
Reliability Modeling of Lidded Flip Chip Packages
158
Reliability modeling of life-critical, real-time systems
159
Reliability modeling of manufacturing systems based on the task network evolved by key quality characteristics
160
Reliability modeling of MEMS devices on CUDA based HPC setup
161
Reliability modeling of metal interconnects with time-dependent electrical and thermal stress
162
Reliability Modeling of Multiple Overhead Transmission Lines
163
Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks
164
Reliability modeling of nanoelectronic circuits
165
Reliability Modeling of NC Machine Tool Components with Single Directed Relevant Failures
166
Reliability modeling of network fabric fault-tolerant industrial communication systems
167
Reliability modeling of parallel systems under multiple common-cause failures
168
Reliability Modeling of PMUs Using Fuzzy Sets
169
Reliability modeling of protection system based on phase-type distribution
170
Reliability Modeling of Protective Systems
171
Reliability Modeling of Protective Systems
172
Reliability modeling of RAID storage systems with latent errors
173
Reliability modeling of real-time systems with deadline information
174
Reliability Modeling of Regional Cabled Observatories
175
Reliability Modeling of Run-of-the-River Power Plants in Power System Adequacy Studies
176
Reliability modeling of SCI ring-based topologies
177
Reliability modeling of silicon or glass interposers to printed wiring board interconnections
178
Reliability modeling of soldered interconnections
179
Reliability modeling of soldered interconnections
180
Reliability modeling of structured systems: exploring symmetry in state-space generation
181
Reliability modeling of successive release of software using NHPP
182
Reliability modeling of systems with latent failures using Markov chains
183
Reliability modeling of the MARS system: a case study in the use of different tools and techniques
184
Reliability modeling of transistor gates at the nanoscale
185
Reliability modeling of warm standby systems subject to fault level coverage based on multi-valued decision diagram
186
Reliability modeling of wind farms considering weather conditions
187
Reliability modeling of wireless sensors
188
Reliability modeling on a MOSFET power package based on embedded die technology
189
Reliability modeling strategy of an industrial system
190
Reliability modeling study of in-orbit satellite systems
191
Reliability modeling that combines Markov analysis and Weibull distributions
192
Reliability modeling under the constraint of specified maximum acceptable service interruptions
193
Reliability Modeling Using SHARPE
194
Reliability modeling with hidden Markov and semi-Markov chains
195
Reliability Modeling, Analysis and Prediction of Wireless Mobile Communications
196
Reliability modeling: an overview for system designers
197
Reliability Modeling: Linear Combination and Ratio of Exponential and Rayleigh
198
Reliability modelling and assessment of electric motor driven systems in hydrocarbon industries
199
Reliability modelling and evaluation of transmission and distribution systems
200
Reliability modelling and evaluation techniques for power distribution networks with local generation
201
Reliability Modelling in Systems with Non-Exponential Down Time Distributions
202
Reliability modelling of access point selection and handovers in heterogeneous wireless environments
203
Reliability modelling of service oriented Internet of Things
204
Reliability Modelling of the DC Uninterruptible Power Supply
205
Reliability modelling of the DC uninterruptible power supply
206
Reliability Modelling of Thermal Units for Peaking and Cycling Operations
207
Reliability Modelling of Thermal Units for Peaking and Cycling Operations
208
Reliability Modelling of Uninterruptible Power Supply Using Probability Tree Method
209
Reliability modelling using Petri-Net simulation of polymer electrolyte membrane fuel cell degradation in automotive applications
210
Reliability modelling with respect to circuit applications
211
Reliability Models
212
Reliability models and application in the process of production scheduling of mechanical products
213
Reliability models and evaluation of internal BGP networks
214
Reliability models and metrics for space shuttle maintenance position statement
215
Reliability models and open source software: An empirical study
216
Reliability models applied to a system of power converters in particle accelerators
217
Reliability Models Applied to Mobile Applications
218
Reliability models for electric power production costing
219
Reliability models for facilities switching
220
Reliability models for fault-tolerant private network applications
221
Reliability models for large wind farms in generation system planning
222
Reliability models for mechanical equipment
223
Reliability Models for SEC/DED Memory With Scrubbing in FPGA-Based Designs
224
Reliability models for some fast packet switch architectures
225
Reliability Models for the Internet of Things: A Paradigm Shift
226
Reliability models for very large software systems in industry
227
Reliability models for wind farms in generation system planning
228
Reliability models of a bridge system structure under incomplete information
229
Reliability models of data retention and read-disturb in 2-bit nitride storage flash memory cells
230
Reliability models of electric machines with structural defects
231
Reliability Models of NMR Systems
232
Reliability models of repairable systems considering the effect of operating conditions
233
Reliability Models: The Influence of Model Specification in Generation Expansion Planning
234
Reliability modes for mechanical equipment
235
Reliability monitoring and screening issues with ultrathin gate dielectric devices
236
Reliability monitoring for highly leaky devices
237
Reliability monitoring of a separable land grid array using time domain reflectometry
238
Reliability monitoring of digital circuits by in situ timing measurement
239
Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
240
Reliability Nonparametric Bayesian Estimation in Parallel Systems
241
Reliability Numbers in Action
242
Reliability objectives for the next generation switch
243
Reliability objectives in next-generation Internet
244
Reliability Odyssey: After 2001
245
Reliability of λ/4-shifted DFB lasers fabricated on a mass-production basis
246
Reliability of (100) and (110) oriented single-grain Si TFTs without seed substrate
247
Reliability of \\hbox {SrRuO}_{3}\\hbox {/SrTiO}_{3}\\hbox {/SrRuO}_{3} Stacks for DRAM Applications
248
Reliability of k Separate Minimal Paths Under Both Time and Budget Constraints
249
Reliability of 0.1 mu m InP HEMTs
250
Reliability of 0.35 μm Devices: Impact of Ultra-Shallow LDD-Source/Drains
251
Reliability of 0.4 mm pitch, 256-pin plastic quad flat pack no-clean and water-clean solder joints
252
Reliability of 0.87 µm (Al,Ga)As double heterostructure lasers with Ga(As,Sb) active layers
253
Reliability of 0.98-1.02 μm InGaAs laser diodes-improvement by low temperature growth of active layer
254
Reliability of 1×5 μm2 emitter InAlAs/InGaAs HBTs under bias and thermal stress
255
Reliability of 1.3 μm V-grooved inner-stripe laser diodes under high-power operation
256
Reliability of 1.55 μm DFB lasers for use in dense-WDM systems
257
Reliability of 100 μm Bi- and In- solder balls
258
Reliability of 100 nm silicon nitride capacitors in an InP HEMT MMIC process
259
Reliability of 10Gb/s 850nm oxide confined vertical cavity surface emitting lasers
260
Reliability of 1206 capacitor/SAC305 solder joint reflowed in protective atmosphere
261
Reliability of 1300-nm spot-size converted lasers for low-cost optical module used in fiber-to-the-home
262
Reliability of 1300-nm spot-size converter integrated laser diodes for low-cost optical modules in access networks
263
Reliability of 1310 nm Wafer Fused VCSELs
264
Reliability of 20µm pitch NCF type COF package with compliant-bump
265
Reliability of 20μm micro bump interconnects
266
Reliability of 28-volt D-C aircraft distribution systems
267
Reliability of 2D quality assessment methods for synthesized views evaluation in stereoscopic viewing conditions
268
Reliability of 2-dimensional consecutive-k-out-of-n:F systems
269
Reliability of 3D Imaging by Digital Holography at Long IR Wavelength
270
Reliability of 3D package using wafer level underfill and low CTE epoxy mold compound materials
271
Reliability of 3-state device systems with simultaneous failures
272
Reliability of 4H-SiC DMOSFETs Evaluated by Bias Stressing
273
Reliability of 4H-SiC SBD/JBS diodes under repetitive surge current stress
274
Reliability of 4MBIT MRAM
275
Reliability of 5.8 GHz short range links in vehicle-roadside communication
276
Reliability of 50 nm low-noise metamorphic HEMTs and LNAs
277
Reliability of 6 inch 0.4 μm-gate PHEMT device
278
Reliability of 6-10 nm thermal SiO2films showing intrinsic dielectric integrity
279
Reliability of 680-nm window laser diodes at 50-100 mW CW operation
280
Reliability of 980 nm pump lasers for submarine, long-haul terrestrial, and low cost metro applications
281
Reliability of a k-out-of-n warm-standby system
282
Reliability of a 2-Dimensional k -Within-Consecutive- r\\times s -out-of- ^{\\circ}\\hbox {C}
438
Reliability of code density test for high resolution ADCs
439
Reliability of Collection Grids for Large Offshore Wind Parks
440
Reliability of column/board/CCGA attachment
441
Reliability of Combined k{\\hbox {-out-\\of-}}n and Consecutive k_{c}{\\hbox {-out-\\of-}}n
442
Reliability of Combined m -Consecutive- k -out-of- \\hbox {BaTiO}_{3} Composite Dielectric During Temperature–Humidity–Bias Tests
552
Reliability of embedded SONOS memories
553
Reliability of embedding concepts for discrete passive components in organic circuit boards
554
Reliability of Emergency Rescue System on Highway
555
Reliability of energy conversion devices in industrial facilities and power plants
556
Reliability of Enhancement-mode AlGaN/GaN HEMTs Fabricated by Fluorine Plasma Treatment
557
Reliability of enhancement-mode AlGaN/GaN HEMTs under ON-state gate overdrive
558
Reliability of Epoxy and Silicone Molded Tape-Carrier Silicon Integrated Circuits with Various Chip-Protective Coatings
559
Reliability of epoxy spacer for EHV-class gas insulated switchgear
560
Reliability of Erasure Coded Storage Systems: A Combinatorial-Geometric Approach
561
Reliability of erasure coded storage systems: A geometric approach
562
Reliability of etched-mesa buried-heterostructure semiconductor lasers
563
Reliability of EVA modules
564
Reliability of event-triggered task activation for hard real-time systems
565
Reliability of example data center designs selected by tier classification
566
Reliability of Example Mechanical Systems for Data Center Cooling Selected by Tier Classification
567
Reliability of facial muscle activity to identify vowel utterance
568
Reliability Of Fare Collection Hardware In Subways
569
Reliability of fault tolerant control systems: Part I
570
Reliability of fault tolerant control systems: Part II
571
Reliability of fault-tolerant software based on a system architecture with a recovery metaprogram
572
Reliability of FDDI´s dual homing network architecture
573
Reliability of Ferroelectric Random Access memory embedded within 130nm CMOS
574
Reliability of FeSi2
575
Reliability of Fiber Optic connectors
576
Reliability of fiber optic datacom modules at Agilent Technologies
577
Reliability of fibre optic transmission lines
578
Reliability of film thickness extraction through CV curves of SOI p-i-n gated diodes
579
Reliability of fine pitch COF: Influence of surface morphology and CuSn intermetallic compound formation
580
Reliability of fine pitch halogen-free organic substrates for green electronics
581
Reliability of fine pitch Sn-3.8Ag-0.7Cu flip chip solder joints with different connection pads
582
Reliability of fine pitch wafer level packages
583
Reliability of fine-line thick-film and LTCC conductors at high-temperature operation
584
Reliability of fine-pitch flip-chip packages
585
Reliability of Finger Tapping Test Used in Diagnosis of Movement Disorders
586
Reliability of flash memory erasing operation under high tunneling electric fields
587
Reliability of flat XOR-based erasure codes on heterogeneous devices
588
Reliability of Flexible Display by Simulation and Strain Gauge Test
589
Reliability of flexible thin-film embedded resistors and electrical characterization of thin-film embedded capacitors and inductors
590
Reliability of flight critical system components and their “history of abuse”
591
Reliability of flip chip assemblies subjected to extreme low temperatures
592
Reliability of flip chip BGA package on organic substrate
593
Reliability of flip chip die attach in multichip mechatronic power module
594
Reliability of flip chip on board. First order model for the effect on contact integrity of moisture penetration in the underfill
595
Reliability of flip chip on flexible substrates under drop impact
596
Reliability of flip chip packages with high thermal conductivity heat spreader attach
597
Reliability of Flip Chip Solder Bump Joints
598
Reliability of flip-chip interconnect for fine pitch applications
599
Reliability of flip-chip technologies for SiC-MEMS operating at 500 °C
600
Reliability of fluoride fiber module for optical amplifier use
601
Reliability of fluoride fiber module for optical amplifier use
602
Reliability of Force Cooled Superconducting Magnets for Fusion
603
Reliability of Freshness-Based Logistics Service for Fresh Agricultural Products
604
Reliability of FSO links in next generation optical networks
605
Reliability of fully and partially replicated systems
606
Reliability of fully-integrated nanoscale ReRAM/CMOS combinations as a function of on-wafer current control
607
Reliability of function points productivity model for enhancement projects (A field study)
608
Reliability of future distribution networks: Handling variability and uncertainty
609
Reliability of future telephone networks
610
Reliability of fuzzy risk assessment by information distribution
611
Reliability of GaAs injection lasers
612
Reliability of GaAs MESFET Logic Circuits
613
Reliability of GaAs PHEMT under hydrogen containing atmosphere
614
Reliability of GaAs PIN switches for high frequency and high power applications
615
Reliability of GaAs-based semiconductor diode lasers: 0.6-1.1 μm
616
Reliability of GaN HEMTs with a 100 nm gate length under DC-stress tests
617
Reliability of GaN HEMTs: Current degradation in GaN/AlGaN/AlN/GaN HEMT
618
Reliability of GaN HEMTs: current status and future technology
619
Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives
620
Reliability of GaN-Based HEMT devices
621
Reliability of GaN-HEMTs for high-voltage switching applications
622
Reliability of gas filled surge arresters characteristics under the influence of induced and built-in radiation
623
Reliability of Gaseous Optical Masers Using Noble Gas Active Media
624
Reliability of Gate Metallization in Power GaAs MESFETs
625
Reliability of Generation Supply
626
Reliability of Geo-replicated Cloud Storage Systems
627
Reliability of germanium avalanche photodiodes for optical transmission systems
628
Reliability of GIS EHV epoxy insulators: the need and prospects for more stringent acceptance criteria
629
Reliability of GIS EHV epoxy insulators: the need and prospects for more stringent acceptance criteria
630
Reliability of glass-ceramic ferrules in the severest conditions
631
Reliability of Gold Metallized Commercially Available Power GaAs FETs
632
Reliability of graphene interconnects and n-type doping of carbon nanotube transistors
633
Reliability of graphene-based films used for high power electronics packaging
634
Reliability of gull-wing and leadless packages subjected to temperature cycling after rework
635
Reliability of hermetically packaged 980 nm diode lasers
636
Reliability of hermetically sealed miniature relays in silicone-rich environments
637
Reliability of Heterogeneous Distributed Computing Systems in the Presence of Correlated Failures
638
Reliability of HfAlOx in multi layered gate stack
639
Reliability of HFO2/SIO2 dielectric with strain engineering using CESL stressor
640
Reliability of HfSiON as gate dielectric for advanced CMOS technology
641
Reliability of high aspect ratio plated through holes (PTH) for advanced printed circuit board (PCB) packages
642
Reliability of High Frequency High Power GaAs MESFETs
643
Reliability of high I/O count wafer level packages
644
Reliability of high I/O FCBGA corner stake materials
645
Reliability of high performance standard two-edge and radiation hardened by design enclosed geometry transistors
646
Reliability of high power laser diode arrays operating in long pulse mode
647
Reliability of high power MQW-DFB-DC-PBH-LDs for Coherent Optical Communication System Application
648
Reliability of high power QCW cm-bar arrays
649
Reliability of High Power QCW-AlGaAs/GaAs 808nm cm-Bars
650
Reliability of high power semiconductor lasers on bonding and mounting design
651
Reliability of high quantum efficiency MA-PMT for spectrometric quality assurance of scintillation imagers
652
Reliability of high radiance InGaAsP/InP LED́s operating in the 1.2-1.3 µm wavelength
653
Reliability of high speed cutting tools
654
Reliability of high temperature electronic components
655
Reliability of High Temperature I2L Integrated Circuits
656
Reliability of High Temperature I2L Integrated Circuits
657
Reliability of High Temperature Inverters for HEV
658
Reliability of High Temperature Lead-Free Solder Alternative
659
Reliability of high Tg copper clad laminate for lead-free assembly
660
Reliability of high-end flip-chip package with large 45nm ultra low-k die
661
Reliability of High-Mobility InGaAs Channel n-MOSFETs Under BTI Stress
662
Reliability of high-performance AlInAs/GaInAs heterojunction bipolar transistors under forward bias and temperature stress
663
Reliability of High-Power 1060-nm DBR Lasers
664
Reliability of high-power AIGalnAs single-mode laser diodes
665
Reliability of high-power AlGaAs SQW grinsch lasers
666
Reliability of high-power diode lasers with oxide-defined stripes formed by pulsed anodization
667
Reliability of High-Power IGBT Modules for Traction Applications
668
Reliability of high-speed SiGe heterojunction bipolar transistors under very high forward current density
669
Reliability of High-Voltage LSI´s Made Using the Dielectric Isolation Process
670
Reliability of home spirometry data in lung transplantation
671
Reliability of HTS and HH/HT tests performed in chips and flex substrates assembled by a thermosonic flip-chip bonding process
672
Reliability of human annotation of semantic roles in noisy text
673
Reliability Of Human Performance In Locating Landmarks On Analog And Digital Duplicate X-ray Images
674
Reliability of Human Visual Signal Detection in the Presence of Noise
675
Reliability of hybrid encapsulation based on fluorinated polymeric materials
676
Reliability of hybrid III-V on Si distributed feedback lasers
677
Reliability of Hybrid Silicon Distributed Feedback Lasers
678
Reliability of IGBT in a STATCOM for harmonic compensation and power factor correction
679
Reliability of Implantable Electronic Devices: Two Case Studies
680
Reliability of Implantable MyoElectric Sensors (IMES)
681
Reliability of impregnated-paper capacitors
682
Reliability of Improved Power GaAs Field-Effect Transistors
683
Reliability of IMS architecture
684
Reliability of InAlGaAs strained-quantum-well lasers operating at 0.81 mu m
685
Reliability of InAs/GaAs Quantum Dot Lasers Epitaxially Grown on Silicon
686
Reliability of indium solder die bonding of high power cm-bars
687
Reliability of indoor and short range FSO - Paper not available at publishing time
688
Reliability of Induction Machines for High Performance Based on Parameter Characteristics
689
Reliability of Information as a Potential Threat to the Acceptability of Decision Support Systems
690
Reliability of infrared surface light emitting diodes suitable for military and avionic wavelength division multiplexing systems
691
Reliability of InGaAs HEMTs on GaAs substrates
692
Reliability of InGaAs waveguide photodiodes for 40-Gb/s optical receivers
693
Reliability of InGaAs/InP HBTs with InP passivation structure
694
Reliability of InGaAs/InP long-wavelength p-i-n photodiodes passivated with polyimide thin film
695
Reliability of InGaAs/InP photodiodes passivated with polyimide
696
Reliability of InGaAs/InP semiconductor diode lasers
697
Reliability of InGaAsP light emitting diodes at high current density
698
Reliability of InGaP emitter HBTs at high collector voltage
699
Reliability of InGaP/GaAs HBT´s under high current acceleration
700
Reliability of InP-based avalanche photodiodes for high bit-rate fiber-optic communication systems
701
Reliability of InP-based HBT IC technology for high-speed, low-power applications
702
Reliability of InP-based HBT IC technology for high-speed, low-power applications
703
Reliability of InP-based HBT´s and HEMT´s: experiments, failure mechanisms, and statistics
704
Reliability of in-situ rapid thermal gate dielectrics in deep submicrometer MOSFET´s
705
Reliability of inspection for fatigue cracks in offshore structures
706
Reliability of insulating substrates — High temperature power electronics for more electric aircraft
707
Reliability of insulation for distribution systems
708
Reliability of integrated circuits ¿ the Eurocon perspective
709
Reliability of integrated municipal water systems during drought: Reliability bounds approach
710
Reliability of intelligent power routers
711
Reliability of Interconnected Power Systems with Correlated Demands
712
Reliability of Interconnected Power Systems With Correlated Demands
713
Reliability of interfaces for lead-free solder bumps
714
Reliability of interleaving filter using planar lightwave circuit
715
Reliability of Intermittently Used Systems
716
Reliability of Internet hosts: a case study from the end user´s perspective
717
Reliability of inversion channel InGaAs n-MOSFETs
718
Reliability of islanded microgrids with stochastic generation and prioritized load
719
Reliability of isotropic electrically conductive adhesives under condensing humidity testing
720
Reliability of k-out-of-n standby systems with gamma distributions
721
Reliability of k-out-of-n:G system in supply chain based on Markov chain
722
Reliability of k-out-of-n:G systems with imperfect fault-coverage
723
Reliability of Ku-Band GaAs Power FETs Under Highly Stressed RF Operation
724
Reliability of La-Doped Hf-Based Dielectrics nMOSFETs
725
Reliability of Large Area Solder Joints within IGBT Modules: Numerical Modeling and Experimental Results
726
Reliability of large conductive polymer flip chip assemblies for multichip modules (MCMs)
727
Reliability of large die ultra low-k lead-free flip chip packages
728
Reliability of large organic flip-chip packages for industrial temperature environments
729
Reliability of large periphery GaN-on-Si HFETs
730
Reliability of large power units in probabilistic approach
731
Reliability of large superconducting magnets through design
732
Reliability of laser activated metal fuses in DRAMs
733
Reliability of laser diode modules in temperature-uncontrolled environment
734
Reliability of laser-induced metallic vertical links
735
Reliability of latchup characterization procedures
736
Reliability of lead (Pb) free SAC solder interconnects with different PWB surface finishes under mechanical loading
737
Reliability of lead free solder joint by using chip size package
738
Reliability of lead free solder SAC 305 for chip components depending on various factors
739
Reliability of lead free solders joints and manufacturability during the SMT process
740
Reliability of Lead-Free BGA Assembly: Correlation Between Accelerated Ageing Tests and FE Simulations
741
Reliability of lead-free copper columns in comparison with tin-lead solder column interconnects
742
Reliability of lead-free fine pitch BGA under thermal and mechanical impact
743
Reliability of lead-free SAC electronics under simultaneous exposure to high temperature and vibration
744
Reliability of lead-free SnAg solder bumps: influence of electromigration and temperature
745
Reliability of Lead-Free Solder Interconnections in Thermal and Power Cycling Tests
746
Reliability of lead-free solder interconnects-a review
747
Reliability of Lead-Free Solder Joints Under a Wide Range of Thermal Cycling Conditions
748
Reliability of Light Emitters and Detectors for Optical Fiber Communication Systems
749
Reliability of lightning resistant overhead power distribution lines
750
Reliability of lightning-resistant overhead lines
751
Reliability of linear and circular consecutively-connected systems
752
Reliability of linear consecutively-connected systems with multistate components
753
Reliability of Liquid Crystal Display
754
Reliability of liquid crystal polymer air cavity packaging
755
Reliability of Liquid Crystals in Space Photonics
756
Reliability of load-sharing systems subject to proportional hazards model
757
Reliability of local control panel of rotating machines
758
Reliability of logic circuits under multiple simultaneous faults
759
Reliability of long-period gratings
760
Reliability of low current filamentary HfO2 RRAM discussed in the framework of the hourglass SET/RESET model
761
Reliability of low temperature poly-Si TFT employing counter-doped lateral body terminal
762
Reliability of low temperature poly-silicon TFTs under inverter operation
763
Reliability of low-cost CdS/Cu2S solar cells
764
Reliability of low-k interconnect dielectrics
765
Reliability of Low-Noise Microwave HEMT by MOCVD
766
Reliability of Low-Temperature-Processing Hafnium Oxide Gate Dielectrics Prepared by Cost-Effective Nitric Acid Oxidation Technique
767
Reliability of LSI Memory Circuits Exposed to Laser Cutting
768
Reliability of Magnetic Tunnel-Junctions
769
Reliability of Magneto-Optical Memory Disks
770
Reliability of majority voting based VLSI fault-tolerant circuits
771
Reliability of malfunction tolerance
772
Reliability of manufacturing 6 inch InGaP HBTs
773
Reliability of measuring control for the generalized measuring model
774
Reliability of measuring human segment three-dimensional orientation using wearable sensor system
775
Reliability of medium voltage primary substation structures
776
Reliability of Medium-Voltage Vacuum Power Circuit-Breakers
777
Reliability of megawatt drive concepts
778
Reliability of Memories Built From Unreliable Components Under Data-Dependent Gate Failures
779
Reliability of Memories Protected by Multibit Error Correction Codes Against MBUs
780
Reliability of memory technologies
781
Reliability of MEMS
782
Reliability of MEMS capacitive switches
783
Reliability of MEMS devices under multiple environments
784
Reliability of MEMS: Effects of different stress conditions and mechanical fatigue failure detection
785
Reliability of MEMS-based mass-flow controllers for semiconductor processing
786
Reliability of MEMS-based storage enclosures
787
Reliability of mesa and planar InGaAs PIN photodiodes
788
Reliability of mesa-structure InAlGaAs-InAlAs superlattice avalanche photodiodes
789
Reliability of metal interconnect after a high-current pulse
790
Reliability of Metal-Insulator-Metal (MIM) after Electrostatic Discharge (ESD) Stress
791
Reliability of metallized ceramic packages
792
Reliability of Metallized Ceramic/Polyimide Substrates
793
Reliability of metamorphic HEMTs on GaAs substrates
794
Reliability of metamorphic HEMTs on GaAs substrates
795
Reliability of meteorological information receipt by means of active remote sounding instruments
796
Reliability of MgAI Semiconductor Interconnects
797
Reliability of MgO Tunneling Barrier for MRAM Device
798
Reliability of microcircuits through partial discharge measurements
799
Reliability of microelectronic packages with tin-plated copper leads under high humidity operating environment
800
Reliability of microelectronics packaging in the era of EnergyWise and Borderless networks
801
Reliability of micro-hotplates on polyimide foil
802
Reliability of micromachined catalytic gas sensors
803
Reliability of micromachined membranes under particle impact
804
Reliability of micromechatronic systems with chip on molded interconnected devices and flexible substrates
805
Reliability of microsystems from the material point of view
806
Reliability of Microwave Gallium Arsenide Field Effect Transistors
807
Reliability of Microwave Mixer Diodes
808
Reliability of Microwave Radio Reley Systems
809
Reliability of microwave SiGe/Si heterojunction bipolar transistors
810
Reliability of military electronic equipment
811
Reliability of military electronic equipment and our ability to maintain it for war
812
Reliability of Military Quartz Crystal Units
813
Reliability of MIM HAO capacitor for 70NM DRAM
814
Reliability of MINP compared to MIS, SIS, and N/P silicon solar cells under 1.0-MeV electron and environmental effects
815
Reliability of mixed alloy ball grid arrays using impact bend test and drop shock test
816
Reliability of MNOS integrated circuits
817
Reliability of mobile agent system in QoS mobile network
818
Reliability of mobile phones
819
Reliability of Mobile Processes with Noisy Channels
820
Reliability of MOCVD grown AlGaAs/GaAs laser diodes at -20 C heatsink temperature
821
Reliability of modified designs: a Bayes analysis of an accelerated test of electronic assemblies
822
Reliability of MOL local interconnects
823
Reliability of molded interconnect devices (MID) protected by encapsulation methods overmolding, potting and coating
824
Reliability of Molybdenum Thin Films in Humid Atmospheres
825
Reliability of monolithic RC-snubbers in MOS-based power modules
826
Reliability of MOS LSl circuits
827
Reliability of MOSFETs as affected by the interface trap transformation process
828
Reliability of MSQ spin-on glass as low-k interlayer dielectric in VLSI device
829
Reliability of multi-layer aluminum capped copper interconnect structures
830
Reliability of multilayer ceramic capacitors after thermal shock
831
Reliability of multi-path virus nanonetworks
832
Reliability of multistage production systems controlled by automated visual inspection
833
Reliability of Multi-State Systems subject to competing failures
834
Reliability of multi-state systems with two failure-modes
835
Reliability of multi-states system with load sharing and propagation failure dependence
836
Reliability of multi-trigger multi-state systems subject to competing failures
837
Reliability of Mutil-Layer ceramic capacitor and its conduction mechanism under high electric field
838
Reliability of NAND flash memories induced by anode hole generation in floating-gate
839
Reliability of NAND-2 CMOS gates from threshold voltage variations
840
Reliability of nanocrystalline diamond MEMS capacitive switches
841
Reliability of nanocrystalline diamond MEMS capacitive switches
842
Reliability of Nanoelectromechanical Nonvolatile Memory (NEMory) Cells
843
Reliability of Nano-Meter Thick Multi-Layer Dielectric Films on Poly-Crystalline Silicon
844
Reliability of Nano-Structured Nickel Interconnections Replacing FlipChip Solder Assembly without Underfill
845
Reliability of n-Bit Nanotechnology Adder
846
Reliability of network connectivity
847
Reliability of network simulators and simulation based research
848
Reliability of network topologies
849
Reliability of New Plastic-Packaged Power Transistors For Consumer Applications
850
Reliability of new semiconductor devices for long-distance optical submarine-cable systems
851
Reliability of next generation high performance pMEMS™ resonator oscillators
852
Reliability of NiO-Based Resistive Switching Memory (ReRAM) Elements with Pillar W Bottom Electrode
853
Reliability of NLDMOS transistors subjected to repetitive power pulses
854
Reliability of Non-Coherent Warm Standby Systems With Reworking
855
Reliability of Nondeteriorating Devices
856
Reliability of nonhermetic bias-free LiNbO3 modulators
857
Reliability of non-released microstructures: failure analysis and innovative solution process
858
Reliability of Nonrepairable Phased-Mission Systems With Common Cause Failures
859
Reliability of novel die attach adhesive for snap curing
860
Reliability of nuclear-power-station protective systems
861
Reliability of Object Oriented Systems with Markov Transfer of Control
862
Reliability of objects in aerospace technologies and beyond: Holistic risk management approach
863
Reliability of obliquely deposited Co-O thin film with carbon protective layer
864
Reliability of offshore pipelines subject to upheaval buckling
865
Reliability of on-board computer for ITASAT university satellite
866
Reliability of On-The-Shelf Stored Image Sensors
867
Reliability of Operation of Single Chip Microprocessor with Watchdog in Thermal Stress Conditions
868
Reliability of operation through proper specification of rotating machinery
869
Reliability of operation through proper specification of rotating machinery
870
Reliability of optical bi-directional path switched ring networks using MEMS-based redundant switching fabrics
871
Reliability of optical branching devices
872
Reliability of optical components for use in submarine optical fiber transmission systems
873
Reliability of optical fiber Bragg grating sensors at elevated temperature
874
Reliability of Optical Fibers, Cables, and Splices
875
Reliability of optical fibres : impact on cable design
876
Reliability of optoelectronic devices for fiber optic communications
877
Reliability of oxide confined 850 nm VCSELs for high speed interconnection systems
878
Reliability of oxide TFT for display application
879
Reliability of oxide VCSELs in non-hermetic environments
880
Reliability of package on package (PoP) subjected to thermal and power loadings
881
Reliability of packet switched HF networks
882
Reliability of packet switching broadcast radio networks
883
Reliability of palladium coated copper wire
884
Reliability of parallel connected power transformers with failure correlation and its preventive maintenance
885
Reliability of Parallel Electronic Components
886
Reliability of passivated 0.15 μm InAlAs-InGaAs HEMTs with pseudomorphic channel
887
Reliability of passivated copper multichip module structures embedded in polyimide
888
Reliability of passive fibre optic branching devices
889
Reliability of passive RFID of multiple objects using folded microstrip patch-type tag antenna
890
Reliability of paste based transient liquid phase sintered interconnects
891
Reliability of Pb-free BGA solder joints under random vibration
892
Reliability of Pb-free preplated leadframe under atmosphere and accelerated aging test
893
Reliability of Pb-free solder alloys in demanding BGA and CSP applications
894
Reliability of Pb-free solder joints in FCBGA using finite element simulation and Taguchi method
895
Reliability of PBGA assemblies under out-of-plane vibration excitations
896
Reliability of percent distribution of power of the electrogastrogram in recognizing gastric electrical uncoupling
897
Reliability of Periodic, Coherent, Binary Systems
898
Reliability of pFET EEPROM with 70-Å tunnel oxide manufactured in generic logic CMOS Processes
899
Reliability of phantom pain relief in neurorehabilitation using a multimodal virtual reality system
900
Reliability of phased mission systems with warm standby subsystems
901
Reliability of phased-mission systems subject to competing failures
902
Reliability of photonic systems - an introduction
903
Reliability of photovoltaic concentrator modules
904
Reliability of physical system
905
Reliability of planar and FinFET SONOS devices for NAND flash applications - Field enhancement vs. barrier engineering
906
Reliability of planar InP-InGaAs avalanche photodiodes with recess etching
907
Reliability of Planar SKiN Interconnect Technology
908
Reliability of planar waveguide photodiodes for optical subscriber systems
909
Reliability of plane fitting by range sensing
910
Reliability of plastic ball grid array package
911
Reliability of plastic products at stages of design, manufacturing and exploitation
912
Reliability of plastic-encapsulated electronic components in supersaturated steam environments
913
Reliability of poles in NESC grade C construction
914
Reliability of polycrystalline silicon under long-term cyclic loading
915
Reliability of polyimide-based thin and flexible capacitors with SrTiO3
916
Reliability of polymer optical fibres -facts and trends
917
Reliability of polymide/nitrate dielectrics for multilevel metallization systems
918
Reliability of polynomial IDS-VGS-VDS model fitted using harmonic-balance simulation
919
Reliability of porous low-k dielectrics under dynamic voltage stressing
920
Reliability of power converters — Lifetime cycle approach
921
Reliability of power cycling for IGBT power semiconductor modules
922
Reliability of power cycling for IGBT power semiconductor modules
923
Reliability of power distribution condition for 10-Gigabit-Ethernet transmission
924
Reliability of power electronic systems
925
Reliability of Power Electronics Under Thermal Loading
926
Reliability of Power Gaas FET´s-Au Gates and Al-Au Linked Gates
927
Reliability of power GaAs field-effect transistors
928
Reliability of power GaAs field-effect transistors
929
Reliability of power supplies
930
Reliability of power supplies and systems
931
Reliability of power supplies and systems at broadcast transmitting stations
932
Reliability of Power Supply Systems
933
Reliability of Power Systems
934
Reliability of power systems considering conventional and alternative sources of energy
935
Reliability of predicting stick-slip in robotics and control using describing function
936
Reliability of Press Fit Contacts and Adjoining SMD Components on Printed Circuit Boards
937
Reliability of press-fit pins in printed wiring boards
938
Reliability of pressure contacted intelligent integrated power modules
939
Reliability of pressure-sensitive adhesive tapes for heat sink attachment in air-cooled electronic assemblies
940
Reliability of Primary Batteries: A Case History
941
Reliability of Printed Circuit Boards Processed Using No-Clean Flux Technology in Temperature–Humidity–Bias Conditions
942
Reliability of Probe Speed Data for Detecting Congestion Trends
943
Reliability of protecting techniques used in fault-tolerant cache memories
944
Reliability of protection and control equipment in the context of compensation for power supply interruptions
945
Reliability of protection and control equipment in the context of compensation for power supply interruptions
946
Reliability of protection systems - operational experience 1976-2002
947
Reliability of PtMn-based spin valves
948
Reliability of pulsed and CW electron-beam semiconductor devices
949
Reliability of PV modules and balance-of-system components
950
Reliability of Qualitative Data Using Text Analysis - A Queensland Health Case Study
951
Reliability of quantitative TUG measures of mobility for use in falls risk assessment
952
Reliability of Quantity Produced Transistors in Low Power Audio Applications
953
Reliability of quantum-mechanical communication systems
954
Reliability of Quartz Crystal Units
955
Reliability of rare-earth-doped fluoride fibers for optical fiber amplifier application
956
Reliability of RDL structured wafer level packages
957
Reliability of real-time information systems for route choice decisions in a congested traffic network: Some simulation experiments
958
Reliability of Recess-channel Gate Cell Transistor under Gate-Induced Drain Leakage Stress and Positive Bias Fowler-Nordheim Gate Stress
959
Reliability of reconfigurable control systems: a fuzzy set theoretic perspective
960
Reliability of reconfigurable distribution systems including distributed generation
961
Reliability of Reconstruction of Arbitrarily Oriented Flaws Using Multiview Transducers
962
Reliability of recursive concentrator
963
Reliability of redundant integrated circuits in failure dependent application
964
Reliability of Redundant Systems with Unreliable Switches
965
Reliability of remote manipulator systems for use in radiation environments
966
Reliability of Repetitively Avalanched Wire-Bonded Low-Voltage Discrete Power Trench n-MOSFETs
967
Reliability of replicated data objects
968
Reliability of replicated files in partitioned networks
969
Reliability of Representative Reviewers on the Web
970
Reliability of reprogrammable nonvolatile memories
971
Reliability of resin molded transformers
972
Reliability of resins for molded transformers
973
Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations
974
Reliability of RF MEMS Capacitive Switches and Distributed MEMS Phase Shifters using AlN Dielectric
975
Reliability of RF MEMS switches due to charging effects and their circuital modelling
976
Reliability of RFID in Logistic Systems
977
Reliability of RFID tag inlay assembled by anisotropic conductive adhesive
978
Reliability of RF-MEMS
979
Reliability of RSA algorithm and its computational complexity
980
Reliability of rural distribution systems in developing countries
981
Reliability of SAR ADCs and associated embedded instrument detection
982
Reliability of scale-free complex networks
983
Reliability of Schoof algorithm and its computational complexity
984
Reliability of scrubbing recovery-techniques for memory systems
985
Reliability Of Sediment Quality Assessment In Puget Sound
986
Reliability of segmented edge seal ring for RF devices
987
Reliability of self-aligned, ledge passivated 7.5 GHz GaAs/AlGaAs HBT power amplifiers under RF bias stress at elevated temperatures
988
Reliability of Self-Assembly Vertical Interconnects in Magnetically Aligned Anisotropic Conductive Adhesive for Electronic Packaging Applications
989
Reliability of semiconductor devices
990
Reliability of semiconductor devices
991
Reliability of semiconductor devices - The need for simulation
992
Reliability of semiconductor devices for submarine-cable systems
993
Reliability of semiconductor laser packaging in space applications
994
Reliability of Semiconductor Lasers and Detectors for Undersea Transmission Systems
995
Reliability of semiconductor lasers and detectors for undersea transmission systems
996
Reliability of semiconductor lasers for undersea optical transmission systems
997
Reliability of semiconductor lasers for undersea optical transmission systems
998
Reliability of semiconductor lasers optical fiber transmission systems
999
Reliability of semiconductor RAMs with soft-error scrubbing techniques
1000
Reliability of Sensors Based on Nanowire Networks Operating in a Dynamic Environment
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