بر اساس عنوان

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Test Technology Technical Council
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Test Technology Technical Council
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Test Technology Technical Council
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Test Technology Technical Council
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Test Technology Technical Council (TTTC)
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Test Technology Technical Council (TTTC)
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Test Technology Technical Council (TTTC)
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Test Technology Technical Council (TTTC)
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Test Technology Technical Council (TTTC)
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Test Technology Technical Council (TTTC)
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Test Technology Technical Council (TTTC) Activities Board
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Test Technology Technical Council Newsletter
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Test Technology: Testing´s Impact on Design And Manufacturing
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Test templates: a specification-based testing framework
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Test the test experts: do we know what we are doing?
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Test Time Analysis for IEEE P1687
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Test time impact of redundancy repair in embedded flash memory
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Test time minimization for hybrid BIST of core-based systems
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Test time minimization for system-on-chip with test bus assignment and sizing
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Test time of multiplier/accumulator based output response analyzer in built-in analog functional testing
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Test Time Optimization for 3D-SICs Having Multiple Towers
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Test time reduction for ACPR measurement of wireless transceivers using periodic bit-stream sequences
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Test time reduction for IDDQ testing by arranging test vectors
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Test time reduction for scan-designed circuits by sliding compatibility
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Test time reduction for scan-designed circuits by sliding compatibility
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Test time reduction in a manufacturing environment by combining BIST and ATE
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Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example
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Test Time Reduction in EDT Bandwidth Management for SoC Designs
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Test time reduction in scan designed circuits
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Test time reduction methods for yield test structures
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Test time reduction of successive approximation register A/D converter by selective code measurement
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Test time reduction reusing multiple processors in a network-on-chip based architecture
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Test time reduction through minimum execution of tester-hardware setting instructions
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Test Time Reduction to Test for Path-Delay Faults using Enhanced Random-Access Scan
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Test time reduction using parallel RF test techniques
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Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations
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Test token driven acoustic balancing for sparse enrollment data in cohort GMM speaker recognition
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Test tool for equivalence of access control list
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Test tool qualification through fault injection
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Test Tool Suite for ASON Signaling
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Test Tools for Road Safety Telematic Systems
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Test tools for the Year 2000 challenges
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Test trade-offs for different dynamic testing techniques for analog and mixed-signal circuits
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Test tradeoffs in ASIC design: tutorial
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Test transformation to improve compaction by statistical encoding
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Test trial of a new broadband access technology based on coaxial cable network
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Test tube systems with controlled applications of rules
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Test up to 80 kA of an Al-Stabilized NbTi Cable With the Upgraded Saclay Superconducting Transformer
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Test validity and Rasch measurement of sustainable quality of life items in building and environment projects
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Test values of armature leakage reactance
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Test values of armature leakage reactance
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Test Values of Armature Leakage Reactance
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Test vector chains for increased resolution and reduced storage of diagnostic tests
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Test vector chains for increased targeted and untargeted fault coverage
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Test vector chains for increasing the fault coverage and numbers of detections
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Test vector compression technique in system-on-chip
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Test vector compression using EDA-ATE synergies
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Test vector compression via statistical coding and dynamic compaction
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Test vector decompression via cyclical scan chains and its application to testing core-based designs
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Test vector embedding in accumulators with stored carry in O(1) time
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Test vector embedding into accumulator-generated sequences: a linear-time solution
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Test vector encoding using partial LFSR reseeding
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Test vector generation and classification using FSM traversals
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Test vector generation based on correlation model for ratio-IDDQ
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Test vector generation for charge sharing failures in dynamic logic
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Test Vector Generation for Linear Analog Devices
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Test vector generation for parametric path delay faults
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Test vector minimization during logic synthesis
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Test vector modification for power reduction during scan testing
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Test Vector Omission for Fault Coverage Improvement of Functional Test Sequences
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Test vector omission with minimal sets of simulated faults
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Test Vector Ordering For Power Reduction During Transmission of Compressed Test Patterns To Embedded System-On-Chip
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Test vector overlapping based compression tool for narrow test access mechanism
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Test vector reordering to reduce peak temperature during testing
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Test vehicle for a wafer-scale field programmable gate array
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Test vehicle for a wafer-scale field programmable gate array
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Test vehicle for a wafer-scale thermal pixel scene simulator
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Test vehicle for a wafer-scale thermal pixel scene simulator
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Test vehicle for MCM-D interconnect process development
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Test Vehicle For The Measurement Of Charge Collection And Soft Error rate Prediction In high-density Memories due to /spl alpha/-particle strikes
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Test vehicle options for ceramic surface mount arrays
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Test vehicle to characterize silicon to organic flip chip package thermomechanical interactions
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Test verification of LD-CELP: an objective measurement approach for a non-bit exact standard
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Test verification of the Cassini spacecraft dynamic model
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Test Versus Security: Past and Present
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Test Video Selection for Video Processing Research and Development
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Test virtual learning environments for teaching network for the deaf
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Test volume and application time reduction through scan chain concealment
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Test volume reduction via flip-flop compatibility analysis for balanced parallel scan
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Test vs. model correlation study on return loss characteristics of an emulated 25Gbps+ backplane system EMI source
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Test wafer control system in 300 mm FAB
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Test Wafer Management and Automated Wafer Sorting
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Test wafer management for semiconductor manufacturing
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Test waveform shaping in mixed signal test bus by pre-equalization
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Test Week Tutorials
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Test width compression for built-in self testing
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Test wire for high voltage power supply crowbar system
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Test workbench for electronic telecommunication systems
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Test wrapper and test access mechanism co-optimization for system-on-chip
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Test wrapper bandwidth assignment for minimizing the SoC test application time
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Test Wrapper Design and Optimization Under Power Constraints for Embedded Cores With Multiple Clock Domains
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Test Wrapper Design for 3D System-on-Chip Using Optimized Number of TSVs
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Test wrapper optimization technique using BDF and GA for 3D IP cores
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Test yield estimation for analog/RF circuits over multiple correlated measurements
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Test Yield Improvement of Class II Bluetooth Devices Through Power Output Optimization Via Circuit Element Tuning
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Test Your Limits [advertisement]
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Test your Strategy: Graphical Construction of Strategies for Connect-Four
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Test yourself: how much do you know about international communications? (International numbering systems)
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Test zone field compensation
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Test–Retest Reliability of Robotic Assessment Measures for the Evaluation of Upper Limb Recovery
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Test, and research for IH intelligent rice cooker immunity against power quality
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Test, integration, commissioning and installation of large drift tube chambers of the ATLAS barrel muon spectrometer
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TEST/AGENT: CAD-INTEGRATED AUTOMATIC GENERATION OF TEST PROGRAMS
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Test/ATE vision 2020 — Entrepreneurship in test CEO panel
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Test/characterization procedures for high density silicon RAMs
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Test/Repair Area Overhead Reduction for Small Embedded SRAMs
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TEST: a Tracer for Extracting Speculative Threads
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TEST: a Web-based T-cell epitope search tool
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TEST: Assessing NoC Policies Facing Aging and Leakage Power
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TEST: Serious games for radio communications learning
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Test: shared problems and shared solutions
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test: tools for evaluation of students´ tests-a development experience
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Test: when is enough enough?
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Test: Wisdom from the giants, visions for the future - Part 1 [ITC Plenary Panel]
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Test++: an adaptive training system on the Internet
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Testa motors inc.: pioneer towards a new strategic approach in the automotive industry along open source movement
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Testability - getting the message across to the ´mature´ engineer
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Testability - What, Why, Where, When And How ?
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Testability access of the high speed test features in the Alpha 21264 microprocessor
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Testability alternatives exploration through functional testing
131
Testability analysis and ATPG on behavioral RT-level VHDL
132
Testability analysis and behavioral testing of the Hopfield neural paradigm
133
Testability analysis and insertion for RTL circuits based on pseudorandom BIST
134
Testability analysis and multi-frequency ATPG for analog circuits and systems
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Testability Analysis and Scalable Test Generation for High-Speed Floating-Point Units
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Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST
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Testability analysis applied to embedded data-flow software
138
Testability analysis based on structural and behavioral information
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Testability Analysis Based on the Identification of Testable Blocks with Predefined Properties
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Testability analysis for software components
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Testability analysis for test generation in synchronous sequential circuits
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Testability Analysis Integrated into Scicos Development Environment
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Testability analysis method for hardware and software based on assertion libraries
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Testability analysis module of FMECA processor
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Testability analysis of a UML class diagram
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Testability analysis of analog systems
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Testability analysis of CMOS ternary circuits
148
Testability analysis of co-designed systems
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Testability Analysis of Digital Design Verification
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Testability Analysis of Grounding Grids Using Network Transformation
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Testability analysis of hierarchical finite state machines
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Testability analysis of IDDQ testing with large threshold value
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Testability analysis of multichip systems
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Testability analysis of pipelined data paths
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Testability analysis of reactive software
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Testability analysis of synchronous sequential circuits based on structural data
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Testability analysis using a discrete event systems framework
158
Testability analysis utilizing a relational database
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Testability and reliability enhancement techniques
160
Testability and self-test in NMOS and CMOS VLSI signal processors
161
Testability and signal integrity in a low cost multichip module
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Testability and signal integrity in a low cost multichip module
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Testability and Software Robustness: A Systematic Literature Review
164
Testability and test architectures
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Testability and test compaction for decision diagram circuits
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Testability and Test Framework for Collaborative Real-Time Editing Tools
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Testability and test protocol expansion in hierarchical macro testing
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Testability and yield of MMICs
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Testability aspects of a DSP based image processing system
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Testability aspects of folded source-coupled logic
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Testability challenges to achieve zero defect goal in MCM manufacturing
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Testability Conditions for Bilateral Arrays of Combinational Cells
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Testability conditions for linear sequential arrays
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Testability conditions for two-dimensional bilateral arrays
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Testability considerations
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Testability considerations in high-performance avionics processors
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Testability considerations in technology mapping
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Testability considerations in the design of the MC68340 Integrated Processor Unit
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Testability Considerotions in Microprocessor-Based Design
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Testability controlled physical design of vertically stacked integrated circuits
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Testability demonstration method of electronic equipment based on hypergeometric distribution
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Testability design for PLA-implemented finite state machine
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Testability design for sequential circuit with multiple feedback
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Testability design of motor control digital signal processor
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Testability design of multi-valued RTD circuits
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Testability design prevents harm
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Testability design with multiple scan chains
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Testability driven statistical path selection
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Testability driven synthesis of interacting finite state machines
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Testability Emphasis in the General Electric A/VLSI Program
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Testability enhancement for behavioral descriptions containing conditional statements
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Testability enhancement of domino CMOS logic
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Testability equals producibility
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Testability Estimation Based on Controllability and Observability Parameters
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Testability Evaluation Based on Multi-signal Model
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Testability evaluation for analog linear circuits via transfer function analysis
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Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
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Testability expertise and test planning from high-level specifications
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Testability Exploration of 3-D RAMs and CAMs
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Testability features and the testability access of the Alpha 21164 microprocessor
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Testability features for a submicron voice-coder ASIC
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Testability features in a high-density memory module
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Testability features in the TMS370 family of microcomputers
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Testability features of a 32 kbps ADPCM transcoder
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Testability features of a single photon counting hybrid pixel detector readout circuit with charge sharing elimination algorithm
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Testability features of AMD-K6TM microprocessor
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Testability features of R10000 microprocessor
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Testability features of the 68040
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TESTABILITY FEATURES OF THE 68HC16Z1
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Testability features of the alpha 21364 microprocessor
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Testability features of the AMD-K6 microprocessor
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Testability features of the first-generation CELL processor
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Testability features of the MC68060 microprocessor
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Testability features of the MC68332 modular microcontroller
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Testability features of the MDSP [Multimedia Fixed Point Digital Signal Processor]
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Testability features of the SuperSPARC microprocessor
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Testability for all seasons
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Testability forecasting for sequential circuits
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Testability guided BIST technique
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Testability implemented in the VAX 6000 model 400
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Testability implications in low-cost integrated radio transceivers: a Bluetooth case study
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Testability implications of performance driven logic synthesis
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Testability improvement during high-level synthesis
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Testability improvement for 12.8 GB/s Wide IO DRAM controller by small area pre-bonding TSV tests and a 1 GHz sampled fully digital noise monitor
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Testability improvement in high-level synthesis through reconvergence reduction
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Testability improvements based on the combination of analytical and evolutionary approaches at RT level
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Testability insertion in behavioral descriptions
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Testability issues in analog cellular neural networks
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Testability issues in superconductor electronics
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Testability measure and analysis
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Testability measurements for data flow designs
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Testability measures combining probablistic and sampling techniques
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Testability measures in pseudorandom testing
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Testability measures reduce test generation time in sequential ATPG
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Testability measures with concurrent good simulation
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Testability metrics for synthesis of self-testable designs and effective test plans
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Testability modeling and analysis based on rough set
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Testability modeling and analysis of a rocket engine test stand
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Testability Modeling for 1553B Bus System Based on Multi-Signal Flow Graph
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Testability modeling usage in design-for-test and product lifecycle cost reduction
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Testability Models for Structured Programs
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Testability of 123DD based differential pass-transistor logic circuits
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Testability of 2-level AND/EXOR circuits
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Testability of a swarm robot using a system of systems approach and discrete event simulation
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Testability of a VLSI Systolic Array
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Testability of AND-EXOR logic vs. AND-OR logic
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Testability of asynchronous timed control circuits with delay assumptions
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Testability of circuits derived from functional decision diagrams
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Testability of circuits derived from lattice diagrams
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Testability of convergent tree circuits
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Testability of Cryptographic Hardware and Detection of Hardware Trojans
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Testability of digital circuits via the spectral domain
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Testability of Dynamic Real-Time Systems: An Empirical Study of Constrained Execution Environment Implications
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Testability of ECL circuits in a BiCMOS process
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Testability of floating gate defects in sequential circuits
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Testability of generalized multiple-valued Reed-Muller circuits
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Testability of object-oriented systems: An AHP-based approach for prioritization of metrics
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Testability of one dimensional ILAs under multiple faults
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Testability of one-dimensional iterative arrays using a variable testability measure
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Testability of parity checkers
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Testability of path history memories with register-exchange architecture used in Viterbi-decoders
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Testability of sequential circuits with multi-cycle false paths
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Testability of software components
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Testability of Software in Service-Oriented Architecture
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Testability of SPP Three-Level Logic Networks in Static Fault Models
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Testability of the arbitrage pricing theory by neural network
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Testability of the PAALS auto-align sensor system
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Testability of the Philips 80C51 micro-controller
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Testability on TAP
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Testability planning for improved system performance
271
Testability prediction for sequential circuits using neural networks
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Testability preserving and enhancing transformations for robust delay fault testability
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Testability preserving Boolean transforms for logic synthesis
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Testability preserving transformations in multi-level logic synthesis
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Testability profile estimation of VLSI circuits from fault coverage
276
Testability properties of acyclic structures and applications to partial scan design
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Testability properties of BDDs
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Testability properties of local circuit transformations with respect to the robust path-delay-fault model
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Testability properties of vertex precedent BDDs
280
Testability simulation validation technology of tank fire control system based on TEAMS
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Testability strategy and DFT methodology of CalmRISC32
282
Testability strategy for registers and memories in a multi-processor architecture
283
Testability strategy of the Alpha AXP 21164 microprocessor
284
Testability structure for mixed-signal boards
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Testability synthesis for jumping carry adder
286
Testability trade-offs for BIST RTL data paths: the case for three dimensional design space
287
Testability transformation
288
Testability using random access test register
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Testability verification based on sequential probability ratio test method
290
Testability, debuggability, and manufacturability features of the UltraSPARC-I microprocessor
291
Testability, failure rates, detectability, trustability and reliability
292
Testability, testing, and critical software assessment
293
Testability, the key to economical and operationally effective avionic test software
294
Testability: an introduction for COMPASS94
295
Testability: Barriers to Acceptance
296
Testability: the state of the art-automatic testing in the next decade and the 21st century
297
Testability-directed service definitions and their synthesis
298
Testability-Driven Fault Sampling for Deterministic Test Coverage Estimation of Large Designs
299
Testability-Driven Random Test-Pattern Generation
300
Testability-Driven Statistical Path Selection
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Testability-oriented channel routing
302
Testability-oriented hardware/software partitioning
303
Testability-preserving circuit transformations
304
Testable and diagnosable commercial off the shelf (COTS) electronics
305
Testable and fault tolerant design for FFT networks
306
Testable and self-repairable structured logic design
307
Testable ASIC design for a fuzzy logic based QRS complex detector
308
Testable CMOS design for robust and logical testability of stuck-open/stuck-on faults
309
Testable combinational circuit design based on free ZDD-implementation of irredundant SOPof Boolean function
310
Testable combinational circuit design based on ZDD-implementation of ISOP Boolean function
311
Testable Design and BIST Techniques for Systolic Motion Estimators in the Transform Domain
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Testable design and support tool for cell based test
313
Testable design and testing of high-speed superconductor microelectronics
314
Testable design and testing of MCMs based on multifrequency scan
315
Testable design and testing of micro-electro-fluidic arrays
316
Testable design environment with test-added tools
317
Testable Design for Adaptive Linear Equalizer in High-Speed Serial Links
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Testable Design for Advanced Serial-Link Transceivers
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Testable design for BiCMOS stuck-open fault detection
320
Testable Design for Electrical Testing of Open Defects at Interconnects in 3D ICs
321
Testable design of BiCMOS circuits for stuck-open fault detection using single patterns
322
Testable design of bit-level systolic block FIR filters
323
Testable design of digital ASIC with embedded analog multiplexers
324
Testable design of GRM network with EXOR-tree for detecting stuck-at and bridging faults
325
Testable design of microcontrollers using a RISC approach
326
Testable design of multiple-stage OTA-C filters
327
Testable design of non-scan sequential circuits using extra logic
328
Testable design of RMC networks with universal tests for detecting stuck-at and bridging faults
329
Testable design of sequential circuits with improved fault efficiency
330
Testable Design of Single-Output Sequential Machines Using Checking Experiments
331
Testable design representations for mobile augmented reality authoring
332
Testable design verification using Petri nets
333
Testable Designs of Multiple Precharged Domino Circuits
334
Testable Designs of Sequential Circuits under Highly Observable Condition
335
Testable on-the-fly carry-save multiplier by alternating input data
336
Testable path delay fault cover for sequential circuits
337
Testable Path Selection and Grouping for Faster Than At-Speed Testing
338
Testable programmable digital clock pulse control elements
339
Testable realizations for ESOP expressions of logic functions
340
Testable Realizations for FET Stuck-Open Faults in CMOS Combinational Logic Circuits
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Testable realizations of CMOS combinational circuits for voltage and current testing
342
Testable Reversible Latches for Molecular QCA
343
Testable Sequential Cellular Arrays
344
Testable sequential circuit design: a partition and resynthesis approach
345
Testable sequential circuit design: partitioning for pseudoexhaustive test
346
Testable Specifications of NoTA-based Modular Embedded Systems
347
Testable switched-capacitor filters
348
Testable Switched-Capacitor Filters
349
Testable synthesis and testing of finite state machines
350
Testable synthesis of high complex control devices
351
Testable synthesis of synchronous sequential circuits considering strong-connectivity using undefined states
352
Testable use cases in the Abstract State Machine Language
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Testable VLSI circuit design of SIMD graphics engine
354
Testable, reusable units of cognition
355
Test-access mechanism optimization for core-based three-dimensional SOCs
356
Test-Access Solutions for Three-Dimensional SOCs
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Test-access-mechanism optimization for multi-Vdd SoCs
358
Test-activity flow control for SOA execution test
359
Test-adequacy and statistical testing: combining different properties of a test-set
360
Test-Algebra Execution in a Cloud Environment
361
Testaments for resilient structured overlay networks
362
Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns
363
Test-Architecture Optimization and Test Scheduling for TSV-Based 3-D Stacked ICs
364
Test-architecture optimization for TSV-based 3D stacked ICs
365
Test-based assessment with mobile devices
366
Test-based diagnosis: tree and matrix representations
367
Test-Based Interoperability Certification for Web Services
368
Test-based model generation for legacy systems
369
Test-based model generation for legacy systems
370
Test-Based Specifications of Components and Systems
371
Testbeam results for a Shashlik calorimeter with longitudinal segmentation
372
Testbeam results for the SiW electromagnetic calorimeter
373
Test-beam results from the ATLAS level-1 calorimeter trigger demonstrator
374
Test-beam results from the ATLAS level-1 calorimeter trigger demonstrator
375
Testbeam results on particle identification with aerogel used as RICH radiator
376
Testbeam results on particle identification with aerogel used as RICH radiator
377
Test-beam study of the performance of the microstrip gas avalanche chamber
378
Testbed architecture and framework for debugging Wireless Sensor Networks
379
Testbed architecture for fusion of imaging and non-imaging airborne sensors
380
Test-Bed Based Comparison of Single and Parallel TCP and the Impact of Parallelism on Throughput and Fairness in Heterogenous Networks
381
Testbed based throughput analysis in a Wireless Sensor Network
382
Test-bed board for 16×64 stereo vision CNN chip
383
Testbed Demonstration and Analysis for Delivering Dual Services Simultaneously in a Single Radio-over-Fiber Access Platform
384
Testbed design and implementation of HDMI based 3D broadcast CWDM access network
385
Testbed design and localization in MiNT-2: A miniaturized robotic platform for wireless protocol development and emulation
386
Test-bed design for evaluation of intelligent transportation systems and intelligent vehicle systems
387
Testbed design for Wireless Biomedical Sensor Network (WBSN) application
388
Test-bed Development & Measurement Plan for Evaluating Transmit Diversity in DVB Networks
389
Testbed development and performance improvement of heterogeneous radio networks
390
Testbed Environment for Wireless Sensor and Actuator Networks
391
Testbed Evaluation of Dynamic GGSN Load Balancing for High Bitrate 3G/UMTS Networks
392
Test-Bed Evaluation of Ingress Queuing for Improved Packet Delivery
393
Testbed evaluation of navigation and text display techniques in an information-rich virtual environment
394
Testbed evaluations of a controlled-delivery power grid
395
Testbed Experimentation of a Meshed Tree Routing with Local Link State for Wireless PAN Mesh
396
Testbed Experiments of Dynamic Survivable Resource Pooling Using FPGA-Based Robot
397
Testbed Experiments on the Location to Service Translation (LoST) Protocol for Mobile Users
398
Testbed federation: An approach for experimentation-driven research in cognitive radios and cognitive networking
399
Testbed for 100 Gb/s Ethernet
400
Testbed for 21st Century Wireless Networks Applications
401
Testbed for a LiFi system integrated in streetlights
402
Testbed for artificial markets
403
Testbed for Cellular Telecommunications Cyber Vulnerability Analysis
404
Testbed for coexistence evaluation in TV White Spaces
405
Testbed for combination of local sensing with geolocation database in real environments
406
Testbed for development of a DSP-based signal processing subsystem for an earth-orbiting radar scatterometer
407
Testbed for distributed high-level information fusion and dynamic resource management
408
Testbed for dual-constellation GBAS concepts
409
Testbed for evaluating reference models of Internet of Things (IoT)
410
Testbed for evaluating Wireless Sensor Networks with non-line of sight links
411
Testbed for experimental analysis on seamless evolution architectures from GPON to high capacity WDM-PON
412
Testbed for IR-UWB based ranging and positioning: Experimental performance and comparison to CRLBs
413
Testbed for measuring of the effect of fiber acoustic-band phase noise on the T&F transfer stability
414
Testbed for microgrid with multi-energy Generators
415
Testbed for Micro-scale Urban Air Quality Monitoring System
416
Testbed for mobile network operator scenarios
417
Testbed for Mobile Telephony Networks
418
Testbed for modeling and inventory regulation of dynamic supply chains
419
Testbed for Multi-Hop Ad hoc Network in IEEE 802.11 Wireless Environment
420
Test-bed for Navigation and Control of a Thruster based AUV
421
Testbed for Node Communication in MANETs to Uniformly Cover Unknown Geographical Terrain Using Genetic Algorithms
422
Testbed for non-coherent zero-feedback distributed beamforming
423
Testbed for performance evaluation of SAT-AIS receivers
424
Testbed for satellite formation flying under ground conditions
425
Test-Bed for Sensor Network Management Protocols
426
Testbed for WDM field trials over 750 km with full compensation of chromatic dispersion
427
Testbed for Wireless Adaptive Signal Processing Systems
428
Testbed for wireless Mesh Backhaul Networks MEMBRANE demonstrator
429
Testbed for wireless vehicle communication: a simulation approach based on three-phase traffic theory
430
Test-Bed Formation for Human Driver Model Development and Decision Making
431
Testbed implementation for Autonomic Network Performance Management of wireless mesh networks
432
Test-bed implementation of a cross-layer framework for video streaming over IEEE 802.11 ad-hoc wireless network
433
Testbed Implementation of a Secure Flooding Time Synchronization Protocol
434
Testbed implementation of control plane extensions for inter-carrier GMPLS LSP provisioning
435
Test-bed implementation of DC microgrid in islanding mode
436
Testbed implementation of delay/fault-tolerant mobile sensor network (DFT-MSN)
437
Testbed implementation of energy aware wireless sensor network
438
Test-bed implementation of iterative interference alignment and power control for wireless MIMO interference networks
439
Testbed infrastructure supporting pervasive services
440
Testbed Innovations for Experimenting with Wired and Wireless Software Defined Networks
441
Test-bed interferometer to develop active optics techniques for space interferometers in mid-IR and far-IR astronomy missions
442
Test-bed measurements for ad-hoc WSN applications
443
Testbed methods to study physical layer path establishment in long haul optical wavelength switched networks
444
Testbed of a Novel Media Streaming Architecture for Heterogeneous Wireless Environment
445
Test-Bed of Doubly Fed Induction Generator for Variable-Speed Constant-Frequency Wind Power Generation
446
Testbed of OBS/GMPLS interworking
447
Test-bed of pulsed radio frequency (RF) signal used with a diode made of carbon nanotubes (CNTs)
448
Testbed of web 2.0 Services for individuals with mental illness
449
Testbed performance analysis of cross-layer based service discovery in Wireless Mesh Networks
450
Test-bed system for improved induction machines diagnostics
451
Testbed techniques of industrial control system
452
Testbed, field trials and measurement issues for UMTS quality of service
453
Testbed-based performance evaluation of a connectionless multicast protocol for MANETs
454
Testbed-based performance evaluation of routing protocols for vehicular delay-tolerant networks
455
Testbed-based validation of design techniques for reliable distributed real-time systems
456
Testbedding MIMO HSDPA and WiMAX
457
TestbedProfiler: A validation tool for wireless sensor network testbed deployment
458
TESTBEDS 2015 Program Committee
459
Testbeds for assessing the performance of a TDMA-based radio access design for UMTS
460
Testbeds for Emulating Dependability Issues of Mobile Web Services
461
Testbeds for IT Systems in Tactical Environments
462
Testbeds of a hybrid-ARQ-based reliable communication for CANs in highly electromagnetic environments
463
TESTBEDS: Testing Techniques & Experimentation Benchmarks for Event-Driven Software Committee
464
Testbench components verification using fault injection techniques
465
Testbench Design for Mixed Signal SoC Based on Task Flow
466
Testbench for electrical drive systems in hybrid applications
467
Testbench for evaluations of maximum power point tracking algorithms for solar energy harvesting
468
Test-bench for ultra high-speed electrical drives
469
Test-bench for very high power variable frequency drives working under constrained grid conditions
470
Testbench generation for reconfigurable media processor
471
Test-bench layout emulating a MMC-based HVDC transmission system
472
Testbench Qualification of SystemC TLM Protocols through Mutation Analysis
473
Test-bench set-up for high-power PMSM test drive for validating novel control schemes
474
Testbricks: Software framework for IEEE Standard 1641 test programs
475
Testbricks: software framework for IEEE standard 1641 test programs
476
TestBuilder - ATPG system for digital devices based on FPGA
477
Test-Case Creation Framework for Touchscreen-Based Device Testing
478
Test-Case Generation and Coverage Analysis for Nondeterministic Systems Using Model-Checkers
479
Test-case generation for concurrent programs with the testing criteria using interaction sequences
480
Test-case generation for embedded simulink via formal concept analysis
481
Test-case generation for marine safety and security scenarios
482
Test-case generation from Prolog-based specifications
483
Test-case generation with IOGen
484
Test-case generator for nonlinear continuous parameter optimization techniques
485
Test-case generator TCG-2 for nonlinear parameter optimisation
486
Testcases Formation Using UML Activity Diagram
487
Testchip for high temperature superconductor passive devices
488
TESTCHIP: a chip for weighted random pattern generation, evaluation, and test control
489
TESTCHIP: A Chip for Weighted Random Pattern Generation, Evaluation, and Test Control
490
Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability
491
Test-Cost Modeling and Optimal Test-Flow Selection of 3-D-Stacked ICs
492
Test-cost optimization and test-flow selection for 3D-stacked ICs
493
Test-cost sensitive classification on data with missing values
494
Test-cost sensitive naive Bayes classification
495
Test-cost-sensitive attribute reduction based on neighborhood rough set
496
Test-data compression using hybrid prefix encoding for testing embedded cores
497
Test-data compression with low number of channels and short test time
498
Test-Data Generation for Web Services Based on Contract Mutation
499
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs
500
Test-data volume optimization for diagnosis
501
Test-decompression mechanism using a variable-length multiple-polynomial LFSR
502
Test-Delivery Optimization in Manycore SOCs
503
Test-driven agent-based simulation development
504
Test-driven agent-oriented software development
505
Test-Driven Assessment of Access Control in Legacy Applications
506
Test-Driven Component Integration with UML 2.0 Testing and Monitoring Profile
507
Test-Driven Development - Still a Promising Approach?
508
Test-Driven Development (TDD) in development of measure application and transducers services
509
Test-driven development and software maintenance
510
Test-driven development as a defect-reduction practice
511
Test-driven development concepts, taxonomy, and future direction
512
Test-driven development for graphical UIs: A multi-platform toolset
513
Test-Driven Development for Spreadsheet Risk Management
514
Test-Driven Development in Large Projects
515
Test-Driven Development of a PID Controller
516
Test-driven development of consumer electronics device drivers: A user-level device driver approach
517
Test-Driven Development of Relational Databases
518
Test-driven goal-directed debugging in spreadsheets
519
Test-Driven GUI Development with TestNG and Abbot
520
Test-driven learning in high school computer science
521
Test-driven migration towards a hardware-abstracted platform
522
Test-driven modeling for model-driven development
523
Test-driven modeling of embedded systems
524
Test-driven porting
525
Test-driven roles for pair programming
526
Test-Driven Service Discovery in Mobile Environments
527
Test-Driving Static Analysis Tools in Search of C Code Vulnerabilities
528
Test-Duo: A framework for generating and executing automated acceptance tests from use cases
529
Tested once, forever right? Influence of aging and temperature on susceptibility and emissions
530
Tested Techniques for Avoiding Responsibility
531
Test-environment based on a team of miniature walking robots for evaluation of collaborative control methods
532
Tester architecture for a time-division switch
533
Tester architecture for the source synchronous bus
534
Tester Feedback Driven Fault Localization
535
Tester for photovoltaic charger using NI cRIO
536
Tester of regulators of idle basing two-phase step-motors
537
Tester of the TRT front-end electronics for the ATLAS-experiment
538
Tester of the TRT front-end electronics for the ATLAS-experiment
539
Tester on the High-voltage Electrical Insulated Resistor Based on SCM
540
Tester retargetable patterns
541
TestEra: a novel framework for automated testing of Java programs
542
TestEra: A tool for testing Java programs using alloy specifications
543
Tester-assisted built in test
544
Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs
545
Tester-based optical and electrical diagnostic system and techniques
546
Testers learning requirements
547
TestEvol: A tool for analyzing test-suite evolution
548
Test-execution-based reliability measurement and modeling for large commercial software
549
Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits
550
TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm
551
TestFilter: A Statement-Coverage Based Test Case Reduction Technique
552
Test-first teaching: extreme programming meets instructional design in software engineering courses
553
Test-Fixture for Suspended-Strip Gap-Waveguide Technology on Ka-Band
554
TestFul: An Evolutionary Test Approach for Java
555
TestFul: automatic unit-test generation for Java classes
556
Testicular torsion: Diagnosis and treatment
557
Testimonial dinner to Edward Dean Adams
558
Testimonial of a convert from intellectual snob to PE: Professional registration? It can´t hurt!
559
Testimony before the Federal Communications Commission, May 2, 1972
560
Testing
561
Testing & maintenance of insulating oils
562
Testing & modeling of generator controls
563
Testing α-stable processes in modelling broadband teletraffic
564
Testing & quality assurance in data migration projects
565
Testing & quality of experiments
566
Testing & simulation of disturbance torque caused by cables in acquisition, tracking & pointing system
567
Testing “untestable” faults in three-state circuits
568
Testing (non-)existence of input-output relationships by estimating fractal dimensions
569
Testing .NET Code with YETI
570
Testing 144- and 256-crystal BGO block detectors
571
Testing 144- and 256-crystal BGO block detectors
572
Testing 24 volt aircraft batteries using Midtronics conductance technology
573
Testing 256k word×16 bit Cache DRAM (CDRAM)
574
Testing 32-bit embedded system using hardware-in-the-loop-simulation of automatic transmission
575
Testing 3D chips containing through-silicon vias
576
Testing 3-D IC Through-Silicon-Vias (TSVs) by Direct Probing
577
Testing 3D stacked ICs for post-bond partial/complete stack
578
Testing 3G mobile network infrastructures
579
Testing 3g-controlled systems: time to rejoice or time to feel pain?
580
Testing 3g-controlled systems: time to rejoice or time to feel pain?
581
Testing 500 kV line relays for a series compensation upgrade
582
Testing 750 node distribution grids and devices
583
Testing 90 nm microcontroller SRAM PUF quality
584
Testing a 110 kV external gas pressure cable to evaluate continued operational reliability
585
Testing a 2-input linear system with periodic binary sequences
586
Testing a 4-b shift register at 11 GHz
587
Testing a 5 MW high-temperature superconducting propulsion motor
588
Testing a capped MEMS gyroscope by an infrared technique
589
Testing a Cloud Provider Network for Hybrid P2P and Cloud Streaming Architectures
590
Testing a cognitive packet concept on a LAN
591
Testing a Collaborative DDoS Defense In a Red Team/Blue Team Exercise
592
Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode
593
Testing a commercial water magnetiser: a study of viscosity
594
Testing a community network testbed control system
595
Testing a complete control and protection system for multi-terminal MMC HVDC links using hardware-in-the-loop simulation
596
Testing a Component-Based Application for Road Traffic Crossroad Control Using the SimCo Simulation Framework
597
Testing a Cu-8Cr-4Nb contact material in vacuum interrupters
598
Testing a Datawarehouse - An Industrial Challenge
599
Testing a decentralized filter for GPS/INS integration
600
Testing a digital library of technical manuals
601
Testing a distributed denial of service defence mechanism using red teaming
602
Testing a Distributed System: Generating Test Sequences without Potential Controllability and Observability Problems
603
Testing a DSP-Based Mixed-Signal Telecommunicatians Chip
604
Testing a framework for multimodal control in the home environment
605
Testing a Fully Autonomous Robotic Salesman in Real Scenarios
606
Testing a high density logic masterslice
607
Testing a High Performance, Random Access Priority Queue: A Case Study
608
Testing a jump-diffusion stochastic interest rates model in currency options markets
609
Testing a Lithium Ion Battery as a Pulsed Power Source
610
Testing a mixed signal board using cost effective VXI bus test technologies-A case study
611
Testing a model for MR imager noise
612
Testing a motion estimator array
613
Testing a multichip package for a consumer communications application
614
Testing a multivariate model for wavelet coefficients
615
Testing a Multi-wavelength, Multi-distance fNIR Probe as a Measure of Cerebral Oxygen Saturation for Use in a Feedback Titrated Oxygen Delivery System
616
Testing a Nanocrossbar for Multiple Fault Detection
617
Testing a Network by Inferring Representative State Machines from Network Traces
618
Testing a new algorithm for automatic processing of bathymetric data
619
Testing a New Automobile Has Always Meant Passing the Competition [advertisement]
620
Testing a New Communications System Has Always Meant Crossing New Frontiers [advertisement]
621
Testing a New Direct Load Control Power Line Communication System
622
Testing a New Direct Load Control Power Line Communication System
623
Testing a new low-frequency GPR antenna on karst environments of central Italy
624
Testing a New Model for the L-Band Radiation of Moist Leaf Litter
625
Testing a new proposed IPv6 QoS management model in inter and intra domains
626
Testing a new real time tariff for the residential clientele
627
Testing a Parametric Fault Detection Method
628
Testing a Partial Reconfiguration based design for sensor reading
629
Testing a Particle Swarm Optimization and Artificial Bee Colony Hybrid algorithm on the CEC13 benchmarks
630
Testing a pneumatic underwater glider in shallow water
631
Testing a polynomial for zeros inside the unit-circle over the ring of Gaussian integers
632
Testing a positional control servo-system. Part 2
633
Testing a predictive control with stochastic model in a balls mill grinding circuit
634
Testing a problem solving paradigm [engineering education]
635
Testing a procedural interface for conformance to a standard
636
Testing a prototype inductive power coupling for an electric highway system
637
Testing a proximity-based location tracking system with Bluetooth Low Energy tags for future use in the OR
638
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers
639
Testing a reliable in-vehicle navigation algorithm in the field
640
Testing a Sample Population for the Rayleigh Distribution
641
Testing a scaled pulsed modulator for an IEC neutron source into a resistive load
642
Testing a secure device: high coverage with very low observability
643
Testing a self-healing material in microgravity using a 3U cubesat
644
Testing a silicon photomultiplier time-of-flight (TOF) system in Fermilab Test Beam Facility
645
Testing a simple polygon for monotonicity optimally in parallel
646
Testing a simple symmetric hypothesis by a finite-memory deterministic algorithm
647
Testing a statistical package for identifying pulse height distribution for a data acquisition system for partial discharges
648
Testing a stereo vision system for motion compensation
649
Testing a switching memory in a telecommunication system
650
Testing a system-on-a-chip with embedded microprocessor
651
Testing a user interface style guide
652
Testing a wavelet-based variability model (WVM) for solar PV power plants
653
Testing a Web application
654
Testing a Web Application Involving Web Browser Interaction
655
Testing access control and obligation policies
656
Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories
657
Testing activities and results of GaAs space solar cells and PV assemblies for high temperature and insolation applications
658
Testing Activities for KT-OSS Development
659
Testing activities within the European Project "PV-Enlargement"
660
Testing Ada Annex E-distributed systems
661
Testing adaptive jamming cancellation algorithms using a digital beamforming array
662
Testing Adaptive Local Hyperplane for multi-class classification by double cross-validation
663
Testing ADC Spectral Performance Without Dedicated Data Acquisition
664
Testing ADC´s at sample rates from 20 to 120 MSPS
665
Testing Advanced Driver Assistance Systems with a serious-game-based human factors analysis suite
666
Testing advanced photovoltaic inverters conforming to IEEE standard 1547 - Amendment 1
667
Testing against Natural Language Requirements
668
Testing agent-based mobile computing applications using distributed simulations
669
Testing aggressive TCP configurations
670
Testing AIMOS ionization rates in the middle atmosphere: Comparison with ground based radio wave observations of the ionosphere
671
Testing aircraft generators
672
Testing Aircraft Generators
673
Testing algorithms for inverse simulation
674
Testing algorithms for linear matrix polynomial equations
675
Testing an ADC linearized with pseudorandom dither
676
Testing an Adoption Model for E-Government Services Using Structure Equation Modeling
677
Testing an analogue circuit using a complementary signal set
678
Testing an assistive fetch robot with spatial language from older and younger adults
679
Testing an automated unsupervised classification algorithm with diverse land covers
680
Testing an e-government Web site
681
Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach
682
Testing an Energy-Dispersive Counting-Mode Detector With Hard X-Rays From a Synchrotron Source
683
Testing an exergame for effectiveness and attractiveness
684
Testing an expert system: testing the emergency operating procedures tracking system
685
Testing an IEEE 1547 compliant generator controller for response to abnormal voltage
686
Testing an implementation of a temporal logic language
687
Testing an Improved Scintillation Camera for PET and SPECT
688
Testing an in-home gait assessment tool for older adults
689
Testing an integrated analog filter in a chip
690
Testing an Intelligent Landing Signals Officer (LSO) Agent for Conducting Pilot Training in a Helicopter Deck Landing Simulator
691
Testing an MCM for high-energy physics experiments: a case study
692
Testing an Open Source Suite for Open Queuing Network Modelling Using Metamorphic Testing Technique
693
Testing Analog and Mixed-Signal Circuits with Built-In Hardware - A New Approach
694
Testing Analog and Mixed-Signal Circuits With Built-In Hardware—A New Approach
695
Testing analog and mixed-signal integrated circuits using oscillation-test method
696
Testing analog circuits by sensitivity computation
697
Testing analog circuits by supply voltage variation and supply current monitoring
698
Testing analog circuits by using a sigma-delta modulator
699
Testing analog electronic circuits using N-terminal network
700
Testing analogue and mixed-signal modules by steady-state response monitoring
701
Testing analogue circuits by AC power supply voltage
702
Testing analogue circuits by power supply voltage control
703
Testing analogue functions using m-sequences
704
Testing analytics on software variability
705
Testing and analysing of 256×256 MOS resistor array for IR scene projector
706
Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress
707
Testing and analysis for lifetime prediction of crystalline silicon PV modules undergoing degradation by system voltage stress
708
Testing and analysis for lifetime prediction of crystalline silicon PV modules undergoing degradation by system voltage stress
709
Testing and Analysis for Rail in Service of Shanghai Metro
710
Testing and analysis of a `smart´ interface to connect two complex avionics bus systems without significant modification to the software of either system
711
Testing and analysis of a flexible feeding system
712
Testing and Analysis of Access Control Policies
713
Testing and analysis of bicrystal Josephson junction mixer´s conversion efficiency at THz
714
Testing and analysis of computer generated holograms for microphotonic devices
715
Testing and analysis of lifetime of a vertical bulk MEMS switch
716
Testing and analysis of OEM GPS sensor boards for AVL applications
717
Testing and Analysis of Separation Joints for Mars Science Laboratory
718
Testing and analysis on thermal performance for water source heat pump system
719
Testing and Analyzing of Solar Energy Resource
720
Testing and analyzing of solar energy resource assessment in inner mongolia
721
Testing and analyzing TCP performance in a wireless-wired mobile ad hoc test bed
722
Testing and Analyzing the Electrical Performances of Piezoelectric SMART Layer
723
Testing and application of lightning arresters
724
Testing and Application of Lightning Arresters
725
Testing And Applications of Inverter-Free PLAs
726
Testing and applying instantaneous trip circuit breakers in combination motor starters
727
Testing and approval of electrical appliances
728
Testing and benchmarking of a novel resistive wall boundary condition in the presence of an intense relativistic electron beam
729
Testing and calibration of internal pressure measurement system
730
Testing and Calibration of SAR ADCs by MCT-Based Bit Weight Extraction
731
Testing and calibration of smart pebble for river bed sediment transport monitoring
732
Testing and certification framework for URC
733
Testing and Certification of Medium Voltage Control Centers to Arc Resistant Standards
734
Testing and Certification of Trustworthy Systems Introduction to Minitrack
735
Testing and certification of trustworthy systems introduction to minitrack
736
Testing and certification of trustworthy systems introduction to minitrack
737
Testing And Characterization Of A Bistable Snaoping Microactuator Based On Thermo-mechanical Analysis
738
Testing and characterization of ASICs by the user
739
Testing and Characterization of Digital Video Devices Using an Advanced Analog VLSI Test System Architecture
740
Testing and characterization of PV modules with integrated microinverters
741
Testing and characterization of SDRAMs
742
Testing and characterization of the DubaiSat-1 imaging system
743
Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis
744
Testing and characterizing jitter in 100BASE-TX and 155.52 Mbit/s ATM devices with a 1 Gsamples/s AWG in an ATE system
745
Testing and commissioning experiences for the Duke Energy Progress Static VAR Compensator at Jacksonville, NC
746
Testing and Commissioning of a 135 MW Pulsed Power Supply at the Wuhan National High Magnetic Field Center
747
Testing and Commissioning of a Modular UHV AC Outdoor Test System
748
Testing and Commissioning of a Modular UHV AC Outdoor Test System
749
Testing and commissioning of the als adjustable, hysteresis-free Chicane magnet
750
Testing and Comparing Web Vulnerability Scanning Tools for SQL Injection and XSS Attacks
751
Testing and comparison of topographic databases
752
Testing and compliance of secure products and systems
753
Testing and configuration of IEC 61850 multivendor protection schemes
754
Testing and conformance checking in the digital television environment
755
Testing and conformance within distributed systems
756
Testing and debugging delay faults in dynamic circuits
757
Testing and debugging distributed programs using global predicates
758
Testing and debugging for main control valve applied in the hydraulic excavator
759
Testing and debugging in real time systems-design decisions to use a distributed computer architecture in a real time application
760
Testing and debugging message passing applications based on the synergy of program and specification executions
761
Testing and Debugging Persistent Computing Systems: A New Challenge in Ubiquitous Computing
762
Testing and debugging UML models based on fUML
763
Testing and Debugging Web Applications: An End-User Perspective
764
Testing and defect tolerance: a Rent´s rule based analysis and implications on nanoelectronics
765
Testing and Demonstration of a 10-kA HTS DC Power Cable
766
Testing and Demonstration Results of the 350 m Long HTS Cable System Installed in Albany, NY
767
Testing and deployment of a new acoustic Doppler current meter
768
Testing and design for testability of BiCMOS logic circuits
769
Testing and design-for-testability solutions for 3D integrated circuits
770
Testing and Design-for-Testability Techniques for 3D Integrated Circuits
771
Testing and detection of aged integrated circuits based on testing embedded ADDS
772
Testing and Development of a Multi-Filter Rotating Shadowband Radiometer Network for Distributed Monitoring of Aerosol Optical Depth and Fine Mode Fraction on US Northeast Region
773
Testing and development of alternative flexible-bus geometries for interconnected substation equipment subjected to earthquakes
774
Testing and Diagnosing Comparison Faults of TCAMs with Asymmetric Cells
775
Testing and diagnosing embedded content addressable memories
776
Testing and diagnosing managed networks
777
Testing and diagnosis of board interconnects in microprocessor-based systems
778
Testing and diagnosis of interconnect faults in cluster-based FPGA architectures
779
Testing and diagnosis of interconnect structures in FPGAs
780
Testing and diagnosis of interconnects using boundary scan architecture
781
Testing and diagnosis of power switches in SOCs
782
Testing and diagnosis techniques for LUT-based FPGA´s
783
Testing and diagnostics
784
Testing and diagnostics
785
Testing and diagnostics of CMOS circuits using light emission from off-state leakage current
786
Testing and diagnostics of power transformer in PT. Indonesia Power Kamojang Geothermal Power Plant unit 1
787
Testing and diagnostics of SIMD arrays
788
Testing and enhancement of the dynamic performance of a Phasor measurement unit
789
Testing and Enhancement of the Dynamic Performance of a Phasor Measurement Unit
790
Testing and Error Analysis of Acceleration of Rotating Transformer
791
Testing and estimation for variable single evoked brain potentials
792
Testing and evaluating atmospheric climate models
793
Testing and evaluating counterterrorism technology
794
Testing and evaluating grounding systems for substations located in urban areas
795
Testing and evaluating grounding systems of high voltage energized substations: alternative approaches
796
Testing and evaluating the quality-level of stratified multichip module instrumentation
797
Testing and evaluating the quality-level of stratified multichip module instrumentation
798
Testing and Evaluating the Single Objective Intelligent Evolutionary Algorithm through a Graphic Interface
799
Testing and evaluation of a dual-frequency six-beam acoustic Doppler current profiler
800
Testing and evaluation of a mobile photovoltaic/genset hybrid system
801
Testing and evaluation of an advanced (3-D) X-ray screening system
802
Testing and evaluation of an automated tether management system for microgravity extravehicular activities
803
Testing and evaluation of an inertial/magnetic sensor-based pen input device
804
Testing and evaluation of an integrated GPS/INS system for small AUV navigation
805
Testing and Evaluation of an Ultra-Wideband Pulse Generator for HPM Weapon Simulation
806
Testing and evaluation of batteries for a fuel cell powered hybrid bus
807
Testing and evaluation of glass fiber reinforced polymers by thermal wave imaging
808
Testing and Evaluation of Insulating Films Part I: Description of Test Facilities at the University at Buffalo
809
Testing and Evaluation of Insulating Films Part II: Test Results Using Facilities at the University at Buffalo
810
Testing and Evaluation of Metal Fiber Brush Operation on Slip Rings and Commutators
811
Testing and Evaluation of Microarray Image Analysis Software
812
Testing and evaluation of permanent scatterers candidates selection methods
813
Testing and Evaluation of Silicon Die Strength
814
Testing and evaluation of superconducting cables for the LHC
815
Testing and evaluation of supportability technology on equipment
816
Testing and Evaluation of the Defense Data Network
817
Testing and evaluation of tubular positive lead-acid batteries
818
Testing and experimental characterization of a linear permanent magnet actuator for active vehicle suspension
819
Testing and failure analysis methodology of the NS32532 microprocessor
820
Testing and Fault Diagnosis of Time-Interleaved S? Modulators Using Checksums
821
Testing and Fault Tolerance of Multistage Interconnection Networks
822
Testing and fault tolerance properties in a class of sorting networks
823
Testing and Final Construction of the Superconducting Magnet for the Alpha Magnetic Spectrometer
824
Testing and Formal Verification of Decoder Circuit
825
Testing and hardware implementation of SPWM inverter using TMSF28335eZDSP
826
Testing and improving forward model and SMOS L2 algorithm for forests
827
Testing and integration of a cabled ocean observatory: Complexity is greater than the sum of the off-the-shelf parts
828
Testing and integration of JPSS Ozone Mapping and Profiler Suite (OMPS) algorithms using the Algorithm Development Library (ADL)
829
Testing and integration of the COMWIN antenna system
830
Testing and interfacing intelligent power supplies for the Los Alamos National Laboratory Accelerator Complex
831
Testing and interfacing intelligent power supplies for the Los Alamos National Laboratory Accelerator Complex
832
Testing and interoperability of 10GBASE-LRM optical interfaces [Topics in Optical Communications]
833
Testing and maintenance in software engineering education
834
Testing and Maintenance of Electrical Protective Devices in Cement Plants
835
Testing and Measurement for Gigabit Networks
836
Testing and measurement problems in ATM networks
837
Testing and measurement techniques for the evaluation of organic insulating materials for hv outdoor application
838
Testing and model validation for combined-cycle power plants
839
Testing and model validation for South African grid code compliance
840
Testing and modeling Ethernet switches and networks for use in ATLAS high-level triggers
841
Testing and modeling Ethernet switches and networks for use in ATLAS high-level triggers
842
Testing and modeling of diffusion bonded prototype optical windows under ITER conditions
843
Testing and modeling of lithium-ion ultracapacitors
844
Testing and Modeling of Low Current Arc in Free Air
845
Testing and Modeling of Motor Driver System Based on PD Control
846
Testing and modelling aircraft gas turbines: an introduction and overview
847
Testing and modelling hollow-core composite station post insulators under short-circuit conditions
848
Testing and modelling of a biomimetric swimmer
849
Testing and modelling of inductive superconducting fault current limiters
850
Testing and modelling of voltage transformer for high order harmonic measurement
851
Testing and modern software development methodologies
852
Testing and monitoring as basis of the dielectric diagnostic
853
Testing and monitoring system for a first generation intracortical visual prosthesis device using Java, Labview and VGA / NTSC output
854
Testing and multi-scale modeling of drop and impact loading of complex MEMS microphone assemblies
855
Testing and optimizing a scale reduction algorithm for a multi-screen video wall application on the META-100 ASIC emulator
856
Testing and optimizing ADC performance: a probabilistic approach
857
Testing and optimizing ADC performance: a probabilistic approach
858
Testing and performance analysis of charge controllers for Solar Home System
859
Testing and performance of transformer differential relays
860
Testing and prevention of head-in-pillow
861
Testing and prevention of head-in-pillow
862
Testing and programming flash memories on assemblies during high volume production
863
Testing and Qualifying Linear Integrated Circuits for Radiation Degradation in Space
864
Testing and Qualifying Linear Integrated Circuits for Radiation Degradation in Space
865
Testing and quality
866
Testing and Realization of Threshold Functions by Successive Higher Ordering of Incremental Weights
867
Testing and Realization of Threshold Functions with Don´t Cares
868
Testing and reconfiguring the application based modulation suited for cognitive radio
869
Testing and Reconstruction of Lipschitz Functions with Applications to Data Privacy
870
Testing and reliability
871
Testing and reliability
872
Testing and reliability
873
Testing and reliability
874
Testing and reliability
875
Testing and reliability
876
Testing and reliability
877
Testing and reliability [breaker page]
878
Testing and reliability [breaker page]
879
Testing and reliability of logic programs
880
Testing and remote field update of distributed base stations in a wireless network
881
Testing and remote maintenance of real future internet scenarios: Towards FITTEST and FastFix advanced software engineering
882
Testing and Safety Evaluation for Lifting Machine Structure Based on Acoustic Emission Technology
883
Testing and selecting surge suppressors for low-voltage AC circuits
884
Testing and selecting surge suppressors for low-voltage AC circuits
885
Testing and simulation for loss evaluation in field wound synchronous motors driven by voltage source inverters
886
Testing and simulation of comb-driven MEMS relay by applying digital image correlation technology
887
Testing and simulation of degrading faults
888
Testing and simulation of wire bonding attach for higher current
889
Testing and specification of environmental sensitivities in cesium and precision quartz signal sources
890
Testing and Specifying Thermal Performance of DC-DC Power Modules used in Sealed Box Applications
891
Testing and Standards for new BIPV products
892
Testing and Start-Up of Programmable Controller Systems
893
Testing and technical characteristics of a small overactuated marine platform
894
Testing and testability of programmable logic devices
895
Testing and testable designs for one-time programmable FPGAs
896
Testing and troubleshooting IEC 61850 GOOSE-based control and protection schemes
897
Testing and Usability Evaluation of the MRAGES Force Feedback Glove
898
Testing and validating activity models for network intrusion detection
899
Testing and Validating the Quality of Specifications
900
Testing and validation of a fast real-time oscillation detection PMU-based application for wind-farm monitoring
901
Testing and validation of a multi-sensor distributed surveillance system
902
Testing and Validation of the CASA DCAS System
903
Testing and validation of the signals and systems concept inventory
904
Testing and verification of HDL-models for SoC components
905
Testing and verification of selected technological parameters of the PKS
906
Testing and verification problems in industry: technology transfer
907
Testing and verification through virtual product models: A survey and look ahead
908
Testing and Verifying an IPv6 Based Multicast Network
909
Testing and verifying technique of the performance of tri-band beacon ground application system
910
Testing android devices for tactical networks: A hybrid emulation testbed approach
911
Testing Anti-denial of Service Attacks Based on Mobile Agent
912
Testing Anti-Frozen Characters of Air-Water Plates Heat Exchangers by FLUENT
913
Testing antivirus engines to determine their effectiveness as a security layer
914
Testing applications using domain based testing and Sleuth
915
Testing Approach for Mobile Applications through Reverse Engineering of UI Patterns
916
Testing approach for online hardware self tests in embedded safety related systems
917
Testing approach of component security based on dynamic monitoring
918
Testing Approach of Component Security Based on Fault Injection
919
Testing approach within FPGA-based fault tolerant systems
920
Testing Architectures for Real Time Systems
921
Testing arithmetic coprocessor in system environment
922
Testing artificial metaplasticity in MLP applications
923
Testing as a Mental Discipline: Practical Methods for Affecting Developer Behavior
924
Testing as a Mental Discipline: Practical Methods for Affecting Student Behavior
925
Testing as a Service (TaaS) on Clouds
926
Testing as a Service over Cloud
927
Testing ASICs at-speed
928
Testing ASICs with multiple identical cores
929
Testing Aspect Oriented Programs: an Approach Based on the Coverage of the Interactions among Advices and Methods
930
Testing aspect-oriented programs
931
Testing asynchronous circuits: help is on the way!
932
Testing ATM systems
933
Testing ATP-EMTP in power system protection
934
Testing Attribute Selection Algorithms for Classification Performance on Real Data
935
Testing Automation for system core kJava applications
936
Testing Automotive System Prototypes Far before Driving on the Proving Ground
937
Testing autonomous driving systems against sensor and actuator error combinations
938
Testing autonomous systems for deep space exploration
939
Testing autonomous systems for deep space exploration
940
Testing AUTOSAR software with QuickCheck
941
Testing Based SoC/VLSI IP Identification and Protection Platform
942
Testing basic access loops for service-affecting impulse noise
943
Testing battery state of health with portable metering devices?
944
Testing Behavioral Models with an Online Game
945
Testing Bell´s inequality with independent observers
946
Testing beyond EPA: TDF methodology solutions matrix
947
Testing beyond the SoCs in a lego style
948
Testing bidding strategies in the clock-proxy auction for selling radio spectrum: A Genetic Algorithm approach
949
Testing big chips becomes an internal affair
950
Testing big data (Assuring the quality of large databases)
951
Testing bio-chips
952
Testing BOI and BOB Algorithms for Solving the Winner Determination Problem in Radio Spectrum Auctions
953
Testing Born´s rule in quantum mechanics for three nutually exclusive events
954
Testing both ways
955
Testing BPEL with Stream X-Machine
956
Testing BPEL-based Web Service Composition Using High-level Petri Nets
957
Testing BPR common wisdom
958
Testing brachytherapy treatment planning software
959
Testing bridges to nowhere - combining Boundary Scan and capacitive sensing
960
Testing bulk HTS modules for resistive superconducting fault current limiters
961
Testing by Feedback Shift Register
962
Testing by Verifying Walsh Coefficients
963
Testing C++ generic libraries
964
Testing C++ classes
965
Testing calculable resistors of quadrifilar design
966
Testing Capability Improvement of NMR Interface
967
Testing Carlo Cipolla´s Laws of Human Stupidity with Agent-Based Modeling
968
Testing carry logic modules of SRAM-based FPGAs
969
Testing Cathode Materials in Factory Production
970
Testing C-elements is not elementary
971
Testing Central Processing Unit scheduling algorithms using Metamorphic Testing
972
Testing challenges for next generation radiological/nuclear detection
973
Testing Challenges for Next-Generation Radios
974
Testing challenges of data center bridging networks
975
Testing challenges of future wireless world
976
Testing challenges of future wireless world
977
Testing Challenges of Maritime Safety and Security Systems-of-Systems
978
Testing check bits at no cost in RAMs with on-chip ECC
979
Testing Chips With Spare Identical Cores
980
Testing Circuit-Partitioned 3D IC Designs
981
Testing civil aircraft and equipment to the new external RF environmental conditions
982
Testing clock distribution circuits using an analytic signal method
983
Testing Cloud Benchmark Scalability with Cassandra
984
Testing CMOS circuits at 50ps resolution with single-photon avalanche detectors
985
Testing CMOS logic gates for: realistic shorts
986
Testing coaxial switches of BPM using a high-resolution RF detector
987
Testing coexistence of different RTE protocols in the same network
988
Testing collaborative traffic over wireless protocols
989
Testing combinational iterative logic arrays for realistic faults
990
Testing combinations of parameters made easy [software testing]
991
Testing comes in from the cold [EMC anechoiuc chambers]
992
Testing commercial & military RF systems with PXI instrumentation modules
993
Testing communication aided power system protection schemes using GPS time synchronization and remote control
994
Testing communication and computer networks: an overview
995
Testing communication protocols
996
Testing Comparison and Delay Faults of TCAMs With Asymmetric Cells
997
Testing comparison faults of ternary CAMs based on comparison faults of binary CAMs
998
Testing Comparison Faults of Ternary Content Addressable Memories with Asymmetric Cells
999
Testing comparison of WS2-C and WS2-W based composite materials of low speed sliding contacts
1000
Testing competing models of sales force communication